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A comparison between different logic synthesis techniques from the digital switching noise viewpoint G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies Verona, 21 June 2007 Terza giornata nazionale di sintesi logica

G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

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Terza giornata nazionale di sintesi logica. A comparison between different logic synthesis techniques from the digital switching noise viewpoint. G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies Verona, 21 June 2007. Introduction. - PowerPoint PPT Presentation

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Page 1: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

A comparison between different logic synthesis techniques from the

digital switching noise viewpoint

G. Boselli, V. Ciriani, V. Liberali

G. Trucco

Dept. of Information Technologies

Verona, 21 June 2007

Terza giornata nazionale di sintesi logica

Page 2: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Introduction Mixed-signal integrated systems

Careful modeling of crosstalk between analog and digital sections

Disturbances injected by digital circuits can degrade overall system performance

Digital switching Deterministic process, depending on circuit parameters

and input signals Huge number of logic blocks cognitively stochastic

process Digital switching currents as stationary shot noise

process Amplitude distribution Power spectral density

Page 3: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Digital switching current

Proposed model valid under some hypotheses: Transition activity of a logic gate independent of the

activity of other gates In fact, gate inputs are driven by other gate outputs A large system contains a huge number of gates each gate

depends on a small number of neighboring cells

Logic transitions uniformely distributed in time Correct for asynchronous digital systems Synchronous system: transistion activity correlated with clock

more complex analysis

All logic transitions require the same time all current pulses have the same finite time duration

Page 4: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Stochastic model of digital switching noise (1)

Consider: Asynchronous digital network Identical logic cells driving equal capacitive loads Switching instants of input signals applied to gates

independent and randomly distributed in uniform manner

Digital switching noise as shot noise process Switching instants of input signals as Poisson points

Page 5: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Stochastic model of digital switching noise (2)

Input transition of logic gates as Dirac impulses Train of impulses, taken at random instants X(t): stochastic process representing the input transition of logic

gates

Logic gates all equal (same IDD and ISS current absorption) convolution between train of impulses X(t) and current absorbed by single logic gate h(t) = total current absorbed by the entire circuit I(t)

Page 6: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Amplitude distribution of switching noise

Represented by the Probability Density Function (pdf, f(x)) of the stochastic process I(t) Calculated from the pdf of the single current pulse

Arbitrary time instant t1 pdf of the total current at time t1 depends on the number of

Poisson impulses falling in the interval and the pdf of the single current pulse fH(x)

where

Page 7: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Power spectral density of switching noise

Power Spectral Density (psd) of switching current:

where is the psd of logic transition

impulses X(t) H(f) is the Fourier transform of the impulse response h(t)

h(t): current pulse, approximated with a triangular pulse the charge Q transferred during the complete switching of a logic gate is equal to the area under the curve

Page 8: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Normalized power of switching current As a result of few calculations, we obtain

Term : dc component of digital switching power

Term : ac component of the power

More general expression:

: “pulse shape” factor, depending on the single current pulse waveform in time domain.

whose normalized power is

Page 9: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Model validation

clip.pla: digital combinatory circuit included in the IWLS’93 benchmarks synthesized using equal-delay gates in a 180-nm CMOS

technology: inverter, 2-input NAND and NOR gates. network made of about 130 logic gates. inputs are driven with random digital signals; at any time, only

one bit can change its logic value. Transistor-level simulation with SPECTRE

values of the iDD current, sampled at 1-ps intervals, were stored for post-processing.

Two different average values of input transition rates, giving a low-density and a high-density switching activity. the number of logic transitions at high-density transition is

approximately ten times larger than the low-density transition.

Page 10: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Model validation: amplitude distribution Current waveforms exhibit triangular pulses Simulated circuit gates with different capacitive loads different current

peaks (generalized Poisson process). Amplitude density constant for intermediate values of current For low current values the amplitude density is larger to account for pulse

tails. Peak values of the single current pulse assumed to be uniformly distributed

between i2 and i3.

Amplitude density of the single switching current pulse.

Digital switching currents (low density of logic transitions).

Page 11: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Amplitude distribution: resultsSimulated pdf of the iDD switching current (low and high density of logic transitions)

Theoretical pdf of the iDD switching current (low and high density of logic transitions)

Page 12: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Model validation: power spectral densitySimulated psd of the iDD switching current (low and high density of logic transitions)

Theoretical psd of the iDD switching current (low and high density of logic transitions)

Page 13: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

IDEA

To analyze different logic synthesis techniques from digital switching noise viewpoint To apply the developed methodology to the same

logic function, synthesized with different techniques

CLIP benchmark circuit: Sop: ~ 770 MOS transistors Xor: ~ 400 MOS transistors

6 transistors 16 transistors

Page 14: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

SOP subcircuits

NAND NORINVERTER

Page 15: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

XOR circuit

A B Y

0 0 B

0 1 B

1 0 A

1 1 0

XOR asymmetric circuit just in one case the output is connected to a supply node In the other three cases XOR works as transfer gate Differences which depends on what input signal switches

Page 16: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Power dissipation

fewer MOS transistor= lower digital switching noise?

MOS transistor: Static power dissipation Dynamic power dissipation

It is important the number and the distribution of input signal commutation

Input files Switching at random instants At any time just one input signal can commutate

Page 17: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Currents

SOP XOR

Page 18: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

PDF

SOP XOR

Page 19: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

PSD

SOP XOR

Page 20: G. Boselli, V. Ciriani, V. Liberali G. Trucco Dept. of Information Technologies

Conclusion

Digital switching noise as stochastic process Faster estimation of digital switching noise, described by few

parameters Digital switching current as shot noise process Amplitude density and power spectral density of switching

currents derived Circuit synthesized with XOR gates exhibits lower switching

activity

Future development Analysis for pseudo-synchronous circuits Methodology to optimize the number and distribution of the

commutations of logic gates