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ww
wso
larz
entru
m-s
tuttg
artc
om DaySy Daylight Luminescence for PV Systems How to Check 400kWpeak Per Day With Electroluminescence Liviu Stoicescua Michael Reutera Juumlrgen H Wernerab
1 a Solarzentrum Stuttgart Stuttgart Germany b Institut fuumlr Photovoltaik Universitaumlt Stuttgart Germany
Solarzentrum Stuttgart
Research and development in photovoltaics and industrialization thereof
ww
wso
larz
entru
m-s
tuttg
artc
om
In close cooperation with Institute for Photovoltaics University of Stuttgart Productsdevelopments
Novel surface texture for crystalline silicon PV module optimization
White colored cell interconnector +1rel efficiency Lifetime calibrated photoluminescence imaging system
Full QSSPC integration Very high irradiation homogeneity on 20x20cmsup2
2
Daylight luminescence analysis
Institute for Photovoltaics Uni Stuttgart w
ww
sola
rzen
trum
-stu
ttgar
tcom
Solar cell research Laser doped selective emitter Innovative solar cell concepts Fully laser processed IBC solar cells asymp 22
PV system research
PV system analysis and monitoring since 2004 Stuttgart Cyprus Egypt
Characterization
3
Lifetime calibrated photoluminescence systems Daylight luminescence system DaySy
wwwipvuni-stuttgartde
Why Electroluminescence
Defects are not always obvious
ww
wso
larz
entru
m-s
tuttg
artc
om
4
uttg
artc
omw
ww
sola
rzen
trum
-st
5
Extreme hail in Germany 2013 About 13 of modules in this PV plant with obvious glass failure All others seemed undamaged
BUT Dark room EL analysis proves 95 out of 96 modules with hail damage
Module Failure Modes Microcracks broken cells
Delamination finger interruptions Browning
ww
wso
larz
entru
m-s
tuttg
artc
om
6
Hot spots Potential induced degradation (PID)
Optical Characterization Methods UV - Fluorescence Thermography Luminescence
ww
wso
larz
entru
m-s
tuttg
artc
om
Koumlntges et al 27th EUPVSEC 2012
7
UV - Fluorescence Thermography Luminescence Pro Cracks visible Power loss All defects
Cost effective Cost effective Identification
Con Night Irradiance Night Generator
Well aged cracks Identification Expensive
What we do about it
Hot spot How hot Remove replace or just observehellip
EL cell damage How severe How to judge
ww
wso
larz
entru
m-s
tuttg
artc
om
8Koumlntges et al 25th EUPVSEC 2010
Novel Method DaySy w
ww
sola
rzen
trum
-stu
ttgar
tcom
Electro (EL)- and photoluminescence (PL) characterization In full daylight Independent of surrounding light On mounted modules and full strings Using either the PV-plant or a DC source as power supply
9
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Solarzentrum Stuttgart
Research and development in photovoltaics and industrialization thereof
ww
wso
larz
entru
m-s
tuttg
artc
om
In close cooperation with Institute for Photovoltaics University of Stuttgart Productsdevelopments
Novel surface texture for crystalline silicon PV module optimization
White colored cell interconnector +1rel efficiency Lifetime calibrated photoluminescence imaging system
Full QSSPC integration Very high irradiation homogeneity on 20x20cmsup2
2
Daylight luminescence analysis
Institute for Photovoltaics Uni Stuttgart w
ww
sola
rzen
trum
-stu
ttgar
tcom
Solar cell research Laser doped selective emitter Innovative solar cell concepts Fully laser processed IBC solar cells asymp 22
PV system research
PV system analysis and monitoring since 2004 Stuttgart Cyprus Egypt
Characterization
3
Lifetime calibrated photoluminescence systems Daylight luminescence system DaySy
wwwipvuni-stuttgartde
Why Electroluminescence
Defects are not always obvious
ww
wso
larz
entru
m-s
tuttg
artc
om
4
uttg
artc
omw
ww
sola
rzen
trum
-st
5
Extreme hail in Germany 2013 About 13 of modules in this PV plant with obvious glass failure All others seemed undamaged
BUT Dark room EL analysis proves 95 out of 96 modules with hail damage
Module Failure Modes Microcracks broken cells
Delamination finger interruptions Browning
ww
wso
larz
entru
m-s
tuttg
artc
om
6
Hot spots Potential induced degradation (PID)
Optical Characterization Methods UV - Fluorescence Thermography Luminescence
ww
wso
larz
entru
m-s
tuttg
artc
om
Koumlntges et al 27th EUPVSEC 2012
7
UV - Fluorescence Thermography Luminescence Pro Cracks visible Power loss All defects
Cost effective Cost effective Identification
Con Night Irradiance Night Generator
Well aged cracks Identification Expensive
What we do about it
Hot spot How hot Remove replace or just observehellip
EL cell damage How severe How to judge
ww
wso
larz
entru
m-s
tuttg
artc
om
8Koumlntges et al 25th EUPVSEC 2010
Novel Method DaySy w
ww
sola
rzen
trum
-stu
ttgar
tcom
Electro (EL)- and photoluminescence (PL) characterization In full daylight Independent of surrounding light On mounted modules and full strings Using either the PV-plant or a DC source as power supply
9
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Institute for Photovoltaics Uni Stuttgart w
ww
sola
rzen
trum
-stu
ttgar
tcom
Solar cell research Laser doped selective emitter Innovative solar cell concepts Fully laser processed IBC solar cells asymp 22
PV system research
PV system analysis and monitoring since 2004 Stuttgart Cyprus Egypt
Characterization
3
Lifetime calibrated photoluminescence systems Daylight luminescence system DaySy
wwwipvuni-stuttgartde
Why Electroluminescence
Defects are not always obvious
ww
wso
larz
entru
m-s
tuttg
artc
om
4
uttg
artc
omw
ww
sola
rzen
trum
-st
5
Extreme hail in Germany 2013 About 13 of modules in this PV plant with obvious glass failure All others seemed undamaged
BUT Dark room EL analysis proves 95 out of 96 modules with hail damage
Module Failure Modes Microcracks broken cells
Delamination finger interruptions Browning
ww
wso
larz
entru
m-s
tuttg
artc
om
6
Hot spots Potential induced degradation (PID)
Optical Characterization Methods UV - Fluorescence Thermography Luminescence
ww
wso
larz
entru
m-s
tuttg
artc
om
Koumlntges et al 27th EUPVSEC 2012
7
UV - Fluorescence Thermography Luminescence Pro Cracks visible Power loss All defects
Cost effective Cost effective Identification
Con Night Irradiance Night Generator
Well aged cracks Identification Expensive
What we do about it
Hot spot How hot Remove replace or just observehellip
EL cell damage How severe How to judge
ww
wso
larz
entru
m-s
tuttg
artc
om
8Koumlntges et al 25th EUPVSEC 2010
Novel Method DaySy w
ww
sola
rzen
trum
-stu
ttgar
tcom
Electro (EL)- and photoluminescence (PL) characterization In full daylight Independent of surrounding light On mounted modules and full strings Using either the PV-plant or a DC source as power supply
9
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Why Electroluminescence
Defects are not always obvious
ww
wso
larz
entru
m-s
tuttg
artc
om
4
uttg
artc
omw
ww
sola
rzen
trum
-st
5
Extreme hail in Germany 2013 About 13 of modules in this PV plant with obvious glass failure All others seemed undamaged
BUT Dark room EL analysis proves 95 out of 96 modules with hail damage
Module Failure Modes Microcracks broken cells
Delamination finger interruptions Browning
ww
wso
larz
entru
m-s
tuttg
artc
om
6
Hot spots Potential induced degradation (PID)
Optical Characterization Methods UV - Fluorescence Thermography Luminescence
ww
wso
larz
entru
m-s
tuttg
artc
om
Koumlntges et al 27th EUPVSEC 2012
7
UV - Fluorescence Thermography Luminescence Pro Cracks visible Power loss All defects
Cost effective Cost effective Identification
Con Night Irradiance Night Generator
Well aged cracks Identification Expensive
What we do about it
Hot spot How hot Remove replace or just observehellip
EL cell damage How severe How to judge
ww
wso
larz
entru
m-s
tuttg
artc
om
8Koumlntges et al 25th EUPVSEC 2010
Novel Method DaySy w
ww
sola
rzen
trum
-stu
ttgar
tcom
Electro (EL)- and photoluminescence (PL) characterization In full daylight Independent of surrounding light On mounted modules and full strings Using either the PV-plant or a DC source as power supply
9
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
uttg
artc
omw
ww
sola
rzen
trum
-st
5
Extreme hail in Germany 2013 About 13 of modules in this PV plant with obvious glass failure All others seemed undamaged
BUT Dark room EL analysis proves 95 out of 96 modules with hail damage
Module Failure Modes Microcracks broken cells
Delamination finger interruptions Browning
ww
wso
larz
entru
m-s
tuttg
artc
om
6
Hot spots Potential induced degradation (PID)
Optical Characterization Methods UV - Fluorescence Thermography Luminescence
ww
wso
larz
entru
m-s
tuttg
artc
om
Koumlntges et al 27th EUPVSEC 2012
7
UV - Fluorescence Thermography Luminescence Pro Cracks visible Power loss All defects
Cost effective Cost effective Identification
Con Night Irradiance Night Generator
Well aged cracks Identification Expensive
What we do about it
Hot spot How hot Remove replace or just observehellip
EL cell damage How severe How to judge
ww
wso
larz
entru
m-s
tuttg
artc
om
8Koumlntges et al 25th EUPVSEC 2010
Novel Method DaySy w
ww
sola
rzen
trum
-stu
ttgar
tcom
Electro (EL)- and photoluminescence (PL) characterization In full daylight Independent of surrounding light On mounted modules and full strings Using either the PV-plant or a DC source as power supply
9
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Module Failure Modes Microcracks broken cells
Delamination finger interruptions Browning
ww
wso
larz
entru
m-s
tuttg
artc
om
6
Hot spots Potential induced degradation (PID)
Optical Characterization Methods UV - Fluorescence Thermography Luminescence
ww
wso
larz
entru
m-s
tuttg
artc
om
Koumlntges et al 27th EUPVSEC 2012
7
UV - Fluorescence Thermography Luminescence Pro Cracks visible Power loss All defects
Cost effective Cost effective Identification
Con Night Irradiance Night Generator
Well aged cracks Identification Expensive
What we do about it
Hot spot How hot Remove replace or just observehellip
EL cell damage How severe How to judge
ww
wso
larz
entru
m-s
tuttg
artc
om
8Koumlntges et al 25th EUPVSEC 2010
Novel Method DaySy w
ww
sola
rzen
trum
-stu
ttgar
tcom
Electro (EL)- and photoluminescence (PL) characterization In full daylight Independent of surrounding light On mounted modules and full strings Using either the PV-plant or a DC source as power supply
9
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Optical Characterization Methods UV - Fluorescence Thermography Luminescence
ww
wso
larz
entru
m-s
tuttg
artc
om
Koumlntges et al 27th EUPVSEC 2012
7
UV - Fluorescence Thermography Luminescence Pro Cracks visible Power loss All defects
Cost effective Cost effective Identification
Con Night Irradiance Night Generator
Well aged cracks Identification Expensive
What we do about it
Hot spot How hot Remove replace or just observehellip
EL cell damage How severe How to judge
ww
wso
larz
entru
m-s
tuttg
artc
om
8Koumlntges et al 25th EUPVSEC 2010
Novel Method DaySy w
ww
sola
rzen
trum
-stu
ttgar
tcom
Electro (EL)- and photoluminescence (PL) characterization In full daylight Independent of surrounding light On mounted modules and full strings Using either the PV-plant or a DC source as power supply
9
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
What we do about it
Hot spot How hot Remove replace or just observehellip
EL cell damage How severe How to judge
ww
wso
larz
entru
m-s
tuttg
artc
om
8Koumlntges et al 25th EUPVSEC 2010
Novel Method DaySy w
ww
sola
rzen
trum
-stu
ttgar
tcom
Electro (EL)- and photoluminescence (PL) characterization In full daylight Independent of surrounding light On mounted modules and full strings Using either the PV-plant or a DC source as power supply
9
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Novel Method DaySy w
ww
sola
rzen
trum
-stu
ttgar
tcom
Electro (EL)- and photoluminescence (PL) characterization In full daylight Independent of surrounding light On mounted modules and full strings Using either the PV-plant or a DC source as power supply
9
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Measurement Procedure w
ww
sola
rzen
trum
-stu
ttgar
tcom
Connect Connect Position CaptureGenerator Measured Camera Image(s)Strings String
String Complete
Yes
No
10
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
8 MP Dark-Box EL
Service Availability Sunny Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
11
DaySy EL MPP Thermography
0 100 700 700 100 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
8 MP Dark-Box EL
Service Availability Cloudy Day Measure when YOU want 100 availability day and night
ww
wso
larz
entru
m-s
tuttg
artc
om
12
DaySy EL MPP Thermography
0 30 200 200 30 0
Thermography
DaySy ndash Self Powered EL
DaySy ndash EL with Power Generator
Night -EL Night -EL
Daytime Irradiance [Wmsup2]
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
ww
wso
larz
entru
m-s
tuttg
artc
om
Whole String Imaging
Potential induced degradation (PID) poor low light response damaged areas
13
groups of broken fingers Very high throughput possible
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Detection Limit w
ww
sola
rzen
trum
-stu
ttgar
tcom
4 modulesimage 1 moduleimage 14 moduleimage
potential induced degra- groups of broken micro-cracks dation (PID) fingers broken fingers
damaged areas
14
groups of broken fingers poor low light response
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
ww
wso
larz
entru
m-s
tuttg
artc
om
15
Throughput
Inverter Cluster
Imag
ed k
Wp
in a
8h
wor
kday
Scenario Field PV installation with clustered string inverters 250Wp modules 20 modulesstring Unpacking amp Setup 30 minutes Wrap up 15 minutes operator Location of PV strings is unknown and has to be discovered 10 min string operator 1 minute for a EL image 2 minutes for a EL+PL image
2 Operators
1 Operator
Micro-Cracks
Cracks
Single Fingers
Potential Induced Degradation (PID)
Broken Cells
Finger Clusters
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
uttg
artc
omw
ww
sola
rzen
trum
-st
16
Photoluminescence on module level
EL PL Example Ohmic ++ -- Broken fingers
RP -- ++ PID low light
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Defective Modules Broken Cells w
ww
sola
rzen
trum
-stu
ttgar
tcom
Badly damaged module - Dead areas Black EL amp black PL - High series resistance Dark EL amp regular PL - Low parallel resistance Dark EL
17
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Defective Modules PID w
ww
sola
rzen
trum
-stu
ttgar
tcom
Potential Induced Degradation (PID) Chessboard pattern with darker EL and black PL due to low parallel resistance
18
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
Degraded Low-Light-Response w
ww
sola
rzen
trum
-stu
ttgar
tcom
Degraded low light response Low parallel resistance reduces the open circuit voltage at low light intensities
Dark cells appear in low light PL image (right)
19
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
ww
wut
tgar
tcom
sol
arze
ntru
m-s
t
20
Automated Image Analysis
PL image EL image Loss image
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
a-Si CIGS
CdTe coming soonhellip
ww
wso
larz
entru
m-s
tuttg
artc
om
21
Thin film module
30 cm
Thanks for your attention
CIGS module
