093161R-ITCEP07V06 Certificate-微星 MS-1351

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:[email protected] http://www.quietek.com

CERTIFICATE

Issued Date: Mar. 25, 2009 Report No. : 093161R-ITCEP07V06

This is to certify that the following designated product

Product : Notebook

Trade name : MSI

Model Number : MS-1351, X320

Company Name : MICRO-STAR INT’L Co., LTD.

This product, which has been issued the test report listed as above in QuieTek

Laboratory, is based on a single evaluation of one sample and confirmed to

comply with the requirements of the following EMC standard.

EN 55022: 2006 EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2: 2006 IEC 61000-4-2 Edition 1.2: 2001-04

EN 61000-3-3: 1995+A1: 2001+A2: 2005 IEC 61000-4-3 Edition 3.0: 2006

IEC 61000-4-4: 2004

IEC 61000-4-5 Edition 2.0: 2005

IEC 61000-4-6 Edition 2.2: 2006

IEC 61000-4-8 Edition 1.1: 2001-03

IEC 61000-4-11 Second Edition: 2004-03

TEST LABORATORY

Vincent Lin / Manager

Test Report

Product Name ： Notebook

Model No. ： MS-1351, X320

Applicant ： MICRO-STAR INT’L Co., LTD.

Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Date of Receipt ： 2009/03/10

Issued Date ： 2009/03/25

Report No. ： 093161R-ITCEP07V06

Version ： V1.0

The test results relate only to the samples tested.

The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein.

This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government.

The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). The listed standards as below were applied: The following Equipment:

Product : Notebook


Trade Name : MSI

This product is herewith confirmed to comply with the requirements set out in the

Council Directive on the Approximation of the laws of the Member States relating to

Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding

EMC, the following standards were applied:

RFI Emission:

EN 55022:2006, Class B : Product family standard

EN 61000-3-2:2006, Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1: 2001+A2: 2005 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1: 2001+A2: 2003 : Product family standard

The following importer/manufacturer is responsible for this declaration:

Company Name :

Company Address :

Telephone : Facsimile :

Person is responsible for marking this declaration:

Name (Full Name) Position/ Title

Date Legal Signature

QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: [email protected]

QTK No.: 093161R-ITCEP07V06

S ta tement o f Conformi ty

This certifies that the following designated product:

Product : Notebook


Trade Name : MSI

Company Name : MICRO-STAR INT’L Co., LTD.

This product is herewith confirmed to comply with the requirements set out in the

Council Directive on the Approximation of the laws of the Member States relating to

Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding

EMC, the following standards were applied:

RFI Emission:

EN 55022:2006, Class B : Product family standard

EN 61000-3-2:2006, Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1: 2001+A2: 2005 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1: 2001+A2: 2003 : Product family standard

TEST LABORATORY

Vincent Lin / Manager

The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.

Report No： 093161R-ITCEP07V06

Page: 2 of 152

Test Report Cert i f icat ion Issued Date : 2009/03/25 Report No. : 093161R-ITCEP07V06

Product Name : Notebook

Applicant : MICRO-STAR INT’L Co., LTD.

Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Manufacturer : MICRO-STAR INT’L Co., LTD.

Model No. : MS-1351, X320

Rated Voltage : AC 230 V / 50 Hz

EUT Voltage : AC 100-240V, 50-60Hz

Trade Name : MSI

Applicable Standard : EN 55022: 2006 Class B

EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2:2006

EN 61000-3-3:1995+A1: 2001+A2: 2005

Test Result : Complied

Performed Location : Quietek Corporation (Linkou Laboratory)

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang,

Taipei, 244 Taiwan, R.O.C.

TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789

Documented By :

( Senior Engineering Adm. Specialist /

Anita Chou )

Reviewed By :

( Engineer / Harrison Chen )

Approved By :

( Manager / Vincent Lin )


Page: 3 of 152

Laboratory Information We , QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and specified testing scopes:

The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site :http://tw.quietek.com/modules/enterprise/services.php?item=100 The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory :

No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : [email protected]

LinKou Testing Laboratory :

No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

Suzhou (China) Testing Laboratory :

No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China.TEL : +86-512-6251-5088 / FAX : +86-512-6251-5098 E-Mail : [email protected]

Taiwan R.O.C. : BSMI, NCC, TAF

Germany : TUV Rheinland

Norway : Nemko, DNV

USA : FCC, NVLAP

Japan : VCCI


Page: 4 of 152

TABLE OF CONTENTS Description Page 1. General Information .................................................................................................... 7

1.1. EUT Description................................................................................................... 7

1.2. Mode of Operation............................................................................................... 8

1.3. Tested System Details ....................................................................................... 11

1.4. Configuration of Tested System......................................................................... 12

1.5. EUT Exercise Software...................................................................................... 13

2. Technical Test ........................................................................................................... 14

2.1. Summary of Test Result..................................................................................... 14

2.2. List of Test Equipment ....................................................................................... 15

2.3. Measurement Uncertainty.................................................................................. 18

2.4. Test Environment ............................................................................................... 20

3. Conducted Emission (Main Terminals)...................................................................... 21

3.1. Test Specification............................................................................................... 21

3.2. Test Setup.......................................................................................................... 21

3.3. Limit ................................................................................................................... 21

3.4. Test Procedure .................................................................................................. 22

3.5. Deviation from Test Standard............................................................................. 22

3.6. Test Result ......................................................................................................... 23

3.7. Test Photograph ................................................................................................ 41

4. Conducted Emissions (Telecommunication Ports).................................................... 44


4.2. Test Setup.......................................................................................................... 44

4.3. Limit ................................................................................................................... 44

4.4. Test Procedure .................................................................................................. 45


4.6. Test Result ......................................................................................................... 46

4.7. Test Photograph ................................................................................................ 64

5. Radiated Emission.................................................................................................... 67


5.2. Test Setup.......................................................................................................... 67

5.3. Limit ................................................................................................................... 67

5.4. Test Procedure .................................................................................................. 68


5.6. Test Result ......................................................................................................... 69

5.7. Test Photograph ................................................................................................ 75

6. Harmonic Current Emission ...................................................................................... 78


Page: 5 of 152


6.2. Test Setup.......................................................................................................... 78

6.3. Limit ................................................................................................................... 78

6.4. Test Procedure .................................................................................................. 80


6.6. Test Result ......................................................................................................... 81

6.7. Test Photograph ................................................................................................ 87

7. Voltage Fluctuation and Flicker................................................................................. 89


7.2. Test Setup.......................................................................................................... 89

7.3. Limit ................................................................................................................... 89

7.4. Test Procedure .................................................................................................. 90


7.6. Test Result ......................................................................................................... 91

7.7. Test Photograph ................................................................................................ 94

8. Electrostatic Discharge ............................................................................................. 96


8.2. Test Setup.......................................................................................................... 96

8.3. Limit ................................................................................................................... 96

8.4. Test Procedure .................................................................................................. 97


8.6. Test Result ......................................................................................................... 98

8.7. Test Photograph .............................................................................................. 101

9. Radiated Susceptibility ........................................................................................... 103

9.1. Test Specification............................................................................................. 103

9.2. Test Setup........................................................................................................ 103

9.3. Limit ................................................................................................................. 103

9.4. Test Procedure ................................................................................................ 104

9.5. Deviation from Test Standard........................................................................... 104

9.6. Test Result ....................................................................................................... 105

9.7. Test Photograph .............................................................................................. 108

10. Electrical Fast Transient/Burst ......................................................................... 110


10.2. Test Setup........................................................................................................ 110

10.3. Limit ................................................................................................................. 110

10.4. Test Procedure .................................................................................................111

10.5. Deviation from Test Standard............................................................................111

10.6. Test Result ....................................................................................................... 112


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10.7. Test Photograph .............................................................................................. 115

11. Surge ............................................................................................................... 118


11.2. Test Setup........................................................................................................ 118

11.3. Limit ................................................................................................................. 118

11.4. Test Procedure ................................................................................................ 119


11.6. Test Result ....................................................................................................... 120

11.7. Test Photograph .............................................................................................. 123

12. Conducted Susceptibility ................................................................................. 125


12.2. Test Setup........................................................................................................ 125

12.3. Limit ................................................................................................................. 126

12.4. Test Procedure ................................................................................................ 126


12.6. Test Result ....................................................................................................... 127

12.7. Test Photograph .............................................................................................. 130

13. Power Frequency Magnetic Field .................................................................... 133


13.2. Test Setup........................................................................................................ 133

13.3. Limit ................................................................................................................. 133

13.4. Test Procedure ................................................................................................ 133


13.6. Test Result ....................................................................................................... 134

13.7. Test Photograph .............................................................................................. 137

14. Voltage Dips and Interruption........................................................................... 139


14.2. Test Setup........................................................................................................ 139

14.3. Limit ................................................................................................................. 139

14.4. Test Procedure ................................................................................................ 140


14.6. Test Result ....................................................................................................... 141

14.7. Test Photograph .............................................................................................. 144

15. Attachment ...................................................................................................... 146

　 EUT Photograph .............................................................................................. 146


Page: 7 of 152

1. General Information

1.1. EUT Description Product Name Notebook Trade Name MSI Model No. MS-1351, X320

Keypart List Item Priority Vendor Model Discription CPU 1st INTEL ATOM(TM), Z530, 1.6GHz INTEL/AC80566UE025DW (SLB6P)

1st CHI MEI N134B6-L04 13.4 inch, WXGA, 1366x768,GLARE, LEDLCD 2nd Samsung LTN134AT01 13.4 inch, WXGA, 1366x768,GLARE, LED

WD1600BEVT 160G WD2500BEVT 250G WD3200BEVT 320G

1st WD

WD5000BEVT 500G MHZ2160BH 160G MJA2250BH 250G 2nd Fujitsu MJA2320BH 320G MK1655GSX 160G MK2555GSX 250G MK3255GSX 320G

HDD

3rd Toshiba

MK5055GSX 500G SSD 1st Phison PZB032GTMC0-P70 32G MLC

Transcend (ETT) JM800QSU-2G 2GB, 400 (800) MHz

Transcend (Elpida) TS256MSQ64V8U 2GB, 400 (800) MHz

Samsung (Samsung) M470T5663QZ3-CF7 2GB, 400 (800) MHz

UNIFOSA (Elpida) GU332G0ALEPR8H2F 2GB, 400 (800) MHz

A-DATA (Hynix) HYOVF1B163BZ 2GB, 400(800) MHz

2GB

Hynix (tiva die) HYMP125S64CP8-S6 2GB, 400(800) MHz Transcend (ETT) JM800QSU-1G 1GB, 400(800) MHz

Transcend (Elpida) TS128MSQ64V8U 1GB, 400(800) MHz

Samsung M470T2864QZ3-CF7 1GB, 400(800) MHz A-DATA (Hynix) HYOVF1A0834Z 1GB, 400(800) MHz UNIFOSA (Elpida) GU331G0ALEPR612F 1GB, 400(800) MHz

DRAM (DDRII 800)

1GB

Hynix (tiva die) HYMP112S64CP6-S6 1GB, 400(800) MHz MS-6891 802.11b/g/n 1T1R WLAN 2nd MSI MS-6896 802.11b/g/n 1T2R

Bluetooth 1st MSI MS-6837D -- 1st LI SHIN 0225A2040 40W, 90-265Vin, 2A, 20Vout, R43011 2nd Delta ADP-40MH BD 40W, 90-264Vin, 2A, 20Vout, R33030 Adaptor 3rd ENERTRONIX EXA0803YI R32379

1st BISON BN82M6S8-000 1.3M Pixels/6AA/ALI 5608/HEIGHT 3.65mm/RIGHT PLUG

Camera 2nd

AzureWave AM-1S004 SYS/OPTICAL MODULE/CMOS CAMERA MODULE/1.3M ixels/6AA/GL860A/HEIGHT 3.45 +0.15/-0.2mm/RIGHT PLUG, RoHS COMPLIANCE

3G Module 1st HUAWEI EM770 HUAWEI/EM770 Battery 1st Simplo BTY-S31 14.8Vdc, 2150mAh.

Note:

The EUT is including two models, The MS-1351 for MSI and the X320 for different marketing

requirement.


Page: 8 of 152

1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were

carried out with the EUT in normal operation, which was shown in this test report and defined as:

Pre-Test Mode

Mode 1

Mode 2

Mode 3

Mode 4

Mode 5

Mode 6

Mode 7 Mode 8 Mode 9 Mode 10 Mode 11 Mode 12

Final Test Mode

Emission

Mode 1

Mode 2

Mode 3

Immunity Mode 1

Mode 2

Mode 3

ITEM Mode 1 Mode 2 CPU INTEL ATOM(TM), Z530, 1.6GHz INTEL ATOM(TM), Z530, 1.6GHz Display/Resolution LCD+CRT/ 1366X768/60Hz LCD+CRT/ 1366X768/60Hz Panel CHI MEI, N134B6-L04 Samsung, LTN134AT01-G01 H.D.D WD, WD1600BEVT, 160G WD, WD2500BEVT, 250G S.S.D Phison, PZB032GTMC0-P70 Phison, PZB032GTMC0-P70 DRAM Transcend, JM800QSU-2G, 2GB Transcend, TS256MSQ64V8U, 2GB Wireless LAN MSI, MS-6891 MSI, MS-6896 Bluetooth MSI, MS-6837D MSI, MS-6837D CCD BISON, BN82M6S8-000, 1.3M Azurewave, AM-1S004, 1.3M Battery Pack Simplo, BTY-S31, 14.8Vdc, 2150mAh Simplo, BTY-S31, 14.8Vdc, 2150mAh AC Adapter LI SHIN, 0225A2040 Delta, ADP-40MH BD 3G Module HUAWEI, EM770 HUAWEI, EM770

ITEM Mode 3 Mode 4 CPU INTEL ATOM(TM), Z530, 1.6GHz INTEL ATOM(TM), Z530, 1.6GHz Display/Resolution LCD+CRT/ 1366X768/60Hz LCD+CRT/ 1366X768/60Hz Panel CHI MEI, N134B6-L04 Samsung, LTN134AT01-G01 H.D.D WD, WD3200BEVT, 320G WD, WD3200BEVT, 320G S.S.D Phison, PZB032GTMC0-P70 Phison, PZB032GTMC0-P70 DRAM Sansung, M470T5663QZ3-CF7, 2GB UNIFOSA, GU332G0ALEPR8H2F, 2GB Wireless LAN MSI, MS-6891 MSI, MS-6896 Bluetooth MSI, MS-6837D MSI, MS-6837D CCD BISON, BN82M6S8-000, 1.3M Azurewave, AM-1S004, 1.3M Battery Pack Simplo, BTY-S31, 14.8Vdc, 2150mAh Simplo, BTY-S31, 14.8Vdc, 2150mAh AC Adapter ENERTRONIX, EXA0803YI LI SHIN, 0225A2040 3G Module HUAWEI, EM770 HUAWEI, EM770


Page: 9 of 152

ITEM Mode 5 Mode 6 CPU INTEL ATOM(TM), Z530, 1.6GHz INTEL ATOM(TM), Z530, 1.6GHz Display/Resolution LCD+CRT/ 1366X768/60Hz LCD+CRT/ 1366X768/60Hz Panel CHI MEI, N134B6-L04 Samsung, LTN134AT01-G01 H.D.D WD, WD5000BEVT, 500G Fujitsu, MHZ2160BH, 160G S.S.D Phison, PZB032GTMC0-P70 Phison, PZB032GTMC0-P70 DRAM A-DATA, HYOVF1B163BZ, 2GB Hynix, HYMP125S64CP8-S6, 2GB Wireless LAN MSI, MS-6891 MSI, MS-6896 Bluetooth MSI, MS-6837D MSI, MS-6837D CCD BISON, BN82M6S8-000, 1.3M Azurewave, AM-1S004, 1.3M Battery Pack Simplo, BTY-S31, 14.8Vdc, 2150mAh Simplo, BTY-S31, 14.8Vdc, 2150mAh AC Adapter Delta, ADP-40MH BD ENERTRONIX, EXA0803YI 3G Module HUAWEI, EM770 HUAWEI, EM770

ITEM Mode 7 Mode 8 CPU INTEL ATOM(TM), Z530, 1.6GHz INTEL ATOM(TM), Z530, 1.6GHz Display/Resolution LCD+CRT/ 1366X768/60Hz LCD+CRT/ 1366X768/60Hz Panel CHI MEI, N134B6-L04 Samsung, LTN134AT01-G01 H.D.D Fujitsu, MJA2250BH, 250G Fujitsu, MJA2320BH, 320G S.S.D Phison, PZB032GTMC0-P70 Phison, PZB032GTMC0-P70 DRAM Transcend, JM800QSU-1G, 1GB Transcend, TS128MSQ64V8U, 1GB Wireless LAN MSI, MS-6891 MSI, MS-6896 Bluetooth MSI, MS-6837D MSI, MS-6837D CCD BISON, BN82M6S8-000, 1.3M Azurewave, AM-1S004, 1.3M Battery Pack Simplo, BTY-S31, 14.8Vdc, 2150mAh Simplo, BTY-S31, 14.8Vdc, 2150mAh AC Adapter LI SHIN, 0225A2040 Delta, ADP-40MH BD 3G Module HUAWEI, EM770 HUAWEI, EM770

ITEM Mode 9 Mode 10 CPU INTEL ATOM(TM), Z530, 1.6GHz INTEL ATOM(TM), Z530, 1.6GHz Display/Resolution LCD+CRT/ 1366X768/60Hz LCD+CRT/ 1366X768/60Hz Panel CHI MEI, N134B6-L04 Samsung, LTN134AT01-G01 H.D.D Toshiba, MK1655GSX, 160G Toshiba, MK2555GSX, 250G S.S.D Phison, PZB032GTMC0-P70 Phison, PZB032GTMC0-P70 DRAM Sansumg, M470T2864QZ3-CF7, 1GB A-DATA, HYOVF1A0834Z, 1GB Wireless LAN MSI, MS-6891 MSI, MS-6896 Bluetooth MSI, MS-6837D MSI, MS-6837D CCD BISON, BN82M6S8-000, 1.3M Azurewave, AM-1S004, 1.3M Battery Pack Simplo, BTY-S31, 14.8Vdc, 2150mAh Simplo, BTY-S31, 14.8Vdc, 2150mAh AC Adapter ENERTRONIX, EXA0803YI LI SHIN, 0225A2040 3G Module HUAWEI, EM770 HUAWEI, EM770


Page: 10 of 152

ITEM Mode 11 Mode 12 CPU INTEL ATOM(TM), Z530, 1.6GHz INTEL ATOM(TM), Z530, 1.6GHz Display/Resolution LCD+CRT/ 1366X768/60Hz LCD+CRT/ 1366X768/60Hz Panel CHI MEI, N134B6-L04 Samsung, LTN134AT01-G01 H.D.D Toshiba, MK3255GSX, 320G Toshiba, MK5055GSX, 500G S.S.D Phison, PZB032GTMC0-P70 Phison, PZB032GTMC0-P70 DRAM UNIFOSA, GU331G0ALEPR612F, 1GB Hynix, HYMP112S64CP6-S6, 1GB Wireless LAN MSI, MS-6891 MSI, MS-6896 Bluetooth MSI, MS-6837D MSI, MS-6837D CCD BISON, BN82M6S8-000, 1.3M Azurewave, AM-1S004, 1.3M Battery Pack Simplo, BTY-S31, 14.8Vdc, 2150mAh Simplo, BTY-S31, 14.8Vdc, 2150mAh AC Adapter Delta, ADP-40MH BD ENERTRONIX, EXA0803YI 3G Module HUAWEI, EM770 HUAWEI, EM770


Page: 11 of 152

1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including

inserted cards) are:

Product Manufacturer Model No. Serial No. Power Cord

1 Monitor Dell 2407WFPb CN-0FC255-46633-638-1MDS Non-Shielded, 1.8m

2 Microphone &

Earphone

PCHOME N/A N/A N/A

3 USB Mouse Logitech M-BE58 HCA24311471 N/A

4 Notebook PC DELL PPT N/A Non-Shielded, 0.8m

5 Printer EPSON StyLus C63 FAPY094246 Non-Shielded, 1.9m

6 IPod nano Apple A1199 YM709RBUVQ5 N/A

7 Universal Radio

Communication

tester

Rohde &

Schwarz

CMU200 104846 Non-Shielded, 1.8m


Page: 12 of 152

1.4. Configuration of Tested System

Connection Diagram

Signal Cable Type Signal cable Description

A LAN Cable Non-Shielded, 7.0m

B D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded.

C Earphone & Microphone Cable Non-Shielded, 1.6m

D USB Cable Shielded, 1.5m

E USB Cable Shielded, 1.5m

F USB Cable Shielded, 1.5m


Page: 13 of 152

1.5. EUT Exercise Software

1 Setup the EUT and peripheral as shown on Figure

2 Connect the power to EUT and peripherals, then turn on the power of all equipments.

3 Waiting for EUT to enter Window Windows Vista Operating System, and adjust the display resolution to the test mode.first.

4 Connect LAN and Telecom to Notebook PC for transmitting data.

5 Activate Wireless interface and Bluetooth function, and perform the wireless data communication with the other Notebook (write/delete action).

6 Run Windows Media Player program and play a disk with color Bar pattern

7 Carry out the function of the EUT cell-phone and platform of simulation base of cell-phone and do the line

8 Run “H＂ pattern.

9 Begin to test and repeat the above procedure (4)~(7)


Page: 14 of 152

2. Technical Test

2.1. Summary of Test Result

No deviations from the test standards

Deviations from the test standards as below description:

Emission

Performed Item Normative References Test

Performed Deviation

Conducted Emission EN 55022:2006 Class B Yes No

Impedance Stabilization Network EN 55022:2006 Class B Yes No

Radiated Emission EN 55022:2006 Class B Yes No

Power Harmonics EN 61000-3-2:2006 Yes No

Voltage Fluctuation and Flicker EN 61000-3-3:1995+A1: 2001+A2: 2005 Yes No

Immunity

Performed Item Normative References Test

Performed Deviation

Electrostatic Discharge IEC 61000-4-2 Edition 1.2: 2001-04 Yes No

Radiated susceptibility IEC 61000-4-3 Edition 3.0: 2006 Yes No

Electrical fast transient/burst IEC 61000-4-4:2004 Yes No

Surge IEC 61000-4-5 Edition 2.0: 2005 Yes No

Conducted susceptibility IEC 61000-4-6 Edition 2.2: 2006 Yes No

Power frequency magnetic field IEC 61000-4-8 Edition 1.1: 2001-03 Yes No

Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03 Yes No


Page: 15 of 152

2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 100366 2008/10/18 LISN R&S ENV4200 833209/007 2008/08/12 LISN R&S ENV216 100085 2009/02/14 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2008/09/04 Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A 18331 2008/11/10 EMI Test Receiver R&S ESCS 30 100366 2008/10/18 LISN R&S ENV216 100085 2009/02/14 LISN R&S ENV4200 833209/007 2008/07/13 lmpedance Stabilization Network

Schaffner ISN T400 19099 2008/07/15

Pulse Limiter R&S ESH3-Z2 357.88.10.52 2008/09/04 RF Current Probe FCC F-65 10KHz~1GHz 198 2008/11/10 BALANCED TELECOM ISN FCC FCC-TLISN-T2-02 20316 2008/11/24 BALANCED TELECOM ISN FCC FCC-TLISN-T4-02 20317 2008/11/24 BALANCED TELECOM ISN FCC FCC-TLISN-T8-02 20319 2008/11/24 Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2704 2008/09/15 Broadband Horn Antenna Schwarzbeck BBHA9170 208 2008/07/25 EMI Test Receiver R&S ESCS 30 838251/001 2009/03/22 Horn Antenna Schwarzbeck BBHA9120D 305 2008/08/10 Pre-Amplifier QTK N/A N/A 2009/01/03 Spectrum Analyzer Advantest R3162 101102468 2008/10/24 EMI Test Receiver R&S ESI 26 838786/004 2008/05/25

Pre-Amplifier MITEQ QMF-4D-180400-45-6P

925974 2009/01/03

Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic)

Schaffner NSG 1007 HK54148 2008/06/23

IEC1000-4-X Analyzer(Flicker)

Schaffner CCN 1000-1 X7 1887 2008/06/23

Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic)

Schaffner NSG 1007 HK54148 2008/06/23

IEC1000-4-X Analyzer(Flicker)

Schaffner CCN 1000-1 X7 1887 2008/06/23


Page: 16 of 152

Electrostatic Discharge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator System KeyTek MZ-15/EC 0112372 2008/08/02 Horizontal Coupling Plane(HCP)

QuieTek HCP AL50 N/A N/A

Vertical Coupling Plane(VCP)

QuieTek VCP AL50 N/A N/A

Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date

AF-BOX R&S AF-BOX ACCUST

100007 N/A

Audio Analyzer R&S UPL 16 100137 2008/04/23 Bilog Antenna Schaffner Chase CBL6112B 2450 2009/01/03 Broad-Band Antenna Schwarzbeck VULB 9166 1085 2008/08/02 Biconilog Antenna EMCO 3149 00071675 2008/05/29 CMU200 UNIV.RADIOCOMM

R&S CMU200 104846 2008/04/23

Directional Coupler A&R DC 6180 22735 N/A Dual Microphone Supply B&K 5935 2426784 2008/08/04 Mouth Simulator B&K 4227 2439692 2008/08/04 Power Amplifier A&R 30S1G3 309453 N/A Power Amplifier A&R 100W10000M7 A285000010 N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A 0325371 N/A Power Meter R&S NRVD(P.M) 100219 2008/04/22 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone B&K 4182 2278070 2008/08/04

Signal Generator R&S SMY02(9K-2080)

825454/028 2008/09/22

Electrical fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 411225 2008/12/01

Surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2008/12/01

Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator

Schaffner N/A N/A 2008/04/21

Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA 2141 6002 N/A Magnetic Loop Coil Schaffner INA 702 199749-020IN N/A Magnetic/Electric field measuring system

Lackmann Phymetric MV3 N/A N/A

Triaxial ELF Magnetic Field Meter

F.B.BELL 4090 9852 2008/05/30


Page: 17 of 152

Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2008/12/01 Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A 20405 2008/04/21 CDN Schaffner TRA U150 20454 2008/04/21 CDN M016S Schaffner CAL U100A 20410 2008/04/21 CDN M016S Schaffner TRA U150 21167 2008/04/21 CDN T002 Schaffner CAL U100 20491 2008/04/21 CDN T002 Schaffner TRA U150 21169 2008/04/21 CDN T400 Schaffner CAL U100 17735 2008/04/21 CDN T400 Schaffner TRA U150 21166 2008/04/21 Coupling Decoupling Network

Schaffner CDN M016S 20822 2009/02/23

Coupling Decoupling Network

Schaffner CDN M016S 20823 2008/04/21


Schaffner CDN T002 19018 2008/04/21


Schaffner CDN T400 21226 2008/04/21

EM-CLAMP Schaffner KEMZ 801 21024 2008/04/21


Page: 18 of 152

2.3. Measurement Uncertainty

Conducted Emission

The measurement uncertainty is evaluated as ± 2.26 dB.

Impedance Stabilization Network


Radiated Emission


Electrostatic Discharge

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:

1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant ESD standards.

The immunity test signal from the ESD system meet the required specifications in IEC

61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of

voltage and timing as being 1.63 % and 2.76%.

Radiated susceptibility


1999[2], the requirements for measurement uncertainty in RS testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant RS standards.

The immunity test signal from the RS system meet the required specifications in IEC

61000-4-3 through the calibration for the uniform field strength and monitoring for the test

level with the uncertainty evaluation report for the electrical filed strength as being 2.72 Db.

Electrical fast transient/burst


1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to

have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst

standards. The immunity test signal from the EFT/Burst system meet the required

specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty

for the waveform of voltage, frequency and timing as being 1.63 %, 2.8 　 10-10 and

2.76%.

Surge


1999[2], the requirements for measurement uncertainty in Surge testing are deemed to

have been satisfied, and the testing is reported in accordance with the relevant Surge

standards. The immunity test signal from the Surge system meet the required specifications

in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the

waveform of voltage and timing as being 1.63 % and 2.76%.


Page: 19 of 152

Conducted susceptibility


1999[2], the requirements for measurement uncertainty in CS testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant CS standards.

The immunity test signal from the CS system meet the required specifications in IEC

61000-4-6 through the calibration for unmodulated signal and monitoring for the test level

with the uncertainty evaluation report for the injected modulated signal level through CDN

and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.

Power frequency magnetic field


1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant PFM standards.

The immunity test signal from the PFM system meet the required specifications in IEC

61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter

to verify the output level of magnetic field strength as being 2 %.

Voltage dips and interruption


1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant DIP standards.

The immunity test signal from the DIP system meet the required specifications in IEC

61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of

voltage and timing as being 1.63 % and 2.76%.


Page: 20 of 152

2.4. Test Environment

Performed Item Items Required Actual

Temperature (C) 15-35 25

Conducted Emission Humidity (%RH) 25-75 50

Barometric pressure (mbar) 860-1060 950-1000


Impedance Stabilization Network Humidity (%RH) 25-75 50



Radiated Emission Humidity (%RH) 25-75 50



Electrostatic Discharge Humidity (%RH) 30-60 51



Radiated susceptibility Humidity (%RH) 25-75 55



Electrical fast transient/burst Humidity (%RH) 25-75 51



Surge Humidity (%RH) 10-75 51



Conducted susceptibility Humidity (%RH) 25-75 51



Power frequency magnetic field Humidity (%RH) 25-75 53



Voltage dips and interruption Humidity (%RH) 25-75 55



Page: 21 of 152

3. Conducted Emission (Main Terminals)

3.1. Test Specification

According to EMC Standard : EN 55022

3.2. Test Setup

3.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 66 - 56 56 – 46

0.50-5.0 56 46

5.0 - 30 60 50

Remarks: In the above table, the tighter limit applies at the band edges.


Page: 22 of 152

3.4. Test Procedure

The EUT and simulators are connected to the main power through a line impedance

stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the

measuring equipment. The peripheral devices are also connected to the main power through

a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.

(Please refers to the block diagram of the test setup and photographs.)

Both sides of A.C. line are checked for maximum conducted interference. In order to find the

maximum emission, the relative positions of equipment and all of the interface cables must

be changed on conducted measurement.

Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using

a receiver bandwidth of 9kHz.

3.5. Deviation from Test Standard

No deviation.


Page: 23 of 152

3.6. Test Result Site : SR1 Time : 2009/03/17- 23:01

Limit : CISPR_B_00M_QP Margin : 10

EUT : Notebook Probe : ENV-216-L1 - Line1

Power : AC 230V/50Hz Note : Mode 1


Page: 24 of 152

Site : SR1 Time : 2009/03/17- 23:02




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.201 9.824 51.360 61.184 -3.359 64.543 QUASIPEAK

2 0.248 9.830 44.830 54.660 -8.540 63.200 QUASIPEAK

3 0.548 9.820 36.800 46.620 -9.380 56.000 QUASIPEAK

4 1.302 9.840 33.680 43.520 -12.480 56.000 QUASIPEAK

5 2.357 9.850 34.290 44.140 -11.860 56.000 QUASIPEAK

6 4.127 9.860 33.470 43.330 -12.670 56.000 QUASIPEAK

Note:

1. All Reading Levels are Quasi-Peak and average value.

2. " * ", means this data is the worst emission level.

3. Measurement Level = Reading Level + Correct Factor


Page: 25 of 152

Site : SR1 Time : 2009/03/17- 23:02

Limit : CISPR_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.201 9.824 38.280 48.104 -6.439 54.543 AVERAGE

2 0.248 9.830 28.400 38.230 -14.970 53.200 AVERAGE

3 0.548 9.820 22.820 32.640 -13.360 46.000 AVERAGE

4 1.302 9.840 20.870 30.710 -15.290 46.000 AVERAGE

5 2.357 9.850 21.010 30.860 -15.140 46.000 AVERAGE

6 4.127 9.860 21.480 31.340 -14.660 46.000 AVERAGE

Note:





Page: 26 of 152

Site : SR1 Time : 2009/03/17- 23:03


EUT : Notebook Probe : ENV-216-N - Line2



Page: 27 of 152

Site : SR1 Time : 2009/03/17- 23:03




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.189 9.860 50.230 60.090 -4.796 64.886 QUASIPEAK

2 0.248 9.860 42.360 52.220 -10.980 63.200 QUASIPEAK

3 0.548 9.830 36.900 46.730 -9.270 56.000 QUASIPEAK

4 1.611 9.840 35.220 45.060 -10.940 56.000 QUASIPEAK

5 3.013 9.860 35.130 44.990 -11.010 56.000 QUASIPEAK

6 4.775 9.870 33.250 43.120 -12.880 56.000 QUASIPEAK

Note:





Page: 28 of 152

Site : SR1 Time : 2009/03/17- 23:03




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.189 9.860 39.290 49.150 -5.736 54.886 AVERAGE

2 0.248 9.860 28.400 38.260 -14.940 53.200 AVERAGE

3 0.548 9.830 22.970 32.800 -13.200 46.000 AVERAGE

4 1.611 9.840 21.820 31.660 -14.340 46.000 AVERAGE

5 3.013 9.860 23.870 33.730 -12.270 46.000 AVERAGE

6 4.775 9.870 23.160 33.030 -12.970 46.000 AVERAGE

Note:





Page: 29 of 152

Site : SR1 Time : 2009/03/11 - 23:15





Page: 30 of 152

Site : SR1 Time : 2009/03/11 - 23:16




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.193 9.821 45.820 55.641 -9.130 64.771 QUASIPEAK

2 0.259 9.830 35.070 44.900 -17.986 62.886 QUASIPEAK

3 0.451 9.820 32.630 42.450 -14.950 57.400 QUASIPEAK

4 1.154 9.830 23.960 33.790 -22.210 56.000 QUASIPEAK

5 2.693 9.850 24.410 34.260 -21.740 56.000 QUASIPEAK

6 5.070 9.870 29.020 38.890 -21.110 60.000 QUASIPEAK

Note:





Page: 31 of 152

Site : SR1 Time : 2009/03/11 - 23:16




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.193 9.821 39.350 49.171 -5.600 54.771 AVERAGE

2 0.259 9.830 28.080 37.910 -14.976 52.886 AVERAGE

3 * 0.451 9.820 32.060 41.880 -5.520 47.400 AVERAGE

4 1.154 9.830 23.650 33.480 -12.520 46.000 AVERAGE

5 2.693 9.850 22.930 32.780 -13.220 46.000 AVERAGE

6 5.070 9.870 23.020 32.890 -17.110 50.000 AVERAGE

Note:





Page: 32 of 152

Site : SR1 Time : 2009/03/11 - 23:16





Page: 33 of 152

Site : SR1 Time : 2009/03/11 - 23:17




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.189 9.860 43.690 53.550 -11.336 64.886 QUASIPEAK

2 0.322 9.850 34.530 44.380 -16.706 61.086 QUASIPEAK

3 0.451 9.833 35.150 44.983 -12.417 57.400 QUASIPEAK

4 2.439 9.850 23.720 33.570 -22.430 56.000 QUASIPEAK

5 5.009 9.870 26.510 36.380 -23.620 60.000 QUASIPEAK

6 25.621 10.290 23.240 33.530 -26.470 60.000 QUASIPEAK

Note:





Page: 34 of 152

Site : SR1 Time : 2009/03/11 - 23:17




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.189 9.860 36.660 46.520 -8.366 54.886 AVERAGE

2 0.322 9.850 31.620 41.470 -9.616 51.086 AVERAGE

3 * 0.451 9.833 34.260 44.093 -3.307 47.400 AVERAGE

4 2.439 9.850 20.850 30.700 -15.300 46.000 AVERAGE

5 5.009 9.870 20.000 29.870 -20.130 50.000 AVERAGE

6 25.621 10.290 15.570 25.860 -24.140 50.000 AVERAGE

Note:





Page: 35 of 152

Site : SR1 Time : 2009/03/11 - 23:27





Page: 36 of 152

Site : SR1 Time : 2009/03/11 - 23:28




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 9.823 38.120 47.943 -16.714 64.657 QUASIPEAK

2 0.326 9.830 31.950 41.780 -19.191 60.971 QUASIPEAK

3 * 0.783 9.830 30.730 40.560 -15.440 56.000 QUASIPEAK

4 1.962 9.850 27.550 37.400 -18.600 56.000 QUASIPEAK

5 3.595 9.860 25.950 35.810 -20.190 56.000 QUASIPEAK

6 24.349 10.230 25.920 36.150 -23.850 60.000 QUASIPEAK

Note:





Page: 37 of 152

Site : SR1 Time : 2009/03/11 - 23:28




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 9.823 31.510 41.333 -13.324 54.657 AVERAGE

2 0.326 9.830 30.410 40.240 -10.731 50.971 AVERAGE

3 * 0.783 9.830 29.410 39.240 -6.760 46.000 AVERAGE

4 1.962 9.850 18.700 28.550 -17.450 46.000 AVERAGE

5 3.595 9.860 12.300 22.160 -23.840 46.000 AVERAGE

6 24.349 10.230 19.870 30.100 -19.900 50.000 AVERAGE

Note:





Page: 38 of 152

Site : SR1 Time : 2009/03/11 - 23:29





Page: 39 of 152

Site : SR1 Time : 2009/03/11 - 23:29




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 9.860 36.170 46.030 -18.627 64.657 QUASIPEAK

2 0.326 9.850 28.220 38.070 -22.901 60.971 QUASIPEAK

3 * 0.584 9.830 28.970 38.800 -17.200 56.000 QUASIPEAK

4 1.423 9.840 24.980 34.820 -21.180 56.000 QUASIPEAK

5 3.701 9.860 26.170 36.030 -19.970 56.000 QUASIPEAK

6 25.576 10.290 24.700 34.990 -25.010 60.000 QUASIPEAK

Note:





Page: 40 of 152

Site : SR1 Time : 2009/03/11 - 23:29




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 9.860 28.210 38.070 -16.587 54.657 AVERAGE

2 0.326 9.850 23.640 33.490 -17.481 50.971 AVERAGE

3 * 0.584 9.830 28.030 37.860 -8.140 46.000 AVERAGE

4 1.423 9.840 22.070 31.910 -14.090 46.000 AVERAGE

5 3.701 9.860 15.570 25.430 -20.570 46.000 AVERAGE

6 25.576 10.290 17.620 27.910 -22.090 50.000 AVERAGE

Note:





Page: 41 of 152

3.7. Test Photograph Test Mode : Mode 1

Description : Front View of Conducted Test

Test Mode : Mode 1

Description : Back View of Conducted Test


Page: 42 of 152

Test Mode : Mode 2


Test Mode : Mode 2



Page: 43 of 152

Test Mode : Mode 3


Test Mode : Mode 3



Page: 44 of 152

4. Conducted Emissions (Telecommunication Ports)



4.2. Test Setup

4.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 84 – 74 74 – 64

0.50 - 30 74 64

Remarks:

The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50

MHz.


Page: 45 of 152

4.4. Test Procedure

Telecommunication Port:

The mains voltage shall be supplied to the EUT via the LISN when the measurement of

telecommunication port is performed. The common mode disturbances at the

telecommunication port shall be connected to the ISN, which is 150 ohm impedance.

Both alternative cables are tested related to the LCL requested. The measurement range is

from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.

The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable, 55dB

LCL ISN is used for cat. 3.


No deviation.


Page: 46 of 152

4.6. Test Result Site : SR1 Time : 2009/03/17 - 16:28

Limit : ISN_Voltage_B_00M_QP Margin : 10

EUT : Notebook Probe : ISN-T4 - Line1

Power : AC 230V/50Hz Note : Mode 1, ISN 10M


Page: 47 of 152

Site : SR1 Time : 2009/03/17 - 16:30




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.306 9.930 37.040 46.970 -32.573 79.543 QUASIPEAK

2 0.420 9.910 36.250 46.160 -30.126 76.286 QUASIPEAK

3 2.502 9.902 40.400 50.302 -23.698 74.000 QUASIPEAK

4 3.752 9.890 41.480 51.370 -22.630 74.000 QUASIPEAK

5 7.502 9.860 52.070 61.930 -12.070 74.000 QUASIPEAK

6 * 12.502 9.953 52.750 62.703 -11.297 74.000 QUASIPEAK

Note:





Page: 48 of 152

Site : SR1 Time : 2009/03/17 - 16:30

Limit : ISN_Voltage_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.306 9.930 34.500 44.430 -25.113 69.543 AVERAGE

2 0.420 9.910 30.460 40.370 -25.916 66.286 AVERAGE

3 2.502 9.902 29.540 39.442 -24.558 64.000 AVERAGE

4 3.752 9.890 30.290 40.180 -23.820 64.000 AVERAGE

5 * 7.502 9.860 40.010 49.870 -14.130 64.000 AVERAGE

6 12.502 9.953 39.170 49.123 -14.877 64.000 AVERAGE

Note:





Page: 49 of 152

Site : SR1 Time : 2009/03/17 - 16:32





Page: 50 of 152

Site : SR1 Time : 2009/03/17 - 16:33




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.455 9.908 35.050 44.958 -30.328 75.286 QUASIPEAK

2 1.052 9.900 31.680 41.580 -32.420 74.000 QUASIPEAK

3 5.908 9.870 45.090 54.960 -19.040 74.000 QUASIPEAK

4 7.923 9.860 47.290 57.150 -16.850 74.000 QUASIPEAK

5 13.357 10.020 49.710 59.730 -14.270 74.000 QUASIPEAK

6 * 17.693 9.990 51.560 61.550 -12.450 74.000 QUASIPEAK

Note:





Page: 51 of 152

Site : SR1 Time : 2009/03/17 - 16:33




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.455 9.908 23.850 33.758 -31.528 65.286 AVERAGE

2 1.052 9.900 23.360 33.260 -30.740 64.000 AVERAGE

3 5.908 9.870 42.540 52.410 -11.590 64.000 AVERAGE

4 7.923 9.860 44.360 54.220 -9.780 64.000 AVERAGE

5 13.357 10.020 46.610 56.630 -7.370 64.000 AVERAGE

6 * 17.693 9.990 48.210 58.200 -5.800 64.000 AVERAGE

Note:





Page: 52 of 152

Site : SR1 Time : 2009/03/11 - 23:18





Page: 53 of 152

Site : SR1 Time : 2009/03/11 - 23:19




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.259 9.940 33.790 43.730 -37.156 80.886 QUASIPEAK

2 0.513 9.900 33.490 43.390 -30.610 74.000 QUASIPEAK

3 * 0.900 9.900 35.030 44.930 -29.070 74.000 QUASIPEAK

4 1.541 9.910 34.320 44.230 -29.770 74.000 QUASIPEAK

5 7.966 9.860 30.150 40.010 -33.990 74.000 QUASIPEAK

6 22.529 9.970 34.590 44.560 -29.440 74.000 QUASIPEAK

Note:





Page: 54 of 152

Site : SR1 Time : 2009/03/11 - 23:19




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.259 9.940 31.610 41.550 -29.336 70.886 AVERAGE

2 0.513 9.900 33.230 43.130 -20.870 64.000 AVERAGE

3 * 0.900 9.900 34.940 44.840 -19.160 64.000 AVERAGE

4 1.541 9.910 34.130 44.040 -19.960 64.000 AVERAGE

5 7.966 9.860 25.900 35.760 -28.240 64.000 AVERAGE

6 22.529 9.970 34.580 44.550 -19.450 64.000 AVERAGE

Note:





Page: 55 of 152

Site : SR1 Time : 2009/03/11 - 23:20





Page: 56 of 152

Site : SR1 Time : 2009/03/11 - 23:20




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.322 9.930 35.080 45.010 -34.076 79.086 QUASIPEAK

2 1.607 9.910 35.830 45.740 -28.260 74.000 QUASIPEAK

3 4.412 9.890 40.110 50.000 -24.000 74.000 QUASIPEAK

4 7.923 9.860 46.480 56.340 -17.660 74.000 QUASIPEAK

5 13.420 10.020 50.170 60.190 -13.810 74.000 QUASIPEAK

6 * 23.127 9.970 50.380 60.350 -13.650 74.000 QUASIPEAK

Note:





Page: 57 of 152

Site : SR1 Time : 2009/03/11 - 23:20




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.322 9.930 32.140 42.070 -27.016 69.086 AVERAGE

2 1.607 9.910 34.140 44.050 -19.950 64.000 AVERAGE

3 4.412 9.890 37.410 47.300 -16.700 64.000 AVERAGE

4 7.923 9.860 43.280 53.140 -10.860 64.000 AVERAGE

5 13.420 10.020 46.970 56.990 -7.010 64.000 AVERAGE

6 * 23.127 9.970 48.220 58.190 -5.810 64.000 AVERAGE

Note:





Page: 58 of 152

Site : SR1 Time : 2009/03/11 - 23:32





Page: 59 of 152

Site : SR1 Time : 2009/03/11 - 23:33




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.298 9.930 32.990 42.920 -36.851 79.771 QUASIPEAK

2 * 0.771 9.900 34.350 44.250 -29.750 74.000 QUASIPEAK

3 1.173 9.900 31.010 40.910 -33.090 74.000 QUASIPEAK

4 1.759 9.910 27.810 37.720 -36.280 74.000 QUASIPEAK

5 6.345 9.870 23.600 33.470 -40.530 74.000 QUASIPEAK

6 11.783 9.898 24.930 34.828 -39.172 74.000 QUASIPEAK

Note:





Page: 60 of 152

Site : SR1 Time : 2009/03/11 - 23:33




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.298 9.930 31.810 41.740 -28.031 69.771 AVERAGE

2 * 0.771 9.900 33.140 43.040 -20.960 64.000 AVERAGE

3 1.173 9.900 14.700 24.600 -39.400 64.000 AVERAGE

4 1.759 9.910 18.200 28.110 -35.890 64.000 AVERAGE

5 6.345 9.870 14.700 24.570 -39.430 64.000 AVERAGE

6 11.783 9.898 18.050 27.948 -36.052 64.000 AVERAGE

Note:





Page: 61 of 152

Site : SR1 Time : 2009/03/11 - 23:30





Page: 62 of 152

Site : SR1 Time : 2009/03/11 - 23:31




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.779 9.900 33.780 43.680 -30.320 74.000 QUASIPEAK

2 1.236 9.900 33.440 43.340 -30.660 74.000 QUASIPEAK

3 5.236 9.880 45.650 55.530 -18.470 74.000 QUASIPEAK

4 7.923 9.860 46.330 56.190 -17.810 74.000 QUASIPEAK

5 13.357 10.020 50.060 60.080 -13.920 74.000 QUASIPEAK

6 * 23.127 9.970 50.210 60.180 -13.820 74.000 QUASIPEAK

Note:





Page: 63 of 152

Site : SR1 Time : 2009/03/11 - 23:31




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.779 9.900 27.980 37.880 -26.120 64.000 AVERAGE

2 1.236 9.900 24.180 34.080 -29.920 64.000 AVERAGE

3 5.236 9.880 43.050 52.930 -11.070 64.000 AVERAGE

4 7.923 9.860 43.040 52.900 -11.100 64.000 AVERAGE

5 13.357 10.020 46.810 56.830 -7.170 64.000 AVERAGE

6 * 23.127 9.970 48.000 57.970 -6.030 64.000 AVERAGE

Note:





Page: 64 of 152


Description : Front View of ISN Test

Test Mode : Mode 1

Description : Back View of ISN Test


Page: 65 of 152

Test Mode : Mode 2


Test Mode : Mode 2



Page: 66 of 152

Test Mode : Mode 3


Test Mode : Mode 3



Page: 67 of 152

5. Radiated Emission



5.2. Test Setup

5.3. Limit

Limits

Frequency (MHz)

Distance (m) dBuV/m

30 – 230 10 30

230 – 1000 10 37

Remark:

1. The tighter limit shall apply at the edge between two frequency bands.

2. Distance refers to the distance in meters between the measuring instrument antenna

and the closed point of any part of the device or system.


Page: 68 of 152

5.4. Test Procedure

The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The

turn table can rotate 360 degrees to determine the position of the maximum emission level.

The EUT was positioned such that the distance from antenna to the EUT was 10 meters.

The antenna can move up and down between 1 meter and 4 meters to find out the maximum

emission level.

Both horizontal and vertical polarization of the antenna are set on measurement. In order to

find the maximum emission, all of the interface cables must be manipulated on radiated

measurement.

Radiated emissions were invested over the frequency range from 30MHz to1GHz using a

receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10

meters.


No deviation.


Page: 69 of 152

5.6. Test Result Site : OATS-3 Time : 2009/03/18 - 10:58


EUT : Notebook Probe : Site3_CBL6112_10M_0811 - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 144.000 14.178 5.552 19.730 -10.270 30.000 QUASIPEAK

2 162.410 13.115 6.946 20.061 -9.939 30.000 QUASIPEAK

3 233.500 15.126 7.201 22.327 -14.673 37.000 QUASIPEAK

4 240.000 15.590 10.210 25.800 -11.200 37.000 QUASIPEAK

5 324.000 18.043 10.459 28.502 -8.498 37.000 QUASIPEAK

6 * 540.000 22.758 7.339 30.097 -6.903 37.000 QUASIPEAK

7 731.990 25.337 4.507 29.844 -7.156 37.000 QUASIPEAK

8 874.990 27.322 2.136 29.458 -7.542 37.000 QUASIPEAK

Note:

1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or

average measurements as necessary.




Page: 70 of 152

Site : OATS-3 Time : 2009/03/18 - 11:31


EUT : Notebook Probe : Site3_CBL6112_10M_0811 - VERTICAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 * 31.200 18.621 4.776 23.397 -6.603 30.000 QUASIPEAK

2 110.600 14.902 6.711 21.613 -8.387 30.000 QUASIPEAK

3 149.040 13.876 7.299 21.176 -8.824 30.000 QUASIPEAK

4 162.000 13.128 8.035 21.163 -8.837 30.000 QUASIPEAK

5 216.000 13.863 7.009 20.872 -9.128 30.000 QUASIPEAK

6 240.000 15.590 9.610 25.200 -11.800 37.000 QUASIPEAK

7 323.200 18.018 6.164 24.182 -12.818 37.000 QUASIPEAK

8 731.980 25.337 4.406 29.743 -7.257 37.000 QUASIPEAK

Note:






Page: 71 of 152

Site : OATS-3 Time : 2009/03/12 - 00:57




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 138.694 14.488 5.100 19.588 -10.412 30.000 QUASIPEAK

2 244.090 15.880 7.800 23.680 -13.320 37.000 QUASIPEAK

3 388.781 19.777 7.600 27.376 -9.624 37.000 QUASIPEAK

4 * 648.000 24.310 7.300 31.610 -5.390 37.000 QUASIPEAK

5 777.583 25.997 4.600 30.597 -6.403 37.000 QUASIPEAK

6 907.176 27.763 2.000 29.763 -7.237 37.000 QUASIPEAK

Note:






Page: 72 of 152

Site : OATS-3 Time : 2009/03/12 - 01:18




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 138.648 14.490 8.000 22.490 -7.510 30.000 QUASIPEAK

2 * 244.821 15.933 14.200 30.133 -6.867 37.000 QUASIPEAK

3 388.845 19.778 5.600 25.378 -11.622 37.000 QUASIPEAK

4 518.387 22.385 5.000 27.385 -9.615 37.000 QUASIPEAK

5 648.000 24.310 4.500 28.810 -8.190 37.000 QUASIPEAK

6 777.579 25.997 3.100 29.097 -7.903 37.000 QUASIPEAK

Note:






Page: 73 of 152

Site : OATS-3 Time : 2009/03/12 - 02:10




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 141.245 14.359 5.300 19.659 -10.341 30.000 QUASIPEAK

2 162.780 13.104 7.700 20.803 -9.197 30.000 QUASIPEAK

3 388.791 19.777 8.600 28.377 -8.623 37.000 QUASIPEAK

4 540.000 22.758 6.000 28.758 -8.242 37.000 QUASIPEAK

5 * 648.000 24.310 6.500 30.810 -6.190 37.000 QUASIPEAK

6 777.578 25.997 4.300 30.297 -6.703 37.000 QUASIPEAK

7 907.179 27.763 2.400 30.163 -6.837 37.000 QUASIPEAK

Note:






Page: 74 of 152

Site : OATS-3 Time : 2009/03/12 - 02:30




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 120.000 15.180 4.000 19.180 -10.820 30.000 QUASIPEAK

2 * 162.800 13.103 12.000 25.103 -4.897 30.000 QUASIPEAK

3 259.193 16.516 10.500 27.016 -9.984 37.000 QUASIPEAK

4 388.789 19.777 5.200 24.977 -12.023 37.000 QUASIPEAK

5 648.000 24.310 5.100 29.410 -7.590 37.000 QUASIPEAK

6 777.578 25.997 3.000 28.997 -8.003 37.000 QUASIPEAK

Note:






Page: 75 of 152


Description : Front View of Radiated Test

Test Mode : Mode 1

Description : Back View of Radiated Test


Page: 76 of 152

Test Mode : Mode 2


Test Mode : Mode 2



Page: 77 of 152

Test Mode : Mode 3


Test Mode : Mode 3



Page: 78 of 152

6. Harmonic Current Emission


According to EMC Standard : EN 61000-3-2

6.2. Test Setup

6.3. Limit

(a) Limits of Class A Harmonics Currents

Harmonics

Order

n

Maximum Permissible

harmonic current

A

Harmonics

Order

n

Maximum Permissible

harmonic current

A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 n 40 0.23 * 8/n

11 0.33

13 0.21

15 n 39 0.15 * 15/n


Page: 79 of 152

(b) Limits of Class B Harmonics Currents

For Class B equipment, the harmonic of the input current shall not exceed the maximum

permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

(c) Limits of Class C Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

Expressed as a percentage of the input

current at the fundamental frequency

％

2 2

3 30．λ＊

5 10

7 7

9 5

11 n 39

(odd harmonics only) 3

＊λ is the circuit power factor

(d) Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible

harmonic current per watt

mA/W

Maximum Permissible

harmonic current

A

3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 n 39

(odd harmonics only) 3.85/n See limit of Class A


Page: 80 of 152

6.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same

normal voltage and frequency as the rated supply voltage and the equipment under test.

And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be

performed.


No deviation.


Page: 81 of 152

6.6. Test Result Product Notebook

Test Item Power Harmonics

Test Mode Mode 1

Date of Test 2009/03/19 Test Site No.3 Shielded Room

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-3

-2

-1

0

1

2

3

-300

-200

-100

0

100

200

300

Cu

rre

nt (A

mp

s) V

olta

ge

(Vo

lts)

Harmonics and Class D limit line European Limits

0.0000.0250.0500.0750.1000.1250.1500.1750.200

Cu

rre

nt R

MS

(Am

ps)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.


Page: 82 of 152

Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 229.63 Frequency(Hz): 50.00 I_Peak (Amps): 2.454 I_RMS (Amps): 0.469 I_Fund (Amps): 0.175 Crest Factor: 5.306 Power (Watts): 39.6 Power Factor: 0.369

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.004 3 0.165 0.135 0.0 0.165 0.202 0.00 Pass 4 0.004 5 0.160 0.075 0.0 0.160 0.113 0.00 Pass 6 0.004 7 0.153 0.040 0.0 0.154 0.059 0.00 Pass 8 0.005 9 0.145 0.020 0.0 0.145 0.030 0.00 Pass 10 0.005 11 0.135 0.014 0.0 0.136 0.021 0.00 Pass 12 0.005 13 0.124 0.012 0.0 0.124 0.018 0.00 Pass 14 0.005 15 0.112 0.010 0.0 0.112 0.015 0.00 Pass 16 0.005 17 0.099 0.009 0.0 0.100 0.013 0.00 Pass 18 0.005 19 0.086 0.008 0.0 0.087 0.012 0.00 Pass 20 0.005 21 0.073 0.007 0.0 0.074 0.011 0.00 Pass 22 0.004 23 0.061 0.007 0.0 0.061 0.010 0.00 Pass 24 0.004 25 0.049 0.006 0.0 0.049 0.009 0.00 Pass 26 0.003 27 0.038 0.006 0.0 0.039 0.008 0.00 Pass 28 0.003 29 0.028 0.005 0.0 0.029 0.008 0.00 Pass 30 0.002 31 0.020 0.005 0.0 0.020 0.007 0.00 Pass 32 0.002 33 0.013 0.005 0.0 0.013 0.007 0.00 Pass 34 0.001 35 0.007 0.004 0.0 0.007 0.007 0.00 Pass 36 0.001 37 0.002 0.004 0.0 0.002 0.006 0.00 Pass 38 0.001 39 0.002 0.004 0.0 0.002 0.006 0.00 Pass 40 0.001

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the

same window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power

>75W. Others the result should be pass.


Page: 83 of 152

Product Notebook


Test Mode Mode 2




-3

-2

-1

0

1

2

3

-300

-200

-100

0

100

200

300

Cu

rre

nt (A

mp

s)

Vo

ltag

e (V

olts)


0.0000.0250.0500.0750.1000.1250.1500.1750.200

Cu

rre

nt R

MS

(Am

ps)

Harmonic #4 8 12 16 20 24 28 32 36 40



Page: 84 of 152









Page: 85 of 152

Product Notebook


Test Mode Mode 3




-3

-2

-1

0

1

2

3

-300

-200

-100

0

100

200

300

Cu

rre

nt (A

mp

s)

Vo

ltag

e (V

olts)


0.0000.0250.0500.0750.1000.1250.1500.1750.200

Cu

rre

nt R

MS

(Am

ps)

Harmonic #4 8 12 16 20 24 28 32 36 40



Page: 86 of 152









Page: 87 of 152


Description : Power Harmonics Test Setup

Test Mode : Mode 2



Page: 88 of 152

Test Mode : Mode 3



Page: 89 of 152

7. Voltage Fluctuation and Flicker


According to EMC Standard : EN 61000-3-3

7.2. Test Setup

7.3. Limit

The following limits apply:

－ the value of Pst shall not be greater than 1.0;

－ the value of Plt shall not be greater than 0.65;

－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500

ms;

－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;

－ the maximum relative voltage change, dmax, shall not exceed;

a) 4 ％ without additional conditions;

b) 6 ％ for equipment which is:

－ switched manually, or

－ switched automatically more frequently than twice per day, and also has either a

delayed restart (the delay being not less than a few tens of seconds), or manual restart,

after a power supply interruption.

NOTE The cycling frequency will be further limited by the Pst and P1t limit.

For example: a dmax of 6％producing a rectangular voltage change characteristic twice per

hour will give a P1t of about 0.65.


Page: 90 of 152

c) 7 ％ for equipment which is:

－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment

such as mixers, garden equipment such as lawn mowers, portable tools such as

electric drills), or

－ switched on automatically, or is intended to be switched on manually, no more than

twice per day, and also has either a delayed restart (the delay being not less than a

few tens of seconds) or manual restart, after a power supply interruption.

Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.

7.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same

normal voltage and frequency as the rated supply voltage and the equipment under test.

And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be

performed.


No deviation.


Page: 91 of 152


Test Item Voltage Fluctuation and Flicker

Test Mode Mode 1


Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

18:1

6:1

2

Plt and limit line

0.00

0.25

0.50

Plt

18:1

6:1

2

Parameter values recorded during the test:

Vrms at the end of test (Volt): 229.59

Highest dt (%): 0.00 Test limit (%): 3.30 Pass

Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass

Highest dc (%): 0.00 Test limit (%): 3.30 Pass

Highest dmax (%): 0.00 Test limit (%): 4.00 Pass

Highest Pst (10 min. period): 0.064 Test limit: 1.000 Pass

Highest Plt (2 hr. period): 0.028 Test limit: 0.650 Pass


Page: 92 of 152

Product Notebook


Test Mode Mode 2




0.25

0.50

0.75

1.00

Pst

18:5

3:5

3

Plt and limit line

0.00

0.25

0.50

Plt

18:5

3:5

3










Page: 93 of 152

Product Notebook


Test Mode Mode 3




0.25

0.50

0.75

1.00

Pst

19:0

5:2

3

Plt and limit line

0.00

0.25

0.50

Plt

19:0

5:2

3










Page: 94 of 152


Description : Flicker Test Setup

Test Mode : Mode 2



Page: 95 of 152

Test Mode : Mode 3



Page: 96 of 152

8. Electrostatic Discharge


According to Standard : IEC 61000-4-2

8.2. Test Setup

8.3. Limit

Item Environmental

Phenomena

Units Test Specification Performance

Criteria

Enclosure Port

Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge

±4 Contact Discharge B


Page: 97 of 152

8.4. Test Procedure

Direct application of discharges to the EUT:

Contact discharge was applied only to conductive surfaces of the EUT.

Air discharges were applied only to non-conductive surfaces of the EUT.

During the test, it was performed with single discharges. For the single discharge

time between successive single discharges will be keep longer 1 second. It was at

least ten single discharges with positive and negative at the same selected point.

The selected point, which was performed with electrostatic discharge, was marked

on the red label of the EUT.

Indirect application of discharges to the EUT:

Vertical Coupling Plane (VCP):

The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned

at a distance 0.1m from, the EUT, with the Discharge Electrode touching the

coupling plane.

The four faces of the EUT will be performed with electrostatic discharge. It was at


Horizontal Coupling Plane (HCP):

The coupling plane is placed under to the EUT. The generator shall be positioned

vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching

the coupling plane.

The four faces of the EUT will be performed with electrostatic discharge. It was at



No deviation.


Page: 98 of 152


Test Item Electrostatic Discharge

Test Mode Mode 1


Item Amount of

Discharge Voltage

Required

Criteria

Complied To

Criteria

(A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

A

A

Pass

Pass

Contact Discharge 25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Note:

The testing performed is from lowest level up to the highest level as required by standard,

but only highest level is shown on the report. NR: No Requirement

Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark:

The Contact discharges were applied at least total 200 discharges at a minimum of four

test points.


Page: 99 of 152

Product Notebook


Test Mode Mode 2


Item Amount of

Discharge Voltage

Required

Criteria

Complied To

Criteria

(A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

A

A

Pass

Pass


25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Note:





Remark:


test points.


Page: 100 of 152

Product Notebook


Test Mode Mode 3


Item Amount of

Discharge Voltage

Required

Criteria

Complied To

Criteria

(A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

A

A

Pass

Pass


25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Note:





Remark:


test points.


Page: 101 of 152


Description : ESD Test Setup

Test Mode : Mode 2



Page: 102 of 152

Test Mode : Mode 3



Page: 103 of 152

9. Radiated Susceptibility



9.2. Test Setup

9.3. Limit

Item Environmental

Phenomena

Units Test

Specification

Performance

Criteria

Enclosure Port

Radio-Frequency

Electromagnetic Field

Amplitude Modulated

MHz

V/m(Un-modulated, rms)

% AM (1kHz)

80-1000

3

80

A


Page: 104 of 152

9.4. Test Procedure

The EUT and load, which are placed on a table that is 0.8 meter above ground, are

placed with one coincident with the calibration plane such that the distance from

antenna to the EUT was 3 meters.

Both horizontal and vertical polarization of the antenna and four sides of the EUT are set

on measurement.

In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.

All the scanning conditions are as follows:

Condition of Test Remarks

1. Field Strength 3 V/m Level 2

2. Radiated Signal AM 80% Modulated with 1kHz

3. Scanning Frequency 80MHz - 1000MHz

4 Dwell Time 3 Seconds

5. Frequency step size f : 1%

6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


No deviation.


Page: 105 of 152


Test Item Radiated susceptibility

Test Mode Mode 1

Date of Test 2009/03/20 Test Site Chamber5

Frequency

(MHz)

Position

(Angle) Polarity

(H or V)

Field

Strength

(V/m)

Required

Criteria

Complied

To Criteria

(A,B,C)

Results

80-1000 FRONT H 3 A A PASS

80-1000 FRONT V 3 A A PASS

80-1000 BACK H 3 A A PASS

80-1000 BACK V 3 A A PASS

80-1000 RIGHT H 3 A A PASS

80-1000 RIGHT V 3 A A PASS

80-1000 LEFT H 3 A A PASS

80-1000 LEFT V 3 A A PASS

80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS

80-1000 DOWN H 3 A A PASS

80-1000 DOWN V 3 A A PASS

Note:

The testing performed is from lowest level up to the highest level as required by

standard, but only highest level is shown on the report.


There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz.

No false alarms or other malfunctions were observed during or after the test.


Page: 106 of 152

Product Notebook


Test Mode Mode 2


Frequency

(MHz)

Position

(Angle) Polarity

(H or V)

Field

Strength

(V/m)

Required

Criteria

Complied

To Criteria

(A,B,C)

Results









80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS



Note:





at frequency MHz.



Page: 107 of 152

Product Notebook


Test Mode Mode 3


Frequency

(MHz)

Position

(Angle) Polarity

(H or V)

Field

Strength

(V/m)

Required

Criteria

Complied

To Criteria

(A,B,C)

Results









80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS



Note:





at frequency MHz.



Page: 108 of 152


Description : Radiated Susceptibility Test Setup

Test Mode : Mode 2



Page: 109 of 152

Test Mode : Mode 3



Page: 110 of 152

10. Electrical Fast Transient/Burst



10.2. Test Setup

10.3. Limit

Item Environmental Phenomena

Units Test Specification Performance Criteria

I/O and communication ports Fast Transients Common Mode

kV (Peak) Tr/Th ns Rep. Frequency kHz

+0.5 5/50 5

B

Input DC Power Ports Fast Transients Common Mode


+0.5 5/50 5

B

Input AC Power Ports Fast Transients Common Mode


+1 5/50 5

B


Page: 111 of 152

10.4. Test Procedure

The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on

the table, and uses a 0.1m insulation between the EUT and ground reference plane.

The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and

projected beyond the EUT by at least 0.1m on all sides.

Test on I/O and communication ports:

The EFT interference signal is through a coupling clamp device couples to the signal and

control lines of the EUT with burst noise for 1minute.

Test on power supply ports:

The EUT is connected to the power mains through a coupling device that directly couples the

EFT/B interference signal.

Each of the Line and Neutral conductors is impressed with burst noise for 1 minute.

The length of the signal and power lines between the coupling device and the EUT is 0.5m.


No deviation.


Page: 112 of 152


Test Item Electrical fast transient/burst

Test Mode Mode 1


Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result

L+N+PE ± 1kV 60 Direct B A PASS

LAN ± 0.5kV 60 Clamp B A PASS

Note:



Meet criteria A : Operate as intended during and after the test

Meet criteria B : Operate as intended after the test

Meet criteria C : Loss/Error of function

Additional Information

EUT stopped operation and could / could not be reset by operator at kV of

Line .



Page: 113 of 152

Product Notebook


Test Mode Mode 2


Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result



Note:








Line .



Page: 114 of 152

Product Notebook


Test Mode Mode 3


Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result



Note:








Line .



Page: 115 of 152


Description : EFT/B Test Setup

Test Mode : Mode 1

Description : EFT/B Test Setup-CLAMP


Page: 116 of 152

Test Mode : Mode 2


Test Mode : Mode 2



Page: 117 of 152

Test Mode : Mode 3


Test Mode : Mode 3



Page: 118 of 152

11. Surge



11.2. Test Setup

11.3. Limit

Item Environmental Phenomena Units Test Specification Performance Criteria

Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) 1

B

Input DC Power Ports Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) 0.5

B

AC Input and AC Output Power Ports Surges Line to Line Line to Ground

Tr/Th us kV kV

1.2/50 (8/20) 1 2

B

Notes:

1) Applicable only to ports which according to the manufacturer’s may directly to outdoor

cables.

2) Where normal functioning cannot be achieved because of the impact of the CDN on the

EUT, no immunity test shall be required.


Page: 119 of 152


The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane

measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least

0.1m on all sides. The length of power cord between the coupling device and the EUT shall

be 2m or less.

For Input and Output AC Power or DC Input and DC Output Power Ports:

The EUT is connected to the power mains through a coupling device that directly couples the

Surge interference signal.

The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and

the peak value of the a.c. voltage wave. (Positive and negative)

Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with

interval of 1 min.


No deviation.


Page: 120 of 152


Test Item Surge

Test Mode Mode 1


Inject

Line Polarity Angle

Voltage

kV

Time

Interval

(Second)

Inject

Method

Required

Criteria

Complie

d to

Criteria Result

L-N ± 0 1kV 60 Direct B A PASS




L-PE ± 0 2kV 60 Direct B A PASS




N-PE ± 0 2kV 60 Direct B A PASS




Note:


standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV of Line .



Page: 121 of 152

Product Notebook

Test Item Surge

Test Mode Mode 2


Inject

Line Polarity Angle

Voltage

kV

Time

Interval

(Second)

Inject

Method

Required

Criteria

Complie

d to

Criteria Result













Note:






Page: 122 of 152

Product Notebook

Test Item Surge

Test Mode Mode 3


Inject

Line Polarity Angle

Voltage

kV

Time

Interval

(Second)

Inject

Method

Required

Criteria

Complie

d to

Criteria Result













Note:






Page: 123 of 152


Description : SURGE Test Setup

Test Mode : Mode 2



Page: 124 of 152

Test Mode : Mode 3



Page: 125 of 152

12. Conducted Susceptibility



12.2. Test Setup

CDN Test Mode

EM Clamp Test Mode


Page: 126 of 152

12.3. Limit

Item Environmental Phenomena Units Test Specification

Performance Criteria

Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted

MHz V (rms, Un-modulated) % AM (1kHz)

0.15-80 3 80

A

Input DC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80

A

Input AC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80

A


The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz – 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


No deviation.


Page: 127 of 152


Test Item Conducted susceptibility

Test Mode Mode 1


Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performanc

e Criteria

Complied

To

Result

0.15~80 130 (3V) CDN AC IN A A PASS

0.15~80 130 (3V) CDN LAN A A PASS

Note:







EUT stopped operation and could / could not be reset by operator at dBuV(V) at

frequency MHz.

No false alarms or other malfunctions were observed during or after the test. The

acceptance criteria were met, and the EUT passed the test.


Page: 128 of 152

Product Notebook


Test Mode Mode 2


Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performanc

e Criteria

Complied

To

Result


0.15~80 130 (3V) CDN LAN A A PASS

Note:








frequency MHz.




Page: 129 of 152

Product Notebook


Test Mode Mode 3


Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performanc

e Criteria

Complied

To

Result


0.15~80 130 (3V) CDN LAN A A PASS

Note:








frequency MHz.




Page: 130 of 152


Description : Conducted Susceptibility Test Setup

Test Mode : Mode 1

Description : Conducted Susceptibility Test Setup -CDN


Page: 131 of 152

Test Mode : Mode 2


Test Mode : Mode 2



Page: 132 of 152

Test Mode : Mode 3


Test Mode : Mode 3



Page: 133 of 152

13. Power Frequency Magnetic Field



13.2. Test Setup

13.3. Limit Item Environmental

Phenomena Units Test Specification Performance

Criteria Enclosure Port Power-Frequency

Magnetic Field Hz A/m (r.m.s.)

50 1

A


The EUT and its load are placed on a table which is 0.8 meter above a metal ground

plane measured at least 1m*1m min. The test magnetic field shall be placed at central

of the induction coil.

The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.

And the induction coil shall be rotated by 90 in order to expose the EUT to the test field

with different orientation (X, Y, Z Orientations).


No deviation.


Page: 134 of 152


Test Item Power frequency magnetic field

Test Mode Mode 1


Polarization Frequency

(Hz)

Magnetic

Strength

(A/m)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS

Meet criteria A: Operate as intended during and after the test

Meet criteria B: Operate as intended after the test

Meet criteria C: Loss/Error of function


EUT stopped operation and could / could not be reset by operator at kV

of Line .




Page: 135 of 152

Product Notebook


Test Mode Mode 2



(Hz)

Magnetic

Strength

(A/m)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result









of Line .




Page: 136 of 152

Product Notebook


Test Mode Mode 3



(Hz)

Magnetic

Strength

(A/m)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result









of Line .




Page: 137 of 152


Description : Power Frequency Magnetic Field Test Setup

Test Mode : Mode 2



Page: 138 of 152

Test Mode : Mode 3



Page: 139 of 152

14. Voltage Dips and Interruption



14.2. Test Setup

14.3. Limit

Item Environmental

Phenomena

Units Test Specification Performance

Criteria

Input AC Power Ports

% Reduction

Period

30

25 C

Voltage Dips

% Reduction

Period

>95

0.5 B

Voltage Interruptions % Reduction

Period

> 95

250 C


Page: 140 of 152


The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane

measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least

0.1m on all sides. The power cord shall be used the shortest power cord as specified by the

manufacturer.

For Voltage Dips/ Interruptions test:

The selection of test voltage is based on the rated power range. If the operation range is

large than 20% of lower power range, both end of specified voltage shall be tested.

Otherwise, the typical voltage specification is selected as test voltage.

The EUT is connected to the power mains through a coupling device that directly couples to

the Voltage Dips and Interruption Generator.

The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods,

for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three

voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied

voltage and duration 250 Periods with a sequence of three voltage interruptions with

intervals of 10 seconds.

Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the

voltage.


No deviation.


Page: 141 of 152


Test Item Voltage dips and interruption

Test Mode Mode 1


Voltage Dips and

Interruption

Reduction(%)

Angle Test

Duration

(Periods)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result

30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C B PASS >95(0V) 45 250 C B PASS >95(0V) 90 250 C B PASS >95(0V) 135 250 C B PASS >95(0V) 180 250 C B PASS >95(0V) 225 250 C B PASS >95(0V) 270 250 C B PASS >95(0V) 315 250 C B PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV

of Line .




Page: 142 of 152

Product Notebook


Test Mode Mode 2


Voltage Dips and

Interruption

Reduction(%)

Angle Test

Duration

(Periods)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result




of Line .




Page: 143 of 152

Product Notebook


Test Mode Mode 3


Voltage Dips and

Interruption

Reduction(%)

Angle Test

Duration

(Periods)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result




of Line .




Page: 144 of 152


Description : Voltage Dips Test Setup

Test Mode : Mode 2



Page: 145 of 152

Test Mode : Mode 3



Page: 146 of 152

15. Attachment EUT Photograph

(1) EUT Photo

(2) EUT Photo


Page: 147 of 152

(3) EUT Photo

(4) EUT Photo


Page: 148 of 152

(5) EUT Photo

(6) EUT Photo


Page: 149 of 152

(7) EUT Photo

(8) EUT Photo


Page: 150 of 152

(9) EUT Photo

(10) EUT Photo


Page: 151 of 152

(11) EUT Photo

(12) EUT Photo


Page: 152 of 152

(13) EUT Photo

Documents

093161R-ITCEP07V06 Certificate-微星 MS-1351