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General Physics Experiment II Final Report

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  • Estimation of Intensity Profile of Single Slit Diffraction Patterns

    Joonsuk Huh (20125098)

    (General Physics Experiment 2: Section 8)

    Abstract: We estimated intensity profiles of single slit diffraction patterns via digital

    image processing. We used slit width 0.02mm, 0.04mm, 0.08mm and 0.16mm. Then we

    compared estimated intensity profiles with theoretical calculations based on phasor

    diagram. We show that estimated intensity profiles well agree with theoretical calculations.

    Theory & Introduction

    Figure 1. Schematic of diffraction by slit with width a. D is the distance between the slit and the screen. y is the distance from the diffraction center.

    Diffraction is a wave phenomenon such that

    when a group of waves passes an obstacle or a hole,

    its direction and intensity changes so that it looks

    like spreading out.[1] It essentially comes from the

    superposition of infinitely many electromagnetic

    waves with slightly different phases. Let be

    angular phase difference of wave at point 1 and

    point 2 at Figure 1. Then the intensity of electro-

    magnetic wave due to infinite superposition of

    electromagnetic waves between point 1 and point 2

    is given by[2]

    = !!"#!!!!

    !

    (1)

    where I is the intensity of the light of given and I0

    is the maximum intensity of the light (when =0).

    Figure 2. Phasor diagram for the diffracted light with net angular pahse difference .

    This formula can be derived geometrically from

    phasor diagram[2,3]. If we think a single slit as a

    composition of infinitesimal width slits, then

    diffracted light can be thought as an infinite

    superposition of lights emitted from every point

    between point 1 and 2 due to Huygens principle.

    Therefore its phasor diagram is like Figure 2. For

    each , the amplitude of superposed wave E is same

    as the length of the line segment bc. From the

    isosceles triangle abc, the length of bc is given by

    = = 2sin !!

    (2)

    where R is the radius of the half-circle C. Because

    the length of the arc bc is same as original

    magnitude of wave E0, R can be written as

  • Figure 3. The path difference shown near the slit.

    = !!!

    (3)

    If we combine (2), (3) and use the fact that the

    intensity I is proportional to E2, then we get (1).

    In the real experiment, is not the direct control

    variable. Therefore we need to express as a

    function of slit width a and other variables. From

    Figure 3, one can see that path difference between

    the wave starting from the point 1 and the wave

    from the point 2 is given by

    = sin (4)

    Because of proportionality between and the

    wavelength is and 2,

    = !!!!= !!" !"#!

    ! (5)

    Finally, from figure 1, for small , sin tan =

    y/D. Therefore the final expression for I is

    = !!"#!"#!"!"#!"

    !

    (6)

    Where y is the vertical distance from the center of

    the diffraction pattern and D is the distance between

    the slit from the screen. Especially, from (6) one can

    see minima occurs when

    !"# =!"#!

    = 1,2,3 (7)

    Experimental Procedure

    We used 650nm wavelength laser and slits of

    width a = 0.02, 0.04, 0.08, 0.16mm respectively. Slit

    to screen distance D = 1m. We took digital pictures

    of diffraction patterns in dark room. We used Mathe

    Figure 4. Estimated intensity profile of diffraction patterns from slit with width a=0.02, 0.04, 0.08, 0.16mm along with theoretical calculations.

    Table 1. Distances ymin with theoretical calculations by Eq. 1. Estimated slit width a is presented with standard deviation (SD). All values are presented in mm unit.

    matica packages LineProfile function to extract

    intensity information of digital images along a line

    segment. We normalized extracted intensity data by

    dividing them by the maximum intensity value.

    Then we interpolated normalized intensity data

    points.

    Result & Discussion

    Figure 4 shows estimated intensity profile along

    with theoretical calculations. Froms figure 4, we see

    that as slit width a increases, the width of intensity

    curve decreases. This can be shown from (7) and

    also intuitively expected. From figure 4, one can see

    that theory and experiments agree well.

    Table 1 shows estimated distances ymin from the

    center of the diffraction pattern to the minimum

  • intensity positions along with theoretical calcul-

    ations by (7). We also estimated slit width a from

    measured ymins using (7). Mean estimated value of a

    and standard deviation (SD) is presented in Table 1.

    We can see that theory and experimental values only

    differ up to few millimeters. Specifically, their

    mean % error between measurement and theory was

    about 7.8%.

    Conclusion

    We observed single slit diffraction patterns of

    650nm wavelength laser on the screen apart from the

    slit by 1m. We used slits with width with width a =

    0.02, 0.04, 0.08, 0.16mm. We estimated normalized

    intensity profiles of diffraction patterns via digital

    image processing using Mathematica software and

    interpolated and plotted them as a function of

    distance y from the center of the pattern. We saw

    that as slit width a increases, the width of intensity

    curve decreases as expected. We compared esti-

    mated intensity profile with theoretical formula (6)

    and found that theory and experiment agree well.

    We also measured distance ymins from the center of

    the diffraction pattern to the points of minimum

    intensity. We compared these with approximation

    formula equation (7) and confirmed that this formula

    and experiment also agree well.

    References [1] D. Halliday, R. Resnick, J. Walker, Fundamentals of Physcis (Wiley, 2010, 9th ed.), p.963. [2] D. Halliday, R. Resnick, J. Walker, Fundamentals of Physcis (Wiley, 2010, 9th ed.), p.997. [3] D. Halliday, R. Resnick, J. Walker, Fundamentals of Physcis (Wiley, 2010, 9th ed.), p.998.