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Anand JainSenior Software Engineer

NI TestStand | ATML

Continued Investment in ATML

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The NI Investment in ATML

2004 2005 2006 2007 2008 2009 2010

Initial Support of Test Results for NI

TestStand

Full Support of Test Results for NI

TestStand

Test Results DataPlugin for NI

DIAdem

Initial Support of Test Description in

NI TestStand

NI Releases TestStand ATML

Toolkit 1.0

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NI TestStand ATML Toolkit 1.0 - 2009

• Major features Improve SIMICA Test Results support

• Standard Version 2.02 Add ATML Test Description support

• Standard Version 1.01

• Released Sept 2009

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SIMICA Test Results using NI TestStand

NI TestStand Development Environment

NI TestStand TPS

SIMICATest

ResultsFile

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SIMICA Test Results Support

• Adds ATML TD elements to the report• Complies to latest approved standard version• Updates TestStand 4.1.1 and later

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ATML Test Description Support• Translates ATML TD to TestStand sequence files and

VI or C code modules Generates shell code modules Capability to modify shell code generation

• TestStand Sequence Editor and custom User Interface integration File » Open starts translation Tools menu configuration settings

• TestStand 4.1.1 and later

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Additional Feature

• Incremental updates Apply changes from an ATML TD file to previously-

translated sequence file Works with TestStand 4.2 and later Phase 1 of 2

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ATMLTest

DescriptionDocument

ATML TD

Translator

NI TestStand Development Environment

NI TestStandSequence

LabVIEW orLabWindows/CVI

Code Modules

ATML TD Translation using the NI ATML Toolkit

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NI TestStand ATML Toolkit 2011

• Major Features Improve SIMICA Test Results support Improve ATML Test Description support

• Schedule Beta Q4 2010 Release Q2 2011

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DIAdem DataFinder ATML Plug-in

• DataFinder indexes SIMICA Test Results files Index database can be queried

• Built-in common trending routines Histogram, Pareto, Capability, Yield, etc.

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Trending Analysis using DIAdem and Test Results

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Benefits of Using ATML• IEEE Standard• Test Results

Exchange/storage format Transformable to other related standards

• IEEE 1545• STDF

• Test Description Exchange/storage format for storing test

requirements and IP

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Issues Encountered• Lack of an ATML users guide• Lack of toolsets required to create an ATML test

system Editors for ATML instance documents

• “Trial-Use” IEEE standards• Costs associated with IEEE standards

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Learn More Today

Derrick SnyderProduct Manager

derrick.snyder@ni.com

Anand JainSenior Software Engineer

anand.jain@ni.com• ni.com/teststand• ni.com/diadem