FMEA Doc

(Information Sheet)

PFMEA Number:

Process Name:

Process Responsibility:

Prepared By:

Affected Product(s):

PFMEA Key Date:

PFMEA Origination Date:

PFMEA Revision Date:

Core Team Members:

Potential Failure Modes and Effects Analysis

1 Lamp Dead Loss of Product

8 4 10 320

2 8

Input Wire Dry

3

Visual Inspection

9 216 ###

8Elacap Dry

3 8 192

8 4

Visual Inspection

5 160

8Track Broken

2 5 80

8 2Visual Inspection

4 64


7 56


2 48

8DT Defective

8Loose Wrapping

Process Function

(Step)

Potential Failure Modes (process

defects)

Potential Failure Effects (KPOVs)

SEV

Potential Causes of

Failure (KPIVs)

OCC

Current Process Controls

DET

RPN

Recommend Actions

Responsible Person &

Target Date

Taken Actions

SEV

OCC

DET

RPN

Part Failure during Assembly & Aging

No Control after circuit despatch

Transfer to Design Philips

Six Sigma Project to be register for

Solder Defects Suneel Singh-Closer March

End

Touch and Visual Inspection

Input Wire Long Lead Shorting

1 Packing person will check for I/P Long lead. 2. Dixon will explore to have less strip length at PCB side of Input wire

Sudha / Pramod - 15

Feb

ATE & Visual Inspection

SMD Missing Non ATE

Wire Wrong Mounting

Component Missing Non ATE

Process Function

(Step)


defects)


SEV

Potential Causes of

Failure (KPIVs)

OCC


DET

RPN

Recommend Actions


Target Date

Taken Actions

SEV

OCC

DET

RPN

1 Lamp Dead Loss of Product

8Solder Short

1 2 16

3 Flickering ###

4 High Input Power ###

5 ###

6 ###

1 Low Lumens 6 1

ATE inspection

1 6

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ATE & Visual Inspection

Not Glowing on Min. Voltage

Lamp Abnormal Behave

Circuit Assembly with DT

Loss of Resource & Material, may be

scrap

Reverse of Polarity component

Process Function

(Step)


defects)


SEV

Potential Causes of

Failure (KPIVs)

OCC


DET

RPN

Recommend Actions


Target Date

Taken Actions

SEV

OCC

DET

RPN

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Process Function

(Step)


defects)


SEV

Potential Causes of

Failure (KPIVs)

OCC


DET

RPN

Recommend Actions


Target Date

Taken Actions

SEV

OCC

DET

RPN

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Process Function

(Step)


defects)


SEV

Potential Causes of

Failure (KPIVs)

OCC


DET

RPN

Recommend Actions


Target Date

Taken Actions

SEV

OCC

DET

RPN

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Process Function

(Step)


defects)


SEV

Potential Causes of

Failure (KPIVs)

OCC


DET

RPN

Recommend Actions


Target Date

Taken Actions

SEV

OCC

DET

RPN

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Process Function

(Step)


defects)


SEV

Potential Causes of

Failure (KPIVs)

OCC


DET

RPN

Recommend Actions


Target Date

Taken Actions

SEV

OCC

DET

RPN

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Process Function

(Step)


defects)


SEV

Potential Causes of

Failure (KPIVs)

OCC


DET

RPN

Recommend Actions


Target Date

Taken Actions

SEV

OCC

DET

RPN

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Severity of Effect

May endanger machine or operator. Hazardous without warning

May endanger machine or operator. Hazardous with warning

Major disruption to production line. Loss of primary function, 100% scrap. Possible jig lock and Major loss of Takt Time

Reduced primary function performance. Product requires repair or Major Variance. Noticeable loss of Takt Time

Medium disruption of production. Possible scrap. Noticeable loss of takt time. Loss of secondary function performance. Requires repair or Minor Variance

Minor disruption to production. Product must be repaired. Reduced secondary function performance.

Minor defect, product repaired or "Use-As-Is" disposition.

Fit & Finish item. Minor defect, may be reprocessed on-line.

Minor Nonconformance, may be reprocessed on-line.

Non

e

No effect

Ext

rem

eH

igh

Mod

erat

eL

ow

Rating

May endanger machine or operator. Hazardous without warning 10

May endanger machine or operator. Hazardous with warning 9

Major disruption to production line. Loss of primary function, 100% scrap. Possible jig lock and 8

Reduced primary function performance. Product requires repair or Major Variance. Noticeable loss of Takt Time 7

Medium disruption of production. Possible scrap. Noticeable loss of takt time. Loss of secondary function performance. Requires repair or Minor Variance 6

Minor disruption to production. Product must be repaired. Reduced secondary function performance. 5

Minor defect, product repaired or "Use-As-Is" disposition. 4Fit & Finish item. Minor defect, may be reprocessed on-line. 3

Minor Nonconformance, may be reprocessed on-line. 2

1

Likelihood of Occurrence

Process is in statistical control.

Low Process is in statistical control. Only

isolatedfailures associated with almost identical processes.

Rem

ote

Failure is unlikely. No known failures associatedwith almost identical

processes.

Failure is almost inevitable

Process is not in statistical control.Similar processes have experienced

problems.

Process is in statistical control but with isolated failures.Previous processes have experienced

occasionalfailures or out-of-control conditions.

Ver

y H

igh

Hig

hM

oder

ate

FailureRate

Capability(Cpk) Rating

1 in 2 < .33 10

1 in 3 > .33 9

1 in 8 > .51 8

1 in 20 > .67 7

1 in 80 > .83 6

1 in 400 > 1.00 5

1 in 2000 > 1.17 4

1 in 15k > 1.33 3

failures associated with almost identical processes.

1 in 150k > 1.50 2

1 in 1.5M > 1.67 1

Likelihood that control will detect failureV

ery

Low

No known control(s) available to detect failure mode.

The process automatically detects failure.Controls will almost certainly detect the existence ofa failure.

Controls have a good chance of detecting the existenceof a failure

Low

Mod

erat

eH

igh

Ver

y H

igh

Controls have a remote chance of detecting the failure.

Controls may detect the existence of a failure

Rating

10

9

8

7

6

5

4

3

2

1

Documents

FMEA Doc