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DATA SHEET
SILICON TRANSISTOR
2SC3356
MICROWAVE LOW NOISE AMPLIFIER
NPN SILICON EPITAXIAL TRANSISTOR
DATA SHEET
Document No. P10356EJ5V1DS00 (5th edition)
Date Published March 1997 NPrinted in Japan 19
DESCRIPTION
The 2SC3356 is an NPN silicon epitaxial transistor designed for low
noise amplifier at VHF, UHF and CATV band.
It has dynamic range and good current characteristic.
FEATURES
Low Noise and High Gain
NF = 1.1 dB TYP., Ga = 11 dB TYP. @VCE = 10 V, IC = 7 mA, f = 1.0 GHz
High Power Gain
MAG = 13 dB TYP. @VCE = 10 V, IC = 20 mA, f = 1.0 GHz
ABSOLUTE MAXIMUM RATINGS (TA = 25 C)
Collector to Base Voltage VCBO 20 V
Collector to Emitter Voltage VCEO 12 V
Emitter to Base Voltage VEBO 3.0 V
Collector Current IC 100 mA
Total Power Dissipation PT 200 mW
Junction Temperature Tj 150 C
Storage Temperature Tstg 65 to +150 C
ELECTRICAL CHARACTERISTICS (TA = 25 C)
CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT TEST CONDITIONS
Collector Cutoff Current ICBO 1.0 A VCB = 10 V, IE = 0
Emitter Cutoff Current IEBO 1.0 A VEB = 1.0 V, IC = 0
DC Current Gain hFE* 50 120 300 VCE = 10 V, IC = 20 mA
Gain Bandwidth Product fT 7 GHz VCE = 10 V, IC = 20 mA
Feed-Back Capacitance Cre** 0.55 1.0 pF VCB = 10 V, IE = 0, f = 1.0 MHz
Insertion Power Gain
S21e
2
11.5 dB VCE = 10 V, IC = 20 mA, f = 1.0 GHz
Noise Figure NF 1.1 2.0 dB VCE = 10 V, IC = 7 mA, f = 1.0 GHz
* Pulse Measurement PW
350
s, Duty Cycle
2 %
** The emitter terminal and the case shall be connected to the guard terminal of the three-terminal capacitance bridge.
hFE Classification
Class R23/Q * R24/R * R25/S *
Marking R23 R24 R25
hFE 50 to 100 80 to 160 125 to 250 * Old Specification / New Specification
PACKAGE DIMENSIONS
(Units: mm)
1.5
2
13
Marking
PIN CONNECTIONS
1.2.3.
EmitterBaseCollector
2.80.2
2.9
0
.2
1.1
to1
.4
0
to0
.1
0.9
5
0.3
0.95
0.4
+0.1
0.0
5
0.4
+0.1
0.0
5
0.1
6+0.1
0.0
6
0.65+0.10.15
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TYPICAL CHARACTERISTICS (TA = 25 C)
TOTAL POWER DISSIPATION vs.AMBIENT TEMPERATURE
200
100
0
10
20
50
100
200
50
1 5 10 500.5
100 150
TA-Ambient Temperature-C
IC-Collector Current-mA
DC CURRENT GAIN vs.COLLECTOR CURRENT
PT-To
talPower
Dissipa
tion-m
W
hFE-D
CCurren
tGa
in
VCE = 10 V
0
5
10
15
0.5 1 5 10 50 70
IC-Collector Current-mA
INSERTION GAIN vs.COLLECTOR CURRENT
|S21e
|2-Insert
ion
Ga
in-d
B
VCE = 10 Vf = 1.0 GHz
0.3
0.5
1
2
0 0.5 1 2 5 10 20 30
VCB-Collector to Base Voltage-V
FEED-BACK CAPACITANCE vs.COLLECTOR TO BASE VOLTAGE
Cre-Feed-backCapaci
tance-pF
f = 1.0 MHz
0.1
0.2
0.3
0.5
1.0
2.0
3.0
5.0
10
0 0.5 1.0 105.0 30
IC-Collector Current-mA
GAIN BANDWIDTH PRODUCT vs.COLLECTOR CURRENT
fT-G
ainBan
dw
idthPro
duc
t-MHz
VCE = 10 V0
10
20
0.1 0.2 0.4 0.6 0.81.0 2
f-Frequency-GHz
INSERTION GAIN, MAXIMUM GAINvs. FREQUENCY
Gmax-Max
imum
Ga
in-d
B
|S21e
|2-Insert
ion
Ga
in-d
B
VCE = 10 VIC = 20 mA
Gmax
|S21e|2
Free Air
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2SC3356
0
2
1
5
4
3
7
6
0.5 1 5 10 50 70
IC-Collector Current-mA
NOISE FIGURE vs.COLLECTOR CURRENT
NF-NoiseFigure-dB
VCE = 10 Vf = 1.0 GHz
5
4
3
2
1
0
18
15
12
6
3
02 4 6 8 10
VCE-Collector to Emitter Voltage-V
NOISE FIGURE, FORWARD INSERTIONGAIN vs. COLLECTOR TO EMITTER VOLTAGE
NF-NoiseFigure-dB
|S21e|2-Inse
rtionGain-dB
f = 1.0 GHzIC = 20 mA
|S21e|2
NF
S-PARAMETER
VCE = 10 V, IC = 5 mA, ZO = 50
f (MHz)
S11
S11
S21
S21
S12
S12
S22
S22
200
400
600
800
1000
1200
1400
1600
1800
2000
0.651
0.467
0.391
0.360
0.360
0.361
0.381
0.398
0.423
0.445
69.3
113.3
139.3
159.2
176.9
172.7
160.3
152.2
143.3
137.6
10.616
6.856
4.852
3.802
3.098
2.646
2.298
2.071
1.836
1.689
129.3
104.4
90.9
81.2
72.9
67.3
59.3
55.2
49.0
46.2
0.051
0.071
0.086
0.101
0.118
0.137
0.157
0.180
0.203
0.220
59.2
54.4
56.0
59.1
61.0
63.5
63.3
64.1
63.7
64.7
0.735
0.550
0.468
0.426
0.397
0.373
0.360
0.337
0.320
0.302
28.1
34.1
33.9
33.6
35.7
38.3
43.0
45.9
52.3
52.2
VCE = 10 V, IC = 5 mA, ZO = 50
f (MHz) S11 S11 S21 S21 S12 S12 S22 S22
200
400
600
800
1000
1200
1400
1600
1800
2000
0.339
0.258
0.243
0.242
0.260
0.269
0.294
0.314
0.343
0.367
107.0
147.3
167.7
177.0
164.5
157.6
148.7
143.1
136.5
131.4
16.516
8.928
6.022
4.633
3.744
3.193
2.750
2.479
2.185
2.016
108.7
92.1
83.0
76.2
69.9
65.7
58.8
55.5
50.1
47.8
0.035
0.060
0.085
0.109
0.136
0.160
0.187
0.212
0.238
0.254
66.1
71.0
71.9
72.2
70.4
69.9
66.7
65.2
62.4
61.6
0.459
0.343
0.305
0.284
0.266
0.246
0.233
0.208
0.190
0.173
36.6
32.9
29.9
29.4
31.7
35.0
40.4
43.6
50.5
48.3
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S-PARAMETER
ANGLEOF
REFLECTI
ON
CO
EFF
CIENT
INDEGREE
S 20
30
40
50
0060
70
8090
100
110
120
130
140
150
160
150
14
0
13
0
12
0
110
10090
80
70
60
50
40
3
0
20
10
0
10
0.28
0.22
0.30
0.20
0.32
0.18
0.34
0.16
0.36
0.140.38
0.12
0.40
0.10
0.42
0.08
0.440
.06
0.46
0.04
0.21
0.19
0.17
0.15
0.130.11
0.09
0.07
0.05
0.03
0.29
0.31
0.33
0.35
0.370.39
0.41
0.43
0.45
0.47
0.0
2
0.4
8
0.0
1
0.4
9
0 0
0.
49
0.
01
0.4
80.0
2
0.4
70.0
3
0.46 0
.04
0.4
5 0.0
5
0.4
4 0.0
6
0.43 0.0
7
0.42
0.08
0.41
0.09
0.40
0.10
0.39
0.11
0.38
0.12
0.37
0.130.36
0.14 0.35
0.150.34
0.16
0.33
0.17
0.32
0.18
0.31
0.19
0.3
0
0.2
0
0.29
0.2
1
0.28
0.22
0.27
0.23
0.26
0.24
0.25
0.25
0.24
0.26
0.23
0.27
WAVELENGTHSTOWARD
LOAD
WAVELENGTH
STOWARDGENERATOR
2.0
50
10
6.0
4.0
3
.0
1.8
1.6
1.4
1.20
.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
1.
0
(+JX
ZO
)
0.2
0.4
0.6
0.8
1.0
0.8
0.7
0.6
0.3
0.2
0.1
0.2
1.0
0.8
0.6
0.4
0.2
1.0
0.8
0.6
0.4
0.4
0.5
5.0
10
50
3.0
4.0
1.8
2.0
1.2
1.
00
.91.4
1.6
REACTANCE COMPONENT
( R
ZO)
NEGAT
IVE
REACTA
NCECOMPONENT
POSITIVE
REACTANCE
COMPO
NENT
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.2
1.4
1.6
1.8
2.0
3.0
4.0
5.0 1
020
0
(JX
ZO)
20
20
0.2
0.4
0.6
0.8
1.0
S11e, S22e-FREQUENCY
S21e-FREQUENCY
90
0
30
30
60
60
180
150
150
120
120
90
5 10 15 20
S21e
0.2 GHz
2.0 GHz
90
0
30
30
60
60
180
150
150
120
120
90
0.05 0.1 0.15 0.2 0.25
S12e
0.2 GHz
2.0 GHz
S12e-FREQUENCY
VCE = 10 V200 MHz Step
CONDITION
VCE = 10 VIC = 20 mA
CONDITION VCE = 10 VIC = 20 mA
CONDITION
0.2 GHz
0.2 GHz
0.2 GHz
2.0 GHz
IC = 20 mA
S22e
S11e
IC = 20 mAIC = 5 mA
IC = 5 mA
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[MEMO]
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[MEMO]
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[MEMO]
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2SC3356
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in thisdocument.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on
a customer designated "quality assurance program" for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
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The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96. 5
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