6 Sigma SD Shaft Dia. Variation

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    SD BASKET SHAFT

    DIAMETER VARIATION &

    MWO DIMPAL HEIGHT VAR.

    6

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    Commitment / Help Required

    Six Sigma Theme Registration

    App

    rova

    lVP MD

    Deptt : Production

    Theme

    Period

    Team Members

    Theme

    Description

    Target

    SD Basket Shaft Diameter Improvement

    10/01/2000 - 20/03/2000

    Sandeep Sethi, Sanjay Jain, AK Jindal

    Project Schedule

    Step

    Event

    Items

    Time Schedule

    Ist wk

    1

    2

    3

    4

    M

    A

    I

    C

    Definition Of Yield

    More Dia. Results In Tight Fitting Of SDBasket In Bellow Assembly,Displacing

    The Spring OF Bellow,Causing Leakage

    Through Spin Side. This Water Falls On

    The Spin Motor , Leading To Burning Of

    Motor.

    From existing defect rate of

    56,000 ppm to 3.4ppm.

    Cost saving =Rs 75,000

    RM Engg. ,the manufacturers of theS Shaft.

    Shaft diameter

    2nd wk 3rd wk 4th wk 5th wk 6th wk 7th wk 8th wk

    Team Leader: Sanjay Arora

    FacilitatorCustomer

    HOD

    Chetan

    Khosla

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    Process Map 6

    define measure analyse improve control

    Parting

    Turning

    on lathe

    Milling

    Centre

    Drill

    Centre

    less

    Grinding

    Knurling

    Pressing

    Insert

    Rivet

    Flaring ofRivet

    Polishing

    (oemery )

    Final

    Inspection

    Sleeve

    Insertion

    Packing

    Dispatch

    to Brite

    IQC at

    brite

    Moulding

    Check for

    runout

    Dispatch to

    LGEILaccepted

    accepted

    Scrap

    rejected

    IQC at

    LGEIL

    rejected

    Segregation

    Inspection

    Emery

    paper

    Check

    Sdbasket

    assm.

    a

    cc

    e

    p

    te

    d

    r

    e

    j

    e

    c

    t

    ed

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    ANALYSEANALYSE/Fish Bone Diagram 6

    define controlanalyse

    improvemeasure

    Innovation with 6 Achieve Super A! LGEIL

    Material

    MethodMan

    Method

    Dia.

    var.in

    shaft

    Min. cut possible

    Manual feed

    Not accounted for

    Manufacturing

    system Inspectionmethod

    Position of shaftNo. of cuts

    Depth of cut

    Dressing of grinder

    wheel

    Inconsistent view of the

    scale

    Inconsistency in selecting

    the point of checking

    Inability to concentrate

    Use of

    wrong

    measuring

    system

    Gages Micrometers

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    1 2

    1 3 . 9 7 5

    1 3 . 9 7 6

    1 3 . 9 7 7

    1 3 . 9 7 8

    1 3 . 9 7 9

    1 3 . 9 8 0

    1 3 . 9 8 1

    f a c t o r

    dia.

    ofshaft

    B oxplots of d ia. of by fac tor

    ( m e a n s a re i n d i c a t e d b y so l i d c i r cl e s )

    One-way Analysis of Variance

    Analysis of Variance for dia. of

    Source DF SS MS F Pfactor 1 0.0000528 0.0000528 77.13 0.000

    Error 18 0.0000123 0.0000007

    Total 19 0.0000651

    Individual 95% CIs For

    Mean

    Based on Pooled StDev

    Level N Mean StDev --------+---------+----

    1 10 13.9765 0.0006

    2 10 13.9797 0.0010

    Pooled StDev = 0.0008 13.9770 13.9785

    13.9800

    ANALYSE / No. of cuts6

    As p value is less than 0.05 so no. of cuts is a factor for

    dia.variation in S - Shaft

    define measure analyse improve control

    Innovation with 6s AchieveSuperA

    Level 1: 5 cuts

    Level 2 : 6 cuts

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    ANALYSE / Measuring Sys.6

    As p value is less than 0.05 so measuring system is a factor for

    dia.variation in S - Shaft

    define measure analyse improve control

    Innovation with 6s AchieveSuperA

    13.975

    13.976

    13.977

    13.978

    13.979

    factor

    dia.

    Boxplots of dia. by factor

    (means are indicated by sol id c i rc les)One-way Analysis of Variance

    Analysis of Variance for dia.

    Source DF SS MS F P

    factor 1 0.0000153 0.0000153 28.05 0.000Error 18 0.0000098 0.0000005

    Total 19 0.0000251

    Individual 95% CIs For Mean

    Based on Pooled StDev

    Level N Mean StDev -+---------+---------+--

    1 10 13.9777 0.0008 (---*--)

    2 10 13.9759 0.0006 (--*--)

    Pooled StDev = 0.0007 13.9755 13.9770 13.978513.9800

    Level 1: mech.

    Level 2: Digi.

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    No of cuts Measuring sy

    5 6 mech

    digi

    13.9762

    13.9774

    13.9786

    13.9798

    13.9810

    data

    Main Effects Plot (data means) for data

    No of cuts Mea.sys. data

    6 mech 13.982

    6 mech 13.983

    6 mech 13.979

    5 mech 13.977

    5 digi 13.976

    5 digi 13.975

    6 digi 13.982

    5 digi 13.975

    5 mech 13.977

    6 mech 13.982

    6 digi 13.981

    5 mech 13.977

    6 digi 13.98

    6 mech 13.979

    5 mech 13.978

    5 digi 13.975

    6 digi 13.9795

    6 digi 13.98

    5 digi 13.976

    5 mech 13.978

    The graph suggests that no. of cuts is a

    major factor & the measuring system

    is a minor factor.

    6define controlanalyseimprove

    measure

    IMPROVE /DOE

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    OPTIMUM CONDITIONS OF THE FACTORSOPTIMUM CONDITIONS OF THE FACTORS

    OBTAINED AFTER DOEOBTAINED AFTER DOE

    FACTORS OPTIMUM

    CONDITIONS

    1.NO. OF CUTS

    2.MEASURING SYSTEM

    3.DRESSING ( CUTTING WHEEL )

    4.DRESSING ( CONTROL WHEEL )

    SIX

    DIGITAL MICROMETER

    EVERY ONE HOUR

    EVERY TWO DAYS

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    Innovations Practical Result

    Improved the Process CapabilityTo more than Six Sigma level.

    all Operators about the seriousness ofEducated Vendor Top Management &

    quality of this dimension and also how

    to maintain it.

    Provided the right equipment &educated the vendor supervisor &operators about how to use theequipment.

    Involved the Vendor supervisors indeveloping the control mechanism &plan as well as its execution.

    Four Vendor persons and one LGperson involved in 100 % inspectionremoved.

    Avery tight tolerance of 11microns(10

    -6m) earlier thought unachievable

    was met. A Chronic problem of Washing

    machine line : SD Shaft loose or tightwas solved.

    Leakage problem on the line due toscratches generated because of excessivehandling was also eliminated.

    Total RTN reduced from 56000 toZero .

    Three stages of emery paper rubbing ,rejection from Brite IQC and

    Segregation at our end were eliminated.

    Innovation with 6 Achieve Super A! LGEIL

    ANALYSEANALYSE/Fish Bone Diagram 6

    define controlanalyse

    improvemeasure

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    1 3 .9 7 5 1 3 .9 7 7 1 3 .9 7 9 1 3 .9 8 1 1 3 .9 8 3 1 3 .9 8 5 1 3 .9 8 7

    L S L U S L

    P r o c e s s C a p a b i l i t y A n a ly s i s f o r d i a m

    U S L

    T a r g e t

    L S L

    M e a n

    S a m p l e NS t D e v ( S T )

    S t D e v ( L T )

    C p

    C P U

    C P L

    C p k

    C p m

    P p

    P P U

    P P L

    P p k

    P P M < L S L

    P P M > U S L

    P P M T o ta l

    P P M < L S L

    P P M > U S L

    P P M T o ta l

    P P M < L S L

    P P M > U S L

    P P M T o ta l

    1 3 . 9 8 6 0

    *

    1 3 . 9 7 5 0

    1 3 . 9 8 0 0

    3 00 . 0 0 0 7 5 7 9

    0 . 0 0 1 0 1 1 7

    2 . 4 2

    2 . 6 2

    2 . 2 2

    2 . 2 2

    *

    1 . 8 1

    1 . 9 6

    1 . 6 6

    1 . 6 6

    0 . 0 0

    0 . 0 0

    0 . 0 0

    0 . 0 0

    0 . 0 0

    0 . 0 0

    0 . 3 0

    0 . 0 0

    0 . 3 0

    P r o c e s s D a t a

    P o t e n t i a l ( S T ) C a p a b i l i ty

    O v e r a l l ( L T ) C a p a b i l i ty O b s e r v e d P e r f o r m a n c e E x p e c t e d S T P e r fo r m a n c eE x p e c t e d LT P e r f o r m

    S T

    L T

    1 3 .9 7 0 1 3 .9 7 4 1 3 .9 7 8 1 3 .9 8 2 1 3 .9 8 6

    L S L U S L

    P r o c e s s C a p a b i l i t y A n a ly s i s f o r d i a m

    C a l c u l a ti o n s B a s e d o n W e i b u l l D i s t r i b u t i o n

    U S L

    T a r g e t

    L S L

    M e a n

    S a m p le N

    S h a p e

    S c a l e

    P p

    P P U

    P P L

    P p k

    P P M < L S L

    P P M > U S L

    P P M T o t a l

    P P M < L S L

    P P M > U S L

    P P M T o t a l

    1 3 . 9 8 6 0

    *

    1 3 . 9 7 5 0

    1 3 . 9 7 6 0

    3 0

    1 7 6 9 2 . 1

    1 4 . 0

    1 . 6 4

    2 . 4 0

    0 . 3 6

    0 . 3 6

    0 . 0 0

    0 . 0 0

    0 . 0 0

    1 3 9 1 9 0 . 5 5

    0 . 0 0

    1 3 9 1 9 0 . 5 5

    P r o c e s s D a t a

    O v e r a l l ( L T ) C a p a b i l i ty

    O b s e r v e d L T P e r f o r m a n c e

    E x p e c t e d L T P e r f o r m a n c e

    BEFORE6Cp = 1.5Cpk=0.36

    Cp = 2.42Cpk=2.12

    ImproveImprove/Process Capability definemeasure analyse improve control

    AFTER6

    6

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    1Subgroup 2 3 4 5 6

    13.9785

    13.9795

    13.9805

    13.9815

    SampleMean

    X=13.98

    3.0SL=13.98

    -3.0SL=13.98

    0.000

    0.001

    0.0020.003

    0.004

    0.005

    SampleR

    ange

    R=0.002353

    3.0SL=0.00497

    -3.0SL=0.00E+

    Xbar/R Chart for diameter

    ControlControl /Xbar R Chart 6

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    Date 1 2 3 4 5 6 7 8 9 1012 13 14 15

    X1

    X2

    X3

    X4

    X5

    13.9860

    13.9815

    Remarks

    Total X

    Average x

    Range R

    X Chart

    0.00

    5

    0.00

    4

    0.00

    3

    0.002

    0.00

    R Chart

    In ChargeSupervisorX-R Control Chart(S Shaft Diameter)

    CTQ No.

    IQC -02

    Part Name

    Measuring Unit

    Measuring Method

    S SHAFT( SD Basket)

    mm

    Digital Micrometer

    Spec.

    Spec.Limit

    UpperLower

    Periodical Check

    14.000-0.014-0.025

    13.98613.975

    Model

    Application

    Time period

    All Washing Machines

    W/M Assembly Line

    01/03/2000~15/03/2000

    CheckedBy

    Cpk

    MeasuredValue

    Every 2hours

    13.9785

    13.9750

    13.980

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    CTP (Check Sheet)CTQ

    S Shaft (SD Basket ) 8003

    LINE

    IQC

    CTP No.

    IQC-02-01

    CTP Item

    No. of cuts

    How to checkSpec. Frequency

    Every 2 Hours

    Remarks

    Date

    Month ( )

    2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 2

    9:00

    Measuring SystemIQC-02-02

    IQC-02-03

    6Digital

    Grinding Wheel Every HourDressing

    Every 2 Hours

    IQC-02-04 Control Wheel Dressing Update W.I After 2 days

    11:00

    2:00

    5:00

    11:00

    2:00

    5:00

    9:00

    10.00

    9:00

    CTP Name

    No. of Cuts

    MeasuringSystem

    Cuting Wheel

    Update W.I

    Update W.I

    UpdateW.I

    11.0012.003:004:005:00

    ControlWheel

    2 days

    Signature of

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    0

    10000

    20000

    30000

    40000

    50000

    60000

    Jan Feb Mar Apr May

    REJECTION

    6 SIGMALEVEL

    ZeroRejectionR

    eje

    ctIon

    56k

    22k

    0.1k

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    0

    10000

    20000

    30000

    40000

    50000

    60000

    Jan Feb Mar Apr May

    REJECTION

    6 SIGMALEVEL

    38 k

    62 k 63 k 63 k

    ZeroRejection

    ANNUAL SAVING = 6.27

    LACS

    Reje

    ctIon

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    CTQ Registration Format. 6

    CTQ Description(what is the CTQ)

    CTQ REGISTRATIONCTQ REGISTRATION( SD Shaft Dia Variation)( SD Shaft Dia Variation)

    Zst

    Zlt

    Target Present

    Registration No.

    Date

    Graphical Description (show sketch or photo)

    Measuring System(How to measure)

    Sig

    n

    PjtLdr. Super A CTQ

    InchargeR&D QP

    Gage R&R Specifications Control Limits

    %Study

    Variation% Tolerance LSL USL LCL UCL

    CTP List Document Check List

    S.No. Name Area ofApplication

    CTP Spec. S.No. Document

    !Doc. Reference

    Number

    Shaft Diameter Digital Micrometer ( LC-0.001 mm)

    29.63% 10.47% 13.9750mm

    13.9860mm

    13.9785mm

    13.9815mm

    7.26

    6.36

    1

    2

    3

    4

    Number if cuts

    Measuring sys

    Grinding Wheel

    Control Wheel

    Vendor end

    Vendor end

    Vendor end

    Vendor end

    6

    Digital

    Dressing everyhour

    Dressing every2 days

    6.0

    4.5

    SDShaft

    Approvald

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    Theme Registration66Approval

    Pjt. Leader

    Guide

    Dept. Head

    V.P.

    M.D.

    Period

    18 NOV.99

    to

    17 FEB .00

    Name Sign

    MEMBERS

    Theme :Theme :

    Detailed Description :Detailed Description :

    Q.Fn.(Y) Specification Gauge Name Gauge L.C. Current ( Y ) Target ( Y )

    Process Map With Yield of each processProcess Map With Yield of each process Logic Tree of Worst ProcessLogic Tree of Worst Process

    Request To M.D.Request To M.D.Estimated Contribution after Project

    Qualitative Quantitative (Rs. Lacs)

    Sanjay Arora

    C. Khosla

    A.K.Jindal

    H.G.Choi

    N.C.Upreti

    V.Madaan

    NO. OF

    SET UP REJ. NIL NILNIL 80,000 PPM 3.4 PPM

    OPTIMISING SET UP COND FOR PROJ. WELDING

    FOR MS-283/304 MWO CAVITY.

    * HIGH REJECTION DUE TO UN OPTIMISED SET UP CONDITIONS.

    * THE LOSS IS APPROX RS.400 PER CAVITY.

    * IT IS A CTQ AS IF THE Pcs GO UNDETECTED THESE CAN LEAD

    TO FAILURE OF THE M/C & HAMPER MARKET POSITION.

    Inspection

    of sheetsU-Bending

    Back Short

    Welding

    Fr. Short

    Welding

    TT Bkt

    Welding

    Balance

    Checking

    Wv Gd/Mgt

    Welding

    Lo-Up

    Welding

    Back Long

    WeldingFr. Long

    Welding

    Hng. Plt

    Welding

    Shift To

    MW Line

    Set Up Rej.

    of MS-283/304

    Welding

    Pressure

    Welding

    Current

    Dimple

    Height

    Contact

    Time

    Sheet

    Chemistry

    Rs. 400,000* Improvement inRejection

    Measure

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    6DefineMeasure

    Analyse Improve ControlMeasure / Gage R&R

    LG ElectronicsInnovation with Achieve Super A! 6

    StdDev Study Var %Study Var %Tolerance

    Source (SD) (5.15*SD) (%SV) (SV/Toler)

    Total Gage R&R 1.36E-03 0.006997 6.44 5.60

    Repeatability 1.34E-03 0.006878 6.33 5.50

    Reproducibility 2.49E-04 0.001283 1.18 1.03Operator 2.49E-04 0.001283 1.18 1.03

    Part-To-Part 2.11E-02 0.108451 99.79 86.76

    Total Variation 2.11E-02 0.108677 100.00 86.94

    Number of Distinct Categories = 22

    Gage Used For Measurement of Dimple Height : Puppy Dial

    Least Count= 0.001 mm

    As Gage R&R % Study Variation & % Tolerance is less than 20% hence we can use this gage for dimple height

    variation study

    Sample Jindal Jindal2 V .M adaan V.Madaan2

    1 1.295 1.293 1.295 1.292

    2 1.299 1.299 1.299 1.299

    3 1.289 1.29 1.284 1.287

    4 1.322 1.322 1.322 1.322

    5 1.305 1.3 1.302 1.305

    6 1.279 1.279 1.279 1.279

    7 1.298 1.3 1.298 1.298

    8 1.302 1.302 1.302 1.302

    9 1.348 1.348 1.348 1.348

    10 1.333 1.33 1.33 1.331

    Measure

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    6DefineMeasure

    Analyse Improve ControlMeasure / Gage R&R

    LG ElectronicsInnovation with Achieve Super A! 6

    1 .1 5 1 .2 0 1 .2 5 1 .3 0 1 .3 5 1 .4 0

    L S L U S L

    D i m p l e H t.P r o c e s s C a p a b i li ty A n a l ys i s f o r

    U S L

    T a rg e t

    L S L

    M e a n

    S a m p l e N

    S t D e v ( W i t h i n)

    S tD e v (O v e ra l l )

    C p

    C P U

    C P L

    C p k

    C p m

    P p

    P P U

    P P L

    P p k

    P P M < L S L

    P P M > U S L

    P P M T o ta l

    P P M < L S L

    P P M > U S L

    P P M T o ta l

    P P M < L S L

    P P M > U S L

    P P M T o ta l

    1 . 3 7 5 0 0

    *

    1 . 2 2 5 0 0

    1 . 2 9 0 4 4

    1 25

    0 . 0 2 5 8 1 6 4

    0 . 0 4 2 1 1 3 7

    0 .9 7

    1 .0 9

    0 .8 4

    0 .8 4

    *

    0 .5 9

    0 .6 7

    0 .5 2

    0 .5 2

    4 0 0 0 0 . 0 0

    4 0 0 0 0 . 0 0

    8 0 0 0 0 . 0 0

    5 6 2 4 . 1 2

    5 2 7 . 6 1

    6 1 5 1 . 7 3

    6 0 1 0 0 . 5 6

    2 2 3 2 9 . 1 6

    8 2 4 2 9 . 7 2

    P r o c e s s D a t a

    P o te n t i a l (W i th i n ) C a p a b i l i t y

    O v era ll C ap ab il ity O bs e rv e d P e rfo rm a nc e E x p . "W i th in " P e rf orm a nc e E x p . "Ov e ra ll " P e rfo rm a n

    W i thin

    Ov e ra l l

    Four Block Diagram

    A B

    C D

    Zst

    Zshift

    1.5

    4.5

    From measurement of dimple Ht. ; which we know is an important factor for quality of welding

    we know that it is a primarily a problem of variation.

    6Analyse

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    Set Up

    Rejection

    Machine

    Method

    Man

    LG ElectronicsInnovation with Achieve Super A! 6

    VOLTAGELEVELPRESSURE

    ELECTRODES GAPELECTRODES

    DRESSING

    CAVITY TPR

    DURING WELDING

    PARAMETERS

    NOT DEFINED PROPERLY

    Material

    DIMPLE HEIGHT

    VARIATION

    PROFILEOF

    DIMPLE CONTACT

    TIME

    SHEET

    CHEMISTRY

    6Define MeasureAnalyse

    Improve ControlAnalyse / 4-M Diagram

    6Measure

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    Sheet

    Sheet

    DIMPLE WITH CONICAL PROFILE

    DIMPLE WITH TOMB PROFILE

    LG ElectronicsInnovation with Achieve Super A! 6

    6DefineMeasure

    Analyse Improve ControlAnalyse / Dimple Profile

    Two proportion test to examine the effect of dimple profile on no. of weak joints during

    projection welding.

    Test and CI for Two Proportions

    Sample X N Sample p

    Tomb Type 3 42 0.071429

    Conical 13 42 0.309524

    Estimate for p(1) - p(2): -0.238095

    95% upper bound for p(1) - p(2): -0.103783

    Test for p(1) - p(2) = 0 (vs < 0): Z =

    -2.92

    P-Value = 0.002

    We have established that the dimple profile is having an effect on welding quality.Tomb

    profile is better.

    6Analyse

    A l / Di l P fil

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    LG ElectronicsInnovation with Achieve Super A! 6

    6Define MeasureAnalyse

    Improve ControlAnalyse / Dimple Profile

    1.381.361.341.321.301.281.261.241.22

    U SLL S L

    P r o c e s s C a p a b i l i ty A n a l y s i s fo r C 4 5

    P P M T o ta l

    P P M > U S L

    P P M < L S L

    P P M T o t al

    P P M > U S L

    P P M < L S L

    P P M T ot a l

    P P M > U S L

    P P M < LS L

    P pk

    P P L

    P P U

    P p

    C pm

    C pk

    C P L

    C P U

    C p

    S tD e v (Ove ra l l)

    S tD e v (W i th in )

    S a m p l e N

    Me a n

    LS L

    TargetU S L

    8.68

    0.42

    8.25

    0.00

    0.00

    0.00

    0.00

    0.00

    0.00

    1.44

    1.44

    1.64

    1.54

    *

    2.45

    2.45

    2.81

    2.63

    0.0162463

    0.0095059

    12 5

    1.29498

    1.22500

    *1.37500

    E xp. "Overa l l " P erformancE xp . " Wi th i n " Pe r fo rma n ceOb se rve d P e r fo rma n ceOve ra l l C a p a b i li t y

    P otentia l (W i th in) Capabi l i ty

    P ro ce ss D a ta

    W ith in

    O v e r a l l

    1 .1 5 1 .2 0 1 .2 5 1 .3 0 1 .3 5 1 .4 0

    L S L U S L

    D i m p l e H t.P r o c e s s C a p a b i li ty A n a l ys i s fo r

    U S LT a rg e t

    L S L

    M e a n

    S a m p l e N

    S t D e v ( W i t h i n )

    S tD e v (O v e ra l l )

    C p

    C P U

    C P LC p k

    C p m

    P p

    P P U

    P P L

    P p k

    P P M < L S L

    P P M > U S L

    P P M T o t a l

    P P M < L S L

    P P M > U S L

    P P M T o ta l

    P P M < L S L

    P P M > U S L

    P P M T o ta l

    1 . 3 7 5 0 0*

    1 . 2 2 5 0 0

    1 . 2 9 0 4 4

    1 2 5

    0 . 0 2 5 8 1 6 4

    0 . 0 4 2 1 1 3 7

    0 .9 7

    1 .0 9

    0 .8 40 .8 4

    *

    0 .5 9

    0 .6 7

    0 .5 2

    0 .5 2

    4 0 0 0 0 . 0 0

    4 0 0 0 0 . 0 0

    8 0 0 0 0 . 0 0

    5 6 2 4 . 1 2

    5 2 7 . 6 1

    6 1 5 1 . 7 3

    6 0 1 0 0 . 5 6

    2 2 3 2 9 . 1 6

    8 2 4 2 9 . 7 2

    P r o c e s s D a t a

    P o te n t i a l (W i th i n ) C a p a b i l i t y

    O v era ll Ca pa b il it y O bs e rv e d P e rfo rm a nc e E x p . "W i th in " P e rf orm a nc e E x p . "O ve ra ll " P e rfo rm a n

    W i thin

    Ov e ra l l

    The press die dimple profiles were changed as per previous test inference. Also the punches

    which were varying in height were made same.With this direct improvement the process

    capability of dimple height improved from 0.97 to 2.63.

    6

    I / SS C it

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    PG PSP voltage O.K N.G. Response(%o.k)

    3.000 1.000 270 2 10 0.167

    4.500 1.000 270 1 11 0.083

    3.000 1.500 270 4 9 0.308

    4.500 1.500 270 0 13 0.000

    3.000 1.000 320 11 1 0.917

    4.500 1.000 320 2 10 0.167

    3.000 1.500 320 11 2 0.846

    4.500 1.500 320 6 7 0.462

    3.750 1.250 295 4 8 0.333

    3.750 1.250 295 8 5 0.615

    3.750 1.250 295 3 9 0.250

    3.750 1.250 295 7 6 0.538

    2.525 1.250 295 11 1 0.917

    4.975 1.250 295 5 8 0.385

    3.750 0.842 295 4 8 0.333

    3.750 1.658 295 5 8 0.385

    3.750 1.250 254 2 10 0.167

    3.750 1.250 336 8 5 0.615

    Response Surface Regression: r versus PG, voltageThe analysis was done using coded units.

    Estimated Regression Coefficients for r

    Term Coef SE Coef T P

    Constant 0.4285 0.04016 10.671 0.000

    Block -0.0383 0.04016 -0.955 0.356

    PG -0.1796 0.04399 -4.082 0.001

    voltage 0.1925 0.04399 4.375 0.001

    S = 0.1606 R-Sq = 72.4%R-Sq(adj) = 66.5%

    Analysis of Variance for r

    Source DF Seq SS Adj SS Adj MS F P

    Blocks 1 0.02351 0.02351 0.02351 0.91 0.356

    Regression 2 0.92387 0.92387 0.46194 17.90 0.000

    Linear 2 0.92387 0.92387 0.46194 17.90 0.000

    Residual Error 14 0.36127 0.36127 0.02581

    Lack-of-Fit 6 0.21210 0.21210 0.03535 1.90 0.198

    Pure Error 8 0.14918 0.14918 0.01865

    Total 17 1.30866

    LG ElectronicsInnovation with Achieve Super A! 6

    6Define Measure Analyse Improve ControlImprove / SS CavityWe know from past setting experience that three parameters (PG - Pressure Gauge. PSP &

    Voltage ) have a crucial impact on welding quality. We did RSM to establish the best machine

    condition.

    After Analysis of RSM model , we realise that PSP is not a vital few factor and hence is

    removed from the regression equation.

    I / SS C it (Wi f Pl t) 6Improve

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    0.0

    0.5r

    34PG

    3

    1.0

    270260

    5

    250

    330320

    310300

    290

    voltage280270260

    340330

    voltage

    Surface Plot of r ( %age O.K.)

    LG ElectronicsInnovation with Achieve Super A! 6

    Improve / SS Cavity (Wireframe Plot)

    Best Condition :

    Voltage :310

    PG :2.8

    By the Wire Frame plot we establish the best condition for SS-cavity

    6Define Measure AnalyseImprove

    Control

    I / G S C it 6

    Improve

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    voltpsppg

    320

    270

    1 .51 .04 .53.0

    0.24

    0.18

    0.12

    0.06

    0.00

    resp

    Main Effects Plot (data means) for resp

    320

    270

    1.51

    0.30

    0.15

    0.00

    0.30

    0.15

    0.00

    pg

    psp

    volt

    1.5

    1

    4.5

    3

    Interaction Plot (data means) for resp

    p g p s p v o l t o k r e j r e s p

    3 .0 0 1 .0 0 2 7 0 . 0 03 . 0 0 9 . 0 0 0 . 2 5

    4 .5 0 1 .0 0 2 7 0 . 0 00 .0 0 1 3 .0 0 0 .0 0

    3 .0 0 1 .5 0 2 7 0 . 0 04 . 0 0 8 . 0 0 0 . 3 34 .5 0 1 .5 0 2 7 0 . 0 00 .0 0 1 3 .0 0 0 .0 0

    3 .0 0 1 .0 0 3 2 0 . 0 00 .0 0 1 3 .0 0 0 .0 0

    4 .5 0 1 .0 0 3 2 0 . 0 00 .0 0 1 2 .0 0 0 .0 0

    3 .0 0 1 .5 0 3 2 0 . 0 05 . 0 0 8 . 0 0 0 . 3 84 .5 0 1 .5 0 3 2 0 . 0 00 .0 0 1 3 .0 0 0 .0 0

    LG ElectronicsInnovation with Achieve Super A! 6

    Improve / GpSp Cavity 6Define Measure AnalyseImprove

    Control

    We know from past setting experience that three parameters (PG - Pressure Gauge. PSP &

    Voltage ) have a crucial impact on welding quality. We did 2 level factorial design to establish the

    vital few.

    We conclude that PG & PSP seem to have more effect than voltage in this case.There is

    also mild interaction between all factors.

    I / G S C it 6

    Improve

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    Response Surface Regression: resp versus pg, psp

    The analysis was done using coded units.

    Estimated Regression Coefficients for resp

    Term Coef SE Coef T P

    Constant 0.0309 0.03810 0.812 0.432

    Block -0.0368 0.02865 -1.284 0.222

    pg -0.1856 0.03113 -5.963 0.000

    psp 0.0634 0.03113 2.035 0.063

    pg*pg 0.1402 0.03262 4.298 0.001

    S = 0.1137 R-Sq = 82.6% R-Sq(adj) = 77.2%

    Analysis of Variance for resp

    Source DF Seq SS Adj SS Adj MS F P

    Blocks 1 0.043849 0.021291 0.021291 1.65 0.222

    Regression 3 0.751804 0.751804 0.250601 19.39 0.000

    Linear 2 0.513070 0.513070 0.256535 19.85 0.000Square 1 0.238735 0.238735 0.238735 18.47 0.001

    Residual Error 13 0.168013 0.168013 0.012924

    Lack-of-Fit 5 0.130239 0.130239 0.026048 5.52 0.017

    Pure Error 8 0.037773 0.037773 0.004722

    Total 17 0.963666

    pg psp volts ok rej resp

    3.00 1.00 270 3 9 0.250

    4.50 1.00 270 0 13 0.000

    3.00 1.50 270 4 8 0.333

    4.50 1.50 270 0 13 0.000

    3.00 1.00 320 0 13 0.000

    4.50 1.00 320 0 12 0.0003.00 1.50 320 5 8 0.385

    4.50 1.50 320 0 13 0.000

    3.75 1.25 295 1 11 0.083

    3.75 1.25 295 0 13 0.000

    3.75 1.25 295 0 12 0.000

    3.75 1.25 295 0 13 0.000

    2.53 1.25 295 12 1 0.923

    4.97 1.25 295 0 12 0.000

    3.75 0.84 295 0 13 0.000

    3.75 1.66 295 3 10 0.231

    3.75 1.25 254 0 12 0.000

    3.75 1.25 336 0 13 0.000

    LG ElectronicsInnovation with Achieve Super A! 6

    Improve / GpSp Cavity 6Define Measure AnalyseImprove

    Control

    We have done RSM to optimise the welding machine settings for GpSp cavity.We have used the

    Central composite design.

    We conclude that the main effect is of PG(Pressure gauge) & PSP has some effect.But

    voltage which was very important in SS case is not important in GpSp.

    Impro e / GpSp Ca it 6Improve

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    0.0

    0.5

    resp

    34

    pg3

    1.0

    1.00.9

    5

    0.8

    1.51.41.31.2 psp1.1

    1.00.9

    1.71.6

    1.5

    psp

    LG ElectronicsInnovation with Achieve Super A! 6

    Improve / GpSp Cavity 6Define Measure AnalyseImprove

    Control

    Best Condition :

    PSP :1.3

    PG :2.8

    Through Wire frame plot we establish the best condition for GpSp Cavity.

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    Rejection Trend 6

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    Rejection Trend 6Define Measure Analyse Improve Control

    0

    20000

    40000

    60000

    80000

    November

    January

    M

    arch

    May

    July

    PPM

    PPM

    6 Project