22a109a

7/27/2019 22a109a

http://slidepdf.com/reader/full/22a109a 1/17

JEDEC

STANDARD

HERMETICITY

JESD22-A109-A(Revision of JESD22A-109)

JULY 2001

JEDEC SOLID STATE TECHNOLOGY ASSOCIATION

7/27/2019 22a109a


NOTICE

JEDEC standards and publications contain material that has been prepared, reviewed, andapproved through the JEDEC Board of Directors level and subsequently reviewed and approved

by the EIA General Counsel.

JEDEC standards and publications are designed to serve the public interest through eliminating

misunderstandings between manufacturers and purchasers, facilitating interchangeability and

improvement of products, and assisting the purchaser in selecting and obtaining with minimumdelay the proper product for use by those other than JEDEC members, whether the standard is to

be used either domestically or internationally.

JEDEC standards and publications are adopted without regard to whether or not their adoptionmay involve patents or articles, materials, or processes. By such action JEDEC does not assume

any liability to any patent owner, nor does it assume any obligation whatever to parties adopting

the JEDEC standards or publications.

The information included in JEDEC standards and publications represents a sound approach to

product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby an JEDEC standard or

publication may be further processed and ultimately become an ANSI/EIA standard.

No claims to be in conformance with this standard may be made unless all requirements stated inthe standard are met.

Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC Solid State Technology Association, 2500 Wilson

Boulevard, Arlington, VA 22201-3834, (703)907-7560/7559 or www.jedec.org

Published by

JEDEC Solid State Technology Association 2001

2500 Wilson Boulevard

Arlington, VA 22201-3834

This document may be downloaded free of charge, however JEDEC retains the

copyright on this material. By downloading this file the individual agrees not tocharge for or resell the resulting material.

PRICE: Please refer to the current

Catalog of JEDEC Engineering Standards and Publications or call Global Engineering

Documents, USA and Canada (1-800-854-7179), International (303-397-7956)

Printed in the U.S.A.

All rights reserved

7/27/2019 22a109a


PLEASE!

DON’T VIOLATE

THE

LAW!

This document is copyrighted by the JEDEC Solid State Technology Association

and may not be reproduced without permission.

Organizations may obtain permission to reproduce a limited number of copiesthrough entering into a license agreement. For information, contact:

JEDEC Solid State Technology Association

2500 Wilson Boulevard

Arlington, Virginia 22201-3834or call (703) 907-7559

7/27/2019 22a109a


7/27/2019 22a109a


JEDEC Standard No. 22-A109-APage 1

Test Method A109-A(Revision of Test Method A109)

TEST METHOD A109

HERMETICITY

(From JEDEC Board Ballot, JCB-01-01, formulated under the cognizance of the JC-14.1 Subcommittee

on Reliability Test Methods for Packaged Devices.)

1 Scope

The purpose of this test is to determine the effectiveness of the seal of hermetically sealed solid-statedevices.

The seal tests are considered nondestructive. They are intended to be used for 100% screen, lotacceptance, product monitoring or for qualification testing as applicable. The seal tests may also beemployed as end points for other environmental durability tests.

2 Terms and definition

Measured Leak Rate: The measured leak rate is defined as the leak rate of a given package as measuredunder specified conditions and employing a specified test medium. Measured leak rate shall be expressedin units of atmosphere cubic centimeters per second (atm-cc/s).

3 Apparatus

3.1 Test condition A – Helium Fine Leak Test

Apparatus required shall consist of suitable pressure and vacuum chambers and a mass spectrometer-type

leak detector, preset and properly calibrated for a helium leak rate sensitivity to read measured heliumleak rates of 10-9 atm-cc/s He and greater. The volume of the chamber used for leak measurement should

be held to the minimum practical, since this chamber volume has an adverse effect on sensitivity limits.The leak detector indicator shall be calibrated using a diffusion-type calibrated standard leak at least onceduring every working shift.

7/27/2019 22a109a




3 Apparatus (cont’d)

3.2 Test Condition B – Radioisotope Fine Leak Test

The apparatus for this shall consist of:

1) Radioactive tracer gas activation console.

2) Counting equipment consisting of a scintillation crystal, photomultiplier tube, preamplifier, ratemeter,

and krypton-85 reference standards. The counting station shall be of sufficient sensitivity todetermine the radiation level of any krypton-85 tracer gas present within the device. The counting

station shall have a minimum sensitivity corresponding to a leak rate of 10-9

atm-cc/s of krypton-85and shall be calibrated at least once every working shift using krypton-85 reference standards andfollowing the equipment manufacturer’s instruction.

3) A tracer gas consisting of a mixture of krypton-85 and dry nitrogen. The concentration of krypton-85

in dry nitrogen shall be no less than 100 microcuries per atmospheric cubic centimeter. This value

shall be determined at least once per month.

3.3 Test condition C – Perfluorocarbon bubble gross leak

The apparatus for this test shall consist of:

1) A vacuum/pressure chamber for the evacuation and subsequent pressure bombing of devices up to

75 psig for up to 10 hours.

2) A suitable observation container with provisions to maintain the indicator fluid at a temperature of 125 ºC and a filtration system capable of removing particles greater than one micron in size from thefluid.

3) A magnifier with a magnification in the range between 3X and 30X for observation of bubbles

emanating from devices when immersed in the indicator fluid.

4) Sources of perfluorocarbon detector fluids, and perfluorocarbon indicator fluids.

5) A lighting source capable of producing at least 15,000 foot candles in air at a distance equal to that

which the most distant device in the bath will be from the source. The lighting source shall notrequire calibration, but the light level at the point of observation (i.e., where the device under test islocated during observation for bubbles) shall be verified.

6) Suitable calibrated instruments to indicate that test temperatures, pressures and times are as specified.

7) Suitable fixtures to hold the device(s) in the indicator fluid.

7/27/2019 22a109a




3 Apparatus (cont’d)

3.4 Test condition D – Perfluorocarbon vapor detection gross leak

The apparatus for this test shall consist of:

1) A vacuum/pressure chamber for the evacuation and subsequent pressure bombing of devices up to75 psig for up to 12.5 hours.

2) Sources of perfluorocarbon detector fluids.

3) Suitable calibrated instruments to indicate that test temperatures, pressures and times are as specified.

4) A perfluorocarbon vapor detection system capable of detecting vapor quantities equivalent to 0.28 mg

of perfluorocarbon.

5) A calibration source for the vapor detector. The vapor detector shall be calibrated at least once each

working shift per the manufacturer’s instructions.

4 Procedure

Fine and gross leak tests shall be conducted in accordance with the requirements and procedures of thespecified test condition. Testing order shall be fine leak, followed by gross leak. Where bomb pressurespecified exceeds the device package capability, alternative pressure, exposure time and dwell timeconditions may be used provided they satisfy the leak rate, pressure, time relationships which apply, and

provided no less than 30 psia bomb pressure is applied in any case.

4.1 Test condition A – Helium fine leak

4.1.1 Test condition A1, A2

Test condition A1 is a “fixed” method with specified conditions per Table 1 that will ensure the testsensitivity necessary to detect the required measured leak rate (R 1). Test condition A2 is a “flexible”

method that allows the variance of test conditions in accordance with the formula of 4.1.1.3 to detect thespecified equivalent standard leak rate (L) at a predetermined leak rate (R 1).

4.1.1.1 Test conditions A1 and A2 – Procedure applicable to “Fixed” and “Flexible” methods

The completed device(s) shall be placed in a sealed chamber, which is then pressurized with a tracer gas

of 100 +0/-5 percent helium for the required time and pressure. The pressure shall then be relieved andeach specimen transferred to another chamber(s) which are connected to the evacuating system and amass spectrometer-type leak detector. When the chamber(s) is evacuated, any tracer gas which was

previously forced into the specimen will thus be drawn out and indicated by the leak detector as ameasured leak rate (R 1). (The number of devices removed from pressurization for leak testing shall belimited to such that the test of the last device can be completed within 60 minutes for test condition A1 or

within the chosen value of dwell time t2 for test condition A2).

7/27/2019 22a109a




4.1.1 Test condition A1, A2 (cont’d)

4.1.1.2 Test Condition A1 – Fixed Method

The device(s) shall be tested using the appropriate conditions specified in Table 1 for the internal cavity

volume of the package under test. The time t1 is the time under pressure and the time t2 is the maximumtime allowed after release of pressure before the device shall be read. The fixed method shall not be usedif the maximum equivalent standard leak rate limit given in the procurement document is less than thelimits specified herein for the flexible method.

Table 1 — Fixed conditions for test condition A1

Bomb ConditionVolume of

package (cc) Pressure

(psia)

Exposure time

(h)

Maximum

dwell (h)

R1

Reject limit

(atm-cc/s He)

< 0.05 75 2 1 5 x 10-8

0.05 to <0.5 75 4 +0.2/-0 1 5 x 10-8

0.5 to <1.0 45 2 +0.2/-0 1 1 x 10-7

1.0 to <10.0 45 5 +0.5/-0 1 5 x 10-8

10.0 to <20.0 45 10 +1.0/-0 1 5 x 10-8

4.1.1.3 Test condition A2 – Flexible method

Values for bomb pressure exposure time, and dwell time shall be chosen such that actual measured tracer gas leak rate (R 1) readings obtained for the devices under test (if defective) will be greater than theminimum detection sensitivity capability of the mass spectrometer. The devices shall be subjected to a

minimum of 2 atmospheres absolute of helium pressure. If the chosen dwell time (t2) is greater than 60minutes, graphs shall be plotted to determine an R 1 value which will assure overlap with the selectedgross leak test condition. The chosen values, in conjunction with the value of the internal volume of the

device package to be tested and the maximum equivalent standard leak rate (L) limit (as shown below or as specified in the applicable procurement document), shall be used to calculate the measured leak rate

(R 1) limit using the following formula:

Where:

R 1 = The measured leak rate of tracer gas (He) through the leak in atm-cc/s (He).

L = Equivalent standard leak rate in atm-cc/s (air).

Pe = The pressure of exposure in atmospheres absolute.Po = The atmospheric pressure in atmospheres absolute. (1)MA = The molecular weight in air in grams. (28.7)M = The molecular weight of the tracer gas (He) in grams. (4)

t1 = The time of exposure to Pe, in seconds.t2 = The dwell time between release of pressure and leak detection, in seconds.v = The internal free volume of the device package cavity in cubic centimeters.

R L P

P

M

M

L T

V P

M

M

L T

V P

M

M

e

o

A

o

A

o

A

1

1 21=

⋅

⋅ ⋅ − −

⋅

⋅

⋅ −

⋅

⋅

exp exp

7/27/2019 22a109a




4.1.1 Test condition A1, A2 (cont’d)

4.1.1.4 Failure criteria

Unless otherwise specified, devices with an internal cavity volume of 0.01 cc or less shall be rejected if

the equivalent standard leak rate (L) exceeds 5x10-8 atm-cc/s (air). Devices with an internal cavityvolume greater than 0.01 cc and equal to or less than 0.5 cc shall be rejected if the equivalent standardleak rate (L) exceeds 1x10-7 atm-cc/s (air).

4.2 Test condition B – Radioisotope fine leak test

4.2.1 Activation parameters

The activation pressure and soak time shall be determined in accordance with the following equation:

Where:

QS = The maximum calculated leak rate allowable, in atm-cc/s Kr, for the devices to be tested.

R = Counts per minute above the ambient background after activation if the device leak rate were

exactly equal to QS. This is the reject count above the background of both the countingequipment and the component, if it has been through prior radioactive leak tests.

s = The specific activity, in microcuries per atmospheric cubic centimeter, of the krypton-85 tracer gas in the activation system.

K = The overall counting efficiency of the scintillation crystal in counts per minute per microcurie of krypton-85 in the internal void of the specific component being evaluated. This factor dependsupon component configuration and dimensions of the scintillation crystal. The countingefficiency shall be determined in accordance with 4.2.2.

P = Pe2

– Pi2, where Pe is the activation pressure in atmospheres absolute, and P i is the original

internal pressure of the device in atmospheres absolute. The activation pressure (Pe) may beestablished by specification or if a convenient soak time (T) has been established, the activation

pressure (Pe) can be adjusted to satisfy equation (1).

t = Conversion factor, 3600 seconds per hour.

NOTE The complete version of equation (1) contains a factor [Po2 – ∆P2] in the numerator which is a correction

factor for elevation above sea level. Po is sea level pressure in atmospheres between the actual pressure at the test

station and sea level pressure. For the purpose of this test method, this factor has been dropped.

QS R

s K T P t =

⋅ ⋅ ⋅ ⋅

7/27/2019 22a109a




4.2 Test condition B – Radioisotope fine leak test (cont’d)

4.2.2 Determination of counting efficiency (k)

The counting efficiency (k) of equation (1) shall be determined as follows:

1) Five representative units of the device type being tested shall be tabulated and the internal void of thedevice shall be backfilled through the tabulation with a known volume and known specific activity of krypton-85 tracer gas and the tabulation shall be sealed off.

2) The counts per minute shall be directly read in the shielded scintillation crystal of the counting station

in which the devices are read. From this value, the counting efficiency, in counts per minute per microcurie, shall be calculated.

4.2.3 Evaluation of surface sorption

All device encapsulations consisting of glass, metal, and ceramic or combinations thereof, including

coatings and external sealants, shall be evaluated for surface sorption of krypton-85 before establishingthe leak test parameters. Representative samples of the questionable material shall be subjected to the

predetermined pressure and time conditions established for the device configuration as specified in 4.2.1.The samples shall then be counted every 10 minutes, with count rates noted, until the count rate becomes

asymptotic with time (this is the point in time at which surface sorption is no longer a problem). Thistime lapse shall be noted and shall determine the “wait time” specified in 4.2.4.

4.2.4 Procedure

The devices shall be placed in a radioactive tracer gas activation tank. The activation chamber may be partially filled with inert material to reduce pumpdown time. The tank shall be evacuated to 0.5 torr. Thedevices shall be subjected to a minimum of 2 atmospheres absolute pressure of krypton-85/dry nitrogen

mixture for a minimum of 12 minutes. Actual pressure and seal time shall be determined in accordancewith 4.2.1. The R value in counts per minute shall not be less than 600 above background. The krypton-

85/dry nitrogen gas mixture shall be evacuated to storage until 0.5 torr vacuum exists in the activationtank. This evacuation shall be completed within 3 minutes maximum. The activation tank shall then be

backfilled with air (air wash). The devices shall the be removed from the activation tank and leak tested

within 1 hour after gas exposure with a scintillation crystal-equipped counting station. Deviceencapsulations that do not come under the requirements of 4.2.3 may be tested without a “wait time”.

The number of devices removed from pressurization for leak testing shall be limited such that the test of the last device can be completed within 1 hour. The actual leak rate of the component shall be calculatedwith the following equation:

Where:

Q = actual leak rate in atm-cc/s, and QS and R are defined in 4.2.1.

( )

Q

actual r eadout i n net counts per ute QS

R=

⋅ _ _ _ _ _ _ min

7/27/2019 22a109a




4.2 Test condition B – Radioisotope fine leak test (cont’d)

4.2.5 Failure criteria

Unless otherwise specified, devices that exhibit a leak rate equal to or greater than 5 x 10-8 atm-cc/s

(calculated Q) shall be considered failures.

4.2.6 Personnel precautions

Federal, some state and local governmental regulations require a license for the possession and use of krypton-85 leak test equipment. In the use of radioactive gas, these regulations and their maximum

permissible exposure and tolerance levels prescribed by law should be observed.

4.3 Test condition C – Perfluorocarbon bubble gross leak

4.3.1 Procedure

1) The devices shall be placed in a vacuum/pressure chamber and the pressure reduced to 5 torr andmaintained for a minimum of 30 minutes except that, for devices with an internal volume > 0.1 cc,

this vacuum cycle may be omitted.

2) A sufficient amount of detector fluid shall be admitted to cover the devices. When a vacuum cycle is performed, the fluid shall be admitted after the one-hour period, but before breaking the vacuum.

3) The pressure shall then be increased to 60 +15/-0 psig for a duration of 2 hours minimum. For devices with an internal cavity volume of less than 0.05 cc, an acceptable alternate condition is a

pressure of 75 +5/-0 psig for one hour minimum. For devices with an internal cavity volume > 0.1 cc,if the package cannot be subjected to 60 +15/-0 psig, the pressure shall be decreased to 30 +15/-0 psig(or 45 +5/-0 psig if the vacuum cycle was omitted) and maintained for a duration of 10 hours

minimum.

Pressure

psia psig

Duration (h) Comment

15 30 N/A Note 1

30 45 23.5 Note 2

45 60 8

60 75 4

75 90 2

90 105 1

105 120 0.5

NOTE 1 For modules which cannot withstand 60 psig and require preconditioning.

NOTE 2 For modules which cannot withstand 60 psig and do not require preconditioning.

4) At the end of this time, the pressure shall be released and the device removed from the pressurechamber and retained continuously immersed in a bath of the detector fluid. When the devices areremoved from the bath, they shall be dried for 2 +/- 1 minutes in air prior to immersion indicator

fluid, which shall be maintained at 125 ºC +/- 5 ºC.

7/27/2019 22a109a




4.3 Test condition C – Perfluorocarbon bubble gross leak (cont’d)

4.3.1 Procedure (cont’d)

5) The devices shall be immersed with the uppermost portion at a minimum depth of 2 inches below the

surface of the indicator fluid, one at a time or in such a configuration that a single bubble from asingle device out of a group under observation may be clearly observed as to its occurrence andsource.

6) The device shall be observed against a dull, non-reflective black background through the magnifier,while illuminated by the lighting source, from the instant of immersion until expiration of a 30-

second minimum observation period, unless rejected earlier.


A definite stream of bubbles or two or more large bubbles originating from the same point shall be cause

for rejection.

4.3.3 Precautions

The following precautions shall be observed in conducting the perfluorocarbon gross leak test:

1) Perfluorocarbons shall be filtered through a filter system capable of removing particles greater than 1micron prior to use. Bulk filtering and storage is permissible. Liquid which has accumulated

observable quantities of particulate matter during use shall be discarded or reclaimed by filtration for reuse. Precaution should be taken to prevent contamination.

2) The observation container shall be filled to assure coverage of the device to a minimum of 2 inches.

3) Devices to be tested should be free from foreign materials on the surface, including conformalcoatings and any markings that may contribute to erroneous test results.

4) A lighting source capable of producing at least 15,000 foot candles in air at a distance equal to thatwhich the most distant device in the bath will be from the source. The lighting source shall not

require calibration but the light level at the point of observation (i.e., where the device under test islocated during observation for bubbles) shall be verified.

5) Precaution should be taken to prevent operator injury due to package rupture or violent evolution of bomb fluid when testing large packages.

7/27/2019 22a109a




4.4 Perfluorocarbon vapor detection gross leak

4.4.1 Procedure

The devices shall be placed in a vacuum/pressure chamber and the pressure reduced to 5 torr and

maintained for 30 minutes minimum. A sufficient amount of detector fluid shall be admitted to the pressure chamber to cover the devices. The fluid shall be admitted after the 30 minute minimum vacuum period, but before breaking the vacuum. The devices shall then be pressurized to 75 psig minimum. The pressure shall be maintained for a period of 30 minutes minimum. If the devices will not withstand the

75 psig minimum test pressure, the pressure may be lowered to 30 psig minimum and the pressuremaintained for 2.5 hours minimum. If the devices will not withstand the 30 psig, the pressure may be

lowered to 15 psig minimum and maintained for 12.5 hours minimum. Upon completion of the pressurization period, the pressure shall be released, the devices removed from the pressure chamber without being removed from a bath of detector fluid for more than 20 seconds and then retained in a bath

of fluorocarbon fluid. When the devices are removed from the fluid, they shall be air dried for aminimum of 20 seconds and a maximum of 5 minutes prior to the test cycle. The devices shall then be

tested with a perfluorocarbon vapor detector that is calibrated per 2.4(4) and 2.4(5). “Purge” time shall be

in accordance with Table 2. Test time shall be a minimum of 3.5 seconds, unless the devices are rejectedearlier, with the fluorocarbon vapor detector purge chambers at 125 +/- 15 ºC and the test chamber at 125

+/- 5 ºC, or a minimum of 2.5 seconds with the purge chambers at 150 +0/-25 ºC and the test chamber at150 +/- 5 ºC.

NOTE Air-dry, purge and test limits for each device shall be complied with in all cases, including stick-to-stick

handling.


A device shall be rejected if the detector instrumentation indicates more than 200.

Table 2 — Purge timePackage with internal free volume (cc) Maximum purge time (seconds)

0 to 0.01 5

>0.01 to 0.10 9

>0.10 13

NOTE Maximum purge time can be determined by cycling a device with a 0.02 to 0.05 inch hole and measuring

the maximum purge time that can be used without permitting the device to escape detection.

4.4.3 Precaution

The following precautions shall be observed in conducting a perfluorocarbon gross leak test:

The perfluorocarbon shall be filtered through a filter system capable of removing particles greater than 1micrometer prior to use. Bulk filtering and storage is permissible. Liquid that has accumulatedobservable quantities of particulate matter during use shall be discarded or reclaimed by filtration for

reuse. Precaution should be taken to prevent contamination.

7/27/2019 22a109a




5 Summary

The following details shall be specified in the applicable procurement document.

a) Accept or reject leak rate for test condition B when other than the accept or reject leak rate specifiedherein applies (see 4.2.4).

b) Order of performance of fine and gross if other than fine followed by gross (see clause 3).

c) The device package pressure rating, if that rating is less than 60 psig.

d) Sample size and quality level.

7/27/2019 22a109a


7/27/2019 22a109a


7/27/2019 22a109a
