2005 September

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Vol. 19, No. 3 The Newsletter of the Measurement Quality Division, American Society for Quality September 2005

MQD InstallsNew Officers!

V i r g i n i a B e a c h C a m p u s S c h o l a r s h i p s @ T C C

S C H O L AR S H I P N AT I O N AL I N S T R U M E N T S / C H R I S G R AC H AN E N M E T R O L O G Y S C H O L AR S H I P

D E S C R I P T I O N E s t a b l i s h e d i n J a n u a r y 2 0 0 5 b y N a t i o n a l I n s t r u m e n t s C o m p a n y . T h i s s c h o l a r s h i p s g o a l i s

t o a t t r a c t s t u d e n t s i n t o c u r r i c u l a t h a t w i l l p r e p a r e t h e m t o e n t e r t h e m e t r o l o g y f i e l d i n o r d e r

t o a l l e v i a t e a s h o r t a g e o f t r a i n e d M e t r o l o g i s t s . S e e i n s i d e f o r d e t a i l s ...

A J u i c y L e t t

e r t o

t h e E d i t o r...

T H E L E AR N I N G C U R V E

T HE STANDARDS C OMMITTEE

C C T U

P D A T E

C H A I R S C O L U M N

S T A N D A R D

O C C U P A

T I O N

C L A S S I F

I C A T I O N

M E T R O L

O G Y

I N I T I A T

I V E

J OINT MQD AND IDC ONFERENCE

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The Standard is published quarterly by the Measurement Quality Division of ASQ; deadlines are February 15, May 15, August 15 and November 15. Text infor-mation intended for publication can be sent via electronic mail as an attachment inMS Word format (Times New Roman, 11 pt). Use single space between sentences.Graphics or illustrations must be sent as a separate attachment, in jpg format. Pho-tographs of MQD activities are always appreciated. Publication of articles, productreleases, advertisements or technical information does not imply endorsement byMQD or ASQ. While The Standard makes every effort to ensure the accuracy of articles, the publication disclaims responsibility for statements of fact or opinionmade by the authors or other contributors. Material from The Standard may not bereproduced without permission of ASQ. Copyrights in the United States and allother countries are reserved. Website information: MQDs homepage can be foundat http://www.asq.org/measure . 2005 ASQ, MQD. All rights reserved.

The StandardVol 19, No. 3, September 2005

Editor and PublisherJay L. Bucher6700 Royal View Dr.De Forest, WI 53532-2775

Voice: 608-277-2522Fax: 608-846-4269Email: [email protected] or [email protected]

Advertising Submit your draft copy to Jay Bucher , with arequest for a quotation. Indicate size desired.Since The Standard is published in-housethe requester must submit a photo or graphicof their logo, if applicable. The followingrates apply: Business card size............................ $1001/8 page .......................................... $1501/4 page ........................................... $2001/3 page ........................................... $250 page ............................................. $300Full page ......................................... $550

Advertisements will be accepted on a perissue basis only; no long-term contracts willbe available at present. Advertising must beclearly distinguished as an ad. Ads must berelated to measurement quality, quality of measurement, or a related quality field. Adsmust not imply endorsement by the Measure-ment Quality Division or ASQ .

Letters to the EditorThe Standard welcomes letters from mem-bers and subscribers. Letters should clearlystate whether the author is expressing opin-ion or presenting facts with supporting infor-mation. Commendation, encouragement,constructive critique, suggestions, and alter-native approaches are accepted. If the con-tent is more than 200 words, we may deleteportions to hold that limit. We reserve theright to edit letters and papers.

Information for Authors The Standard publishes papers on the qual-ity of measurements and the measurement of quality at all levels ranging from relativelysimple tutorial material to state-of-the-art.Papers published in The Standard are notreferred in the usual sense, except to ascer-tain that facts are correctly stated and to as-sure that opinion and fact are clearly distin-guished one from another. The Editor re-serves the right to edit any paper.

T ABLE OF C ONTENTS CHAIRS COLUMN ......................................................................3LETTERS TO THE EDITOR......................................................4/5EVENTS CALENDAR ..................................................................5CCT UPDATE................................................................................6METROLOGY JOB DESCRIPTION INITIATIVE......................6

THE STANDARDS COMMITTEE ACTIVITY ...........................7CONSIDERATIONS IN DETERMING CALIBRATIONSTATUS .........................................................................................8THE LEARNING CURVE...........................................................11MQD MEETING MINUTES .......................................................12NCSLI WORKSHOP & SYMPOSIUM PHOTOS......................16MAX J. UNIS AWARD ...............................................................18MQD OFFICERS AND COMMITTEE CHAIRS ..................23/24MQD / ID CONFERENCE PAMPHLET.....................................25MSC 2006 PAMPHLET...............................................................31

F ROM T HE DESK OF T HE E DITOR /P UBLISHER

In this edition, youll find three different open letters tothe editor...please see pages five and six. By the timethis goes to print, another successful NCSL Interna-tional Workshop and Symposium will have happenedin Washington, D.C. MQDs showing can be found onpages 16, 17 and 18. We have the minutes from our bi-monthly division meetings, and some photos to accom-pany the event in our nations capital. A synopsis of theTidewater Community College Scholarship can befound on page 20 (congratulations to Chris Grachanenfor having a scholarship issued in his name). I would also like to welcomeInstrument Rental Labs as a paid advertiser to The Standard . Our adver-tisement for the upcoming conference jointly sponsored by MQD and theInspection Division is at the back of this newsletter; along with 2006Measurement Science Conference (MSC) pamphlet. We hope you enjoythis edition of The Standard .

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MQD The Standard Page 3


C HAIR S C OLUMN By Graeme C. Payne

Planning for the Future

One of the tasks of leader-ship is to provide ideas(some call it vision) to aidin the organizational plan-ning for the future. Plan-ning, and a process forplanning, is something Ibelieve we need to empha-size more in the future thanwe have in the past. A good

planning process will enable us to be better in han-dling current and future changes in our Division, inASQ as a whole, with our membership and withthe society that we live and work in.

There are three types of organizational planning,with different time frames and goals. Short term oroperational planning focuses on immediate objec-tives, rarely looking beyond the upcoming 12months. Intermediate term or tactical planning fo-cuses on goals with a longer time scale, looking outto the two to four year period. Long term or strate-gic planning focuses on goals that are five yearsand more away. Planning is an essential qualityprocess that, as quality professionals, we should allpay more attention to.

Short term planning is the area of finalizing andimplementing goals and projects that have (ideally)been set in motion by intermediate and strategicplanning processes. Short term projects in our cur-rent calendar include next month's technical con-ference with Inspection Division, preparing for theMeasurement Science Conference in February/ March, and preparing for ASQ's WCQI in Milwau-kee next May. We are pretty good at this, with theawareness that as in all processes there is someroom for improvement.

Note: if you want to participate in or work onany of these and some have a very short leadtime please contact the Arrangements Com-mittee Chair, Dilip Shah.

In my view, we are not doing as well in tactical andstrategic planning. I would like to see us changethat. I believe we need to have a long term visionof where we want to be, a set of strategic goals thatreflect that vision and are aligned with ASQ's stra-tegic plan, and targeted tactical action plans forachieving the goals. We may want to benchmark some other Divisions that do a good job in thisarea, such as Statistics and Quality Management.For instance, I know that several other Divisionshold one or two weekend planning sessions eachyear; we should find out if that is a workable ideafor us.

For a strategic plan, we need to define a set of goals that can be used to pull us forward and tomeasure progress. The strategic plan should enablethe Division to move in the direction indicated byour mission and vision, support and improve themanagement system of the Division, and it shouldbe aligned with and support the ASQ strategies.

Intermediate or tactical goals are really of twokinds at this time . One kind targets the mission andvision related goals of the strategic plan. They willbe developed at some time in the future. The otherkind supports the management of the Division. Inthis area, we need to develop plans for areas suchas member satisfaction, event planning, volunteerdevelopment and leadership succession. Eventu-ally, the Division management goals will be part of the strategic plan so the two kinds will disappear.

I believe an effective way to aid intermediate plan-ning, and eventually strategic planning, is to de-velop and implement a documented and accessiblequality management system. This should not be anew concept to any of us. I am sure most memberswork in (or have worked in) a management systemunder ISO 9001, AS-9100, TS-16949, ISO/IEC17025 or any of the other similar systems. I amsure that developing a documented system basedon ISO 9001 would be beneficial for the Division,and I would like to see it accomplished and imple-mented by the end of June 2007. Note that I am not talking about going to the final step of becomingregistered to the standard. At least not yet but Idon't know what the future will bring.

(Continued on page 22)

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Letters to the Editor Mr. Editor,Just a few lines to express my appreciation for yourefforts. I always look forward to receiving my issueof "The Standard". I particularly enjoy Phil Pain-

chaud's column "The Learning Curve", the Chair'scolumn, (I arranged for Dilip Shah to come andspeak to our local section and his presentation wasenjoyed by all in attendance), and ChrisGrachanen's CCT updates. I usually am not recep-tive to publications sent in electronic format how-ever you and your staff have done an excellent jobwith the electronic version of "The Standard".Keep up the good work as I eagerly await my nextissue.

Steven D. Scott CCT, CQT

ASQ Section 0904TreasurerEducation ChairExamining Chair

Thank you, Steven, for the kind words. Thishas become a regular labor of love for me,myself, and I (the entire staff). I greatly appre-ciate you taking the time send along your note.

Hello, I am Tony Abel, Program Chair for the Me-trology Program here at Central Georgia TechnicalCollege (CGTC). Chris Grachanen asked me tosend you a short update on our 2005 graduates forpublication in the Standard.

Tony Abel and Mary Anderson

Mary L. Anderson of Ocilla, Georgia received herAssociate of Applied Science Degree in Metrology.(Mary assisted in 2 ASQ CCT workshops)

Don Schreiber of Macon, Georgia received his As-sociate of Applied Technology Degree in Metrol-ogy in addition Don was awarded a Technical Cer-tificate of Credit (TCC) in ISO 9000 Quality Sys-tems. Don was an Honor Graduate with a Cumula-tive GPA of 3.89 out of a possible 4.0.

James E. Wheeler of Warner Robins, Georgia re-ceived his Associate of Applied Technology De-gree in Metrology.

Richard Francis of Bonaire, Georgia received hisDiploma in Metrology

Derek L. Smith of Warner Robins, Georgia re-ceived his Diploma in Metrology and Derek wasalso an Honor Graduate with a cumulative GPA of 3.65 out of a possible 4.0

Thanks for everything you do to assist the CGTCMetrology Program,

Tony AbelProgram ChairMetrology ProgramCentral Georgia Technical College3300 Macon Tech DriveMacon, Georgia [email protected]

Thanks to Tony for keeping us informed and up-to-date on what is happening at CGTC. Our hearty congratulations go out to all the gradu-ates. I had the pleasure on a couple of occa-sions to work with Mary at CCT workshops,and send along my personal congratulations:You go girl!


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First Impressions, Second Thoughts,and The Third Degree!By The Laird of Glencairn

Please consider this an open letter to the editor,officers of the Measurement Quality Division(MQD), its members, and calibration practionerseverywhere.

Me first impression after a few years of readingThe Standard is that there must have been a changeat the top. All of a sudden, The Standard is comingout on a regular basis. Its great to know that everythree months something will be available, rather Iagree with Old Pappy or not; rather a new articleis published or not; or if there are a lot of missingnames among the Regional Councilors. Who cares?Get your rag (I believe Mr. Bucher has a sense of humor) on the newsstands and we will continue toapplaud your efforts.

Now for me second thoughts. Ive noticed that ba-sically the same groups of people are doing all theworkor at least have their names attached to theofficer and/or committee chair positions. We havean old saying here in the land of heatherThewilling horse is always worked to death. If the restof us dont step up to the plate before this batch of volunteers gets worn out, then the ball gets droppedand the MQD, newsletter, and a valuable source fornetworking and communicating fades to black. Thebimonthly meetings are held by way of a toll-freetelephone conference call. Benchwarmers we havea plenty. How about some new players?

Now for me third degree. How many of you havepaid a visit to your local medical practioners andbeen given results? I went to see the local saw-bones and had the usual bunch of tests performed. Iwas curious if the unit hanging on the wall to takeme blood pressure was ever actually calibrated.Nobody knew! To those of us anal-retentive types,

heres an example. What if me pressure was120/80? What if the unit that has been squeezingme arm is +/- 10% of reading? Then I could havehad a reading of 132/88 (time for high blood pres-sure medication?) or 108/72, or any combination inbetween. I be pretty sure they rely on their instru-ments the same as most of us rely on oursthenumbers are correct unless proven differently,right? So those readings go into my files and deci-sions are made that affect me medications, anddose sizes. Maybe some of you working in the in-dustry can send a note to the illustrious editor of this rag and let all of us know theres a happyending, that somebody is actually calibrating theseinstruments and we have nothing to worry about. Adinna ken.

Howp ye enjoy whit we hae tae offer, so just signme A Juicy Hub Loser !

(http://www.coolopticalillusions.com/

ladderupdown.htm)

(Continued from page 4)

E VENTS C ALENDAR

ASQ ID/MQD September 22nd ~ 23rd, 2005 Corona, CA www.asq.org/measure

MSC February 27th ~ March3rd, 2006 Anaheim, CA 866-672-6327 www.msc-conf.com

NCSLI August 6th ~ August 10th, 2006 Nashville, TN 303-440-3339 www.ncsli.org

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CCT U PDATE By Chris Grachanen

MQD Certification Chair

There were a total of 152 who sat for theJune 7 offering of theCCT exam with 116passing. Congratula-tions go out to allnew CCT alumni!

Current CCT program stats are:

MQD officers have approved the creation of acommemorate coin for all CCT alumni. Artwork iscurrently at the vendors with an expected comple-tion date of mid-September. Special thanks go outto Jay Bucher, Dilip Shah and Keela Sniadach forall their hard work on this project.

M ETROLOGY J OB DESCRIPTION INITIATIVE (UPDATE )

By Chris Grachanen

1st pass of MJD pilot survey has been completed. MJD pilot survey has been updated with core teamcomments / additions. Core team to make final com-ments / additions (week after NCSLI conference). MJD survey participation mass e-mail to NCSLI &ASQ MQD constituents scheduled for end of Aug. Compiled survey results by Professional Examina-tion Services (PES) anticipated by end of Sept. Core team review of final job descriptions antici-pated 1 st week of OctFinal job descriptions submitted to SOC anticipated nolater than end of Oct.

Note: Chris is signed up on the Standard Occupa-tion Classification (SOC) mail list to receive for-mal notification of the federal register announce-ment soliciting input for the new SOC.

Note: Chris has been in correspondence with aSOC economist who will hand walk the finalizedMJD initiative job descriptions to the appropriatefolks at the SOC

At first glance, this looks like a spiral. But use yourfinger and trace the line, starting in the middle oroutside. You'll never get to the middle because theyare actually concentric circles!

How does this work? First, the background drawsyour eyes to the center. But mainly it works be-cause of how the circles are created. Instead of be-ing a solid line, you'll see that each circle actuallylooks like a two shades of something twisted to-gether, and that further leads your eyes into thecenter.

(from: http://www.coolopticalillusions.com/ circlespiral.htm )

Sat forExam

PassedExam Date of Exam

7-Jun-03 97 69 71%

6-Dec-03 107 69 65%

23-May-04 4 4 100%

5-Jun-04 133 102 77%

4-Dec-04 139 104 75%

4-Jun-05 152 116 76%

Total CCTAlumni: 464

%Passed

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T HE STANDARDS C OMMITTEE ACTIVITY

By Bill McCullough

In two separate meetings, the

NCSLI 174 Committee andWriting Group met at theNCSLIs August WashingtonDC Conference. The 174Committee is responsible forthe ANSI/NCSL Z540 familyof standards. A couple of years ago we were taskedwith updating Z540-1, the USstandard on the care and feed-ing of measurement and test

equipment. After a great deal of work putting to-

gether the best of the current Z540-1 and other bestpractices, the Working Group circulated the firstcoordination, or for you familiar with ISO termi-nology, committee draft to the full committee forcomment. We reviewed, appraised and proposedresponses on the excellent comments received bythe deadline. The Working Group, through the con-sensus process, fined-tuned those changes, or posi-tions, the Sunday before the convention. Except fora technical issue on the scope of the standard mostof the comments were editorial in nature or a resultof a committee member not fully appreciating or

understanding the scope and purpose of the stan-dard. It occurred to me that if committee membersknowledgeable about the standard made the misun-derstandings, The Standard Report readers mightbe interested in what we are doing and why. Seeingthat there is no news to report from the TAG this isa good issue to discuss it.

The current version of Z540 consists of two parts,part 1 being an, edited for US use, version of ISOGUIDE 25 and part 2 control and calibration re-quirements directed at the users of measurement

and test equipment (M&TE). In 1999 GUIDE 25was abandoned and ISO 17025 replaced it. Al-though technically much improved, from a contractperspective it is missing key calibration perspec-tive. Assessors and Standard Lab Experts are theprimary authors of ISO 17025 and expectedly thestandards focus reflects that bias. Reasonable peo-ple do not agree on where that leaves the calibra-tion laboratory. There is a faction in the Committee

that feels that we only need one calibration stan-dard and appose Z540 in favor of ISO 17025. I amof the opinion that it leaves us with a standard thatemphasizes standards lab practices and accredita-tion and overlooks some prime elements of calibra-tion.

Recognizing that, a faction of calibration commu-nity did not fully embrace ISO 17025, the 174committee resolved to produce as standard thatwould fill the gap. The issues:

The standards labs focus on producing a de-scribed value with an associated uncertainty,whereas calibration lab focus is on tolerancetesting.

The standards lab is experiment orientate andthe cal lab is process or procedure orientated.

The standards lab is not particularly interestedin calibration intervals, but the calibration labmost certainly is.

There are control elements that are a part of calibration such as labels and procedures.

The scope of the labs is very different.

Z540 is directed the organization that uses meas-urement and test equipment but does not need aninternal accredited cal lab or out-sources calibra-tion. It is not intended for the cal lab per say, al-though such a cal lab would use the control tools.Z540s scope is to provide the tools that definewhat such an organization needs to ensure the qual-ity of the M&TE. There are those that believe thatevery lab needs to be accredited, but that is not thecase. The lab that is internal to a company and doesnot sell the majority of their calibration service tocustomers, and of course has no customer accredi-tation requirements, would find no return on in-vestment in accreditation. That is no small target;about 80% of the current labs are not accredited.Even if an organization chooses to outsource cali-bration to an accredited laboratory, they still need aprocess in place that monitors the supplier and con-trols M&TE use to produce or service their prod-uct. ISO 17025 provides sparse control guidancebut the new Z540 contains a wealth of advice andguidance to help to manage M&TE.


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Considerations in DeterminingCalibration Status

By Christopher L. Grachanen Manager Houston Metrology Group

Hewlett-Packard Company

Much literature hasbeen devoted to ex-amining the virtuesof calibrating inspec-tion, measuring andt e s t e q u i p m e n t(IM&TE) with re-gard to measurementintegrity and trace-

ability. The outer fringes of these arguments in-volve situations where IM&TE is represented asessentially non-quantitative in nature with appar-ently no hard and fast requirements for traceability.This article will examine a few scenarios encoun-tered by calibration facilities that attempt to breachthe traditional lines of reasons for determining thecalibration status of IM&TE.

Traditional Criteria

IM&TE calibration status is often classified intoone of the following categories:

Calibration Required unit requires a calibration

Calibrate Before Use unit must be calibrated before being used

Limited Calibration some attributes of a units performance islimited

No Calibration Required (NCR) as the calibration status implies

Special Calibration some qualifier is associated with a unitsperformance

Note: From an auditors perspective, the absenceof IM&TE calibration status does not constitute aninferred NCR status but rather brings the question:

Has this unit been properly evaluated for calibra-tion status or has it been overlooked?

Traditional criteria used to determine IM&TE cali-bration requirement focus on a units ability to pro-

duce quantitative measurements that are accurateand traceable. Measurement accuracy in terms of:does a measurement represent the correct amountof something and traceability in terms of: is thatamount faithfully represented in accepted units of measure i.e. volts, inches, degrees Fahrenheit,etc.? Simply stated, if a measurement needs to beelucidatory to a specific level of confidence, thenchances are the IM&TE producing the measure-ment should be calibrated.

The need for calibration of IM&TE can be largelyattributed to component aging (drift) and as a resultof being exposed to environmental changes and/ormechanical stress which alter their performancecharacteristics. These influences have the effect of degrading IM&TE performance such that their per-formance can not be assumed to be within originalequipment manufacturer (OEM) specifications norwithin subsequent characterization ranges beyondthe time interval established for their recalibration.Most IM&TE operational or functional verificationare contingent on performance specifications beingmet.

Often, measurement applications that use both ameasurement device and a measurement source canseemingly negate the calibration requirement of either one depending on how they are being used.The following two scenarios will help illustrate thispoint:1. Dummy Measurement Source - A measure-

ment source is used to produce a generalbulk output such as temperature or pressureand relies on an external measurement deviceto determine actual output values.

2. Smart Measurement Source - The measure-ment source output is known via its own instru-mentation (typical of multifunction electroniccalibrators) or uses something analogous tolookup tables such as the frequency responsefor a RF power source. In this scenario an ex-ternal measurement device may be used to givea ballpark indication that the smart measure-ment source is working and that the output isnot fluctuating beyond a level so as to be unus-able for an application.


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It can be construed from the aforementioned sce-narios that the decision to calibrate a measurementdevice or source may be derived from the way it isbeing used. An example of this is the decision tolimit calibrate or NCR a measurement source withthe recommendation that its output be monitored.In this scenario it is assumed that1. The target application the IM&TE will be used

in will not change and that2. Non-monitored performance specifications of

the measurement source, normally confirmedin a calibration, will have an insignificant ef-fect on the application.

Power Supplies

These are often the assumptions made regardingthe calibration status of power supplies. Many fa-cilities regard the calibration status of power sup-plies as NCR such that it is up to users of powersupplies to setup and monitor their output. It mustbe emphasized that this calibration status assumesthe existence of control over deployment and thedetermination has been made that excessive non-monitored performance specifications will not ad-versely effect a target application.

The aforementioned assumptions should put up ared flag for seasoned calibration practitioners.Typically calibration facilities 1) have no assurancenor power to enforce that a unit will only be usedin a particular application (IM&TE users tend toborrow equipment as needed) and 2) do not havedetailed information about IM&TE user applica-tions. Often IM&TE users have only a cursoryknowledge of IM&TE specifications and very littleunderstanding as to how these specifications, if notmet, can adversely impact their application.

To illustrate this point, the testing of a high-speed,multichannel printed circuit board (PCB) poweredby a power supply would typically have a very lowthreshold of tolerance regarding excessive rippleand noise (a power supply performance specifica-tion commonly referred to as PARD - Periodic andRandom Deviation) as would a RF switch in a RFtest rack. Similarly an application where a powersupply is initially setup for a specific load condi-tion may respond inappropriately when the AC line

or load changes thus the need for power supply lineand load regulation verification.

The reality is monitor output power supplies maymigrate to other user applications that could benegatively impacted by excessive non-monitoredpower supply performance specifications. Withoutknowledge of IM&TE user applications and themeans to control IM&TE deployment, assignmentof other than a calibration required status forpower supplies is not recommended.

Go-NoGo Instrumenation

Another common situation bordering on the fringesof calibration required status justifications aremeasurement devices used for Go-NoGo indica-tions. Typically, measurement devices used forindication only are only required to respond tothe presence of a stimulus. Often these measure-ment devices are designed to compare one item toanother such that relative information betweenthem can be obtained. Relative indication informa-tion is frequently used to evaluate qualitative infor-mation about the items such as shape or otherqualitative attribute. Scenarios such as this are typi-cally ratiometric in nature and as such can be ar-gued that traceability does not have to be estab-lished as one is only interested in comparing awidget with another widget in order to obtainrelative widget information.

Logic Analyzers

A common type of measurement device that is of-ten categorized as Go-NoGo are logic analyzers.Logic analyzer users are often unwilling to sendtheir units to a calibration facility for periodic cali-bration under the notion that they are only used forGo-NoGo indications, despite the fact that mostlogic analyzer OEMs recommend periodic calibra-tion.

In addition to this mindset, todays microprocessorcontrolled products are more complex and employhigh logic analyzer channel count resulting in labo-rious fixturing which users are reluctant to break down in order to move their logic analyzer to thecalibration facility. Logic analyzer users who apply



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them only in Go-NoGo situations often are notaware that uncalibrated performance attributes candramatically skew intercomparisons leading to er-roneous assumptions being made about the prod-ucts performance they are assessing.

Logic analyzer intercomparisons commonly re-quire evaluating relative proportionality of differ-ent signals in terms of their amplitude and shape.Amplitude and shape discrepancies can occur dueto differences in channel to channel sensitivity,frequency responses, etc. At the heart of logic ana-lyzer design is its ability to capture events in thetime domain in order to determine when signalsoccur relative to other signals. Excessive logic ana-lyzer channel to channel timing skew can producemisaligned (askew) event capture. Excessive chan-nel to channel skew can be especially detrimentalto development and debugging efforts involvinggigahertz, multi-channel product designs. Misinter-pretation of Go-NoGo indications due to errantlogic analyzer performance attributes can result intime to market delays due to chasing down phan-tom problems and/or troubleshooting masked prob-lems.

Non-technical Considerations

Scenarios that border on the "gray areas of tradi-tional IM&TE calibration justification very oftenare influenced by non-technical considerationswhich have no direct connection with IM&TE per-formance. Mitigating factors such as calibrationexpense, support costs (shipping/ handling), down-time criticality, transportation hazards, lack of ade-quate backup IM&TE resources, etc., often influ-ence calibration status determination and as suchmay outweigh the risk of possibly using IM&TEwith errant performance.

A companys interpretation of ISO IEC 9000/2000quality standard regarding the calibration of IM&TE may mandate that all IM&TE receive acalibration required status regardless of user ap-plication and other mitigating factors. In addition,an often overlooked consideration in determiningIM&TE calibration status concerns safety relatedissues. IM&TE which could conceivably injurepersonnel due to such problems as defective

grounding (floating ground potential problems of-ten will show up during IM&TE calibration),frayed power cord, (most calibration facilities per-form a visual inspection of the IM&TE they ser-vice), proper safety interlock operation (normallyverified in order to perform an IM&TE calibration)as well as the obvious hazards of excessive highvoltage, intense luminosity, etc. should be periodi-cally verified for safe operation. Whatever the cir-cumstances, the justification to forego an OEMrecommendation to calibrate a piece of IM&TEshould be well thought out, documented and ap-proved by management.


The preceding article is a re-print from theApril-May-June 2005 edition of

Our thanks to Carol Singer and Chris Grachanenfor allowing us to use this article.

This is a variation of the Hermann grid illusion,named after L. Hermann. While he was reading abook on sound by John Tyndall, Hermann (1870)saw spots in the intersections of spaces among thefigures that Tyndall had arranged in a matrix.

Scan your eyes over the figure. Do you see thegray spots at the intersections? Stare at one of them and it will disappear.

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T HE L EARNING C URVE By Phil Painchaud

This is the forty-second in anuninterrupted succession of dis-

courses ostensibly chartered tobe on the subject of MetrologyEducation. Oftentimes due tothe pressure of items of higherpriority or because of the dearthof current news from our educa-tional institutions, we are forcedto digress and discuss other

mattershopefully related to Metrology. As usual,this will be in form of an open letter to our Boss,the Editor of this periodic journal.

Dear Boss:

Unfortunately, this offering is again to be not verynewsy concerning Metrology Education. As usual,at this time of year, we have the Summer Dol-drums. Most educational institutions are shutdown for the summer. Naturally, not much is hap-pening. While I am sometimes in contact with But-ler and Dominguez Hills, I never hear anythingfrom any of those other institutions purporting tobe teaching Metrology. How about you folks atRidgewater, Aurora, and all of those other institu-

tions who are purporting to be teaching Metrology,occasionally sending me updates on your activi-ties? I know that I see most of you at the annualMeasurement Science Conference. But why waituntil then. Fill me in frequently in between and Iwill tell the world about you.

Now for the bad news; a few months ago in thiscolumn, I asked each one of you to write a letter toDr, Louis Hart at West Liberty State College inWest Virginia, expressing an interest in his effortsto establish a Metrology curriculum at that institu-

tion and defining the need for such a program. I amtold that I have at least ten thousand readers of thiscolumn. Only one of you out of that ten thousandanswered and wrote a letter to Dr. Hart. That wasSteve Scott of the Duffy Tool & Stamping Co. of Muncie, IN. That is 0.001%not a very notewor-thy showing. Thank you Steve, but your lone con-tribution was not enough, the administration atWest Liberty, without evidence at hand, told Dr.

Hart to cease and desist all effort to establish aMetrology curriculum at that institution.

I was just about at this point in writing this columnwhen I received an urgent e-mail from LarryKreyer. I can hear the questions nowWho inthe Sam Hill is Larry Kreyer? I dont doubt thatmost of you have never heard of him. He has kept avery low profile over the years. But if any of youare involved in computer controlled automatedcalibration, you can thank Larry.

I was looking over his shoulder during the late1960s when he designed the first fully automaticcalibration center based upon an IBM 1130 com-puter and composed entirely of off the shelf com-ponentsnothing had to be invented. He later re-luctantly grossly scaled it down to become theNavys ACS-200, which was commercially pro-duced and eventually deployed to the fleet. Furtherevolution, to which he was also a contributor,brought about the MECCA system that includedportable units small enough to pass through a sub-marines hatch.

During most of these automated calibration days,he ostensively was in charge of a design group inSanta Barbara responsible for the design of the in-strumentation used to measure the nuclear blastsout on the Nevada flats. Because of his calibrationexperience, almost every major manufacturer of automated calibration equipment quietly engagedhim as a consultant to get their in house develop-ments working and marketable. He later becameinvolved in the development of satellite navigationsystems (Yes, the very ancestors of the same onesthat some of you now have today on your cars andboats). He eventually returned to Santa Barbaraand became head of Quality Assurance for hisoriginal employer. After his retirement, he movedto Santa Fe and now works part time in Quality atthe Los Alamos National Laboratories.

Larry is not only a leading authority on automatedcalibration, but is also a good friend of long stand-ing, so when I received this message from him. Iknew that I was obligated to respond.


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MQD PHONE CONFERENCE16 JUNE 2005

Attendees:Dilip ShahGraeme PayneChris GrachanenJay BucherBill McCulloughKarl WigdalDuane Allen

Minutes:Dilip Shah: Called the meeting to order and we have a quorum so we could conduct business and voteon issues as required. Keela Sniadachs design for the CCT coin will be used as the foundation fordeveloping the coin. Will use just the Q for ASQ without the wording (too small to use on this coin).Chris will check with the vendor to see if we can get an extra large version for display/advertisementin our booth. Any additions or changes to current design need to be submitted on our Share Point siteas soon as possible.

ASQs template for Division Operating Agreement (DOA) will be used to replace the division bylaws.Dilip will contact Karen Prosser to get the latest template of the DOA for use by MQD.

A motion was made and seconded to nominate Jay Bucher as the Chair-elect for 2005-06 and 2006-07(Graeme Payne has accepted the Chair position for two consecutive terms, starting July 1 st, 2005), andChris Grachanen as the Secretary for the same period. The motion passed by unanimous approval of the attendees. Jay reminded the attendees that he was accepting under the condition that his term forChair was for one (1) year, not two. This was also agreed to by the members in attendance.

NIST Measurement System initiative, participation, and funding:A motion was made and seconded to nominate Jay Bucher to be the MQD Champion/and Bill McCul-lough as the alternate, to represent MQD during the US Measurement System initiative. This passedunanimously. Also, a motion was made and seconded to allow an initial travel funding not to exceed$10,000 for support of this initiative. It was noted that our coffers are in good shape, and that $20,000a year is being saved by going electronic with The Standard, as well as having ASQ webmaster our online web site. Bill will represent MQD in Jays absence.

Joint MQD/Inspection Division Conference:Dilip, our program chair, will discuss more about the conference during the NCSLI conference in Au-gust, attended by Graeme and Chris.

NCSLI conference in August, 2005:Four presenters are scheduled to attend and do booth duty Dilip Shah, Graeme Payne, ChrisGrachanen, and Keith Bennett. NCSLI has expressed interest in becoming a sanctioned provider of CEUs within the next couple of years, similar to what ASQ is currently doing.

Reviewing and planning for the 2005/2006 budget:Anyone that has inputs for the upcoming budget year should submit their requests to Dilip Shah andKarl Wigdal before the 24 th of June, so they can submit the final budget in a timely manner.


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MQD Committee roster updates and final listing:Graeme will submit the final committee roster to ASQ by the 24 th of June, 2005. Following is the final list of officers and chairs for the 2005-2006 year:

* denotes voting members

Action items: Chris will contact Karen Prosser to produce an email/mailing for members concerning RUs by at-

tending NCSLI this year. Dilip will contact Karen Prosser to get a copy of the template for a Division Operating Agreement. Jay will make contact with Georgia Harris at NIST concerning where we go from here on the USMS

initiative. Any budget changes, requests concerning MSC 2006, the September MQD/Insp Conference,

NCSLI, or any other travel expenses should be submitted to Dilip and Karl ASAP. Graeme will send the updated committee roster to ASQ before the 24 th of June.

Respectfully submitted:

Jay L. Bucher, ASQ CCTSecretary, MQD



Position Title Name of Member

Arrangements Chair Dilip A. ShahBody of Knowledge Chair Chris GrachanenCertification Chair Chris GrachanenChair* Graeme PayneChair Elect* Jay BucherConference Chair Dilip A. ShahExamining Chair Graeme PayneHistorian Keela SniadachImmediate Past Chair* Dilip A. Shah

Internet Liaison Chris GrachanenLiaison to Certification Board Chris GrachanenNewsletter Editor Jay BucherNomination Chair Dilip A. ShahPrograms Chair* Dilip A. ShahPublications Chair* Jay BucherScholarship Chair Dilip A. ShahSecretary* Chris GrachanenTreasurer* Karl WigdalShare Point administrator Jay Bucher

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MQD Meeting MinutesNCSLI Conference, Washington DC

10 August 2005

ATTENDEES PRESENT: Keith Bennett Georgia Harris Bill McCullough Graeme Payne Don Ruth Dilip Shah Howard Zion

ATTENDEES VIA PHONE:

Jay L. Bucher Randy Farmer Chris Grachanen Karl Wigdal

OPENING Graeme welcomed everybody to the meeting. Dr. Richard Pettit recognized for being NCSLI 2005 William A. Wildhack Award winner (award is

presented annually to recognize outstanding contributions to the field of metrology and measure-ment science, consistent with the goals of NCSL International). Dr. Pettit is an ASQ member.

Chris recognized for being NCSLI 2005 Outstanding Regional Coordinator

Jay read previous meeting minutes (June 2005) - minutes approved as read

JAY Metrology Handbook is in its 2 nd printing (all corrections have been incorporated) Monday 15 Aug. is article deadline for next issue of The Standard - some folks have requested ex-

tensions. Jay and Bill are MQD champions for NIST U.S. Measurement System (USMS) Initiative (travel

budget not to exceed $10k for attending the many USMS workshops schedule later this year and in2006)

KARL The Standard is making money having received first paid advertisement. Received and paid ASQ 2005 WCQI bill. CCT alumni coin down payment has been sent

CHRIS CCT alumni coin design has been finalized.



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June 4, 2005 CCT exam review completed Latest CCT program Stats: 152 sat for exam, 116 passed (76% pass rate), CCT alumni is 464. Suggestion made to develop a game plan addressing non-U.S. CCT exam opportunities. Folks from

the Netherlands, S. Africa and Mexico have expressed interest in tailoring the CCT exam for their

countries. Dec 06, 2005 CCT exam item review completed. Metrology Job Description (MJD) Initiative:

1st pass of MJD pilot survey has been completed. MJD pilot survey has been updated with core team comments / additions. Core team to make

final comments / additions (week after NCSLI conference). MJD survey participation mass e-mail to NCSLI & ASQ MQD constituents scheduled for end

of Aug.

DILIP MQD joint conference agenda is being finalized 2005 NCSLI conference has been very positive with a lot of interest in MQD, CCT, The Standard,

Metrology Handbook, etc. MQD conference track was standing room only (> 150 attendees) with presentations being well re-

ceived. Dilip put forth the motion to update MQD conference booth (booth has old ASQ logo) not to exceed

$1k. Motion approved. Two Metrology Handbooks presented to NCSLI as door prizes. Metrology handbook presented to Charlie Mays for his outstanding support of MQD and Measure-

ment Community.

RANDY

Expressed concern over the lack of Metrology (MQD, CCT, etc.) activities / involvement in his re-gion and requested ideas to help get people involved.

GRAEME MQD officers can now make announcement changes directly to MQD website Division session for ASQ 2006 WCQI is due 23 Sept. ASQ Testimony submission due by end of the month (Aug)

GEORGIA Open discussion about the virtues of MQD and MSC endorsing NCSLI Training & Education Road-

map the subject was favorable received. Georgia is still accepting comments on the Roadmap andwill provide Chris with its contents to post on MQD website.

ACTION ITEMS: Chris Submit CCT Alumni Coin art work to vendor. Chris Submit MQD NCSLI Liaison report ASAP for NCSLI BOD meeting Chris Write MJD survey E-mail coversheet to include hyperlink to NCSLI Training & Education

roadmap posted on MQD website.



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Chris Develop game plan for addressing non-U.S. CCT program opportunities. Dilip Finalize MQD joint conference agenda Dilip Submit Past Chair report Dilip Finalize and submit 2006 ASQ WCQI MQD conference track Dilip Finalize and submit 2006 MSQ MQD conference track Graeme Investigate MQD shirts

CLOSINGGraeme thanked all attendees. Motion to close meeting motion approved.

Respectfully Submitted,Christopher L. GrachanenMQD Secretary


Dilip Shah was one of several MQD membersrepresenting the Division in Washington, DC.Here, he is seen talking to one of the attendeesfrom Michigan.

Our sincere appreciation and thanks tothe NCSLI Board for providing thebooth to MQD and to Craig Gulka forhelping with other teleconference logis-tics during the conference.

Photos from NCSL Internationals 2005Workshop & Symposium

Washington, DC

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MQD Chair Graeme Payne (2nd from right), with Dilip Shah (R) and Keith Bennet (L), presentsa copy of The Metrology Handbook to Charlie Mays, in appreciation for his support of the Divi-sion. Charlie had been instrumental in helping us host the 2004 MQD/ID conference in Heath,Ohio at the Air Force METCAL facility. The Metrology Handbook presented to Charlie is auto-graphed by 5 of the 8 authors (three of which are pictured above). Since Charlie plans to tour thecountry in his camper, we have a mission for him (if he chooses to accept so). He has to find theother 3 co-authors and get their autographs, too. Who knows, he may be the first one to get all 8autographs! Happy Retirement Charlie. Now, you really have a listen to your boss at home!

The Measurement Quality Division (MQD) attended the NCSL International conference in Wash-ington DC last week. MQD was an exhibitor at the four-day event, and experienced a lot of inter-est in the CCT program, The Metrology Handbook , the Division and ASQ. We promoted the ASQQuality Press by providing 10% off book coupons during the conference. MQD also had a bookdrawing each day for books donated by the ASQ Quality Press. In addition, a copy of The Metrol-

ogy Handbook was donated for the NCSLI raffle door prize. In addition, Keith Bennett, (shownbelow) Graeme Payne and Dilip Shah were speakers at the event in a session sponsored by MQD.Keith spoke on Test Uncertainty Ratios; Graeme talked on lessons learned about virtual teamswhile writing The Metrology Handbook ; and Dilip presented updates on the CCT program and theMetrology Job Description Initiative. The MQD session was attended by over 150 attendees(standing room only) indicating that there was a lot of interest in all four presentations.

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Much of the argument heard in 94 was thatGUIDE 25 was not something conducive to write acontract to and ISO 17025 has not done much toremedy the situation. The Work Group designedZ540 to be an effective contracts document. Somecustomers are or will accept 17025 but with addi-tional requirements. Several customers requiringthe same additional requirement with different ver-biage could add confusion and cost to calibrationproviders. Z540 has aligned itself to the knownadditional requirement. The Work Group feels thatZ540 adds value by using common verbiage thatwill be suitable to use in contracts giving the pro-viders one set of terminology.

Going forward, the Work Group will create a sec-ond and hopefully a final committee draft that willinclude the work done at NCSLI for action atMSC. There is a good chance that we could have anew Z540-1 published next year.

Bill McCulloughMcCullough ConsultingCarson City, NV 89706Phone 775-883-3042Cell 775-220-2464Email [email protected]


Max J. Unis AwardMax J. Unis was the first chairman and a founder of the Metrology Technical Committee of the Ameri-can Society for Quality Control (ASQC), which became the American Society for Quality (ASQ) Meas-urement Quality Division (MQD) in 1991. Max, a former director of the National Conference of Stan-dards Laboratories (NCSL), was the founder of Gage Lab Corporation of Hutchington Valley, PA, andserved as its Chairman of the Board until his death in July 1990. Max was a Mechanical Engineer spe-cializing in Dimensional Metrology, and was considered a pioneer in the field of Metrology. Max par-ticipated on the ASQC-sponsored trip to the Peoples Republic of China during the Nixon administra-tion, to promote Metrological advancement and cooperation between the U.S. and China. Max waselected a Fellow of ASQC in May 1975.

When Gage Lab built their new facility, Max had an area within the building set up as a classroom forteaching Metrology-related subjects. At his passing, a request was made that donations in lieu of flowersbe made to Drexel University Mechanical Engineering Department for the purchase of Metrologyequipment.

The Max J. Unis award is the highest honor bestowed by MQD, to recognize outstanding contributionsto the Metrological community. The recipients in the recent past have been the late Phil Stein, in 2002,Chris Grachanen in 2003, and Jay Bucher in 2004.

MQD members Hershal Brewer (Leftand co-author of The Metrology Hand-

book ) and Bill McCullough attendedthe 2005 NCSL International Sympo-sium and Workshops in Washington,DC. Bill is MQD's representative onthe ISO Standards Committee and hislatest report can be found on page 7.

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Phil, please review the ISO Calibration definition. Let's make some noise about this gross return to the land of the tweakers. (Rememberwhen the Navy was adjusting oscilloscope powers

supplies as the first step in their calibration procedure, thus throwing all parameters out of calibration?) Glad we stopped that, but here go the ISO folks screwing up in the same fashion! Larry

I wasnt quite sure what he meant until he sent methe rest of an internal Los Alamos National Labcommunication:

From: Jacqueline KolakowskiTo: [email protected]: Fri, 05 Aug 2005 11:12:48 -0500Subject: Re: Your Opinion

Actually Larry--that is the definition from ISO- 9000. What is "required" by the ISO is that youuse their definitions. This is a good point and one

might one to write ISO about their definitions. Per ISO, the definition of calibration is as follows:

"Adjusting a measuring instrument to make it accurate. The set of operations which establish,under specified conditions, the relationship of values indicated by a measuring instrument or

measuring system and the corresponding values of a quantity realized by a referenced stanard."

I dont know who Ms. Kolagowski is, but she mustbe important in the Los Alamos structure for Larryto have answered her thusly:

Jackie: Wow! I can't believe this! I'll forward your message to the greatest living expert in Me- trology, Phil Painchaud for a reaction. It will beexplosive! [NOTE: I realize that not everybody,including myself, shares Larrys opinion of mypersonal expertise!]

The ADESTA [re Local organization] definition is wrong, wrong, wrong! One does not adjust a measurement instrument to make it accurate! Doing so moves an instrument which was in a state of statistical control to a state which is out of statistical control. This is what Deming refers to

as "tampering." I have many years of experiencein the field of Metrology and saved the US Navy

$20M per year by getting them to change their calibration process from "Tweaking" to Inspec- tion as their first step in the Calibration Process, following the ASQ Glossary definition, above. Larry

I did answer Larrys e-mail as follows:

LARRY: You just dropped a thermonuclear bomb! It is difficult for me to believe that such retrogres-sion actually exists. I'll make an issue of it in mynext "THE LEARNING CURVE" column that I amcurrently composing.

This is even worse than what I experi-enced at an 1991 IEEE meeting in Washington that

I sat in on where a gang of representatives fromtwo major instrument manufacturers tried to throwout all of the International pulse standardizationwork we on the IEEE and IEC Pulse WorkingGroups had done over the twenty-five previous

years. They were demanding that they be allowed to re-establish all of the so-called "intuitive" gar-bage words we had gotten rid of in the US and In-ternational standards.

Thanks for asking my opinion. You havemade my day! People generally are not much inter-ested in what I have to say these days. It seems tomany people today that I represent a Paleolithicage of Metrology of sometime before the inventionof the Egyptian cubic Phil

So Readers, that is what has been keeping me oc-cupied for the past couple of daysnow, is thereanyone out there reading this column who still be-lieves that a measuring device should only to becalibrated AFTER it has been first repaired and/oradjusted? I hope not, but if someone such does ex-ist, please contact meI am always ready for agood argument.

As Larry aptly pointed out, unless you calibrateAs Received you lose any possibility of main-taining statistical control of the devices accuracyparameters and drifts. If the device is found to beoutside specification limits, then and only then ad-

just and/or repair. Even if a parameter is at, or justinside of the specification limits, DO NOT AD-



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Virginia Beach Campus Scholarships @ TCC

SCHOLARSHIP

NATIONAL INSTRUMENTS / CHRIS GRACHANEN METROLOGY SCHOLARSHIP

DESCRIPTION

Established in January 2005 by National Instruments Company. This scholarships goal is to attract stu-dents into curricula that will prepare them to enter the metrology field in order to alleviate a shortage of trained Metrologists.

CRITERIA

Must be or must have been a TCC student in good standing during the year immediately preceding theaward.

Must be specializing in either mechanical or electronic metrology.

Must have a cumulative grade point average at TCC of at least 2.500.

Must have completed at least 32 credits toward the AAS degree with a specialization in Mechanical orElectronic Metrology.

Must submit a typed original essay describing his/her reasons for studying metrology and the antici-pated benefits of the metrology curriculum. Optional additional topics include past experience in metrol-ogy, future and present career plans in metrology, and the importance of measurement expertise in in-dustry. The essay should be not less than one nor more than two 8.5 x 11 inch sheets, double spaced,using 12 pitch Times New Roman or similar font. The essay is to be submitted to the Dean of Engineer-ing and Industrial Technology at the Virginia Beach Campus after announcement, typically in the Fallsemester, and prior to the middle of the following semester. The scholarship will typically be awarded inFebruary.

May be required by the scholarship committee to be interviewed for selection from among finalists.The scholarship committee determines by consensus whether or not to hold interviews.

Award Amount: Selected recipients will receive an award of $1,000.00 to either be applied toward fu-ture courses taken toward the AAS degree or as reimbursement for courses completed that lead to themetrology specialization.

The recipient must send an acknowledgment letter to National Instruments and another letter to Mr.Chris Grachanen through the Development Office at the time of award. Original letters should be sent toTidewater Community College , PO Box 3575 , Norfolk , VA 23514-9887 . The Development Officewill distribute the letters.

http://www.tcc.edu/students/admissions/scholarships/vabeach.htm

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JUST! If adjustment or repair proves necessarybecause of this As Received calibration, then doa second total calibration after the repair or adjust-ment is completed and before releasing the deviceto the user. In this manner, you establish a new sta-tistical base. Naturally, if the device is receivedcompletely defunct or totally nonfunctional, it willbe impossible to perform an As Received cali-bration, you must forego the As Received cali-bration and repair it first.

To leave you in a lighter mood, I must tell you oneof my horror tales concerning calibration. Asunbelievable as it may seem, this is not fictionitreally happened. Many years ago, I was visiting arival calibration lab (that is one in the same cor-poration as mine, but in a totally different divisionand location). I knew the manager fairly well andrespected his competence. He introduced me to hisassistant, an older gentleman who claimed over 50years experience in the calibration and repair of defection type meters. He had set up a separatelaboratory for the calibration and maintenance of multimeters (The parent organization had severalhundred type Simpson 260 Multimeters. Remem-ber them?). There he showed me eighteen speciallydesigned benches lined up, with eighteen entry-level young ladies he had personally trained tocalibrate multimeters. They had been trained,when calibrating multimeters, to first totally disas-semble the devices and to bridge each and everyinternal resistor to determine if they were withintolerance. They were then, after testing all of theother non-resistive components, re-assemble thedevices and to check them out on at least ten pointson every scale of every range against a calibrationdevice (If I remember correctly these were the clas-sic RFL-829 Meter Calibrators). And then the ad-

justment screw, normal on most deflection meters,was to be sealed. Incidentally, no values were everrecorded.

When I got free of the assistant and got back to myfriend the manager, I asked him, What in blazesis going on here? You know better than this!. Myfriends reply was, Yes, I know, but he wentaround me direct to top management. Somebodyup there was impressed with his white hair andyears of experience and overruled me. The money

he caused to be wasted there, I could have used tobuild up the rest of the lab.

My friend left that employer shortly after my visit.He went to a new startup company, and there laidthe foundations for what eventually became one of the premier metrology organizations in the nation.The assistant? Well, he hung around long enoughto become the president of one of the metrologyprofessional societiesthen he just disappeared.Nobody that I know of has heard from him in thelast forty years. His laboratory? Eventually the en-tire operation was shut down and the work con-tracted out.

With that bit of humor(?) Ill sign off. If you wish aconversation concerning Metrology or Calibration,or anything for that matter, I am always available.

Phil Painchaud1110 West Dorothy DriveBrea, CA. 92821-2017Phone: 714-529-6604FAX: 714-529-1109E-Mail:[email protected] or [email protected]

DeWAYNE B. SHARP

Many of you who have been with the MeasurementQuality Division for any length of time will re-member DeWayne Sharp, the former Editor-in-Chief of THE STANDARD. DeWayne was morethan just the Editor, he was the FOUNDING EDI-TOR , in other words, he was the CREATOR of this Journal. He and I have been close personalfriends for forty-two years, each of us a frequentvisitor at each others homes while our wives werealive. In fact, he gave the principal eulogies at thefunerals of both of my wives. He is the one whocoerced me into writing the LEARNING CURVEcolumn, the forty-second of which appears in thisissue.

Geographic separation had reduced the frequencyof our visits during recent years; I had heard thathis family had moved him from Washington Stateto Santa Barbara, California, and that he was in



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declining health. So on last Saturday, August 13,2005, my daughter, Dr. Denise Michelle and I de-cided that we should take a daylong trip and driveup to visit him.

To say the least, I was shocked by the degree of decline that I foundthis is no reflection on theability and quality of his caretakers, they are superbit is the natural decline that many of us that man-age to survive must surely face. The human body

just naturally wears out in time. The human mind issomething else again. It needs stimulation by expo-sure to what it is familiar.

After an hour and a half of Metrology talk and anexchange of friendly barbs, the repost was almostto the level of twenty years ago.

I feel that it would be a great boon if some of youcould take the time to write a letter to DeWayneand in it discuss Metrological matters; or ask hisopinion on some matter; or talk about ASQ orQMD news; or something of the sort. I could givehim just the stimulation he needs. His address:

DeWayne B. Sharp, P.E.7190Davenport Road, Apt 103Goleta, CA 93117-2944

I am enclosing a photo my daughter took after wehad been talking for about an hour. At an hour anda half, he was exhausted and we had to leave.

Phil Painchaud


DeWayne B. Sharp

(continued from page 3)

Why is this important?

Change is happening in ASQ, as in all otherplaces. In the past couple of years we have seenthe new Living Community marketing model, thenew membership model, and major changes in theSociety bylaws and at the Director level. In theSections we have seen a shift in operating structurefrom a bylaws-based system to an operating agree-ment that gives the Sections more freedom in theiroperations. A similar change is in the works for the

Divisions. We need to be prepared and able tomanage this change, and use our strengths as anorganization to take advantage of opportunities andovercome weaknesses and threats.

(By the way, information on the ASQ strategicplan is at http://www.asq.org/strategy/ it took mea while to find it!)

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Chair, Examining ChairGraeme C. PayneGK Systems, Inc.4440 Weston Drive SW, Suite BLilburn, GA 30047 USAVoice: (770) 931-4004 / Fax (866) 887-9344E-mail: [email protected]

Chair-Elect, Publication Chair, Newsletter Edi-tor/Publisher, Share Point Administrator

Jay L. BucherBucherview Metrology Services6700 Royal View Dr.De Forest, WI 53532-2775Voice (608) 277-2522 / Fax (608) 846-4269E-mail: [email protected],[email protected]

Secretary, Certification Chair, WebsiteManager, NCSL International Representative

Christopher L. GrachanenManager, Houston Metrology GroupHewlett-PackardP. O. Box 692000 MS070110Houston, TX 77269-2000Voice (281) 518-8486 / Fax (281) 518-7275E-mail: [email protected]

TreasurerKarl WigdalPromega Corp.5445 East Cheryl ParkwayMadison, WI 53711Voice (608) 277-2633 / Fax (608) 277-2516E-mail: [email protected]

Standards Committee RepresentativeBill McCulloughMcCullough Consulting1936 June CrCarson City, NV 89706Voice: (775) 883-3042 Fax: (775) 883-3042Cell: (775) 220-6424E-mail: [email protected]

Immediate Past Chair / Nominating ChairJoe Simmons Scholarship MQD RepresentativeProgram Chair

Dilip A. ShahE = mc3 Solutions197 Great Oaks Trail #130Wadsworth, Ohio 44281-8215Voice (330) 328-4400 / Fax (330) 336-3974E-mail: [email protected], [email protected]

Joe Simmons ScholarshipNorm Belecki7413 Mill Run DrDerwood, MD 20855-1156Voice (301) 869-4520E-mail: [email protected]

HistorianKeela SniadachPromega Corp.5445 East Cheryl ParkwayMadison, WI 53711Voice (608) 298-4681 / Fax (608) 277-2516E-mail: [email protected]

ASQ Division AdministratorMs. Karen ProsserVoice (800) 248-1946, x7471E-mail: [email protected]

M EASUREMENT Q UALITY DIVISION O FFICERS AND C OMMITTEE C HAIRS

Volunteers aren't paid...Not because they're worthless,but because they're priceless

Please consider volunteering with MQD. If anyonehas questions or needs more information, contactany officer or committee chair.

Thank You!

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Region 1 (CT, MA, ME, NH, RI, VT)Volunteer Opportunity!

Region 2 (NJ, NY, PA)

Volunteer Opportunity!

Region 3 (CT, NJ, NY)

Mr. Eduardo M. HeidelbergPfizerParlin, NJ 08859E-mail: [email protected]

Region 4 (Canada)

Mr. Alexander T. C. LauExxonMobilWhitby, ON L1R 1R1E-mail: [email protected]

Region 5 (DC, DE, MD, PA, VA)

Mr. Richard A. Litts

Litts Quality TechnologiesDownington, PA 19335E-mail: [email protected]

Region 6 (AK, CA, HI, ID, MT, OR, UT, WA,WY)


Region 7 (AZ, CA, NV, part of Mexico)

Mr. Randy D. FarmerMetrology Solutions

Chula Vista, CA 91913E-mail: [email protected]

Region 8 (OH, PA)


Region 9 (IN, KY, OH)


Region 10 (OH, MI)


Region 11 (NC, SC, TN, VA)


Region 12 (IL, MN, ND, SD, WI)

Dr. Donald S. Ermer ASQ Fellow; Eugene L. Grant Medal(2001)University of WisconsinMadisonMadison, WI 53706E-mail: [email protected]

Region 13 (CO, IA, KS, MO, NE, SD, WY)


Region 14 (AR, LA, NM, OK, TX, part of Mexico)

Mr. R. Keith BennettTRANSCATKingwood, TX 77339E-mail: [email protected]

Region 15 (AL, FL, GA, LA, MS, Puerto Rico)

Mr. E. Bryan Miller ASQ FellowBryan Miller Consulting

Florence, AL 35633E-mail: [email protected]

Region 25 (all other countries)


ASQ M EASUREMENT Q UALITY D IVISION R EGIONAL C OUNCILORS

Regional Councilors represent the Division to members and Sections in theirgeographic areas. Regional Councilors are appointed for renewable two-year

terms, and are advisory members of the Division leadership team.

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Measurement Quality Division Inspection Division Joint Conference

September 21-23, 2005Hosted by:

NSWC Corona2300 Fifth StreetNorco, CA 92860

Registration and Continental Breakfast Starts at 7:30 am

Conference : 9:00 am to 4:00 pm

Please join us for this informative and educational conference.All conference attendees receive the full conference proceedings on CD.

Measurement Quality DivisionInspection Divisionc/o 197 Great Oaks Trail #130Wadsworth, Ohio 44281-8215

http://www.asq.org/inspecthttp://www.asq.org/measure

2005 MQD/ID Conference Committee:Mr. Duane Allen, NSWC Corona ASQ Measurement Quality Division (NSWC Liaison)

Ms. Mollie Brown , Li lly Technological Center ASQ Inspection DivisionMs. Jenny Persful, Sabin Corporation ASQ Inspection Division

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Conference Location:

NSWC Corona2300 Fifth StreetNorco, CA 92860

Nearby Airports:There are three major airports serving the greater LA area: Los Angeles International (LAX), John Wayne Airport (SNA)in Orange County, and Ontario International Airport (ONT) in Ontario. The Ontario International Airport is the rec-ommended destination since it is the closest to NSWC Corona Division and avoids hectic traffic at LAX .

Estimated drive time for each airport is given below. Maps for each airport are obtainable on the internet at various web-sites. Ontario International Airport (20 min) John Wayne/ Orange County Airport (45 min) Los Angeles International Airport (90 min)

2005 MQD/ID Conference Committee

Mr. Duane Allen, NSWC Corona ASQ Measurement Quality Division (NSWC Liaison)Ms. Mollie Brown, Lilly Technological Center ASQ Inspection Division

Ms. Jenny Persful, Sabin Corporation ASQ Inspection DivisionMr. Dilip A. Shah, E = mc 3 Solutions ASQ Measurement Quality Division

CORONA AREA HOTELSAyres Suites - Corona East (Designated Conference Hotel)

2260 Griffin WayCorona, CA

(951) 734-2140www.ayreshotels.com/coronaeast/

Ayres Suites - Corona West1900 Frontage Road

Corona, CA(951) 738-9113

www.ayreshotels.com/coronawest/

Residence Inn by Marriott 2025 Montecito Dr.Corona, CA 92879

(951) 371-0107www.marriott.com

ONTARIO AREA HOTELSAyres Suites at the Ontario Mills Mall

4390 East Mills CircleOntario, CA 91764

(909) 481-0703www.ayreshotels.com/ontariomills/

Residence Inn by Marriott 2025 Convention Center Way

Ontario, CA 91764(909) 937-6788

www.marriott.com

Hilton - Ontario Airport 700 North Haven Ave

Ontario, CA 91764(909) 980-0400

www.hilton.com

RIVERSIDE AREA HOTELSThe Historic Mission Inn

3649 Mission InnRiverside, CA 92501

(800) 843-7755www.missioninn.com

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Thursday, September 22, 2005Time Program

7:30 - 8:30 Registration, Breakfast

8:30 - 9:00 Welcome, Opening Remarks

9:00 - 9:45 Insuring the Quality of your Measurement Data Robert M. Graham, Sandia National Laboratories

Millions of measurements are taken every day, in all types of operations. But how do you know that those measurements are

valid? This talk will present four questions you should ask yourself; the answers will tell you where to concentrate your re-sources to insure that your measurements will have the necessary level of quality.

9:45:10:00 Coffee Break, Exhibit Viewing

10:00-10:45 Understanding Test Uncertainty Ratio Helps Improve Calibration Service Keith Bennett, Transcat CorporationTest and measurement equipment (T&ME) must be periodically calibrated to ensure it's operating within its specified parame-ters. Of course, the uncertainty of the system used to calibrate the equipment shouldn't add appreciable error to this process. AsTURs decrease the confidence of the UUT being in tolerance also decreases.

10:45-11:30 Practical Example of Mass Calibration and determining Measurement Uncertainty Emil Hazarian, NSWC , Corona.

This presentation provides a practical example of mass calibration and determination of measurement Uncertainties associatedwith the calibration.

11:30 1:00 Lunch and Award Presentations

1:00 - 3:00 Measurement Science and Technology Laboratory TOUR (Pre-register for tour before September 10. Certainrestrictions apply) U.S. Citizens only. See Tour registration Form

3:00-3:15 Coffee Break, Exhibit Viewing

3:15 - 4:00 USP 41 Panel Discussion Mark Ruefenacht, Heusser Neweigh The Pharmacopeial Forumthe U.S. Pharmacopeias (USP), Rockville, Md., journal for the development and revision of itsofficial standardsrecently published recommended changes to the USP, Chapter 41, Balances and Weights. Four significantchanges have been proposed to USP 41 for the evaluation and use of weighing instruments (scales and balances) used in thepharmaceutical environment.

4:00-4:15 Wrap up for the dayFriday, September 23, 2005

Time Program

7:30 - 8:30 Registration, Breakfast

8:30 - 9:15 Quality, Culture and Social Responsibility Approaches Navin S. Dedhia, (Retired: Hitachi Global Storage Technologies, Inc.)

Many companies and organizations strive to be quality conscience, culture sensitive and socially responsible. Poll shows that84% of consumers agree that it is important to buy from an organization with a high degree of social responsibility. By somemeasures, modern-day consumers appear to be more concerned about social and environmental issues than ever before. Manybusiness leaders have moved beyond the basic need to justify the incorporation of greater corporate social responsibility (CSR)into the way they manage their enterprise. Statistics prove that CSR profiling increases sales, customer dedication and brandrecognition. Whatever dollar value is invested in it, ten-fold return is obtained. CSR is the future role of business. Well estab-lished culture and social responsibility give birth to the quality product. Quality, culture and social responsibility have the samerelation as the quality, cost and delivery. Quality, culture and social responsibility are interrelated.

9:15-10:00 Process Control for Personal Health: Using The HOPE Model. Dr. E.F. Bud Gookins, Strategic Quality Consulting

The Process Control Analysis is a widely used tool for analyzing variation in manufacturing processes. Once a manufacturingprocess is deemed stable and the process functions have been "frozen" the monitoring and maintaining criteria become an essen-tial process applicator. This paper walks us through the "How to" of a typical process control analysis by using our personalhealth factors and applying the "HOPE Model", a paradigm for losing weight and maintaining good health.

10:00-10:15 Coffee Break, Exhibit Viewing(1.5 Recertification Units are granted for conference attendance)

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Friday, September 23, 2005Time Program

10:15-11:00 Lean Sigma: Application for Fleet Management Services John Vandenbemden, VP Quality Assurance and Process Development, First Vehicle Services

Six Sigma methodologies have only begun to be applied to such areas as Fleet Management Services. Combining aspects of Lean manufacturing and ISO9000: 2000 allows this industry to utilize these techniques and increase profitability of the business.The implementation of Quality Management Systems and Six Sigma is new approaches to this industry. The small independent

job shop approach is being replaced with systematic repeatable information driven system focused on customer service. This

approach provides new business opportunities in both the private and public markets.11:00-11:45 Topic: To be announced

Willy Zech

To be announced: Check website for updated brochure. ( http://www.asq.org/inspect or http://www.asq.org/measure )

11:45-12:45 Lunch and Award Presentations

1:00-1:45 Recent Measurement Quality Division InitiativesGraeme Payne, Chair-MQD/Dilip A. Shah, Past Chair-MQD

The American Society for Qualitys Measurement Quality Division has taken an active role on various metrology related activi-ties since 1999. This presentation summarizes the accomplishments of the Measurement Quality Division and provides a generalreport. Topics include the ASQs certified Calibration Technician Exam, the Metrology Handbook and the Joint MQD/NCSLIMetrology job description initiative.

1:45-2:30 Changes to ISO 17025 standard: 2005 revision Dilip A. Shah, Past Chair, Measurement Quality Division, E = mc 3 Solutions

The 2005 revision of ISO 17025 standard was released on May 15, 2005. This presentation highlights the changes and how itcan affect your laboratory.

2:30-2:45 Coffee Break, Exhibit Viewing

2:45-3:45 Closing Remarks, Raffle Drawing

HAVE A SAFE TRIP BACK HOME!

Measurement Science and Technology Laboratory Tour Registration(Thursday, September 22, 2005 (1:003:00 PM)

Full Name: ______________________________________________________________

Job Title: _______________________________________________________________

Organization/Company: ___________________________________________________

Are you a representative of a Foreign Interest? _____ YES _____ NO

If yes, state your affiliation: _______________________________________________________

Are you a US Citizen? _____ YES _____ NO (The tour is open to US citizens only)

Phone Number: _________________________________

I certify that the above statements are true.

Signature: _______________________________________ Date: _________________

During the tour, cell phones must be turned off. NO photo capable cell phones allowed. No recording devicesallowed. NO cameras allowed (We advise leaving the phone/camera in the car or the hotel).

All tour participants must have a valid government issued photo ID. (e.g. Drivers License, passport)

This tour registration MUST accompany conference registration and reach us before September 10, 2005. Absolutely NOexceptions! Late registrations for the tour will not be allowed.

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Tutorial Workshop on September 21, 2005 (9:00 AM1:00 PM) - Choose one

Calibration & Use of Weighing Devices in an AnalyticalEnvironment Workshop

Weigh processes are a significant part of many manufacturing and analytical processes. This workshop will present an overviewof the calibration and use of weighing devices in the analytical environment. It will focus on the use of weighing techniques, cor-

rect procedures, eliminating and minimizing sources of errors, and compliance with weighing requirements of the USP and ASTM.Additionally, the workshop will present basic concepts and methods for calculating and evaluating the uncertainty of balance andscale calibrations. This approach is based on the content of NIST IR6919, Recommended Guide for Determining and ReportingUncertainties for Balances and Scales.

Proposed changes to USP 41 and current status of the changes will be discussed. Presentation handouts and NIST IR6919 will beprovided to all participants.(0.5 Re-certification Units Granted)

Workshop Leader: Mark Ruefenacht, HEUSSER NEWEIGH

Breakfast, Lunch and refreshments are included in the workshop registration.

Tutorial Workshop on September 21, 2005 (9:00 AM4:00 PM) - Choose one

Geometric Dimensioning & Tolerancing WorkshopThe basics of GD&T will be reviewed. Included will be some hands on examples of measuring of part features using the applica-tion of GD&T principals. Starting with attendee's basic print reading knowledge, the tutorial will cover the symbols, terminologyand rules of Geometric Dimensioning & Tolerancing as based on the current version of the standard ASME Y14.5M-1994.

Areas covered will include the basics of datums, material condition symbols, form, profile, orientation, run out, and location toler-ances. Also included is a review of bonus tolerancing and a comparison between conventional tolerancing and positional toleranc-ing. Composite positional tolerancing will be reviewed including use of the two single segment feature control frames.

In addition, the use of GD&T with gages will be reviewed including the concepts of a MMC hole in relation to another MMC holeand a MMC hole in relation to a RFS hole.

This tutorial is designed for inspectors, quality engineers, quality managers, machinists, supervisors, manufacturing engineers andothers interested in greater understanding of engineering drawings with GD&T specifications.

The tutorial is presented from the perspective of an Inspector. Attendees should have an understanding of conventional engineer-ing drawings.(1.0 Re-certification Units Granted)

Learning objectives:After attending, participants will be able to

Identify Datums and their use

Understand the relationship of size dimensions to the form of the part.Interpret feature control framesCompute MMC & LMC valuesCompute positional tolerance zones including use of bonus tolerancing.Design simple MMC gages under GD&T controlInterpret the Five General Rules of GD&TInspect to composite positional tolerancing requirements

Workshop Leader: Gregory S. Gay, ASQ Fellow - ASQ Certified CMI, CQT, CQA, CQE

Breakfast, Lunch and refreshments are included in the workshop registration.

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Name: ___________________________________________ Phone ( ) __________________________

Company: ________________________________________ Fax ( ) ___________________________

Address: ______________________________________________ E-Mail__________________________(required for confirmation)

Please photocopy for additional attendees or send additional attendee names on a separate piece of paper.

ASQ Member? Y / N : Membership Number: __________________________

DIVISION MEMBER? Measurement Quality ________ Inspection ________

NSWC Employees check here: ______

U.S. Citizen? Yes ________ No ________ Other: ___________________________________(1.5 Recertification Units are granted for conference attendance)

Conference Admission includes breakfast, coffee breaks and lunch.

Method of Payment:

Check or money order # ___________________ We regret that we cannot accept a Purchase Order.

Credit card: VISA _____ MASTERCARD _______AMEX________ Authorized Amount: $ __________

Card Number: ______________________________________________ Exp. Date: __________________

Authorized Signature: _________________________________(Required for credit card Authorization)Registrations will not be processed without authorized signature.

Mail or Fax this form to:

Measurement Quality/

Inspection DivisionConferencec/o E= mc 3 Solutions

197 Great Oaks Trail #130Wadsworth, OH

44281-8215

Phone: (330)--328-4400Fax: (330)- 336-3974

E-Mail: [email protected]

Confirmations will be sent via e-mail on September 12,

2005

EXHIBITORS:

Exhibit displays shall be set up in the conference hall perimeter .

The cost to set up an exhibit display table is $200.00.

If you would like to set up a display, please call or e-mail:

Dilip Shah - Phone: (330)--328-4400

E-Mail: [email protected]

Make checks payable to: Measurement Quality Division . Credit Cards will be processed by E = mc 3 Solutions andreflected so on your credit card statement. All cancellations after September 12, 2005 are subject to a $75 cancella-

tion fee . However, no shows and cancellations received within 5 working days prior to the conference will be charged thefull amount. Substitutions/alternates are permitted without any extra cost. Audio/videotaping not allowed.

Tutorial WorkshopsIn addition to the conference program, 2 tutorial workshops are planned on September 21, 2005:

Calibration & Use of Weighing Devices in an Analytical Environment WorkshopGeometric Dimensioning & Tolerancing Workshop

Workshop registration begins at 8:00 a.m. Complimentary Breakfast, coffee breaks and lunch is provided

Full-day Workshop starts at 9:00 a.m. and ends at 4:00 p.m.Half-day Workshop starts at 9:00 a.m. and ends at 1:00 p.m.

Note: Registrations must be received by September 10, 2005 to qualify for early registration discount

TotalNote: Workshops run concurrently. Choose one only

$ 200.00$ 200.00Exhibit Table: $ 200.00/table

$ 200.00$ 175.00Early Registration Discount

(Before Sep. 10, 2005)

$ 225.00$ 200.00Conference (September 22-23, 2005)

$ (25.00)$ (25.00)Deduct $25.00 from Workshop for early

registration before Sep. 10, 2005

$ 150.00$ 125.00

SEPTEMBER 21, 2005: Calibration & Use ofWeighing Devices in an AnalyticalEnvironment Workshop (4 hours)

$ 275.00$ 225.00SEPTEMBER 21, 2005:G D & T Workshop (8

hours)

AmountASQ

Non MemberASQ MemberDescriptionQty.

Note: Registrations must be received by September 10, 2005 to qualify for early registration discount

TotalNote: Workshops run concurrently. Choose one only

$ 200.00$ 200.00Exhibit Table: $ 200.00/table

$ 200.00$ 175.00Early Registration Discount

(Before Sep. 10, 2005)

$ 225.00$ 200.00Conference

Documents

2005 September