To interface and associated verification requirements for the control of the electromagnetic interference (emission and susceptibility) characteristics of electronic, electrical, and electromechanical equipment and subsystems designed or procured for use by activities and agencies of the Department of Defense.

Such equipment and subsystems may be used independently or as an integral part of other subsystems or systems.

PURPOSE.

STRATEGY OF EMC RISK

UK Defence Standardization

TEST METHODS

Military Test System

for Transient

Transient Category

External Transient

Internal Transient

A.

B.

1.

2.

3.

1.

2.

.

.

HEMP=High-altitude EM Pulse

OTHER SOURCE

NATURE

NATURE

IMPULSE EXCITATION

*********IMPULSE EXCITATION…..HOW?**********

Impulse Excitation

*********IMPULSE EXCITATION…..HOW?**********

Impulse Excitation

*********IMPULSE EXCITATION…..HOW?**********

Impulse Excitation

*********IMPULSE EXCITATION…..HOW?**********

Impulse Excitation

*********IMPULSE EXCITATION…..HOW?**********

Impulse Excitation

CS115-CS116 TEST

CS115-CS116 TEST

CS115-CS116 TEST

CS115-CS116 TEST

CS115-CS116 TEST

generator

CS115-CS116 TEST

generator

generator

GENERATOR

GENERATOR

For susceptibility measurements, the entire frequency range for each applicable test shall be scanned

frequency scan rates and frequency step sizes of signal sources shall not exceed the values listed in Table III. The rates and step sizes are specified in terms of a multiplier of the tuned frequency (fo) of the signal source.

Analog scans refer to signal sources which are continuously tuned. Stepped scans refer to signal sources which are sequentially tuned to discrete frequencies.

If a controlled video bandwidth is available on the measurement receiver, it shall be set to its greatest value. Larger receiver bandwidths may be used; however, they may result in higher measuredemission levels.

These bandwidths are specified at the 6 dB down points for the overall selectivity curve of the receivers.

Bandwidths.

NO BANDWIDTH CORRECTION FACTORS SHALL BE APPLIED TOTEST DATA DUE TO THE USE OF LARGER BANDWIDTHS.

RF absorber loading diagram

RF absorber loading diagram

General test setup

Test setup for non-conductive surface mounted EUT

Test setup for free standing EUT in shielded enclosure

Test setup for free standing EUT

LISN schematic.

LISN impedance.

CE101 limit for submarine applications, DC

CE101 limit for submarine applications, 50 Hz

CE101 limit for submarine applications, 400 Hz

CE101:Measurement system check

CE101: Measurement setup

RS103:Test equipment configuration

RS103-2. Multiple test antenna locations for frequency > 200 MHz.

Multiple test antenna locations for N positions,D>3 meters

Test setup for RS101

Field StrengthAs specified in Standard (Fig.RS101-1)

Frequency range 30 Hz to 100 kHzModulation nilDwell time 3 Sec

Frequency Step

Frequency Step Size

30 Hz to 100 Hz

3 Hz

100 Hz to 1kHz

10 Hz

1kHz to 100 kHz

100 Hz

Frequency Step Size Antenna10 kHz to 100

kHz1kHz

Parallel element E-Field Generator

100 kHz to 1MHz

10 kHz

1MHz to 5 MHz

20 kHz

5 MHz to 30 MHz

100 kHz

30 MHz to 100 MHz

300 kHz

Biconilog

100 MHz to 200 MHz

1 MHz

200 MHz to 400 MHz

2 MHz

400 MHz to 1 GHz

4 MHz

1 GHz to 3 GHz

5 MHzDouble Ridged

Waveguide Horn

Test setup for RS103

Subrange DetectorsIF

BandwidthStep Size Antenna

CommentsMeas. Time

30Hz - 1kHz MaxPeak 10 Hz 4 HzSensor

0.2s1kHz - 10kHz MaxPeak 100 Hz 40 Hz

0.02 s10kHz - 100kHz MaxPeak 1 kHz 400 Hz

Test setup for RE101

Subrange IF Bandwidth Step Size Antenna Comments10 kHz – 150 kHz 1 kHz 400 Hz Monopole Antenna150 kHz – 30 MHz 10 kHz 4 kHz Monopole Antenna30 MHz – 200 MHz 100 kHz 40 kHz Biconical

200 MHz – 1 GHz

100 kHz 40 kHz Log Periodic

1GHz – 7 GHz

1 MHz 400 kHzDouble Ridged

Waveguide Horn

Test setup for RE102

Test set up for RS105

Test for RS105