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8Sep 2003 Run2b Readout Meeting Qun Yu / Moreshwar Dhole Louisiana Tech University DJC Testing at LaTech: Update

DJC Testing at LaTech: Update

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DJC Testing at LaTech: Update. Quality Control Tests of DJC’s. Continuity and shorts test Resistance testing High voltage standoff testing. LaTech Testing Crew: Moreshwar Dhole Qun Yu Matthew Bellot Henry Hollins. Since our last report. - PowerPoint PPT Presentation

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Page 1: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

DJC Testing at LaTech:Update

Page 2: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

Quality Control Tests of DJC’s1. Continuity and shorts test2. Resistance testing3. High voltage standoff testing.

LaTech Testing Crew:Moreshwar DholeQun YuMatthew BellotHenry Hollins

Page 3: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

Since our last report• Updated and improved our database

to reflect changes suggested last time and to include results of recent testing

• Received 168 50cm-test cables from Century– Commenced affixing backings to cables

as per procedure from Jim Fast– In parallel, ~80 of these have been

tested

Page 4: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

On the following slide are sample data from SHEET 1 of the DJC database (http://caps.phys.latech.edu/~greenw/run2b/run2b_page.html)

Page 5: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

ID Type Vendor Location Length_cm Tested Resistence Tester Date TestedCurrent Shorts-Open < 3 σ

CT 150 Test Century FermilabCT 151 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 152 Test Century Fermilab 50 Tested OK Yes Moreshwar 7/29/2003CT 153 Test Century Fermilab 50 Tested OK Yes Moreshwar 7/29/2003CT 154 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 155 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 156 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 157 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 158 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 159 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 160 Test Century Fermilab 50 Tested OK Yes Moreshwar 7/29/2003

Page 6: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

• Also on the DJC database spreadsheet is SHEET 2 which has resistance measurements, mean resistances and standard deviations. Part of this sheet is on the next slide..

Page 7: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

Line Line Board Resistance Resistance MEAN STANDARDNumber Description Resistance cable ct_19 cable ct_21 RESISTANCE DEVIATION

(CENTURY) (CENTURY)35 AVDD(S) 0.094 2.883 2.646 2.529 0.22837 AVDD 0.096 0.19 0.161 0.163 0.01839 AVDD 0.099 0.185 0.157 0.157 0.01241 GND 0.099 0.092 0.082 0.084 0.01543 DVDD(S) 0.098 2.932 2.726 2.614 0.25045 DVDD 0.102 0.183 0.143 0.146 0.01447 DVDD 0.105 0.18 0.144 0.150 0.022

Page 8: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

Some Observations…• We have tested ~125 Century

cables.• Of these, ~ 10 cables have some

type of defect- shorts between lines, discontinuity, or high resistance. Shorts are the most common of these.

Page 9: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

• END OF REPORT

Page 10: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

• EXTRA SLIDES

Page 11: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

Digital Jumper Cable Readout Setup:

Page 12: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

3) High Voltage Standoff Test: • The purpose of this test is to check

whether there is any short or current leakage (Arcing) between HV (High Voltage) Cu trace and other adjacent Cu traces.

• For this testing here at LaTech we developed our own High Voltage Testing Jig and it is working fine.

• This High Voltage Testing Jig allows us to test 10 cables at a time for overnight.

Page 13: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

Test procedure: • Continuity: two multimeter probes

are connected to both ends of the line in a given cable, if the line is good, there will be “beep” from multimeter.

• Short circuit tests: each line is tested against its nearest neighbor.

Page 14: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

High Voltage Test Schematic

Page 15: DJC Testing at LaTech: Update

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

Complete Test Setup: