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Department of Electronics Advanced Information Storage 12 Atsufumi Hirohata 17:00 11/November/2013 Monday (AEW 105)

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Advanced Information Storage 12. Atsufumi Hirohata. Department of Electronics. 17:00 11/November/2013 Monday (AEW 105). Quick Review over the Last Lecture. Flash memory :. NAND-flash writing operation :. NOR-type. 1 byte high-speed read-out. Low writing speed. Difficult to integrate. - PowerPoint PPT Presentation

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Page 1: Department of Electronics

Department of Electronics

Advanced Information Storage12

Atsufumi Hirohata

17:00 11/November/2013 Monday (AEW 105)

Page 2: Department of Electronics

Quick Review over the Last Lecture

Flash memory :NOR-type

1 byte high-speed read-out×Low writing speed×Difficult to integrate

NAND-type

High writing speed Ideal for integration

×No 1 byte high-speed read-out

×Flash erase for a unit block ( 1 ~ 10 kbyte ) only !

* http://www.tdk.co.jp/techmag/knowledge/200705/index2.htm

NAND-flash writing operation :

NAND-flash erasing operation :

Page 3: Department of Electronics

12 Dynamic Random Access Memory

•Memory cell• Architecture• Data storage• Read-out• Refresh

• Further integration

Page 4: Department of Electronics

Flash Memory vs DRAMComparisons between flash memory and DRAM :

* http://pc.nikkeibp.co.jp/article/NPC/20061228/257976/

Flash memory

TransistorCondenser

Transistor

Tunnel barrier Floating gate

On OnElectrons are stored at the floating gate.

Electron charges are stored in the

condenser.

Leakage from the condenser.

Electrons cannot tunnel through the barriers.

Prin

cipl

esW

ritin

g op

erat

ion

Dat

a vo

latil

ity

Page 5: Department of Electronics

Storage and Working MemoriesCurrent major memories for storage and work :

* http://techon.nikkeibp.co.jp/article/HONSHI/20070926/139715/

Page 6: Department of Electronics

Dynamic Random Access Memory (DRAM)In a computer, data is transferred from a HDD to a Dynamic Random Access Memory :

* http://www.wikipedia.org/

Data stored in a capacitor. Electric charge needs to be refreshed. DRAM requires large power consumption.

Page 7: Department of Electronics

DRAM PackagesDRAM design :

* http://www.wikipedia.org/

DRAM packages : • Dual in-line package (DIP)• Single in-line pin package (SIPP)• Single in-line memory module (SIMM) 30-pin• SIMM 72-pin• Dual in-line memory module (DIMM) 168-pin• Double data rate (DDR) DIMM 184-pin

Page 8: Department of Electronics

Memory Cell DevelopmentDRAM memory cells :

* http://www.intechopen.com/books/advances-in-solid-state-circuit-technologies/dimension-increase-in-metal-oxide-semiconductor-memories-and-transistors

Page 9: Department of Electronics

Memory Storage1 DRAM cell consists of 1 capacitor + 1 switching FET (1C1T) :

* http://www.wikipedia.org/

Capacitor

Floatingcapacitor

1 V

2 V

0 V

OFF

“1”-state :

1 V

0 V

0 V

OFF

“0”-state :

Page 10: Department of Electronics

Memory Read-OutRead-out operation of 1C1T :

* http://www.wikipedia.org/;

1 V + ΔV = 2 V

2 V = 1 V + ΔV

3.6 V

ON

“1”-data :

1 V – ΔV = 0 V

0 V = 1 V – ΔV

3.6 V

ON

“0”-data :

** http://www.ritsumei.ac.jp/se/re/fujinolab/IntroLSI/IntroLSI-11.pdf

Word line (3.6 V)

Datarewrite

Page 11: Department of Electronics

Memory RefreshRefresh operation of 1C1T :

* http://users.cis.fiu.edu/~prabakar/cda4101/Common/notes/lecture09.html

Page 12: Department of Electronics

DRAM ArchitectureDRAM architecture ::

* http://www.wikipedia.org/

Page 13: Department of Electronics

Data Access SpeedAddressing a cell :

* http://www.elsena.co.jp/elspear/specialist_column/ddr-sdram.html

• Raw address strobe (RAS)• Column address strobe (CAS)

Access time60 ~ 80 ns

Cycle time40 ~ 50 ns

Access time50 ~ 70 ns

Cycle time20 ~ 30 ns

Raw 1 Col. 1 Col. 2 Col. 3

Data1 Data2 Data3

Raw 1 Col. 1 Col. 2 Col. 3

Data1 Data2 Data3

Col. 4

• Page mode enables to address different columns in the same raw. → Fast page mode

→ Extended data out (EDO) → Synchronous DRAM PC-100 : 100 MHz cycles

Page 14: Department of Electronics

Synchronous DRAM (SDRAM)SDRAM access diagram :

* http://www.dewassoc.com/performance/memory/memory_speeds.htm

Page 15: Department of Electronics

DRAM TrendsDRAM follows Moore’s law (160 % / yr.) :

* http://www.intechopen.com/books/advances-in-solid-state-circuit-technologies/dimension-increase-in-metal-oxide-semiconductor-memories-and-transistors

Page 16: Department of Electronics

DRAM Design DevelopmentsStorage node shapes :

* http://www.intechopen.com/books/advances-in-solid-state-circuit-technologies/dimension-increase-in-metal-oxide-semiconductor-memories-and-transistors

Page 17: Department of Electronics

Fin-Type DRAM DesignsVarious manufacturers developed different designs :

* http://eetimes.jp/ee/articles/1306/14/news072.html

Page 18: Department of Electronics

Cells, Pages and BlocksTypical 10Gbit DRAM with high-k materials :

* http://www.intechopen.com/books/advances-in-solid-state-circuit-technologies/dimension-increase-in-metal-oxide-semiconductor-memories-and-transistors

Page 19: Department of Electronics

For Higher Recording Density ...Conventional DRAM cell :

* http://www.wikipedia.org/

Next-generation DRAM cell :

Word line

Bit line

Capacitor1-cell size

Word line

Bit line

Capacitor1-cell size

Word line

Bit line

Capacitor

Source

DrainChannelInsulator for gating

Page 20: Department of Electronics

DRAM MarketMarket dominated by 3 major manufacturers :

* http://www.computerworld.com/s/article/9242145/After_Hynix_plant_fire_spot_market_DRAM_prices_jump_20_

Page 21: Department of Electronics

Super Pillar Transistor (SPT)Universal transistor architecture for various memories :

* http://www.intechopen.com/books/advances-in-solid-state-circuit-technologies/dimension-increase-in-metal-oxide-semiconductor-memories-and-transistors

Page 22: Department of Electronics

Memory Types

* http://www.semiconductorjapan.net/serial/lesson/12.html

Rewritable

Read only

Read majority(Writable)

Volatile

Non-volatile

Non-volatile

Non-volatile

Dynamic

Static

Static

Static

Static

DRAM

SRAM

MRAM

FeRAM

PRAM

PROM

Mask ROM

Flash

EPROM

Page 23: Department of Electronics

Major Memories

* http://techon.nikkeibp.co.jp/article/HONSHI/20070926/139715/