V Notch (Special) Inspection system

For the inspection of test specimens of impact testing machine (Charpy) and Dumb-bell shaped Tensile

samples, profile projector is being used. The inspection on profile projector was time consuming and

also readings were person dependent. So, Fine IT Solutions developed computerized V-Notch inspection

system using camera vision with dedicated fixtures for V-Notch, V-Notch sub, Tensile and Tensile sub

samples.

The specifications of the system are as follows. The system consists of 3 magnifications:

1. 7 x Magnification: a. Used for Tensile sample inspection b. Field of View: 110 mm x 30 mm c. Measurement resolution of 0.002”

d. To measure Diameter at gauge length, Length of reduced section (dumb-bell radius at all the 4 sides – Left-Top, Right-Top, Left-Bottom, Right-Bottom)

2. 10 x Magnification: a. Used for Charpy sample – Total length, Width, Thickness and V-Position measurement b. Field of View: 75 mm x 30 mm c. Measurement resolution of 0.02 mm for < 20 mm and 0.04 mm for > 20 mm dimension

3. 130 x Magnification:

a. Used for Chapry sample – V Notch measurement (Notch depth, Notch angle, Notch radius)

b. Field of View: 4.5 mm x 3.5 mm c. Measurement resolution of 0.002 mm for length and 0.2 degree (12’) for angular

measurement The system is NABL calibrated in Pune on glass scale with maximum uncertainty of +/- 0.024 mm for 7 x and 10 x magnifications and +/- 0.005 mm for 130 x magnification. The angular uncertainty observed in NABL calibration is 9’38” (9 minute 38 seconds of arc). The system is much faster, accurate and person independent as against the older profile projector method.