ASHWIN VIJAYSAI1102 S. Abel St., Milpitas, CA-95035 (806)
368-1881 [email protected]
OBJECTIVETo secure a challenging position where I can apply my
significant research and industrial experience with test and
characterization of electro-mechanical systems and semiconductor
devices.
SUMMARY
Microelectromechanical systems (MEMS) design, test and
characterization. Experience in developing automated test -
characterization setups using LabVIEW and NI hardware. Device and
product reliability test development. Experience with material
characterization and failure analysis tools. root cause analysis
Over 2 years of Class-100 clean room experience (Texas Tech
University and Fab-8, Malta, NY). Supervised and worked with a
group of 4 Doctoral, 13 Masters Students and 50 industrial
co-workers. Documentation of test procedures, test development and
technology transfer to parent fab.
EDUCATION
Ph.D. candidate in EE GPA: 3.83 Texas Tech University, Lubbock,
Texas 2008 - 2012
TeCHNICAL SKILLS
Test equipments: Agilent 4080 parametric tester, Texas
Instruments Very Low Cost Tester (VLCT); Keithley 2400
source-meter; Agilient power supply, oscilloscope, NI DAQ boards
PCI 6024E, USB 6259, USB 6281, USB 6009; NI PCI IMAQ-1407, NI
PCI-GPIB, CSZ environmental chambers. Other characterization tools:
probe stations; visual inspection optical microscope,
interferometric microscope, SEM, TEM, goniometer; chemical
inspection FTIR spectroscopy; scanning probe microscopy AFM, LFM,
adhesion force. Nanocoating process tool: Integrated surface
Technologies - RPX-550; Surface cleaning techniques- plasma asher
Harrick plasma #PDC-32G; UV/O cleaner Novascan #PSD-UV4. Numerical
computation software: MATLAB Control software for automated
testing: C, C++, LabVIEW. Statistical analysis: JMP
EXPERIENCE
Display Systems Engineer, Qualcomm Inc., Mirasol Division, San
Jose, CA (Sep13 - Present) System level reliability testing on
various electro-mechanical display products. Characterize
electro-mechanical systems and develop test programs. Development
of in-situ correction factors for sensor systems. Life time testing
and accelerated test method development. Data analysis and report
generation for quality and reliability tests. Defect and root cause
failure analysis. Process modifications and yield improvement.
Product Reliability Engineer, Globalfoundries Inc., Malta, NY
(Jan12 Sep13) Wafer level reliability testing on various test
devices fabricated by 32nm and 28nm technology. Performed high
temperature and high input signal reliability testing of
semiconductor devices. Test program development and debug for 32nm
and 28nm products. Agilent SPECS-FA, Framework and Algorithm
development. Test program automation and debug at wafer-die scale.
Effective team player and responsible for conducting root cause
analysis of failures by working on the Test floor. Handle tasks and
worked with senior staff in taking Corrective Action to solve
customer issues. Data analysis and automation of report
generation.
Research Assistant, Dept. of Electrical Engineering, Texas Tech
University (Aug 08 May12) Design, development and characterization
of micro electro-mechanical systems. Developed automated test
setups that can be used to test and characterize the
electro-mechanical systems. Develop recipes and idealize process
parameters for deposition of nanocoatings to MEMS devices.
Developed automated test and characterization setups for studying
reliability and accelerated lifetime testing of electro-static
actuators. Performed high and low temperature reliability testing,
high and low humidity reliability testing of nanocoated MEMS
devices. Developed a haptic controlled electro-mechanical sensor
system for manipulation of mico-parts. Integrated a capacitance
sensor system for measuring electro-mechanical system operation.
Designed several electro-static and electro-thermal MEMS devices.
Worked with Integrated Surface Technologies to develop nanocoating
recipes.
accomplishments/ MEMBERSHIPS
Participated in Qualcomm Innovation Conference- QTech14 2014
Executive committee member of IEEE Silicon Valley MEMS Chapter 2013
Globalfoundries appreciation award for outstanding dedication in
work 2013 Published four journal articles and six conference paper
2010 2012 Secured 1st place in Sandia National Laboratories UAP
MEMS design competition 2010 2012 Scholarship Texas Instruments
2010 2012 Graduate scholarship Teaching and research assistant
roles 2008 2010
REFERENCES
Dr. Richard Gale and Dr. Tim Dallas, Department of Electrical
and Computer Engineering, Texas Tech University, TX, USA. Dr.
Michelle Pantoya, Department of Mechanical Engineering, Texas Tech
University, TX, USA. Ravi Doraiswami, Linear Technology Corp.,
Milpitas, CA, USA
