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8/12/2019 EPS2WAY: AN EFFICIENT PAIRWISE TEST DATA GENERATION STRATEGY
1/11
EPS2Way: An Efficient Pairwise Test Data Generation Strategy
K.F. Rabbi1, Sabira Khatun
1, Che Yahaya Yaakub
1and M. F. J. Klaib
2
1Faculty of Computer Systems & Software Engineering, Universiti Malaysia Pahang,
Pahang, Malaysia.2Faculty of Science and Information Technology, Jadara University, Jordan.
Corresponding E-mail:[email protected]
ABSTRACT
Testing is a very important task to developerror free software. The funds and release
time of a software product is limited, thus, itis nearly hard to execute the exhaustive test
i.e., to test all combinations of input data.Pairwise (2 way) test data generationstrategy maintains higher reduction of
exhaustive numbers at the same time, it isalso a low cost solution to test any software
product thoroughly. Usually, in software,faults are caused by unusual combination ofinput data. Hence, optimization in terms ofnumber of generated test-cases andexecution time is in demand. This paper
proposes an efficient pairwise searchapproach (EPS2Way) of input values for
optimum test data generation. This approachsearches the most coverable pairs by pairing
parameters and adopts one-test-at-a-time to
construct final test suites. EPS2Way iseffective in terms of number of generated
test cases and execution time compared toother existing strategies.
KEYWORDS
Combinatorial interaction, Software testing,Pairwise testing, Pairwise search approach,Test case generation.
1 INTRODUCTION
In the process of software engineering,
software testing and debugging is still
very labor-intensive and expensive [1].
Approximately 50% of project money
goes under software testing. Thus, the
focus is to find an automatic and cost-effective software testing and debugging
strategy to ensure high quality software
release [2]. Nowadays research andinvestigations on software testing
focuses on test coverage criterion design,
test-case generation problem, test oracleproblem, regression testing problem and
fault localization problem [1]. Among
these problems test-case generation
problem is a valuable one and come
forth in producing error free software[1]. To solve this problem, Pairwise
strategy (i.e. two-way interaction) hasbeen renowned as an effective test case
reduction strategy and able to detect
from 60 to 80 percent of the faults [3, 4].
For example, the proofing tab under
option dialog in Microsoft excel
(Figure 1), there are 6 possible
configurations needed to be tested. Eachconfiguration takes two values (checked
or unchecked) and on top of that the
French modes takes 3 possible valuesand Dictionary language takes 54
possible values. So to test this proofing
tab exhaustively, the number of testcases need to be executed is 2
6x 54 x 3
i.e. 10,368. Assuming each test case may
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consume 4 minutes to execute; results
around 28 days to complete the
exhaustive test of this proofing tab [3,4].
Figure 1: Microsoft Excel Proofing Option
Similarly, for a hardware product whichhas 30 on/off switches, to test allpossible combination may need 230 =1,073,741,824 test cases, and consume10,214 years by considering 5 minutesduration for each single test case [4].Nowadays, research work incombinatorial strategy aims to generatesmallest amount of performable test suits
[5]. The solution of this challenge isknown as non-deterministic polynomial-time hard (NP-hard) [6]. So far manyapproaches have been proposed to solvethis problem for last few decades [5-8,10-14] but yet optimum one is indemand. This paper introduces anefficient pairwise search approach fortest data generation. This strategycombines two parameters collectively (apair) and searches for another parameter
combination to generate test suits fromthe parameter pairs in terms of optimumsize and time consumption.
The paper is organized as follows. Therelated work detail is presented inSection 2. Followed by the proposedEPS2Way strategy, the developed
EPS2Way prototype tool, the empiricalresults with its efficiency and
comparison, and finally the conclusion.
2 RELATED WORKS
Observed facts show that lack of testingfor both functional and nonfunctional isone of the major sources of software andsystems bug/errors [7, 8]. NationalInstitute of Standard and Technology(NIST) estimated that the cost ofsoftware failure to the US economy at $6
X 1010
, which was the 0.6 percent ofGDP [9, 10]. Around one-third of thiscost can be reduced by improvingsoftware testing structure. Hence,automatic testing is one of the criticalconcerns [11]. Through systemautomation, software developmentprocess may become more practical andscalable. However, the automatedgeneration and reduction of test cases arechallenging [12]. The underlying
problem is known as NP-hard thusresearchers have focused on thetechniques that search to find nearoptimal test sets in a reasonable time[13, 14].
Pairwise testing is a significant approachfor software testing as it providesefficient error detection at a very lowcost. It shows a good balance by linkingthe magnitude and effectiveness of
combinations. It requires, combinationof any two parameter values has to becovered by at least one test case [14, 15].From the point of pairwise there aresome pre-defined rules to calculate thetest cases directly from the mathematicalfunctions, which are known as algebraicstrategy [4]. On the other side,
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computational approaches are based on
the calculation of coverage of generated
pairs, followed by an iterative or randomsearch technique to create test cases.
IRPS algorithm [6] uses the
computational approach. It is adeterministic strategy which generates
all pairs and then stores it to the linked
list. Finally it searches the entire list,
select best list and empties the list. Whenall list become empty, the collection of
best list is determined as the final test
suite.
The Automatic Efficient Test Generator
(AETG) [16] and its deviation mAETG[6] generate pairwise test data using
computational approach. This approach
uses the Greedy technique to build test
cases based on covering as much aspossible uncovered pairs. AETG uses a
random search algorithm [17]. Genetic
Algorithm (GA) and Ant Colony
Algorithm (ACA) are the variants ofAETG [18, 19]. Genetic algorithm [18]
creates an initial population of
individuals (test cases) and then thefitness of those individuals is calculated.
Then it starts discarding the unfit
individuals by the individual selectionmethods. The genetic operators such as
crossover and mutation are applied on
the selected individuals and this
continues until a set of best individuals
found. Ant Colony Algorithm [18]candidate solution is associated with the
start and end points. When an antchooses one edge among the different
edges, it would choose the edge with a
large amount of pheromone which givesthe better result with the higher
probability.
The In-Parameter-Order (IPO) [12]
strategy starts with an empty test set andadds one test at a time for pairwise
testing. It creates the test cases by
combination of the first two parameters,
then add third and calculate how manypair is been covered and so on until all
the values of each parameter is checked.
This approach is deterministic approach.
AllPairs [20] algorithm can generate test
suites covering all pairwise interactions
within a reasonable time. The strategyseems to be deterministic strategies since
the same test suite are generated every
run time.
The Simulated Annealing (SA) [21]
algorithm is also a deterministic strategy
with the same generated test suite forevery run time.
Generalization of Two Way test data
(G2Way) [22] is one of the excellenttools based on computational and
deterministic strategy. It is based on
backtracking algorithm and usescustomized markup language to describe
base data. The G2Way backtracking
algorithm tries to combine generatedpairs so that it covers highest pairs.
Finally after covering all the pairs, the
test case treats as a final test suite.
One of the recent algorithms is effectiverandom search based pairwise test data
generation algorithm named R2Way tooptimize the number of test cases [23].
R2Way takes a random number from 0
to maximum possible exhaustive
number of test cases and creates a testcase based on some binary calculations.
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Java program was used to test the
performance of R2Way. It is able to
support both uniform and non-uniformvalues effectively with near optimum
performance in terms of number of
generated test cases and time
consumption.
3 PROPOSED EPS2Way
STRATEGY
The proposed efficient pairwise test data
generation strategy works in three (3)steps as follows:
I. Firstly, it generates pairparameters and their values.
II. Then, the value of one pair iscombined with another pair bycalculating the highest possible
coverable pairs. In this way it
constructs a test case and adds to
the final test suit.
III. Finally, it constructs the testcases from uncovered pairsthrough an adjustment algorithm.
To make this easily understandable, ascenario is presented in terms of
example as follows:
3.1 Pair Generation
EPS2Way strategy/algorithm first takes
the parameters and corresponding valuesto make the 2 way combinations. The
combinations stored into the memory.
As an example, suppose, there are six (6)parameters A, B, C, D, E, and F, each
with 2 values as shown in Table 1.
Table 1: Example parameters with values
Parameters A B C D E F
Valuesa1 b1 c1 d1 e1 f1
a2 b2 c2 d2 e2 f2
EPS2Way first generates header pairparameters which are AB, CD, EF and
then calculates the possible values of all
the pairs as shown in Table 2. In this
example, each of AB, CD and EF paircontains 2 x 2 = 4 pair of values and
stored in the memory respectively. The
expression can be expressed as follows:
NP = [V1 * V2] (1)
Where, NP = Number of Pairs, V1 =Value of Parameter 1, V2 = Value of
Parameter 2.
Table 2: Generated header pair parameters and
all possible values
Pair
ParametersAB CD
EF
Generated
all possibletest cases
[a1, b1] [c1, d1] [e1, f1]
[a1, b2] [c1, d2] [e1, f2]
[a2, b1] [c2, d1] [e2, f1]
[a2, b2] [c2, d2] [e2, f2]
3.2 Test Case Generation
At the beginning, each AB pair tries tocombine with one of the CD pairs. If
combined pairs give highest or
maximum coverage, then it tries tocombine with the values of EF pairs. Sothe test case generation approach is in
greedy mode and constructs test cases
one at a time.
In Table 2, EPS2Way tries to combine
[a1, b1] pair with four possible values of
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CD which are: [c1, d1], [c1, d2], [c2,
d1], [c2, d2]. The first combined AB-CD
pair with the highest coverage looks forthe available pairs again from EF header
pair among: [e1, f1], [e1, f2], [e2, f1],
[e2, f2] as shown in Table 3. Finally, the
combined AB-CD-EF pair with highestcoverage is then added to the final test
suit.
Table 3 shows, one of AB pairs [a1, b1]searches for the best pairs among the
available pairs of CD and its output
should be only one, which is [a1, b1, c1,d1] as the first uncovered final test-case
with full coverage. Again, generated pair
[a1, b1, c1, d1] search for the availablepairs of EF and the generated output is
[a1, b1, c1, d1, e1, f1]. Same procedure
is followed by other AB pair parameters
to generate other final test cases. Thehighest coverable pairs are stored in the
final test set.
Table 3: Example of pair search and final test
case generation
Initi
al
pairs
Avai
lable
pairs
Best
uncover
ed pairs
Available
Pairs
Bestuncove
red
pairs
[a1,b1]
[c1,
d1]
[a1, b1,c1, d1]
[e1,
f1]
[a1, b1,
c1, d1,
e1, f1]
[c1,
d2]
[e1,
f2]
[c2,
d1]
[e2,
f1]
[c2,
d2]
[e2,
f2]
[a1,b2]
[c1,
d1][a1, b2,c1, d2]
[e1,
f1] [a1, b2,
c1, d2,
e1, f2]
[c1,
d2]
[e1,
f2]
[c2, [e2,
d1] f1]
[c2,
d2]
[e2,
f2]
[a2,
b1]
[c1,
d1]
[a2, b1,
c2, d1]
[e1,
f1]
[a2, b1,
c2, d1,e2, f1]
[c1,
d2]
[e1,
f2]
[c2,
d1]
[e2,
f1]
[c2,
d2]
[e2,
f2]
[a2,
b2]
[c1,
d1]
[a2, b2,
c2, d2]
[e1,
f1]
[a2, b2,
c2, d2,e2, f2]
[c1,d2]
[e1,f2]
[c2,d1]
[e2,f1]
[c2,d2]
[e2,f2]
3.3 Pair Covering & Test Case
Adjustment
At this stage, the adjustment algorithm
performs an exhaustive search for allpossible uncovered pairs and tries to
adjust all uncovered pairs. When an
adjustment is done it is added to the finaltest set. Figure 2 shows the test case
generation adjustment algorithm and
Figure 3 shows the flowchart of the
strategy.
Adjustment Algorithm to Generate Test Suits ()Begin
Let PP= {} represents the set of
all possible pairs
Let PS= {} represents the pairs
where all the PSstores in PP
Let PB= {} represents the best
pairs set which cover highest
pairs
Let PF= {} as empty set
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represents the Final test suits
Let CBas number = 0 represents
the best covering number
Let CCas number = 0 represents
the current covering number
For each PSas P1in PP
For each next PSas P2in PP
Add P1with P2and
put in P
CC= Get coverage
pair number of P
IF CBis less or
equal to CC
Put CCinto CB
Put P2into PB
End IF
End ForAdd P1with PBand store to PF
End For
End
Figure 2: EPS2Way pseudo code for test case
generation from uncovered pairs.
Figure 3: Flow chart of the EPS2way strategy
4 EPS2Way PROTOTYPE TOOL
A prototype tool is developed withsimple GUI to investigate EPS2Wayperformance in terms of the number of
generated test cases & execution time.
The tool accepts both uniform and non-uniform values and shows the required
number of test cases. Figures 4 to 7
shows the screen shot of PS2Way
prototype tool.
Figure 4: Generator Window
Figure 5: Same parameter & value window
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Figure 6: Different Parameter and Value window
Figure 7: Generated Test cases
Figure 4 shows the initial windows
containing two buttons. The value of the
T-way field is 2 (un-editable) as thecurrent algorithm supports pairwise (2-
way) testing. The buttons Same Params
& Values and Differ Params and
Values are for uniform and non-uniform input values respectively.
Clicking on the Same Params &
Values opens input popup windows
shown in Figure 5. The Number ofParameter field takes the required
number of parameters as input and the
Number of values for each parametertakes input values for each parameter.
Figure 6 shows the popup window which
can take non uniform values. Here, thevalues can be added on the list box.
After clicking on the ok button the
number of test cases and the test case
suits are produced as shown in Figure 7.
5 EMPIRICAL RESULTS
To evaluate the efficiency of proposedEPS2Way, we have considered six (6)
different system configurations. Among
those the first three (3) are non-uniformparameterized values and the rest are
uniform as follows:
S1: 3 parameters with 3, 2 and 3 values.
S2: 3 parameters with 2, 1 and 3 values.
S3: 5 parameters with 3, 2, 1, 2 and 2
values.S4: 3 2-valued parameters
S5: 3 3-valued parameters
S6: 4 3-valued parameters.
The consideration of the parameters and
assumptions are according to some of
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the related existing algorithms that
support pairwise testing to compare our
results with those.
Table 4 shows the comparison of
generated test suite size by proposed
EPS2Way with others. The shadowed
cells indicate the best performance in
term of generated test case size. NA
indicates that data are not available. Itshows that proposed EPS2Way produces
the lowest number of test cases for each
configuration by showing its superiority.
Table 4: Comparison based on the generated test size
Sys AETG[16]
IPO[12]
TConfig[24]
Jenny[25]
TVG[26]
ALLPairs
[20]
G2Way[22]
R2Way[23]
ProposedEPS2Way
S1 NA 9 9 9 9 9 9 9 9
S2 NA 6 6 6 6 6 6 6 6
S3 NA 7 8 8 8 9 7 7 7S4 NA 4 4 5 6 4 4 4 4
S5 NA 10 9 9 10 10 10 10 9
S6 9 10 9 13 12 10 10 9 9
For a fair comparison of execution time
(i.e., complexity) among related test
strategies, either computing environment
should be same or need the source code(usually not available most of the cases).
All Pairs tool [20] is free to download
and can be executed using any platform.Also R2Way [23] is our proposedstrategy and have source code. Hence we
have compared the execution time of
EPS2Way with All Pairs and R2Wayusing the same platform as follows:
Intel P IV 3 GHz, 1 GB RAM, Java
programming language, and WindowsXP OS. For some of the other existing
strategies, the platform instances and
data are taken from References [22]. We
have managed to execute our EPS2Waystrategy using the following platform for
respective comparison with:
AETG [16], AETGm [6], SA [21]:Intel P IV 1.8 GHz, C++
programming language, Linux
Operating System.
IPO [12]: Intel P II 450 MHz, Javaprogramming language, Windows 98operating system.
GA [18], ACA [19]: Intel P IV 2.26GHz, C programming language,
Windows XP operating system.
G2Way [22]: Intel P IV 1.6 GHz, 1GB RAM, C++ programming
language, Windows XP operating
system.
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To compare the complexity, we have
assumed the following five (5)
configurations.
T1: 3 3-valued parameters,
T2: 4 3-valued parameters,
T3: 13 3-valued parameters,T4: 10 5-valued parameters,
T5: 1 5-valued parameters, 8 3-valued
parameters and 2 2-valued parameters.
Table 5 shows that in terms of executiontime, EPS2Way gives the better result
for first three system configurations T1,
T2 and T3. For the other two systems T4and T5 the execution time is also very
close to the lowest values with negligible
difference. Hence EPS2Wayoutperforms other existing strategies.
Table 5: Comparison Based on Execution Time (in seconds)
SysAETG[16]
AETGm[6]
IPO[12]
SA[21]
GA[18]
ACA[19]
ALLPairs[20]
G2Way[22]
R2Way[23]
ProposedEPS2Way
T1 NA NA NA NA NA NA 0.08 0.047 0.07 0.027
T2 NA NA NA NA NA NA 0.23 0.062 0.16 0.062
T3 NA NA NA NA NA NA 0.45 0.25 1.44 0.2
T4 NA NA 0.05 NA NA NA 1.02 0.687 20.3 0.06
T5 NA 58 NA 214 22 31 0.35 0.33 5 0.43
6 CONCLUSIONS
In this paper we have proposed pair
parameter based search algorithm forpairwise (2-way) test case generation.
The correctness of the proposed strategyis apparent. The algorithm is efficient interms of execution time and able to
generate highly reduced test suites to
fulfill the current demand by softwaredevelopment companies. The proposed
algorithms could be further extended to
support higher t-way interaction testingwhich is under investigation in
University Malaysia Pahang.
7 ACKNOWLEDGEMENTS
The authors would like to thanksUniversiti Malaysia Pahang for financial
support under University Research
Grants (RDU 100361) to finalize thiswork.
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8 REFERENCES
1. Xiang Chen, Qing Gu, Jingxian Qi, DaoxuChen, Applying Particle Swarm
optimization to Pairwise Testing, in
proceedings of the 34th Annual IEEE
Computer Software And Application
Conference, Seoul, Korea, 2010.
2. Yingxia Cui, Longshu Li, Sheng Yao, ANew strategy for pairwise test case
generation, in proceedings of the third
international Symposium on Intelligent
Information Technology Application,
NanChang, China, 2009.3. Y. Lei, R. Kacker, D.R. Kuhn, V. Okun, and
J.Lawrence, "IPOG: A general strategy for t-
way software testing, in proceedings of the
14th Annual IEEE International Conference
and Workshops on the Engineering of
Computer-Based Systems, Tucson, Arizona,
2007.
4. M. I. Younis, K. Z. Zamli, N. A. Mat Isa,Algebraic Strategy to Generate Pairwise
Test Set for Prime Number Parameters and
Variables, in proceedings of the IEEE
international conference on computer and
information technology, Kuala Lumpur,
Malaysia, 2008.
5. Mohammad F. J. Klaib, SangeethaMuthuraman, Noraziah Ahmad, and
Roslina Sidek, A Tree Based Strategy for
Test Data Generation and Cost Calculation
for Uniform and Non-Uniform Parametric
Values, in proceedings of the 10 th IEEE
international conference on computer and
information technology, West Yorkshire,
UK, 2010.
6. M. I. Younis, K. Z. Zamli, N. A. Mat Isa,IRPS - An Efficient Test Data Generation
Strategy for Pairwise Testing, in
Proceedings of the 12th internationalconference on Knowledge-Based Intelligent
Information and Engineering Systems,
Lecture Notes In Artificial Intelligence,
Springer-Verlag, 2008.
7. D. Leffingwell and D. Widrig, ManagingSoftware Requirements: A Use Case
Approach, Addison Wesley, 2003.
8. R. L. Glass, Facts and Fallacies of SoftwareEngineering, Addison Wesley, 2002.
9. National Institute of Standards andTechnology, The Economic Impacts ofInadequate Infrastructure for Software
Testing, Planning Report, 2-3 May, 2002.
10. Mark Harman and Phil McMinn, ATheoretical and Empirical Study of Search-
Based Testing: Local, Global, and Hybrid
Search, IEEE Transactions on Software
Engineering, vol. 36, no. 2, pp-226-247,
2010.
11. P. McMinn, Search-Based Software TestData Generation: A Survey, Software
Testing, Verification and Reliability, vol.
14, no. 2, pp. 105-156, 2004.
12. Y. Lei and K. C. Tai, "In-Parameter-Order:A Test Generation Strategy for PairwiseTesting", in proceedings of the 3rd IEEE
International conference on High-Assurance
Systems Engineering, Washington, DC,
USA, 1998.
13. D. Gong, X. Yao, Automatic detection ofinfeasible paths in software testing IET
Software, vol. 4, no. 5, pp-361-370, 2010.
14. Jangbok Kim, Kyunghee Choi, Daniel M.Hoffman, Gihyun Jung, White Box
Pairwise Test Case Generation, in
proceedings of the IEEE Seventh
International Conference on QualitySoftware, Oregon, USA, 2007.
15. Zainal Hisham Che Soh, Syahrul Afzal CheAbdullah, Kamal Zuhari Zamli, A
Parallelization Strategies of Test Suites
Generation for t-way Combinatorial
Interaction Testing, in proceedings of the
IEEE International conference on
Information Technology, International
Symposium , Kuala Lumpur, Malaysia,
2008.
16. D. M. Cohen, S. R. Dalal, M. L. Fredman,and G. C. Patton, "The AETG System: An
Approach to Testing Based on
Combinatorial Design," IEEE Transactions
on Software Engineering, vol. 23, no. 7, pp.
437-444, 1997.
17. M. Harman and B.F. Jones, Search-basedSoftware Engineering & Information and
Software Technology, pp. 833-839, 2001.
18. T. Shiba, T. Tsuchiya, and T. Kikuno,"Using Artificial Life Techniques to
Generate Test Cases for Combinatorial
International Journal on New Computer Architectures and Their Applications (IJNCAA) 1(4): 1099-1109
The Society of Digital Information and Wireless Communications, 2011 (ISSN: 2220-9085)
1108
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4385458http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4385458http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4385458http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=43854588/12/2019 EPS2WAY: AN EFFICIENT PAIRWISE TEST DATA GENERATION STRATEGY
11/11
Testing," in proceedings of the 28th Annual
Int. Computer Software and Applications
Conf. (COMPSAC04), Hong Kong, 2004.
19. Xiang Chen, Qing Gu, Xin Zhang, DaoxuChen, Building Prioritized Pairwise
Interaction Test Suites with Ant Colony
Optimization, in proceedings of the 9th
International IEEE Conference on Quality
Software, Jeju, Koria, 2009.
20. J. Bach, "Allpairs Test Case GenerationTool", Available from:
http://tejasconsulting.com/open-
testware/feature/allpairs.html (Last access
date: 27th Sep. 2009)
21. James D. McCaffrey, Generation ofPairwise Test Sets using a Simulated Bee
Colony Algorithm, in proceedings of theIEEE International Conference on,
Information Reuse & Integration, Las
Vegas, USA, 2009.
22. M. F. J. Klaib, K. Z. Zamli, N. A. M. Isa, M.I. Younis, and R. Abdullah, "G2Way A
Backtracking Strategy for Pairwise Test
Data Generation," in proceedings of the 15th
IEEE Asia-Pacific Software Engineering
Conf, Beijing, China, 2008.
23. S. Khatun, K. F. Rabbi, C. Y. Yaakub andM. F. J Klaib, A Random Search Based
Effective Algorithm for Pairwise Test Data
Generation in proceedings of IEEEInternational Conference on Electrical
Control and Computer Engineering 2011,
Kuantan, Malaysia, 2011.
24. "TConfig," Available at:http://www.site.uottawa.ca/~awilliam/. (Last
access date: 27th Sep. 2009).
25. "Jenny," Available at:http://www.burtleburtle.net/bob/math/. (Last
access date: 27th Sep. 2009).
26. "TVG," Available at:http://sourceforge.net/projects/tvg. (Last
access date: 27th Sep. 2009).
International Journal on New Computer Architectures and Their Applications (IJNCAA) 1(4): 1099-1109
The Society of Digital Information and Wireless Communications, 2011 (ISSN: 2220-9085)
1109
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