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AD-A039 802 NORTH AMERICAN ROCKWELL CORP LOS ANGELES CALIF LOS AN—ETC F/8 18/« NUCLEAR EFFECTS ANALYSIS Dl-S-1800 AERIAL RADIAC SYSTEM AN/ADR ETC(U) DEC 72 DAAB07-72-C-0202
UNCLASSIFIED NA-72- 1101 NL |OF/
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MICROCOPY RESOLUTION TEST ChART
NATIONAL BUREAU 01 STANDARDS 1963-.4
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NA-72-1101
PRELIMINARY REPORT
NUCLEAR EFFECTS ANALYSIS
DI-S-1800
AERIAL RAD1AC SYSTEM
AN/ADR-G(XE-4)(V)
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DISTRIBUTION STATEMENT R
Approved ior public loleasm; Distribution Ur. limited
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SERIAL NO. "X.
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PRE LIMINA ItY REPORT,
£ NUCLEAR EFFECTS ANALYSIS
Dl-§-UiO()
AERIAL RAD IAC SYSTEM
AN ADR-6(XE-4)(V)j
Prepared by
NUCLEONICS GROUP
M 6U~ W.E. Arthur, Program Manager Aerial Radiac System Program
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FOREWORD
< This document was prepared under U.S. Army Contract DAAB07-72-C- 0202 to document the analysis of the effects of neutrons^ancTä pulsed Kamma-ray exposure on the Aerial Radiac System. This analysis, while preliminary, indicates that the system as designed is capable of opera- ting within specification after exposure to the nuclear environment of EL-CP5073-0002A.
INTRODUCTION
In addition to certain performance and environmental requirements, delineated in EL-CP5073-0001B, the Aerial Radiac System is required to perform after being exposed to the nuclear effects environment specified in EL-CP5073-0002A. The verification of these environments will be by test during the engineering development phase of the basic contract. Until these tests are conducted the design of the system to meet those requirements is by circuit analysis, parts selection, and component testing.
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TABLE OF CONTENTS
INTRODUCTION BASIC DESCRIPTION ANALYSIS GAMMA RAY DOSE RATE
Appendix 1 EMAX Buffer Circuit Neutron Fluence Analysis Appendix 2 Subtractor Circuit Neutron Fluence Analysis Appendix 3 Ground Dose Computer Circuit Neutron Fluence
Analysis Appendix 4 Self Test Device Driver Circuit Neutron
Fluence Analysis Appendix 5 Alarm Circuit Neutron Fluence Analysis Appendix 6 Self Test Comparator Circuit Neutron Fluence Analysis Appendix 7 Log Module Neutron Fluence Test Response Appendix 8 Subtractor Circuit Prompt Gamma Response Appendix 9 Testing of Aerial Radiac System to Prompt Gamma
Attachment 1 Parts List
References
Page
i 1 1 4
8 13 17
29
34 36 46 48 55
64
75
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BASIC DESCRIPTION
-V This preliminary report summarizes the analysis effort performed to date on the Aerial Radiac System (ARS) to assure proper ARS operation following exposure to nuclear radiation (Reference 12). To facilitate the analysis effort, the ARS has been subdivided into several subcircuits ("FTgHce—A). Each subcircuit will be analyzed and/or tested to assure proper performance following exposure to radiation at specification level.
The ARS is used to measure ground dose radiation level (Rads/hr). '1te£ex. to ^tsuve-i) . The Power Supplies convert aircraft 28 volts dc to regulated +15 and -15 volts dc and -1000 volts dc. Gamma dose rate is measured by the Photomultiplier Tube and converted to a voltage level by a log amplifier. This voltage when scaled by EMAX in the subtractor cir- cuit becomes the air dose level. The Ground Dose Computer provides tne ground dose level by combining a signal proportional to the altitude as furnished by a radar altimeter with the air dose level signal. The ground dose level signal is displayed, recorded and/or can be telemetered. A self test feature is also provided. k»By activating self test, a light which simulates gamma radiation is generated in the Self Test Device Driver resulting in a test level air d\se signal. At the same time, an altitude signal is generated from the radar altimeter. The resulting ground dose level is monitored by the Self Te^t Comparator illuminating either a Go or No-Go light. An alarm system is provided for crew safety. When the selected air dose level is exceeded, the alarm is automatically activated.
ANALYSIS
:
Nominal component values will be used to determine initial circuit values. Several potentiometers are used throughout the ARS circuitry to minimize the effect of differences in component values from nominal. Therefore, only component value changes following radiation expsure will be considered in this report. The components listed in Table 1 were selected from the ARS Parts List (Attachment 1) as being most sensitive to radiation damage or response. The following guidelines will be used in evaluating or modeling component parts parameters. Test data will be used for the 5 typos of integrated circuits. Since the Motorola MC1558G is similar to the uA741 operational amplifiers, test data for the uA741 will be used. References providing IC Radiation Response Data include the North American Rockwell Reports (References 1,2,3), a Martin Marietta Report (Reference 4), as well as a Northrop Report (Reference 5).
Neutron degradation for the log amplifier is included as an appendix to this report. The photomultiplier and high voltage supply will be tested. Transistors will reflect degraded gain after exposure to the
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Table 1. ARS Radiation Sensitive Components
Description
I .C . Op-Amp I .C. Volt Reg. I.C. Volt Reg. I.C. Volt Reg. 1.C. Current Amp. Log Module Photomultiplier High Voltage Supply Transistor Transistor Transistor Transistor FET Diode Diode Diode Zener Diode Zener Diode Relay Relay Relay
Military Part No.
JAN2N2219A JAN2N2222A JAN2N2369A JAN2N3019 JAN2N4857 JAN1N4148 JAN1N4249 JAN1N4942 JAN1N753A JAN1N964B
Vendor
Motorola Fairchild Motorola Motorola Nat. Semicon Teledyne/Philbrick RCA Technetics QPL QPL QPL QPL QPL QPL QPL QPL QPL QPL Teledyne Teledyne Teledyne
Vendor Part Number
MC1558G U5R7723312 MC1569R MC1563R LH0002H 700695 4516
N9567-114
412T-26 411D-26 412D-26
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neutron environment. Either the NR method (Reference 6) or TREE technique (Reference 7) will be used to predict the gain degradation. The FET (alarm circuit) will not reflect degradation at specification levels (References 8,9). Diode response to radiation are also minimal (Reference 7). The diodes and transistors used in the relays will be treated as separate and discrete parts.
System performance following exposure to neutron fluence has been analyzed using DICAP (Reference 10) or hand analysis. Subcircuits not included in the present analysis will be analyzed or tested at a later date. DICAP is a part of the computer aided circuit analysis programs SYSCAP (System of Circuit Analysis programs). SYSCAP encompasses static and dynamic, linear and nonlinear analysis. The program is available at Control Data Corporation Data Centers with the CDC 6600 Computer. The SYSCAP structure is diagrammed in Figure 2. The static (DC) analysis program, DICAP, and the dynamic (transient) analysis program, TRACAP, are each large, complex overlay programs that execute separately.
SYSCAP performs a lumped-parameter, linear and nonlinear analysis of complex electronic networks. The circuit to be analyzed is mathematically modeled as a system of nodes interconnected by circuit elements, driven by signal sources and power supplies. The circuit elements which form the basic analysis set are resistors, capacitors, inductors, diodes, transistors, linear transformers, and operational amplifiers. DICAP and TRACAP use a nodal equation formulation of the electronic network problem. Both programs write these equations automatically and solve them using a sparse matrix solving routine. These equations are solved using an iterative technique that is continued until the non linear side conditions have been satisfied.
Results of the DICAP and Hand Analysis are shown on appendices to this report. Table 2 lists each subcircuit and corresponding appendix number. Test data on the log module is also included.
Gamma Ray Dose Rate
All of the ARS subcircuits were not analyzed for prompt gamma effects. In general, prompt gamma will not cause permanent damage (Reference 7). Although transient upsets are expected at radiation levels greater than 5 X 10' rads/seconds, recovery is expected within a few hundred micro- seconds (References 1,7). The subcircuit time constant will prolong the transient upset into the millisecond range. However, since the ARS re- sponds to the rate of exposure, correct information will resume following the transient upset. Testing will be used to verify that components do not fail. The subtractor subcircuit was analyzed for transient upset at specification level. The prompt gamma prediction technique in Reference 1 was used. The TESS (Reference 11) computer analysis program was used to perform the analysis. As expected the output saturated for approxi- mately 40 microseconds, decayed rapidly until 60 microseconds, then slowly for 3 milliseconds. The detailed analysis is presented in Appendix 8.
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I NR/SYSCAP STRUCTURE
Figure 2
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Table 2
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Subcircuit Type Ana
Neutron
lysis Method A ppendix
EMAX Buffer DICAP 1
Subtractor Neutron DICAP 2
Ground Dose Computer Neutron DICAP 3
Self Test Device Driver Neutron DICAP 4
Alarm Neutron Hand Analysis 5
Self Test Compar ator Neutron DICAP 6
Log Module Neutron Test Data 7
Subtractor Gamma Ra te TESS 8
Various Gamma Ra te Test Data 9
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The TESS computer program was developed by TRW System Group, Redondo Beach, California, and is available through Control Data Corporation. It is designed to perform large scale, nonlinear circuit analysis. The program performs Transient, DC, and AC analysis. Extensive use of state- of-the-art programming techniques, sophisticated list processing techniques and sparse matrix schemes allow rapid analysis of large problems with minimum memory core usage. The transient and DC portions are very similar to the widely available SCEPTRE program. The TESS program was selected because of the transient radiation response feature of the operational amplifier model.
Portions of the ARS have been tested in prompt gamma environment. No failures were observed. Details of these tests are included in Appendix 9.
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Appendix 1
EMAX BUFFER CIRCUIT NEUTRON FLUENCE ANALYSIS
The EMAX Buffer subcircuit of the ground dose computer module in the Aerial Radiac System has been analyzed for neutron fluence. The SYS- CAP DICAP computer program was used to perform the analysis. The DICAP schematic is shown in figure 1-1. This subcircuit is used to generate EMAX, a constant voltage used as a reference by the subtractor subcircuit. The two zener diodes (1N753A) are used for temperature compensation. The non-inverting input to the operational amplifier (1/2 MC1558) is variable through potentiometer R24. The output at Node 6 (EMAX) must remain with- in 8 millivolts following neutron fluence.
The circuit parameters affected by neutron fluence are the operational amplifier parameters only. Based on available neutron test data on operational amplifiers, the data at specification level in Table 1-1 is used for neutron degradation. The DICAP input data is shown in Table 1-2. A summary of the analysis is shown in Table 1-3. The output voltage at node 6 varies from nominal by less than a millivolt. This is within the design tolerance of 8 millivolts.
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Parameter Nominal Minimum Maximum
Input Resistance 1 Meg. 500 K 1 Meg. Input Offset Current 40 Na. 10 Na 70 Na Input Offset Voltage 3 MV 1 MV 5 MV Input Bias Current 300 Na 100 Na 500 Na Common Mode Voltage 0. 0. 0. Gain 200000. 50000. 200000. Output Impedance 75 ohms 75 ohms 75 ohm» V out high 13. V 12 V 14 .V V out low -13 .V -12 V -14.V
Table 1-1. Operational Amplifier MC15S8 Parameter.:
Degraded For Specification Level Neutron Fluence
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Appendix 2
SUBTRACTOR CIRCUIT NEUTRON FLUENCE ANALYSIS
The subtractor subcircuit of the detector module in the Aerial Radiac System has been analyzed for neutron fluence. The SYSCAP DICAP computer program was used to perform the analysis. The DICAP schematic is shown in figure 2-1. This subcircuit is used to shift the voltage level from the log converter module (El) by the negative of EMAX. The output voltage at node 5 (E02) must remain within 50 millivolts of the nomina1.
The circuit parameters affected by specification level neutron fluence are operational amplifier parameters only. The DICAP input data is shown in Table 2-1. A summary of the analysis is shown in Table 2-2. The output voltage at node 5 varies from nominal by -4 millivolts to +12 millivolts. This is within the design tolerance of 50 millivolts.
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Appendix .'i
GROUND DOSE COMPUTER CIRCUIT NEUTRON FLUEN'CE ANALYSIS
The ground close computer subcircuit of the ground dose computer board in the Aerial Ridiac System has been analyzed for neutron lluence. The SYSCAP DICAP computer program was used to perform the analysis. The DICAP schematic is shown in figure 3-1. This subcircuit is used to con- vert air dose to ground dose. The altitude signal (Ealt) from the manual selector switch or radar altimeter is shown as E4. The operational amplifiers A3L and A3H buffer and limit the altitude signal. Operational amplifier A2L serves as the subtractor circuit which scales the altitude signal and adds a constant to form the air ground correction factor (AGCF) . The\AGCF signal is then buffered by operational amplifier A2H. The air doseNiignal (E2) is added to the AGCF signal in operational amplifier AIL. This signal output is limited by the diodes and buffered by A1H. The output ErjG (voltage at node 24) is the ground dose signal. This signal is also telemetered through operational amplifier A4H . The ground dose signal must remain within 0.33 volts of the nominal output voltage.
The circuit parameters affected by specification level neutron fluence arc op amp (MC1558) parameters only. The DICAP input data is shown in Table 3-1. A summary of the analysis is shown in Table 3-2. The ground dose voltage EpG (node 24) varies from nominal by -117 milli- volts to +124 millivolts. This is within the design tolerance of 330 millivolts .
17
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DICAP Circuit Designation Designation
El = 15 volts E2 = air dose E3 = -15 volts E4 = altitude
All operational amplifiers are MC1558 Diodes are 1N4148 Zener Diode is 1N964B
R44 = R36 R46 = R32 R47 = R33 R48 = R31 R4 = R4 + Pot. R3 R49 = R30 R22 = R19 R17 = R17 + Pot. R16 R24 = R20 + Pot. R21 R31 = R27 + R28 R32 = R29 D7 = CRS D8 = CR6 DZ9 = CR7 R29 s R26
Figure 3-1. DICAP Schematic of the Ground Dose Computer Subcircuit (Cont'd)
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Appendix 4
SELF TEST DEVICE DRIVER CIRCUIT NEUTRON FLUENCE ANALYSIS
The Self Test Device Driver subcircuit of the detector module in the Aerial Radiac System has been analyzed for neutron fluence. The SYSCAP DICAP computer program was used to perform the analysis. The DICAP schematic is shown in figure 4-1. This subcircuit is used to gene- rate a light to activate the photomultiplier tube during self test. The input signal, +15 volts, is applied through the detector switch to node 1, Diode CR1 is used for temperature compensation at the non-inverting input of the operational amplifier. The lamp (RL1) is simulated by a 100 ohm resistor. The current through the light bulb is maintained at approxi- mately 10 ma. The design tolerance of the current through the lamp is +0 .5 ma.
The circuit parameters affected by specification level neutron fluence are the operational amplifier parameters and transistor gain. The transistor gain is degraded to 20 from a typical value of 200. The DICAP input data is shown in Table 4-1. A summary of the analysis is shown in Table 4-2. The current (RL1 IR) through the lamp varies from nominal by -19 pa and +2 iaa. This is within the design tolerance of 500 pa.
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NA-72-1101
Append ix 5
ALARM CIRCUIT NEUTRON FLUENCE ANALYSIS
A partial hand analysis lor neutron fluence lias been completed on the Alarm subeircuit of the Aerial Radiac System. The circuit schematic is shown in figure 5-1. The DA Alarm Set is used to select the level (in Rads Hr) that the alarm will be activated. This voltage to operational amplifier A2H is compared with the air dose level (E02) in operational amplifier A2L. Capacitor C5 is used to liltcr out noise and provide a slight time delay to reduce relay chatter. Since operational amplifier A2L is in open-loop configuration, its output will be either plus or minus saturation. Relay Kl must activate when A2L is in plus saturation.
The specification level neutron fluence will induce changes in the operational amplifiers and in the gain of the transistor in Relay Kl. Gain changes in the operational amplifiers will not affect circuit opera- tion. Offset voltage changes will affect the alarm activate level. How- ever, a shift of a few millivolts is not significant when considering the wide range of the alarm set level. Based on data from the manufacturer, the transistor in relay Kl is similar to 2N2222A. Based on prediction techniques, the transistor gain will degrade to 50% of its original value, sufficient for proper transistor action.
I
:• 34
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LOS ANGELES DIVISION NORTH AMERICAN ROCKWELL CORPORATION
NA-72-1101
•
Figure 5-1. Alarm Schematic
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B-1 Division NA-72-1101 North American Rockwell
Appendix 6
SELF TEST COMPARATOR CIRCUIT NEUTRON FLUENCE ANALYSIS
The Self Test Comparator subcircuit in the Aerial Radiac has been analyzed for neutron fluence. The SYSCAP DICAP computer program was used to perform the analysis. The DICAP schematic is shown in Figure 6-1. When Self Test is activated, 28 volts is applied to this subcircuit and EDG (Ground Dose) is computed through the Self Test Device Driver subcir- cuit and EALT is generated. EDG is 3-3 volts +10% and E\]ji is -0.8 +20%. The operational amplifiers A1H and AIL must sense voltage errors greater than 330 millivolts. A2H and A2L must sense voltage errors greater than 160 millivolts. If both voltages are within tolerance, all operational amplifiers will saturate in the plus state, CR9 will conduct current causing Ql (2N2219A) to saturate and Relay Kl will activate resulting in a GO light. If any condition is out of tolerance, Ql will not conduct and the No Go light will remain on.
The circuit parameters affected by specification level neutron fluence are the operational amplifier (MC1558) parameters and transistor gain. The transistor gain is degraded to 20 from a typical value of 200. The degradation is greater than either prediction technique. The DICAP input data is shown in Table 6-1. The tolerance on the Ground Dose Computer EQG is +5% (from appendix 3) and on the altitude signal +5%. The relay Kl is simulated, for the purposes of this analysis, by 1500 ohms, The results of the analysis is shown in Table 6-2. The voltage at node 19 varies from 6.60 to 6.69 volts, sufficient to keep Ql in saturation. The current through RK1 varies from 14.59 ma to 19.94 ma, indicating Relay Kl is turned on.
36
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B 1 Division North American Rockwell
i iii.• .i — .i i.i.!••
NA-72-1101
DICAP Component Designation and Parts List Equivalent
PI CAP
R2 R4 RO RIO Dl D2 D:J
D4 D5 DC D7 D8 D29 RK1
PARTS LIST
R2 + Pot. Rl R4 + Pot. R3 RU + Pot. R7 R10+ Pot. R7 INI UK IN 11 48 INI in; IN U L3 IN 1148 IN 11 Hi IN 11 18 1N11 18 1H753A Relay Kl
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N'A-72-1101
•
Append i x 7
U)G MOD11.E NEUTRON FI,LESi:E TEST RESPONSE
The Log Module subcircuil In the Detector Module uJ the ARS has been tested for neutron 1 lucnce degradation. The Log Module converts the (out- put current of the Pfaotomultiplier Tube to a curresponding voltage level. The test was conducted at the Northrop Reactor us in;; the TRKiA MARK F dry exposure room with the 1 4 boral shield and 2.3" load shield in position around the exposure room window. The shilt in output voltage level at various fluence is shown in the attached Table 7-1.
i 46
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BIDMston North American Rockwell
NA-72-1101 "*"— *
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47
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B-1 Division North American Rockwell
NA-72-1101
Appendix 8
SUBTIUCTOR CIRCUIT PROMPT GAMMA RESPONSE
The subtracter subcircuit of the detector module in the Aerial Radiac System has been analyzed for prompt gamma radiation. The TESS computer program was used to perform the analysis. The TESS schematic is shown in Figure 8-1. This subcircuit is used to shift the voltage level from the log converter modulo (El) by the negative of EMAX. The output voltage (VRL) must return to nominal within a reasonable time.
The circuit parameters affected by specification level prompt gamma are the op-amp transient response. The transient response is shown in reference 1. The op-amp model and other TESS input data is shown in Table 8-1. Tho standard uA741 model was used to simulate the MC1558 op- amp. The initial page of the tabulated output is shown in Table 8-2 and final value in Table 8-3. The prompt gamma was initiated at time 5.E-06. At time 3.23E-03 VRL has returned to nominal. The graphical output is shown in Figure <J-2 . The response goes to negative 13.5 volts, then positive to 13.5 volts for 40 microseconds. The response then returns to 5 volts and slowly returns to +4 volts. However, within the anticipated operational use of the ARS, transient upsets of a few milliseconds are tolerable. It should be noted that the extended response time is due to circuit, not component response.
48
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LOS ANGELES DIVISION NORTH AMERICAN ROCKWELL CORPORATION
HA-7J-U01
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Figure 8-1. TESS Schematic of Subtractor Subcircuit
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OUTPUTS P«;w WC1 .wr?.\/n,vC4.pi OT
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Table 8-1. TESS uA741 Op Amp Model Input Data
50
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MA-72-1101
I • . .
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Table 8-1. (Continued) TESS Subtractor Circuit Input Data
51
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S'A-72-1101
Vppond i>. '.»
TESTING OK AERIAL RADIAC SYSTEM It) PROMPT GAMMA
The Aerial Radiac Syatea (breadboard model) was exposed to prompt t;aninia ray Irradiation using the Feketron Model 7<i5 flask -.-ray machine at the Northrop Corporate Laboratories. These design tests wore schedul- ed to locate potential susceptibilities oi the- ARS electronic components to this environment. The test data can be extrapolated to the spec iln i- t ion level.
The ARS modules which were irradiated were placed in front ol the Hash x-ray target at a distance as close as physical limitations would permit. As a matter ol convenience no special test fixture! were con- structed. Instead, the computer power supply (CPS) box, which contains three of the electronic circuit cards, was used as its own test fixture by employing its existing connectors and test point facilities. For each of the test points monitored (093, C^LT «• cALTo • +1^> "15, Cy2. and H.V.), the selector switch on the CPS was placed in the proper position and then the signal was delivered from the test point Jack to oscillo- scope by means of a coaxial cable. The eo2 and high voltage (H.V.) sig- nals originate from circuitry within the Detector Module (DM), but these are also accessible at the test point jack.
Dose rates received by the breadboard components were limited by the physical proximity of the circuit cards to the x-ray target. The Power Supply board (+15), which was at the rear of the CPS, received a dose rate of 4 X 10^ Rads(Si) second and the Ground Dose (DG) board, at the front of the CPS received 7,3 X 10s Rads(Si) second. These levels were calculated from the average of four thermal luminescent detector (TLD) readings on each board. The Detector Module received two dose rates: one at 1.6 X 108 Rads(Si), second and the other at 1.3 X lOlO Rads(Si) second. For the high level, the scintillator end of the DM was placed flat on the X-ray target. Since the TLD' s on the DM were placed exter- nal to its case, the actual level received internally may have been attenuated slightly. It was approximated that the High Voltage unit received about 5 X 10^ Rads(Si)/second since it is placed about four inches behind the scintillator.
Figure 9-10 shows the test set-up used on the CPS module. The DM was disconnected from the system and the eQ2 input to the CPS was grounded, The CAI module, which control power to the system, and the +28 volt power supply were located out of range of the X-ray beam. A Textronix 556 oscilloscope was used in the control room to monitor the signals from the test point jack. After each shot, the test point selector switch and or the manual altitude switch were rotated to a new position. The TLD's were exposed only once on the first shot and then removed.
S 55
•• - -
• • •• „..,.,., I
EHDMsion NA-72-1101
North American Rockwell
Figures 9-1 through 9-6 show the responses obtained for the CPS tests. Except for e();j (Figure 9-1), all the operational amplifier outputs re- spond quite similarly. The difference Ln 093 may be attributed to the fact that this particular signal path consists of an adder stage for which one input is the output of another op-amp (O^LJO)• Not only do these motorola MC1558G dual op-amps behave like 741 types in general, but even more like their single counterpart, the MC1741G (Reference 3).
Figures 9-5 and 9-<S show the transients which occur on the +15 and -15 voll power supply lines. it can be assumed that these transients are produced only by the output regulators, MC1569R and MC1563R since they are isolated from the rest of the power supply components by large filter capacitors. Although the 15G9 (+) and the 1563 (-) are not identical regulators, they are designed to track temperature identically and, as would be expected, their radiation responses are similar. For both, a small damped sinusoid rides or. the quiescent level for a few microseconds.
Figures 9-7, 9-8, and 9-9 show the effect of prompt gamma radiation on Detector Module signals, CQ2 and high voltage. The e02 signal is the final output signal from circuitry consisting of three stages in cascade. The output current of the phctomultiplier tube (PMT) is converted to voltage by the log module and then level shifted and filtered by an op-amp subtractor stage. Except for the absence of top end saturation, the CQ2 response is the typical 741 op-amp response. Since the maximum bandwidth of the 4351 log module is less than 200 KHz, it may be assumed that most of the fast response that the PMT produces in following the 30 nanosecond gamma pulse is lost in the following two stages. It can be seen that the final value of eo2 after the pulse is slightly higher than its initial value (Figure 9-0). This can be attributed to a short term increase in PMT dark current. Observation of eQ2 on a digital voltmeter showed a gradual decrease to normal dark current level over a five minute interval.
The response of the high voltage power supply was measured by using the H.V. sample test point (5.8 volts = 1000 volts). At approximately 5 X 10^ Rads(Si)/second, the higher voltage drops about 350 volts for 15 microseconds.
The tests performed here show that no catastrophic failures occurred to ARS components at the dose rate levels obtained. All the radiation responses observed consist mainly of brief (50 ps) perturbations from normal voltage levels. The magnitude (under saturation voltage) and time duration of an operational amplifier's output transient has, in general, been found to be directly proportional to dose rate. Extrapolation of present data to higher dose rates does not present a problem to the ARS since it has relatively slow time constants. Although the circuitry of the CAI module was not tested at this time, the only uncertainty within it is the LH0002H integrated circuit and this will be tested at a later date.
56
?
*m-~-*^~*mmmmm<—pp—^»—» ••••II-
N'A-72-1101
Figure 1: e03 response (ft02=0» ealt"°)
II: 10 microseconds/division V: 5 volts/division Dose Rate: 7,3 X 108 Rnds(Si)/second
Figure 2: eait. response (tait=°)
II: 10 microseconds/division V: 5 volts/division Dose Rate: 7.3 X 108 Rads(Si)/second
57
iiniini I • ! --• ~ -•*
JI^.. i. ui ••• •• •• mi ii »• i urn L .,.
N,.\-72-ll()l
Figure 3; Jalt response (Cait- -8V) H: 10 microseconds/division V: 5 volts/division Dose Rate: 7.3 X 108 Rads(Si)/second
figure 4; oait2 response (Calti=°V)
H: 10 microseconds/division V: 5 volts/division Dose Rate: 7.3 X 108 Rads(Si)/second
* 58
"L -"-^-— • • -•• •
"•»•—•-•• '" ' ^—^WPWP
NA-72-1101
Figure 5: +15V response
II: 1 microsecond/division V: 5 volts/division Dose Rate: 4.0 X 108 Rads(Si)/second
Figure 6: -15V response H: 1 microsecond/division V: 5 volts/division Dose Rate: 4,0 X 108 Rads(Si)/second
59
•*» - i» UP «MI - •
I. • —• - -
1 ' • "• "L' ' •""• • '• '
NA-72-llül
Figure 7: o .., response (15 )
II: ö microscconcls/divis ion V: 5 volts/division Dose Rate: 1.6 X 108 Rads(Si) "second
Figure 8: q)2 response (at target)
II: 5 microseconds/division V: 5 volts/division Dose Rate: 1.3 X 1010 Rads(Si)/second
e 60
— - - — -- *••• - •--
N'\-7'J-1 11)1
Figure 9: High Voltage Response (-5.8V sample) H: 5 microseconds/division V; T> volts 'division Dose Rate: 5 X 1US) Rads(Sl) second
(SI
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&
ATTACHMENT 1. AERIAL RADIAC SYSTEM PARTS LIST
DETECTOR MODULE, LOG CONVERTER BOARD
SCHEMATIC DESCRIPTION MILITARY MILITARY VENDOR VENDOR DESIGNATION PART NO. SPECIFICATION PART *
R14 Resistor RN55D5112F MIL-R-10509F QPL Rl5 Resistor RN55D1652F MIL-R-10509F QPL Rl6 Resistor RN55D2052F MIL-R-10509F QPL Rl7 Resistor RN55D5112F MIL-R-10509F QPL R18 Resistor RN55D5112F MIL-R-10509F QPL Rl9 Resistor RN55D1072F MIL-R-10509F QPL R20 Resistor RN5SD4990F MIL-R-10509F QPL R21 Resistor RN55D1002F MIL-R-10509F QPL R22 Resistor RN55D1000F MIL-R-10509F QPL R24 Resistor RN55D1222F MIL-R-10509F QPL
«23 Resistor RCR20G152JM MIL-R-39008 QPL
Cl Capacitor CK05BX104K MIL-C-11015 QPL
c2 Capacitor CK05BX104K MIL-C-11015 QPL C4 Capacitor CK05BX103K MIL-C-11015 QPL c5 Capacitor CK05BX103K MIL-C-11015 QPL
c6 Capacitor CK05BX104K MIL-C-11015 QPL C7 Capacitor CK05BX104K MIL-C-11015 QPL C8 Capacitor CK05BX103K MIL-C-11015 QPL
Qi Transistor JAN2N2222A MIL-S-19500/255 QPL
CRi Diode JAN1N4249 MIL-S-19500/286 QPL CR2 Zener Diode JAN1N733A MIL-S-19500/127 QPL CR3 Zener Diode JAN1N753A MIL-S-19500/127 QPL
Al I.C. OP-AMP Motorola MC1558G
KI1 Thermistor Fenwal LB21J1 Log Mod. Log. Mod Teledyne/
Philbrick 700695
&
MH* * -**•*+'+
• •
wmmm
*•
NJ V-72-1101
DETECTOR MODULE, RESISTOR BOARD •
SCHEMATIC DESCRIPTION MILITARY MILITARY VENDOR \TNDOR . DESIGNATION PART NO. SPECIFICATION PART *
H Resistor RCR20G106JM MIL-R-39003 QPL R2 Resistor RN60D2003F MIL-R-10509F QPL R3 Resistor RN55D1003F MIL-R-10S09F QPL R4 Resistor RN55D1003F MIL-R-10509F QPL R5 Resistor RN55D1003F MIL-R-10509F QPL
Re Resistor RN55D1003F MIL-R-10509F QPL R7 Resistor RN55D1003F MIL-R-10509F QPL R8 Resistor RN55D1003F MIL-R-10509F QPL R9 Resistor RN55D1003F MIL-R-10509F QPL Rio Resistor RN55D1003F MIL-R-10509F QPL Rll Resistor RN55D1003F MIL-R-10509F QPL Rl2 Resistor RN55D9312F MIL-R-10509F QPL Rl3 Resistor RN55D6981F MIL-R-10509F QPL c9 Capacitor CK05BX103K MIL-C-11015 QPL
>
65
-•- — - --- -^--- A
•I III ——>
NA-72-1101
DETECTOR MODULE, CHASSIS
SCHEMATIC DESCRIPTION MILITARY MILITARY VENDOR VENDOR DESIGNATION PART NO. SPECIFICATION PART #
P.M.T. Photomultiplier R.C.A 4516
H.V. Supply High Voltage Supply
Technetics N9567-11
*l Incandescent Lamps Inc. 679AS15 Lamp .
Kl Reed Relay Electronic 1C24A Applications Co.
66
••i.i m
9
GROUND DOSE COMPUTER BOARD
SCHEMATIC DESCRIPTION MILITARY MILITARY VENDOR VENDOR DESIGNATION PART NO. SPECIFICATION PART *
Rl Potentiometer RTR22DX102M MIL-R-39015 QPL R3 Potentiometer RTR22DX102M MIL-R-39015 QPL Rll Potentiometer RTR22DX20LM MIL-R-39015 QPL Rl4 Potent iometer RTR22DX201M MIL-R-39015 QPL Rl6 Potent iometer RTR22DX103M MIL-R-39015 QPL R21 Potentiometer RTR22DX502M MIL-R-39015 QPL R24 Potentiometer RTR22DX202.M MIL-R-39015 QPL
R2 Resistor RN55D9091F MIL-R-10509F QPL R4 Resistor RN3f>D1002F MIL-R-10509F QPL R5 Resistor RN55D1002F MIL-R-10509F QPL R6 Resistor RN55D1132F MIL-R-10509F QPL R8 Resistor RN55D2372F MIL-R-10509F QPL R9 Resistor RN55D1002F MIL-R-10509F QPL
•
RIO Resistor RN55D1402F MIL-R-10509F - QPL R12 Resistor RN55D8450F MIL-R-10509F QPL Rl3 Resistor RN55D1182F MIL-R-10509F QPL R15 Resistor RN55D2941F MIL-R-10509F QPL R17 Resistor RN55D6812F MIL-R-10509F QPL Rl8 Resistor RN55D1002F MIL-R-10509F QPL Rl9 Resistor RNS5D1002F MIL-R-10509F QPL R20 Resistor RN55D3482F MIL-R-10509F QPL R22 Resistor RN55D4991F MIL-R-10509F QPL R23 Resistor RN55D1001F MIL-R-10509F QPL R25 Resistor RN55D6191F MIL-R-10509F QPL R26 Resistor RN55D1Ü02F MIL-R-10509F QPL R27 Resistor RN55D1002F MIL-R-10509F QPL R28 Resistor RN55D3321F MIL-R-10509F QPL R29 Resistor RN55D1002F MIL-R-10509F QPL R30 Resistor RN55D1503F MIL-R-10509F QPL R31 Resistor RN55D2492F MIL-R-10509F QPL R32 Resistor RN55D5112F MIL-R-10509F QPL R33 Resistor RN55D5112F MIL-R-10509F QPL R34 Resistor RN55D3401F MIL-R-10509F QPL R35 Resistor RCR07G153JM MIL-R-39008 QPL R36 Resistor RCR07G911JM MIL-R-39008 QPL
Cl Capacitor CK05BX104K MIL-C-11015 QPL C2 Capacitor CK05BX104K MIL-C-11015 QPL C3 Capacitor CK05BX103K MIL-C-11015 QPL 1
I •• -•-—
- -
••"•
NA-72-1101 1 GROUND DOSE COMPUTER BOARD (continued)
SCHEMATIC DESCRIPTION DESIGNATION
C4 Capacitor C5 Capacitor
C6 Capacitor C7 Capacitor
CRl Diode CR2 Diode CR3 Diode CR4 Diode CR5 Diode CR6 Diode CR7 Zener Diode
Al I.C. OP-AMP A2 I.C. OP-AMP A3 I.C. OP-AMP A4 I.C. OP-AMP
Si Rotary Switch
s2 Rotary Switch
Kl Relay K2 Relay K3 Relay
MILITARY PART NO.
MILITARY SPECIFICATION
VENDOR VENDOR PART #
CK05BX222K CK05BX222K CK05BXIö3K i;K05BX103K
JAN1N4118 JAN1N4148 JAN1N4M8 JAN1N4148 JAN1N4148 JAN1N4148 JAN1N964B
MIL-C-11015 MIL-C-11C15 MIL-C-11015 MIL-C-11015
MIL-S-19500/116 MIL-S-19500/116 MIL-S-19500/116 MIL-S-19500/11G MIL-S-19500/116 MIL-S-19500/116 MIL-S-19500/117
MIL-S-3786/20 MIL-S-3786/20
MIL-R-5757 MIL-R-5757 MIL-R-5757
QPL • QPL QPL QPL
QPL QPL QPL QPL QPL QPL QPL
Motorola Motorola Motorola Motorola
Grayhill Grayhill
Teledyne Teledyno Teledyne
MC1558G MClOöoG MC1558G MC155SG
50MY29010-1-2N 50MY20010-1-2N
412D-26 412D-26 412D-26
08
, .->,..,", .
SELF TEST BOARD
NA-72-1101
*
SCHEMATIC DESCRIPTION MILITARY MILITARY VENDOR VENDOR DESIGNATION PART NO. SPECIFICATION PART 0
Ri Potentiometer RTR22DX502M MIL-R-39015 QPL R7 Potentiometer RTR22DX102M MIL-R-39015 QPL Rl4 Potentiometer RTR22DX102M MIL-R-39015 QPL R2 Resistor RN55DJG52F MIL-R-10509F OJPL R3 Resistor RN55D1503F MIL-R-10509F QPL R4 Resistor RN55D2192F MIL-R-10509F QPL R5 Resistor RN55D1503F MIL-R-10509F QPL R6 Resistor RN55D2102F MIL-R-10509F QPL *8 Resistor RN55D6491F MIL-R-10509F QPL RS Resistor RNS5D1503F MIL-R-10509F QPL RIO Resistor RN55D8G61F MIL-R-10509F QPL Ril Resistor RN55D1503F MIL-R-10509F QPL Rl2 Resistor RN55D8251F MIL-R-10509F QPL Rl5 Resistor RN55D1001F MIL-R-10509F QPL R13
1
Resistor RCR20G822JM MIL-R-39008 QPL
Cl Capacitor CK05BX104K MIL-C-11015 QPL c2 Capacitor CK05BX104K MIL-C-11015 QPL C3 Capacitor CK05BX104K MIL-C-11015 QPL C4 Capacitor CK05BX104K MIL-C-11015 QPL C5 Capacitor CK05BX104K MIL-C-11015 QPL c6 Capacitor CK05BX101K MIL-C-11015 QPL
CRi Diode JANIN4148 MIL-S-19500/116 QPL CR2 Diode JAN1N4148 MIL-S-19500/116 QPL CR3 Diode JAN1N4148 MIL-S-19500/116 QPL CR4 Diode JAN1N4148 MIL-S-19500/116 QPL CR5 Diode JAN1N4148 MIL-S-19500/116 QPL CR6 Diode JAN1N4148 MIL-S-19500/116 QPL CR7 Diode JAN1N4148 • MIL-S-19500/116 QPL CR8 Diode JAN1N4148 MIL-S-19500/116 QPL CRg Zener Diode JAN1N753A MIL-S-19500/127 QPL
oQ
• •..,.,•-..
SELF TEST BOARD
KA-72-J.1»! 1
SCHEMATIC DESCRIPTION MILITARY MILITARY VBNDOR VENDOR DESIGNATION PART NO. SPECIFICATION PART *
Qi Transistor JAN2N2219A MIL-S-19500/251
Al I.C. OP-AMP Motorola MC1558G A2 I.C. OP-AMP Motorola MC1558G
Kl Relay MIL-R-5757 Teledyne 411D-26 K2 Relay MIL-R-5757 Teledyne 411D-26 K3 Relay MIL-R-5757 Teledyne 412D-26
'•""«•' •
1
0* HA-72- -1102
POWER SUPPLY BOARD
SCHEMATIC DESCRIPTION MILITARY MILITARY VENDOR VENDOR DESIGNATION PART NO. SPECIFICATION PART #
Ri Resistor RW70U1R00F MIL-R-26E QPL R2 Resistor RN55D1072F MIL-R-10509F QPL R3 Resistor RN55DG811F MIL-R-10509F QPL Ry Resistor RN55D22C2F MIL-R-10509F QPL R9 Resistor RN55D6811F MIL-R-10509F QPL RIO Resistor RN55D6811F MIL-R-10509F QPL Rl2 Resistor RN55D22C2F MIL-R-10509F QPL R4 Resistor RCR07G512JM MIL-R-39008 QPL R5 Resistor RCR07G331JM MIL-R-39008 QPL Re Resistor RCR20G2R7JM MIL-R-39008 QPL R13 Resistor RCR20G2R7JM MIL-R-39008 QPL
R8 Potentiometer RTR22DX102M MIL-R-3901S QPL Rll Potentiometer RTR22DX102M MIL-R-39015 QPL
cl Capacitor CSR13G156KM MIL-C-39003 QPL C3 Capacitor CSR13F685KM MIL-C-39003 QPL C4 Capacitor CSR13F226KM MIL-C-39003 QPL — c7 Capacitor CSR13F226KM MIL-C-39003 QPL C8 Capacitor CSR13F226KM MIL-C-39003 QPL Cll Capacitor CSR13F226KM MIL-C-39003 QPL
c2 Capacitor CK05BX471K MIL-C-11015 QPL C5 Capacitor CK05BX103K MIL-C-11015 QPL c6 Capacitor CK05BX104K MIL-C-11015 QPL C9 Capacitor CK05BXI03K MIL-C-11015 QPL ClO Capacitor CK05BX104K MIL-C-11015 QPL Cl2 Capacitor CK05BX104K MIL-C-11015 QPL Cl3 Capacitor CK05BX104K MIL-C-11015 QPL Ci4 Capacitor CK05BX104K MIL-C-11015 QPL
CRi Diode JAN1N4148 MIL-S-19500/116 QPL CR2 Diode JAN1N4942 MIL-S-^19500/359 QPL I CR3 Diode JAN1N4942 MIL-S-19500/359 QPL - 1 CR4 Diode JAN1N4942 MIL-S-19500/359 QPL CR5 Diode JAN1N4942 MIL-S-19500/359 QPL CR6 Zener Diode JAN1N3034B MIL-S-19500/115 QPL CR7 Zener Diode JAN1N3034B MIL-S-19500/115 QPL
Q2 Transistor JAN2N3019 MIL-S-19500/391 QPL Q3 Transistor JAN2N3019 MIL-S-19500/391 QPL Q4 Transistor JAN2N2369A MIL-S-19500/317 QPL
Al I.C. Volt Reg. Falrchild U5R7723J A2 i.e. volt Reg. Motorola MC1569R A3 I.C. Volt Reg.
.
Motorola MC1563R
71
•• •
, 7—,-»-—, ——————
KA-72-1101
POWER SUPPLY BOARD (continued)
SCHEMATIC DESIGNATION
DESCRIPTION MILITARY PART NO.
MILITARY SPECIFICATION
VENDOR VENDOR PART tt
H.S.x H . S . 2
Transformer
Heat Sink Heat Sink
MIL-T-27C, TF5RX09ZZ
Zenith WE-2417 Transformer
Thermalloy Thermalloy
6168C 6168C
•"•• •• •"• - - - :%
r
ALARM/OSCILLATOR BOARD
ifA-rz-iioi
SCHEMATIC DESCRIPTION MILITARY MILITARY VENDOR VENDOR DESIGNATION PART NO. SPECIFICATION PART ft
R3 Resistor RN55D1872F MIL-R-10509F QPL R4 Resistor RN55D6811F MIL-R-10509F QPL R5 Resistor RN55D1002F MIL-R-10509F QPL
Re Resistor RN55D2492F MIL-R-10509F QPL R8 Resistor RN55D1002F MIL-R-10509F QPL R9 Resistor RN55D845IF MIL-R-10509F QPL Rl2 Resistor RN55D6981F MIL-R-10509F QPL Rl3 Resistor RN55D1002F MIL-R-10509F QPL Rl4 Resistor RN55D1002F MIL-R-10509F QPL R7 Resistor RCR07G565JM MIL-R-39008 QPL Rll Resistor RCR07G752JM MIL-R-39008 QPL Rl5 Resistor RCR07G512JM MIL-R-39008 QPL Rl6 Resistor RCR07G564JM MIL-R-39008 QPL
Cl Capacitor CK05BX103K MIL-C-11015 QPL C2 Capacitor CK05BX103K MIL-C-11015 QPL c5 Capacitor CK05BX103K MIL-C-11015 QPL C6 Capacitor CK05BX103K MIL-C-11015 QPL C7 Capacitor CK05BX104K MIL-C-11015 QPL c8 Capacitor CK05BX104K MIL-C-11015 QPL c3 Capacitor M39022/9-C/29P MIL-C-39022/9B :om.Research E12A503FSW C4 Capacitor M39022/9-CJ29P MIL-C-39022/9B :om .Researci. E12A503FSW
CRi Diode JAN1N4148 MIL-S-19500/385 QPL CR2 Diode JAN1N4148 MIL-S-19500/385 QPL CR3 Diode JAN1N4148 MIL-S-19500/385 QPL
73
«
' " ' HA-72-J101
ALARM/OSCILLATOR BOARD
SCHEMATIC DESCRIPTION MILITARY MILITARY VENDOR VENDOR DESIGNATION PART NO. SPECIFICATION PART #
Qi F.E.T. JAN2N4857 MIL-S-19500/385 QPL
Al I .C. Op-Amp Motorola MC1558G A2 I .C. Op-Amp Motorola «C1558G A3 I .C . Current Amp Nat .Sem icon LH0002I
«I Relay Teledyne 412T-26 K2 Relay Teledyne 412D-26
Tl Transformer MIL-T27C, TF4RX13YY
U.T.C.
1 D0-T34
74
amm
B-1DMston «4-72-1101 North American Rockwell
REFERENCES
1. NA-72-638; Computer Circuit Analysis of the TREE Response of IC Operational Amplifiers; October 2, 1972; B-l Division, North American Rockwell Corporation, Los Angeles, California.
2. TFD-72-1257; Summary of Component Radiation Tests Performed During Fiscal Year 1972; November 2, 1972; B-l Division, North American Rockwell Corporation, Los Angeles, California.
3. NA-71-755; Preliminary Report Gamma Radiation Test and Evaluation of Integrated Circuit Type High Performance Operational Amplifiers; August 13, 1971; B-l Division, North American Rockwell Corporation, Los Angeles, California.
4. CREG 7U-2; Semiconductor Evaluation, Screening, and Nuclear Hardness Assurance; March 1970; Orlando Division, Martin Marietta Corporation, Orlando, Florida.
5. DASA 2616, NCL 70-77R, Radiation Eflects on MSI LSI Electronic De- vices and Circuits; July 1971; Northrop Corporate Laboratories, Hawthorne, California.
6. NA-71-289; B-l Nuclear Radiation Hardening Design Guidelines and Analysis Requirements; Revised March 24, 1972; B-l Division, North American Rockwell Corporation, Los Angeles, California.
7. DASA 1420; TREE Handbook; September 1969; Battelle Memorial Institute, Columbus, Ohio.
8. B. Buchanan, etal, "Comparison of the Neutron Radiation Tolerance of Bipolar and Junction Field Effect Transistors," IEEE Proceedings, Vol. 55, No. 12, December 1967 .
9. W. Shedd, etal, Radiation Effects on Junction Field Effect Transis- tors", IEEE Transactions NS-16, No. 6, December 1969.
10. Pub. No. D0001359012; SYSCAP Series DICAP (Preliminary); September 1970; Control Data Corporation, Minneapolis, Minnesota.
11. Pub. No. 86615900; TESS User Information Manual; November 1972; Control Data Corporation, Minneapolis, Minnesota.
12. EL-CP5073-0002A, Nuclear Requirements For Aerial Radiac Set AN ADR-6 ( ) (V), 1 March 1971 (Confidential).
75
_ ». mm • - -.m • • . -» „.,>- »«