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Change Detection in Precision Manufacturing Processes under Transient Conditions Fourth Texas Educators Conference on Machining Zimo (Robin) Wang, Satish T.S. Bukkapatnam School of Industrial Engineering and Management, Oklahoma State University

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Change Detection in Precision Manufacturing Processes under Transient Conditions

Zimo Wang Ph.D. candidate [email protected]

Fourth Texas Educators Conference on Machining

Zimo (Robin) Wang, Satish T.S. Bukkapatnam

School of Industrial Engineering and Management, Oklahoma State University

Outline

• Introduction of change detection in precision manufacturing

processes

• Change detection in UPM & CMP

• DPGSM-based detection in sensor-based monitoring system

during precision manufacturing

• Conclusions

4/1/2014 2

Introduction

Aspheric IR optics

1960 1970 1980 1990 2000 2010

Off-axis Mirrors Freeform surfaces

Triangular microprisms

Ultra-precision machining are those

technologies by which the

highest possible dimensional accuracy is,

or has been achieved (Taniguchi, 1983 )

• Ultra-Precision Machining (UPM)

4/1/2014 3

Introduction

• Challenges for UPM quality assurance – Limited metrology and methodology for quality control (Dornfeld, 2006)

– Sensor-based in-process monitoring system of process monitoring and

quality control (Abellan-Nebot, 2010)

4/1/2014 5

Demand • Suitable sensor based monitoring system

for precision machining processes

• Effective incipient change detection

analyzing weak signal of UPM compared

with conventional machining processes

Surface defects in ultra-precision machining

• System vibrations

– Chatter: tool, toolholder and spindle together vibrate at some natural

frequency

– Scratches on the surface, ruining the geometric acquirement of product

4/1/2014 6

One important effect that is not considered in the model above is built up edge. Under most cutting

conditions, some of the cut material will attach to the cutting point. This tends to cause the cut to be

deeper than the tip of the cutting tool and degrades surface finish. Also, periodically the built up

edge will break off and remove some of the cutting tool. Thus, tool life is reduced. In general, built

up edge can be reduced by:Increasing cutting speed

Decreasing feed rate

Increasing ambient workpiece temperature

Increasing rake angle

Reducing friction (by applying cutting fluid)

Rippled surface finish

Most common surface defects (e.g. surface scratches and variations) are

due to abnormal vibration (e.g. chatters) and built-up edge (BUE)

Scratch

Surface defects in ultra-precision machining

• Built-up edge (BUE)

– Causing deeper depth of cut and degrading surface finish

– In UPM, surface sometimes rubs against built-up edge, leading to

surface quality deterioration

4/1/2014 7

BUE

Mean Ra

Region 1 51nm

Region 2 49nm

Region 3 40nm

Scratch

Deteriorated surface due to BUE

CMP experiment setup

4/1/2014 8

1000 2000 3000 4000 5000 6000-40

-30

-20

-10

0

10

20

Tim

e I

nd

ex

Amplitude

XBee wireless sensor

Buehler CMP machine

Vibration signal

Wafer with nanometric roughness

UPM experiment setup

• Sensor setup

– Vibration sensor (3-axis)

– Force sensor (3-axis)

– Acoustic emission (AE) sensor

4/1/2014 9

Scratch

Surface variation

2000 4000 6000 80001000012000140001600018000-40

-20

0

20

Application in ultra precision machining

• UPM experiment

– Depth of cut (5, 10, 20, 25 μm)

– RPM (500, 1000, 2000 rev/min)

– Feed rate (1.5, 3, 6 mm/min)

4/1/2014 10

2000 4000 6000 8000 10000-6

-4

-2

0

2

4

6

Am

plit

ud

e

Time Index

Sample 18 Sample 30

1000 rev/min 2000 rev/min

1000-2000

ARL1 of CUSUM 160

ARL1 of EWMA 5000

SPC methods are reticent to

intermittent pattern changes in

UPM

DPGSM-based change detection in UPM

4/1/2014 11

UP

M &

CM

P

Exp

erim

ents

Surface scratches

Finish roughness

variations

In-process surface

deterioration 1 2 3 4 5

x 104

-40

-20

0

20

40500 1000 1500 2000 2500 3000 3500 4000 4500

-1

0

1

500 1000 1500 2000 2500 3000 3500 4000 45005

10

15

500 1000 1500 2000 2500 3000 3500 4000 45002

4

6

500 1000 1500 2000 2500 3000 3500 4000 4500

-0.5

0

0.5

Data acquisition Feature extraction

Non-linear time series analysis

DPGSM-based change detection

DP-based Gaussian mixture

Transient behavior quantification

Weighted multivariate process control

Decision for quality improvement

Change detection

Limitations of traditional detection methods

• Traditional statistical change detection involves testing a

hypothesis

– Ho: θ = θo against Ho: θ ≠ θo

– On parameters θ of the distribution or a representation of a stochastic

process, such as x(t+1)=f(x(t), θ)

• For most detection methods, a stable operation implies

stationarity, i.e., θ is time-invariant

• However, most real-world processes are highly

nonstationary, i.e., θ varies over time

4/1/2014 12

From a statistical standpoint, change detection

process involves testing a hypothesis, H0: θ =

θ0 against H1: θ ≠ θ0 on the parameters θ of the

distribution or some other quantifiers of the

underlying state vector x.

Limitations of traditional detection methods

• Autocorrelation structure change

– Shifting trends (first order) (De Oca, 2010)

– Volatility (second order) (Killick, 2013)

– Eigenstructure of state space model (Basseville, 1987)

• Frequency and spectrum analysis

– Spectral-based change detection (Choi et al., 2008)

– Wavelet based control chart (Guo, 2012)

4/1/2014 13

Few methods reported for change detection in transient

processes because of the difficulty to capture the complex

nonstationary behaviors

Dynamic intermittency

4/1/2014 14

Phase space for area-preserving map of intermittent signal

(Artuso, et al. 2003)

Intermittency is a common nonstationary (transient) behavior,

consisting of intervals of regularity interrupted at random by bursts as

the trajectory is re-injected into the chaotic part of the phase space.

2 4 6 8 10 12

x 104

-10

-5

0

5

Time Index

Am

plit

ud

e

Window 1 Window 2

State space reconstructed intermittent signal

𝜋11(1) ⋯ 𝜋15

(1) . . . 0⋮ ⋱ ⋮𝜋51(1)

⋮0

⋯𝜋55(1) … 0⋱ ⋮

0 … 0

Dirichlet Process-based Gaussian State Machines (DPGSM)

4/1/2014 16

2 4 6 8 10 12

x 104

-10

-5

0

5

Am

plit

ud

e

Time Index

Window 1 Window 2

-5 0 5

-5

0

5

Y-A

XIS

X-AXIS

-5 0 5

-5

0

5

Y-A

XIS

X-AXIS

0.48 0.05 0.06 0.08 0.05 0.17 0.10 0.01

0.08 0.78 0.00 0.00 0.00 0.02 0.00 0.11

0.04 0.18 0.74 0.00 0.04 0.00 0.00 0.00

0.07 0.00 0.00 0.81 0.00 0.03 0.09 0.00

0.03 0.00 0.43 0.00 0.51 0.00 0.02 0.00

0.22 0.00 0.00 0.16 0.00 0.51 0.11 0.00

0.17 0.00 0.04 0.00 0.30 0.03 0.47 0.00

0.08 0.06 0.00 0.01 0.00 0.30 0.00 0.55

0.12 0.07 0.02 0.04 0.17 0.21 0.36 0.01

0.01 0.53 0.00 0.00 0.00 0.01 0.00 0.45

0.02 0.31 0.63 0.00 0.04 0.00 0.00 0.00

0.18 0.00 0.00 0.06 0.01 0.20 0.56 0.00

0.01 0.00 0.36 0.00 0.62 0.00 0.01 0.00

0.18 0.00 0.00 0.07 0.01 0.48 0.26 0.00

0.07 0.00 0.01 0.00 0.48 0.01 0.43 0.00

0.04 0.02 0.00 0.00 0.00 0.25 0.00 0.69

Reconstructed state space

trajectories

Show overall representation (show an

animation with a nonstionary (asceinding-

desceinding notes?) time series on left and the

state space on right, next fill the state space

with gaussian clusters and the transitions.

Next, show the time series evolving into a

different characterisitc. Now show the new

state space and fill with Gaussians and their

transitions.

Say that we can detect this change in transient

regime.

Dirichlet process based transition

matrix generation

Change detection using

multivariate control chart setup

𝑑𝑗2 = (𝝅′j − μ)′𝜮-1 (𝝅′j − μ)

0.5 0.1 0.1 0.1 0.1 0 0 0

0.1 0.8 0.0 0.0 0.0 0 0 0

0.0 0.2 0.7 0.0 0.0 0 0 0

0.1 0.0 0.0 0.8 0.0 0 0 0

0.0 0.0 0.4 0.0 0.5 0 0 0

0 0 0 0 0 0 0 0

0 0 0 0 0 0 0 0

0 0 0 0 0 0 0 0

𝜋11 ⋯ 𝜋1𝐾

⋮⋱⋮

𝜋𝐾1 … 𝜋𝐾𝐾

𝜋11 ⋯ 𝜋1𝐾

⋮⋱⋮

𝜋𝐾1 … 𝜋𝐾𝐾

𝜋11(2) ⋯ 𝜋15

(2) . . . 𝜋18(2)

⋮ ⋱ ⋮𝜋51(2)

⋮𝜋81(2)

⋯𝜋55(2) … 𝜋58

(2)

⋱ ⋮𝜋85(2) … 𝜋88

(2)

Transition matrix 1

Transition matrix 2

Dirichlet process-based Gaussian mixture

• Chinese restaurant process

4/1/2014 17

• 𝑥𝑖 -data points • 𝜃𝑖- distribution parameter drawn from

unknown distribution G

Cluster 1 Cluster 2

- Tables represent infinite clusters

- Customer i represents data 𝑥𝑖

𝑃 𝑐𝑖 = 𝑘 ≤ 𝐶|𝑐−𝑖 =𝑛𝑘

𝑛−1+𝜗 if data belongs to existing cluster

𝑃 𝑐𝑖 = 𝐶 + 1|𝑐−𝑖 =𝜗

𝑛−1+𝜗 if data belongs to new cluster

𝜗

𝜗 + 𝑛 − 1

𝑛𝑘𝜗 + 𝑛 − 1

0 50 100 150 200 250 300-15

-10

-5

0

5

10

15

Am

plit

ud

e

Time Index

-15

-10

-5

0

5

10

15

0

0.02

0.04

0.06

0.08

0.1

0.12

0.14

Time series Clusters & pdf

xi~F (•|θci)

θci|θ−ci~ 𝛿θci+ 𝜗𝐺0𝑖−1𝜏=1

𝑛 − 1 + 𝜗

DPGSM change detection

4/1/2014 18

0 1000 2000 3000 4000-15

-10

-5

0

5

10

15

Am

plit

ud

e

Time Index

Simulated Data

Normal condition Out of control

(t0=1000)

𝜋11(𝑖) ⋯ 𝜋1𝐾

(𝑖)

⋮⋱

⋮𝜋𝐾1(𝑖) … 𝜋𝐾𝐾

(𝑖)

П(i) ={πjk (i) }=

(T=4000)

, t0≤i ≤ T

Track the process change in

terms of distribution of

transition matrix

DPGSM change detection

• Distribution of transition element

– Proposition 1: The Bayesian posterior distribution of the vector πj,

given the counts 𝒁𝑗 = 𝒛𝑗(𝑖)

(multinomial distributed), follows a

Dirichlet distribution

• Calculation of 𝒛𝑗(𝑖)

4/1/2014 19

𝒛𝑗(𝑡)= {𝑧𝑗1

𝑡, … 𝑧𝑗𝑘

𝑡, … , 𝑧𝑗𝐾

(𝑡)}

𝑃 𝑐𝑡 = 𝑘 𝑥𝑡, 𝜣 = 𝑏𝑓(𝑥𝑡|𝜃𝑘) where

𝑏𝑓(𝑥𝑡|𝜃𝑘)𝐾

𝑘=1= 1

, b is an appropriate normalized constant

which makes

𝑓 𝝅𝑗|𝒛𝑗(𝑖)

= 1

𝐵(𝒛𝑗(𝑖)) 𝜋𝑗𝑘

𝑧𝑗𝑘(𝑖)−1𝐾

𝑘=1 ; 𝐵 𝒛𝑗(𝑖)= Г(𝑧𝑗𝑘

𝑖)𝐾

𝑘=1

Г( 𝑧𝑗𝑘(𝑖)𝐾

𝑘=1 )

𝑧𝑗𝑘(𝑖)= 𝑃 𝑐𝑡 = 𝑗 𝑥𝑡, 𝜣 × 𝑃 𝑐𝑡+1 = 𝑘 𝑥𝑡+1, 𝜣 + 1

𝑖−1

𝑡=𝑖−𝐿+1

Multivariate control chart

• Confidential level

– In DPGSM change detection, we have K control charts (K as cluster

number)

– 𝛼𝑗 = 1 − 1 − 𝛼 𝑤𝑗

𝐾 is the significance level of row j, set by the family-

wise error rate (FWER), i.e. FWER= Pr(rejecting at least one Hj|

Hj ∈ Ho) = α, where Ho={H1, H2,… HK}

• Measurement in multivariate control chart

– 𝑑𝑗2 = (𝝅

𝑗− 𝝅𝑗0) 𝑺𝑗

−1(𝝅 𝑗− 𝝅𝑗0)

𝑇 ~ 𝜒2K distribution

4/1/2014 20

𝜋 𝑗𝑘 = 𝜋𝑗𝑘|𝒛𝑗(𝑖)=𝑧𝑗𝑘(𝑖)

𝑧𝑗𝑘(𝑖)𝐾

𝑘=1

0 1000 2000 3000 4000 5000 6000

-20

-15

-10

-5

0

5

10

15

20

Am

plit

ud

e

Time Index

Multivariate control chart

4/1/2014 21

Control Chart for transition row πj Simulated Data

Normal condition Out of control

1000 1500 2000 2500 3000 3500 4000 4500 5000 5500 60000

0.5

1

1000 1500 2000 2500 3000 3500 4000 4500 5000 5500 60000

0.5

1

x 10-6

1000 1500 2000 2500 3000 3500 4000 4500 5000 5500 60000

0.5

1

1000 1500 2000 2500 3000 3500 4000 4500 5000 5500 60000

0.5

1

1000 1500 2000 2500 3000 3500 4000 4500 5000 5500 60000

2

x 10-6

1000 1500 2000 2500 3000 3500 4000 4500 5000 5500 60000

0.5

1

1000 1500 2000 2500 3000 3500 4000 4500 5000 5500 60000

2

x 10-7

Step 1: Estimate transition matrix: 𝜋 𝑗𝑘|𝒛𝑗(𝑖)=

𝑧𝑗𝑘(𝑖)

𝑧𝑗𝑘(𝑖)𝐾

𝑘=1

Step 2: Calculate Hotelling statistics 𝑑𝑗2 for each row 𝑗

Step 3: Monitor the process and estimate 𝐴𝑅𝐿1 based on out-of-control points

The overall on-line change detection, after consistent estimation of 𝜣,

{𝑈𝐶𝐿𝑗} and 𝜶 based on a training set, may be summarized as follows:

Benchmark case

4/1/2014 22

ARMA(2,1) model at ∼ (N(0, δσ2a ))

0 2000 4000 6000 8000

-20

-15

-10

-5

0

5

10

15

20

Am

plit

ud

e

Time Index

Variance change

Window width change

Normal condition

Model:

where 𝑖𝑚 is the time index of each

breakpoint, 𝑚=1, 2,…,𝑀, 𝑖0 =1,

𝑖𝑀=N (N is the length of the time

series).

xi=

f(x−i;φ(1),ψ(1)) i0<i<i1

…f(x−i;φ

(𝑚),ψ(m)) im−1<i<im

…f(x−i;φ

(M),ψ(M)) i𝑀−1<i<iM

{𝑖0, 𝑖1,… 𝑖𝑚,…, 𝑖𝑀} as a sequence

of order statistics such that each im

follows a uniform distribution

UNIF(0, N).

Benchmark case

4/1/2014 23

0 1000 2000 3000 4000 5000 6000

-20

-15

-10

-5

0

5

10

15

20

Am

plit

ud

e

Time Index

EWMA SD-WCUSUM RNDP DPGSM

Fault A 25.6 2.2 6.1 3.5

Fault B Inf Inf Inf 3.8

Variance change Normal condition

Fault A: variance change Fault B: sojourn time change

0 1000 2000 3000 4000 5000 6000

-20

-15

-10

-5

0

5

10

15

20

Am

plit

ud

e

Time Index

Window width change

Normal condition

ARL1 comparisons (expected steps to reveal a change)

Detection for surface roughness variation

• Surface variation in three

regions

1. Small Ra (~100nm)

2. High Ra (~150nm)

3. High Ra (~ 150nm) with

larger variance

4/1/2014 24

2000 4000 6000 80001000012000140001600018000-40

-20

0

20

Expected delay of detection (ms)

Region 1 Region 2 Region 3

DPGSM achieves consistently low

ARL1 for detecting incipient

surface quality variation within

nano level

EWMA SD-

WCUSUM DPGSM

Region 1-2 10.4 1.5 0.5

Region 2-3 21.4 0.4 0.4

Region 2

Region 1

Region 3

Scratch

1 2 3

100

150

200R

a (

nm

)

Region

Surface Roughness Boxplot

Detection for surface scratch

• Surface scratch and vibration signal

4/1/2014 25

1 2 3 4 5

x 104

-40

-20

0

20

40

500 1000 1500 2000 2500 3000 3500 4000 4500

-1

0

1

500 1000 1500 2000 2500 3000 3500 4000 45005

10

15

500 1000 1500 2000 2500 3000 3500 4000 45002

4

6

500 1000 1500 2000 2500 3000 3500 4000 4500

-0.5

0

0.5

Mea

n

Var

iance

K

urt

osi

s S

kew

nes

s

Scratch

Region 1 Region 2

0 200 400 600 800 1000 12004

6

8

10

12

14

16

18

Time index

Ou

tpu

t

prediction

observation

Detection for surface scratch

4/1/2014 26

R2 = 0.7425

500 1000 1500 2000

6

8

10

12

14

Am

plit

ud

e

Time Index

Predicted feature

Expected delay of detection(ms) comparisons

EWMA SD-WCUSUM DPGSM

164 72 24

GP-DPGSM method discovers scratch appearance in 48 ms

ahead of EWMA and 140 ms earlier than SD-WCUSUM.

Change detection of surface deterioration

• Chemical Mechanical Planarization

(CMP) process experiment

– Lapped coppers (Ra 10nm~15nm)

were polished on Buehler in 3

minutes of each interval

– Platen speed 250 RPM, head speed

60 RPM and download force 4 lbs

4/1/2014 27

Buehler (model Automet® 250)

with 3-axis accelerometer

Change detection of surface deterioration

• Pad wear and surface deterioration

– After 3 minutes, the average Ra improved to around 15 nm

– Pad wear was then accelerated worn by soaking the pad in slurry,

followed by air drying

– After 12 minutes polishing, it was noticed that significant glazing of

polishing pad observed (Fig. 2) as well as the scratch on wafer were

observed and finish degrades to Ra~22nm

4/1/2014 28

After 3 min After 12 min Glazed areas on pad

Ra~9nm Ra~22nm

Scratch

Glazed area

Change detection of surface deterioration

4/1/2014 29

1000 2000 3000 4000 5000 6000-40

-30

-20

-10

0

10

20

Tim

e I

nd

ex

Amplitude

First run Pad wear

0 50 100 150 200 250 3000

1

2

3

4

5x 10

-3 X-vibrend Amplitude spectrum

Frequency(Hz)

|Y(f

)|

0 50 100 150 200 250 3000

1

2

3

4

5x 10

-3 X-vibrend Amplitude spectrum

Frequency(Hz)

|Y(f

)|

EWMA SD-WCUSUM DPGSM

2941 2262 34

Delay for detection (ms)

DPGSM discovers surface deterioration

with an order of magnitude (more than 2

sec) earlier than SPC methods tested

Change detection for music pattern changes

• Case 1

• Case 2

4/1/2014 30

Normal condition Key signature change

Normal condition: 1 1 1 2 2 2 Anomaly condition: 1 1 2 2 1 2

1

2

EWMA SD-WCUSUM DPGSM

Key signature change 90 5 2

Chord progression change in long

period articulation 83 175 15

E5 to D5

Comparison of delays for change detection (ms)

Change detection in Ragas

4/1/2014 32

General types of Raga music

Change detection 1: Sequence

change with ascending and

descending scales

Change detection 2: Scale

change with missing notes

Subtle changes in intermittent music signals, namely scores sequence

change and music scale change, are considered.

Change detection in Ragas

4/1/2014 33

Raga 3 Raga 2 Raga 4 Raga 1

EWMA SD-WCUSUM DPGSM

Ascending and

descending scale 24(False alarm) Inf 17

Descending scale with

missing note 1682 191 151

Ascending and descending scales Scale change with missing notes

Comparison of delays for change detection (ms)

Detection of incipient sleep apnea

• Sleep apnea detection using

ECG signal

4/1/2014 34

6000 12000

-0.5

0

0.5

1

1.5

2

Am

plit

ud

e

Time Index

EWMA SD-WCUSUM DPGSM

1765 12 11

Delay for detection (ms) of sleep apnea

Monitored ECG signal with

incipient sleep apnea

Normal breathing

Breath disorder

Conclusions

• We represent nonlinear nonstationary (intermittency) signal within

precision machining processes as a stochastic mixture of Gaussian

clusters with Markov transition matrix

• Intermittent changes in surface uniformity are efficiently identified by

DPGSM, and it could detect surface damage (scratch) almost an order

of magnitude earlier compared to existing change detection methods

(EWMA and SD-WCUSUM)

4/1/2014 35

Further studies

• Parameters selection

– Selection of window length 𝑳 is crucial to derive consistent estimates of

the transition matrix elements

– Selection of the concentration parameter 𝝑 of Dirichlet process to

ensure generation of proper Gaussian mixtures

• The transition process may be more closely approximated using a

semi-Markov formulation and the representation needs to be

modified to better capture the underlying dynamics

4/1/2014 36

Q & A

4/1/2014 37

Contact me: Zimo Wang Ph.D. candidate Industrial Engineering [email protected]