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Coating Thickness Material Analysi

ANOTEST® YMP30-S

Operator‘s Manual

s Microhardness Material Testing

ANOTEST®

Sealing quality tes

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© 2015 by HelmuGermany.This operator’s maGmbH. All rights re(print, photocopy, processed, multiplithe written consenSubject to correctio

ANOTEST® is a reElektronik und MeNote: The fact, thanot indicate that su

Document Order NIssue

Instrument manufaHelmut Fischer GmInstitut für ElektronIndustriestraße 21D-71069 Sindelfin

Quality AssuranceDIN EN ISO/IEC 17025

DIN EN ISO 9001:2008

YMP30-S

t instrument for anodic oxide coatings.

www.helmut-fischer.com you will find the addresses of our subsidiary companies around the globe.

t Fischer GmbH Institut für Elektronik und Messtechnik,

nual remains the copyrighted property of Helmut Fischer served. This manual may not be reproduced by any means microfilm or any other method) in full or in part, or

umber 932-53110-2015

cturer:bH Phone: +49 (0) 70 31 3 03 - 0

ik und Messtechnik Fax: +49 (0) 70 31 3 03 - 710www.helmut-fischer.com

gen [email protected]

System of the Helmut Fischer GmbHCalibration lab accredited for certified mass per unit area standards

Management system certified by DNV GL - Business Assur-ance

ed or distributed to third parties by electronic means without t of Helmut Fischer GmbH.n and technical changes.

gistered trade mark of the Helmut Fischer GmbH Institut für sstechnik in Germany and/or other countries.t the trademark characters ® and ™ may be missing does ch names are free trademarks.

Operator’s Manual ANOTE

1 Informatiooperating

2 Technical 2.1 Exam

range2.2 Meas

3 Control ElInstrumen

3.1 ParticANOT

4 Measuring4.1 Prepa4.2 Part 1

Chec4.3 Part 2

Meas4.4 Notes4.5 Evalu

5 Testing threference

6 Normaliza

7 Corrective7.1 When7.2 Funct7.3 Perfo7.4 Selec

8 Measuring8.1 Abou8.2 Meas

n about additional options for the ANOTEST® YMP30-S . . . . . . . . . . . . .1

data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3ples for “Information regarding the measuring ” . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5uring Cells . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5

ements and t Technology . . . . . . . . . . . . . . . . . . . . . . . . .7ular Technical Properties of the EST® YMP30-S Instrument . . . . . . . . . . . . . . . .7

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11ring the specimen . . . . . . . . . . . . . . . . . . . . . . .11 of the Measurement:

king instrument settings . . . . . . . . . . . . . . . . . . .12 of the Measurement: Performing the urement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Regarding the Measurement . . . . . . . . . . . . . .14ating the Measurement Results . . . . . . . . . . . . .14

e accuracy using an electrical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15

tion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16

calibration . . . . . . . . . . . . . . . . . . . . . . . . . .18

ST® (2.1 - 06/06) i

to calibrate? . . . . . . . . . . . . . . . . . . . . . . . . . . .18ion of a corrective calibration . . . . . . . . . . . . . . .18rming a corrective calibration . . . . . . . . . . . . . . .18ting the calibration standards . . . . . . . . . . . . . . .18

principle . . . . . . . . . . . . . . . . . . . . . . . . . . . .23t the need for aluminum surface protection . . . .23urement method to test the after-treatment /

ii

sealin8.3 Appli8.4 Meas8.5 Evalu

9 Nomogram

10 Accessori10.1 Regu10.2 Dispo10.3 Trade

11 Additional11.1 Anod

EC Declar

g quality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24cation-specific computation of the admittance . 26urement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27ating the results . . . . . . . . . . . . . . . . . . . . . . . . 27

s, Tables, Characteristics . . . . . . . . . . 29

es . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33lations, legal information . . . . . . . . . . . . . . . . . 34sal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34marks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

technical information . . . . . . . . . . . . . . 35izing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

ation of Conformity

Operator’s Manual ANOTEST® (2.1 - 06/06)

Operator’s Manual ANOTE

1 Informafor ope

For details, please re“DELTASCOPE® MNo. 902-583”

IMPORTANT NOTChapters and topics not mentioned in thein technical regard!

Chapter Headin

3.2 Functio

3.3 LCD Di

5 Applica

5.1 Selectin

5.2 Setting

5.4 Overwr

5.6 Deleting

5.7 List of s

5.8 Assigni

5.9 Applica

7.11 Documeprinter

7.13 Erroneo

8 Evaluat

8.1 Evaluat

8.3 Evaluat

Data exthe inst

11 Start-up

11.1 Start-up

tion about additional options rating the ANOTEST® YMP30-S

fer to the separate operators manualP30, ISOSCOPE® MP30 and DUALSCOPE® MP40

Ein the aforementioned operators manual 902-583 that are list below do NOT apply to the ANOTEST® YMP30-S

g Page

ns of the keys of the control panel 11

splay 14

tions 25

g applications 25

up applications 27

iting applications 29

applications 32

et up applications 33

ng application names 35

tion-specific settings 36

ntation of the measurement using the 71

us measurements 73

ST® (2.1 - 06/06) Page 1

ion 84

ion of the current block 85

ion of the current application 91

port, data import and remote control of rument

Appendix

, maintenance and cleaning

Page 2

11.2 Voltage

11.3 Warran

12 Instrum

12.1 Measur

12.4 Setting

12.6 Service

12.9 Protoco

13 Trouble

17 Technic

supply

y

ent configuration

ement accept signal

the date and time

functions / configuration programs

l of the instrument configuration

shooting and messages

al terms and equation characters 191

Operator’s Manual ANOTEST® (2.1 - 06/06)

2 Technical data

Model designation ANOTEST® YMP30-S

Intended use Sealing quality test instrument for anodic oxide coatings of aluminum and aluminum alloys 1)

Standards for the measurement method

DIN EN ISO 12373-5Aluminum and aluminum alloys - AnodizingPart 5: Testing the quality of sealed anodic oxide coatings by measuring admittance, and ASTM B 457-67

Display of result Admittance (Y) in microsiemens [ µS ]

Trueness 2) 1 % (of reading) + 0.5 µS

Repeatability precision 2) 0.5 % (of reading) + 0.3 µS

Measuring ranges 3):

Measuring cell ø 6 mm 4) 14 - 1880 µS

Measuring cell ø 13 mm 5) 3 - 400 µS = nominal measuring range

Measuring cell ø 26 mm 4) 0.75 - 100 µS

Adjustable meas. area 20 mm² - 600 mm²

Reference meas. area 133 mm² = nominal measuring area

Coating thickness range 3 µm - 100 µm adjustable

Reference coating thickness

20 µm

Measurement frequency 1 kHz ± 0.0001 Hz

Reference temperature 6) 25°C

Temperature range 6) 10°C to 35°C selectable

Operator guidance / display

8 languages selectableUnits of measure: metric only

Power supply Battery 9V6LR61 or optional: NiCd rechargeable battery

Dimensions (L x W x H) 160 mm x 80 mm x 30 mm

Mass 240 g (incl. battery, without probe)

Permitted environmental temperature during operation 7)

5°C ... 45°C

Operator’s Manual ANOTEST® (2.1 - 06/06) Page 3

Information regarding the index numbers in the technical data1) This test method is not suitable for certain aluminum alloys that exceed

certain quantity portion limits of alloy materials (e.g., Si, Mn, Mg). Theyare also not suitable for impregnated (cold-sealed) work pieces or work

pieces that have been dyed anodically. For more information, please consult the current test instructions of your quality mark organization or of your company.

2) The sought-after magnitude for “trueness” or “repeatability precision” is

always determined by adding the percentage components and the fixedvalue, as follows: “Percentage component of display” + “Fixed value“ = Sought magnitude

Example (Trueness): LCD display: “10 µS”-> “Percentage value of display”: 1 % of 10 µS = 0.1 µS-> “Fixed value”: 0.5 µSSought magnitude of the trueness: 0.6 µS

3) Information regarding the measuring rangeThe measuring range changes depending on the correction of the vari-ables test area, temperature or thickness. Cf. examples on the following page.

4) The measuring cells with diameters of 6 mm (measurement area 28.3 mm²) and ø 26 mm (measurement area 530.9 mm²) do not permit measurements conforming to standard due to the measurement areabeing too small or too large, respectively.

5) This is the standard measuring cell with an area of 133 mm² according to DIN EN ISO 12373-5

Permitted storage temperature 7)

5°C ... 60°C

Permitted rel. humidity 30 % ... 90 % (non-condensing)

Interface for remote data transfer

RS232 interface for the documentation of the measurement data using a printer or PC9-pin micro-T-plug

Memory capacity max. 10,000 measurements

Applications max. 100 applications

Test solution (Electrolyte) aqueous potassium sulfate solution (35 g/l)

Order number - instrument 603-800

Page 4 Operator’s Manual ANOTEST® (2.1 - 06/06)

6) This is the standard measuring cell with an area of 133 mm² according to DIN EN ISO 12373-5

6) “Reference temperature” and “Temperature range specimen”refer to the temperature of the specimen.

7) The temperature information refers to the instrument surroundings, not to the temperature of the specimen surface.

2.1 Examples for “Information regarding the measuring range”

Equations

Equation (1) Y1 = Ym * (133 / A)Equation (2) Y2 = Y1 * f1Equation (3) Y3 = Y2 * ( e / 20)

Additional information to equations 1 to 3Cf. Chapter 8.3 ‘Application-specific computation of the admittance’, page 26.

2.2 Measuring CellsThree self-adhesive foam rubber rings, of different sizes, so-called “measur-ing cells” are available (with diameters of 6 mm, 13 mm and 26 mm)

See 10 ‘Accessories’, page 33.

Reference quantity

Nominal meas. range

Actual quantity

Corrected meas. range

According to equation

133 mm² 3 µS - 400 µS 50 mm² 8 µS - 1064 µS (1)

25°C 3 µS - 400 µS 15°C 3.6 µS - 480 µS (2)

20 µm 3 µS - 400 µS 10 µm 1.5 µS - 200 µS (3)

Standard measuring cell with diameter 13 mm



3 Control Elements and Instrument Technology

3.1 Particular Technical Properties of the ANOTEST® YMP30-S Instrument

The following situation may arise:A new measuring result flashes on the LCD display and a double acoustic signal soundsThe ANOTEST® YMP30-S instrument warns the user in this manner that the admittance is greater than 15 uS. The default setting for the warning limit is 15 µS.

1) Socket of the RS232 interface

2) Anode plugwith ground cable3) Meas. probe

4) Measuring cell

5) Connection terminal, connected with the anode plug, or ground cable connected to the ANOTEST instrument


You can change this setting (in the service functions ZERO).If you set the value to a (very) large number, no warning occurs by flashing.How to change the settings of the warning limit:

1. Press the ENTER key 10xThe text “157” appears on the LCD display.

2. Press the key 2xThe text “159” appears on the LCD display.

3. Press the ENTER key 1xThe text “FREE” appears on the LCD display.This indicates that the instrument is in the service parameter setting mode.

4. Press the ZERO key 1xThe text “Warning limit” and a number (as a rule, the default setting 15.0) appear on the LCD display.

5. You can change the setting to a different value using the or key. Confirm the value with ENTER.

6. To exit the service parameter setting mode and return to measuring mode press the DEL key 2x. Ready. The instrument is again ready to make measurements.

Message “Reading above measuring range”.This message appears on the display for readings above 400 µS when using the standard measuring cell with a 13 mm diameter

“Reading above measuring range”

You may also print the message with your printer.Such out-of-range measurements are not saved.The measurement magnitude that triggers this display message for the mea-suring cell types ø 6 mm and ø 26 mm is adjusted accordingly.

Maintenance of the connection terminalThe contact tips of this connection terminal (= the small screw clamp) must not be rounded or damaged, otherwise it will not be able to penetrate the an-odic coating. If necessary, re-sharpen the tip!


Technical differences from other instruments of the HELMUT FISCHER MP instrument seriesThe service parameters of the ANOTEST® YMP30-S offer no options for set-ting “specification limits”, “fixed block limits”, “i single readings” and “out-lier monitoring”

Master calibrationContrary to other Fischer instruments of the MP series, the master calibration is not stored in the probe but in the instrument. The master calibration is performed by service personnel authorized by Fischer and is of no practical significance for the user.

Operation using the active RS232 interfaceIf the instrument is connected to a PC via an RS232 interface, the measure-ment may be influenced by electrical interferences (EMC influence).Remedy: Separate the RS232 port from other electronic devices (e.g., a computer) while making measurements (pull the plug).

Do not bend the probe cable! This might lead to a break in the line. The bending radius of the probe cable and of the ground cable should always be greater than 50 mm!

Sonden-anschluss-leitung

R >= 50 mm!



4 Measuring

Plug in the probe cable in the instrumentPlug in the ground cable in the instrument

Image1 : Measuring system with ANOTEST® YMP30-S and accessories

4.1 Preparing the specimenRecommended methods for cleaning the test area:Degrease the test area using benzine. If preservation agents containing silicon are to be removed, use a paste of ap-prox. 5 percent in weight of Aerosil in benzine.

First, connect the ground wire to the part to be tested in a manner that pro-vides for a good electrical connection to the ANOTEST®.

Then carefully stick the electrolyte cell onto the test location.

Measure the temperature of the specimen with a seprate thermometerwith an accuracy of 0.1 °C

Fill in the electrolyte in the measuring cell.

The admittance is measured after the counter electrode dips into the measur-ing cell. The measurement should be accepted no sooner than 2 minutes after measurement start.


4.2 Part 1 of the Measurement: Checking instrument settings

Keyboard command Display

Continue with Chapter 4.3 ‘Part 2 of the Measurement: Performing the Measure-ment’, page 13

1) Press MENUTemperature [°C]Default setting: 25 °CMeasure the temperature with a sep-arate thermometer and enter it into the instrument at this point (using the

or key).

2) Press ENTERArea [mm²]Default setting: 133 mm²This applies to the standard measur-ing cell with a diameter of 13 mm(Order number 384-002)(To change, use the or key)

3) Press ENTEROxide coating [µm]Default setting: 20 µmIMPORTANT: The user measures the coating thickness using a sepa-rate coating thickness test instru-ment and enters the reading from this menu option.(To enter, use the or key)

4) Press ENTERMeas. time [Seconds ]Default setting: 120 SecondsThe time of 120 sec corresponds to the standard value according to DIN EN 12373-5.Other values may be entered (use the or key).

5) Press MENUExit the Settings menu and return to the measuring mode.


4.3 Part 2 of the Measurement: Performing the Measurement

Prerequisites before beginning a measurement:- Preparations must have been made- Instrument must be switched on- Instrument settings according to the current test situation- Specimen and instrument must be electrically connected with the anode plug/ground cable.- An application must be set up and active- Instrument must be in measurement mode (similar to example below)

Display Sequence

1) Display before the start of the measure-ment

Probe tip is inserted into the measuring cell

2) Measurement in progress

3) End of the measurement

1) Insert the probe tip into the electrolyte solution in the measur-ing cellThe probe tip may touch the surface of the anodic coating.The automatic measurement se-quence starts without any additional actuation of a key or similar. An acoustic signal sounds 1x.

2) Measurement in progress- The countdown of the remaining measuring time runs (display in sec).- The current reading is displayed continuously.Caution: The probe tip must remain immersed in the electrolyte while the measurement is in progress; other-wise, the automatic measurement sequence is terminated.

3) End of the measurementThe automatic measurement se-quence ends at the expiration of the set measuring time (typically 120 s).An acoustic signal sounds 1x.The measurement appears on the display in the unit Microsiemens (µS).To shorten the test use ENTER: Cf. “Information 1” on the next page.


Information 1 : Shorten a measurement using ENTER while “Step (2) Measurement is in progress”The measuring time can be shortened manually at any time during the count-down by pressing ENTER. Pressing ENTER corresponds to the command for accepting the measure-ment.This can be used during a measurement or a normalization.

Note: If the you decide to shorten the prescribed time, the measurement no longer conforms to the standard.

4.4 Notes Regarding the MeasurementPreferably, measurements are to be made between one hour and four hours af-ter sealing and cool-down to room temperature, but never after more than 48 hours.

The reading will change during the initial 30 sec and will approach a constant limit value after about 2 minutes. For this reason, DIN EN ISO 12373-5 does not allow reading of measurements after 2 minutes at the earliest.

4.5 Evaluating the Measurement ResultsInformation about the sealing quality can be deduced from the admittance reading. To evaluate the measurement results, please refer to the quality test regula-tions that are currently applicable in your company.

The quality of the sealed oxide coating is sufficient if the measured admit-tance (and where applicable, corrected according to equations (1) to (3)) is less than 15 µS (value based on experience, not on a technical standard!).


5 Testing the accuracy using an electri-cal reference

The measurement accuracy of the ANOTEST® can be checked using the elec-trical reference part YDR3 (part number 600-772). This part contains electri-cal simulations of Y-values (4 so-called standards). Test procedure:The test tip and the plug of the ground cable are connected to the socket ter-minals of the electrical reference instead of to the measuring cell.

Left: ANOTEST® YMP30-S with electrical reference part YDR3 Right: Full front view of the YDR3 with label “for ANOTEST YD8 only“ (previous version of the instrument). This means, the two bottom socket terminals have no function re-garding their use in connection with the ANOTEST® YMP30-S.

The following Y-values can be checked: 3 µS, 10 µS, 20 µS and 200 µS .


6 Normalization

This step is used to determine the zero point of the characteristic.This compensates for potential properties of the instrument such as drift of the electronics, or similar and reestablishes the original characteristic.The probe and the ground plug are NOT plugged into the socket terminals of the electrical reference part YDR3 (optional accessory) during the normaliza-tion. Thus, this part is not absolutely necessary for the normalization.


NormalizationDisplay Sequence

Display in measuring mode prior to calling the normalization mode. The application to be calibrated (“Appl.: 1“) has been selected.

Probe and ground plug are NOT plugged into the socket terminals of the el. reference part YDR3 during the normalization.

Display at the beginning of the normalization procedure (Condition after step 1, ZERO key)

Display during the normalization

Prerequisites:- Instrument is switched ON and in measuring mode.- Probe and ground plug are NOT plugged into the socket terminals

1) Press ZERO, to start the normalization of the current application.A z appears on the display and remains on the LCD display during the normalization.

2) Press FINAL-RES. (NOT the ENTER key!)

The measurement of the so-called “air” value starts automatically and the countdown of the set measuring time begins to run. The default setting is 120 seconds.

An acoustic signal sounds (1x) when this time is expired.The display returns to that of the regu-lar measuring mode.

FINISHED.The normalization is finished.The instrument is again ready to make measurements.


7 Corrective calibration

7.1 When to calibrate?We recommend to calibrate every 12 months.

7.2 Function of a corrective calibrationA corrective calibration determines anew the calibration curve (= character-istic) of the open application and stores it in that application. Through a mea-surement, the zero point and two additional points are determined (using two calibration standards).Note: The master characteristic determined in the factory remains unchanged in the data memory of the instrument after a corrective calibration.

7.3 Performing a corrective calibrationFor corrective calibration, you require:

ANOTEST® instrument with probe and ground cable connected ready to operate. Cf. Chapter “Start-Up”The application to be calibrated must be set up already.Cf. Chapter “Setting Up an Application”Electrical reference part YDR3(available as optional accessory; part number 600-772)

Note: Measurement and temperature values in the description of the sequence are examples only.

7.4 Selecting the calibration standards Select the following socket terminals for the calibration (instrument-internal names: “Standard 1” and “Standard 2”):Standard 1: 3 µSStandard 2: 200 µS


How to perform a corrective calibration:

Display Sequence

Display in measuring mode prior to calling the calibration mode. The application to be calibrated (“Appl.: 1“) has been selected.

Entering the temperature

Entering the area

Entering the oxide coating

Prerequisite:- Instrument is switched ON and in measuring mode.- Probe and ground plug are NOT plugged into the socket terminals

1) Press CAL to start the corrective calibration of the current application.A j appears on the top right and remains on the LCD display during the corrective calibration.

2) Enter the current temperatureThe temperature setting is always 25° C.

Press the ENTER key to accept the value.

3) Area [mm²]Default setting: Keep 133 mm²This applies to the standard measur-ing cell with a diameter of 13 mm(To change, use the or key)Press the ENTER key to accept the value.

4) Oxide coating [µm]Default setting: keep 20 µm(thickness)(To change, use the or key)Press the ENTER key to accept the value.


Display at the beginning of step 5 “Air”

Display with the prompt to provide “Standard 1”.

Socket connection on the electr. reference part during the measurement of standard 1

Display during the measurement of standard 1

5) AirThis step is used to determine the so-called zero point of the calibration curve.Press the FINAL-RES key. (Do NOT press ENTER!)

The measurement starts automatical-ly and the countdown of the set mea-suring time begins to run. The default setting is 120 seconds.For a few seconds, 4 dashes - - - - appear on the display.

The LCD display will then prompt you to provide “Standard 1”. This refers to the first calibration standard (Example: 3.00 µS).

For information about selecting cal-ibration standards see above.

6) Measuring the calibration stan-dard “Standard 1”- Plug the probe into the first socket terminal of your choice in the left row “ELECTRODE”.- Plug the ground plug into the sock-

et terminal with the mark The measurement starts automatical-ly and the countdown of the set mea-suring time begins to run. The default setting is 120 seconds.

At the end of the measurement:Set the nominal value for “Standard 1” using the arrow key

or (Example: 3.00 µS).

Press the ENTER key to accept the measured value


Display Sequence


Display with the prompt to provide “Standard 2”

Socket connection on the electr. reference part during the measurement of “Standard 2“

Display after the measurement of “Standard 2“

The prompt to provide “Standard 2” appears on the LCD display. This re-fers to the second calibration standard (Example: 200.00 µS).

- Plug the probe into the respective socket terminal in the left row “ELECTRODE” (Example: 200 µS).- The ground plug is plugged into the

socket marked

The measurement starts automatical-ly and the countdown of the set mea-suring time begins to run. The default setting is 120 seconds.

At the end of the measurement:Set the nominal value for “Standard 2” using the arrow key

or (Example: 200 µS).

Press the ENTER key to accept the nominal value.

FINISHED.The calibration is finished.The instrument is again ready to make measurements.

The new characteristic is calculated and stored automatically.


Display Sequence



8 Measuring principle

The ANOTEST® YMP30-S is used for the measurement of the quality of an-odic oxide coatings on aluminum and aluminum alloys. The instrument, therefore, allows for a fully non-destructive, very simple determination of the sealing quality.

8.1 About the need for aluminum surface protection

As a non-precious metal, aluminum is subject to corrosion, however, contrary to iron, it forms together with oxygen a corrosion-resistant oxide coating. Be-cause of this chemical reaction, under normal circumstances the aluminum surface remains in a very good condition; this is enhanced by the fact that the protective oxide coating starts rebuilding when damaged.For many applications (especially for outside applications) this natural oxide coating is not sufficient, because, for example, even the smallest inclusions of heavy metals can prevent a natural oxide coating without gaps, allowing for corrosion to occur in those areas.

There are essentially two options for preventing corrosion:

1.) Attempting to achieve a perfect oxide film by using high-purity aluminum.2.) Improving this natural oxide film through suitable measures.

Solution #1 would increase the costs for aluminum production significantly and is, therefore, ruled out.

ANODIC OXIDATION (in Europe often referred to as eloxal method = elec-trolytic oxidation of aluminum) has generally established itself as a suitable solution according to #2. An electrical current is used to release oxygen, which immediately reacts with the aluminum surface and forms the desired oxide coating.

Two Japanese researchers, SETOH and MIATA, have discovered through tri-als and measurements that the oxide coating produced by ANODIC OXIDA-TION must consist of two entirely different layers. That is to say, at a constant current density, the bath voltage increases over time only insignificantly while at the same time the film thickness increases greatly. In the end, this means that the electrolyte penetrates into the oxide coating, thus making it electrically conducting, while the main portion of the voltage drop must occur


at another layer. This very thin, electrically insulating film determines the corrosion behavior. It is known under several designations: "active layer", "dielectric layer", "compact layer", "barrier layer".

The thickness of the active layer is roughly proportional to the applied bath voltage. Located above it is the porous and to some degree electrically con-ducting oxide coating.

8.2 Measurement method to test the after-treatment / sealing quality

Up until this state, the oxide coating is very sensitive due to its fine pore struc-ture and its large active surface, making an after-treatment essential. This af-ter-treatment is known as "sealing".

First, the aluminum components must be cleaned thoroughly. Additionally, the sealing quality is influenced by the following parameters:

Quality of the oxide coating (determined by the bath temperature, circulation, current density, impurities)Sealing timeTemperature of the sealing bathpH value of the sealing solutionImpurities

Since all the points mentioned above are associated with costs, a measure-ment method is desired that can test the quality of the anodic coating in gen-eral and the sealing quality in particular in a simple and nondestructive man-ner. The admittance measurement method has become a generally accepted method for this task.

Prior to sealing After sealing


Equivalent circuit diagram according to SETOH and MIATA .

C1/R1 effective impedance of the active coatingC2/R2 effective impedance of the porous main coating

Since both R1 and C2 are highly resistive, the circuit can be simplified to the following complex impedance (of course, other simplifications apply as well).

The inverse value of this impedance is the admittance Y = 1 / Z measured by the ANOTEST® YMP30-S. The ANOTEST® YMP30-S has been developed specifically for this measure-ment application. Measurement method and evaluation adhere strictly to the European standard: EN 12373-5 (replaces DIN 50949).

The measuring cell consists of a rubber ring with a self-adhesive ring surface and a test area of 133 mm². The electrolyte to be used is an aqueous potassium sulfate solution (35 g/l).Preferably, the measurements are to be made 1 to 4 hours after sealing and cool-down to room temperature, but never after more than 48 hours.First, connect the ground wire to the part to be tested in a manner that provides for a good electrical connection to the ANOTEST®. Then carefully stick the electrolyte cell onto the test location. The admittance is measured after the counter electrode dips into the measuring cell. The measurement should be accepted no sooner than 2 minutes after measurement start.


8.3 Application-specific computation of the admit-tance

The ANOTEST® YMP30-S can compute the application-specific factors:

Formula 1) Y1 = Ym * (133 / A)Formula 2) Y2 = Y1 * f1Formula 3) Y3 = Y2 * ( e / 20)

Thus, the ANOTEST® YMP30-S instrument can take the test area, the coat-ing thickness and the temperature into account, even if these variables do not correspond to the reference quantities of the standard.

Ym Measured admittance in microsiemens [ µS ]This value is corrected for the test area if the area is not 133 mm²

A Test area [square-millimeter] (= inner area of the measuring cell)

f1 Temperature coefficient (according to DIN EN ISO 12373-5)This value is temperature-corrected if the temperature is not 25°C

e Thickness of the anodic oxide coating [micrometer]

Y1 Admittance corrected by the test area

Y2 Temperature-compensated admittance

Y3 Admittance corrected by the coating thicknessThis value is coating thickness-corrected if the coating thickness is not 20 µm


8.4 MeasurementThe reading will change during the initial 30 sec. and will approach a constant value after about 2 minutes. For this reason, DIN EN ISO 12373-5 allows read-ing of measurements after 2 minutes at the earliest.

8.5 Evaluating the resultsInformation about the sealing quality can be deduced from the admittance readings. For an anodic coating with a coating thickness of 20 µm and a sealing time of 60 minutes at about 98° - 100°C in steam or DI water, the Y-value should not exceed 15 µS.

A slow increase in the reading is not critical as long as the increase is only l - 2 µS and stops after about 2 - 10 minutes. An increase of 18 7- 25 µS points to chalking; coatings with values above 25 µS indicate that anodizing and sealing is insufficient. These basic values apply to the alloys AlMySi 0.5, AlMg and to pure aluminum. For AlSi 5, a value of about 10 - 20 should be added. Depending on the source, composition, heat treatment and aluminum content of the anodizing bath, AlMgSi l shows heavily scattered values that, as a rule, will be above 15 µS.



9 Nomograms, Tables, Characteristics

----- projected profile ----- actual profile

TE 00768: Admittance of thin coatings under standard anodizing conditions

Individual variations of the standard conditions

TE 00968: Effect of the anodizing and sealing conditions on the admittance Y


Coating thicknesses = 20 µm

TE 01868: Dependence of the admittance Y on the anodizing conditions at similar sealing conditions

Coating thicknesses = 20 µm Sealing time in steam at 108°C

TE 01968: Dependence of the admittance Y on the sealing time

Anodizingconditions


Electrolyte temperatureCurrent density [ A / dm² ] Sealing times o 1 min/µm 4 min/µm

TE 00369: Decrease of the initial values of the admittance Y after 30 days of room storage


Conversion table of the admittance to the standard coating thickness of 20 µm referenced to a material temperature of about 20°C

Computation according to the bibliography in the operators manual ANOTEST YMP30-S, Helmut Fischer GmbH+Co.KG


10 Accessories

Order informationItem Order No.Instrument incl. accessoriesANOTEST® YMP30-S 603-800

Optional accessoriesELECTRICAL REFERENCE YDR3 600-772SUPPORT PLATFORM FOR 600-025THE PORTABLE INSTRUMENTINTERFACE 602-341CONNECTION SET MPSOFTWARE PC-DATEX 602-465SOFTWARE PC-DATACC 603-028PRINTER FMP3040 602-890CARRYING BOX MP 602-891CARRYING CASE 602-120MP0D/30/40

Spare partsMeasuring cable YMP30-S 603-855Ground cable ANOTEST 600-767Screw clamp, stainless steel 600-766BOTTLE TEST SOLUTION 600-768VE MEASURING CELLS ø 6 mm 600-769VE MEASURING CELLS ø 13 mm 600-770VE MEASURING CELLS ø 26 mm 600-771


10.1 Regulations, legal information

10.2 Disposal

This symbol means:Do not dispose of this product with household waste!Please follow the guidelines in your area concerning proper disposal of used electrical equipment and electronic accessories, or ask your authorized dealer for the respective information.Recycling of this product helps maintain natural resources and prevents po-tential negative effects on the environment and health that could be caused by wrong handling.

10.3 TrademarksANOTEST® is a registered trademark of Helmut Fischer GmbH+Co.KG, Sindelfingen.Windows® is a registered trademark of the Microsoft Corporation.


11 Additional technical information

11.1 AnodizingAnodic oxidation is an electrolytic method for producing protective oxide coatings on metals. During the electrolysis in a suitable solution (preferred are sulfuric, oxalic or chromic acid), an oxide coating (typically with a thick-ness of 10 – 25 µm) forms on the surface of the anodically switched metal parts and can be dyed using inorganic materials or organic dyes and can be sealed in an after-treatment step. The primary purpose of the coating is to pro-tect the metals from corrosion and abrasion (hard anodizing) but also to serve as electrical insulation or as a decorative coating. After impregnation with light-sensitive silver compounds, photographic images and drawings can be applied as well (e.g., to create scales or signs).

Anodic oxidation is possible with various metals, however, currently it has technical relevance only for light metals. Anodic oxidation is of particular im-portance for aluminum and Al alloys. Anodized aluminum is used extensively in architecture (house facades, doors, window frames), in the automotive in-dustry, in container construction and for equipment components.

The anodizing steps can be divided intoPretreatment (cleaning, etching, polishing, pickling)Anodizing (various methods)After-treatment (dying, sealing, cold sealing).

What is anodizing? Anodic oxidation is an electrochemical process that converts the surface of the aluminum to aluminum oxide. The oxide coating is connected directly to the aluminum and the coating thickness can be selected within a certain range.

Why anodize?Anodizing permanently protects the aluminum. Anodizing makes the aluminum easy to clean. Anodizing improves and maintains the decorative appearance.


HELMUT FISCHER GMBH INSTIT

w

Coating Th

EC D

The manufacturer herewtester for anodic oxide c

The product correspond

Further applied standard

This declaration will becapproved by the manufa

Manufacturer: HELMUT

Representative: Mr. Bern

LVD - Low Voltage Direc

EMC Directive 2014/30

Product Safety Directive

BGV A3 §5and

EMC EN

EN

EN

EN

(Signature

UT FÜR ELEKTRONIK UND MESSTECHNIK

ECLARATION OF CONFORMITY

ith declare for the product ANOTEST® YMP30-S, sealing quality oatings on aluminium:

s to the following directives and standards/acts:

s and regulations:

ome invalid, in case of customer‘s own changes that have not been cturer.

FISCHER GMBH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIKIndustriestraße 21

tive 2014/35/EC EN 61010-1

/EC EN 55011

2001/95/EC Product Safety Act (ProdSG)

, paragraph 4 of accident prevention regulations "Electrical systems equipment"

61000-4-2

61000-4-3

61000-4-4

50082-2

ww.helmut-fischer.de [email protected]

ickness Material Analysis Microhardness Material Testing

D-71069 Sindelfingen

hard Scherzinger, Chief Engineer, Quality

Sindelfingen, the 8. October 2015)

Aaccessories 33accuracy of the ANOTEST® 15active layer 24Additional literature 2Admittance 3after-treatment 24ANODIC OXIDATION 23Applications 1application-specific factors 26Application-specific settings 1Assigning application names 1

Bbarrier layer 24

Ccalibration standards 18Cleaning 2cleaning the test area 11compact layer 24configuration programs 2Connecting a computer 2Connecting a printer 2control panel 1Conversion table of the admittance

32corrective calibration 18

DData export 1data import 1Deleting applications 1dielectric layer 24Dimensions 3disposal 34Documentation of the measurement

using the printer 1

EElectrolyte 4electrolytic oxidation of aluminum

23eloxal method 23Equivalent circuit diagram 25Erroneous measurements 1Evaluation 1Evaluation of the current application

1Evaluation of the current block 1

Ffrequency 3

Gground cable 11

Hhumidity 4

IInstrument configuration 2Intended use 3

Kkeys 1

Llanguages 3LCD Display 1List of set up applications 1

MMaster calibration 9Meas. time 12Measurement accept signal 2Measuring 12Measuring cell 3measuring cells 5


Measuring ranges 3Memory capacity 4

Nnominal measuring area 3nominal measuring range 3normalization 16

OOrder number 4Output format for the measure-

ments 1Overwriting applications 1Oxide coating 12

PpH value 24potassium sulfate solution 4Power supply 3printer 2probe cable 11Probe connection and probe repla-

cement 2Protocol of the instrument configu-

ration 2

RReference temperature 3remote control of the instrument 1Repeatability precision 3RS232 interface commands 2

SSales and repair offices 2sealing 24Sealing time 24Selecting applications 1Service functions 2Setting the date and time 2Setting up applications 1

Spare parts 33Standards 2Start-up 2Start-up, maintenance and cleaning

2Statistics and coating thickness

measurement 2

TTechnical terms and equation cha-

racters 2Temperature range 3Test solution 4trademarks 34Transferring the measurement data

to a computer 1Trouble shooting and messages 2Trueness 3

VVoltage supply 2

Wwarning limit 8Warranty 2

YY = 1 / Z 25YDR3 15

Zzero point of the characteristic 16


Operators Manual

ISOSCOPE® MP30E-R ISOSCOPE® MP30E-S

DELTASCOPE® MP30E-RDELTASCOPE® MP30-S-NiDELTASCOPE® MP30E-SDUALSCOPE® MP40E-RDUALSCOPE® MP40E-S

Coating Thickness Material TestingMicrohardnessMaterial Analysis

Handheld Instruments Series MPxxEInstruments for coating thickness measurements.

On our home page www.helmut-fischer.com you will find the addresses of our sole agencies and subsidiary companies around the globe.

© 2008 by Helmut Fischer GmbH, Sindelfingen, Germany

This manual remains the copyrighted property of Helmut Fischer GmbH Institut für Elektronik und Messtechnik. All rights reserved. This manual may not be re-produced (print, photocopy, microfilm or any other method) in full or in part, or processed, multiplied or distributed to third parties by electronic means without the written consent of the Helmut Fischer GmbH Institut für Elektronik und Messtechnik.

Subject to correction and technical changes.

DELTASCOPE® , ISOSCOPE® and DUALSCOPE® are registered trade marks of the Helmut Fischer GmbH Institut für Elektronik und Messtechnik in Germany and/or other countries.

Note: The fact, that the trademark characters ® and ™ may be missing does not indicate that such names are free trademarks.

Document order number

902-583

Version

5.2

Issue date

08/2008

Instrument manufacturer:

Helmut Fischer GmbH Phone: +49 7031 303-0Institut für Elektronik und Messtechnik Fax: +49 7031 303-710Industriestraße 21 www.helmut-fischer.comD-71069 Sindelfingen [email protected]

Quality Assurance System of the Helmut Fischer GmbH

DIN ISO 17025 Calibration lab with DKD accreditation according to DIN ISO 17025 in the corresponding valid version for cer-tified mass per unit area standards

ISO 9001 Certified according to ISO 9001 in the corresponding valid version, German Lloyd Certification

Operators manual hand-held instrument MP30/40 Page 2

1.1 Symbols and styles used................................................................. 5 1.2 Abbreviations.................................................................................. 6 1.3 General Note.................................................................................. 6 1.4 Trademarks .................................................................................... 6

2 Introduction to the instrument.................................................................. 7 2.1 Intended use................................................................................... 7 2.2 Requirements on the operating personnel........................................ 7 2.3 Power supply.................................................................................. 7 2.4 Environmental conditions for operation and storage of instrument and accessories .......................................................................................... 7

3 Instrument and accessories description .............................................. 9 3.1 Measurement application capabilities and test methods ................... 9 3.2 Keypad functions ...........................................................................11 3.3 Display ..........................................................................................14 3.4 Probes...........................................................................................15 3.5 Calibration standards .....................................................................18

4 Switching the Instrument ON and OFF...................................................20 4.1 Switching the instrument ON..........................................................20 4.2 Test method of the connected probe...............................................23 4.3 Switching the instrument OFF ........................................................24

5 Applications ..........................................................................................25 5.1 Selecting the desired application ....................................................25 5.2 Creating an application ..................................................................27 5.3 Creating an application with a dual probe........................................29 5.4 Overwriting an application..............................................................29 5.5 Overwriting an application with a dual probe ..................................32 5.6 Deleting an application...................................................................32 5.7 List of existing applications.............................................................33 5.8 Assigning application names..........................................................35 5.9 Application-specific settings ...........................................................36

5.9.1 Specification limits monitoring.................................................37 5.9.2 Display resolution...................................................................39 5.9.3 Automatic block formation and block size ................................40 5.9.4 “Mean reading” mode .............................................................45 5.9.5 Outlier rejection ......................................................................46 5.9.6 Display modes........................................................................48 5.9.7 Dual method...........................................................................50

5.10 Linking the applications................................................................51 5.10.1 Enabling or disabling the linking mode...................................54 5.10.2 Linking mode at dual probes .................................................54

6 Standard and matrix measuring mode....................................................55 6.1 Changing the measuring mode.......................................................55 6.2 Standard measuring mode.............................................................55 6.3 Matrix measuring mode..................................................................56


6.4 Changing blocks............................................................................58 6.5 Assigning block names ..................................................................58

7 Measurement........................................................................................60 7.1 Preparations for measurement .......................................................60 7.2 Making a measurement..................................................................60 7.3 Measurement accept .....................................................................64 7.4 Measurements with external start enabled......................................64 7.5 Acoustic signals after measurement accept ......................65 7.6 Display of the test method used when measuring with dual probes.66 7.7 Measurement with specification limits monitoring enabled ..............66 7.8 Measurement with fixed block size .................................................68 7.9 Measurement with ”Mean Reading” mode enabled.........................69 7.10 Measurement with outlier rejection enabled ..................................70 7.11 Recording the measurements with a printer ..................................71 7.12 Printing measurements later.........................................................71 7.13 Erroneous measurements ............................................................73

7.13.1 Deleting single erroneous measurements..............................73 7.13.2 Deleting all measurements of an open block..........................73 7.13.3 Deleting all measurements of the current application ............73 7.13.4 Overwriting single erroneous measurements later..................73 7.13.5 Measurement with ”continuous” display mode .......................75 7.13.6 Turning the ”continuous” display on and off ...........................76 7.13.7 Measurement with ”continuous” display mode enabled ..........76 7.13.8 Analog display......................................................................77 7.13.9 Measurement with ”Continuous” display using dual probes ....79 7.13.10 Measurement with standard or matrix measuring mode enabled ..........................................................................................79 7.13.11 Measurement with standard measuring mode enabled.........80 7.13.12 Measurement with matrix measuring mode enabled............80

7.14 Transferring measurements to a computer and remote control of the Instrument...........................................................................................82 7.15 Output format of the measurement data string ..............................82 7.16 Transferring the measurements to an external computer ...............82

8 Evaluation.............................................................................................84 8.1 Evaluation of the current block (block result) ...................................85 8.2 Recording the block result with a printer .........................................88 8.3 Evaluation of the current application (final result) ............................91 8.4 Recording the final result with a printer ...........................................96

9 Normalization and corrective calibration...............................................100 9.1 Hints for normalization and corrective calibration...........................100

9.1.1 Normalization and corrective calibration with dual probes ......101 9.2 Reference Measurement..............................................................102 9.3 Normalization ..............................................................................102

9.3.1 Performing a normalization ...................................................103 9.3.2 Recording a normalization with a printer................................104


9.4 Corrective calibration ...................................................................105 9.4.1 Corrective calibration............................................................106 9.4.2 Deleting the corrective calibration..........................................109 9.4.3 Recording the corrective calibration with a printer ..................111

9.5 Calibration on the coating.............................................................112 9.5.1 How to calibrate on the coating.............................................112 9.5.2 Recording the calibration on the coating................................115

9.6 Master calibration ........................................................................116 9.6.1 Determination of calibration standards for master calibration..116

10 Technical Data..................................................................................122 10.1 Measurement application capabilities..........................................122 10.2 Technical data ...........................................................................123 10.3 RS232 interface.........................................................................124

10.3.1 Factory settings..................................................................124 11 Start-up, maintenance and cleaning...................................................125

11.1 Instrument start-up.....................................................................125 11.2 Power supply.............................................................................125 11.3 Connecting or replacing a probe.................................................127 11.4 Opening the instrument or the accessories .................................129 11.5 Handling the probes...................................................................129 11.6 Handling, storing and transporting the calibration standards .......130 11.7 Warranty....................................................................................130

12 Instrument configuration ....................................................................131 12.1 Acoustic measurement accept signal..........................................131 12.2 Enabling the measurement accept signal....................................131 12.3 Disabling the measurement accept signal ...................................131 12.4 Setting the date and time............................................................132 12.5 Restricted operating mode .........................................................134

12.5.1 Enabling and disabling the restricted operating mode ..........135 12.6 Configuration programs..............................................................135

12.6.1 Configuration program FINAL-RES ....................................137 12.6.2 Configuration program BLOCK-RES (histogram mode and block result mode).........................................................................138 12.6.3 Configuration program ZERO (unit of measurement, date format, time, date, language, display mode, measurement accept, external start mode and delay) ......................................................139 12.6.4 Configuration program CAL (master calibration) .................143 12.6.5 Configuration program (re-initialization)...........................143 12.6.6 Configuration Program (parameter RS232 interface) ......144 12.6.7 Configuration program APPL No (application linking mode and measuring mode)..........................................................................146 12.6.8 Configuration program PRINT (Printer)................................148 12.6.9 Record of the instrument status...........................................150

13 Errors................................................................................................152 14 Display Messages .............................................................................155


1 Conventions

1.1 Symbols and styles used The following symbols and styles are used in this operator manual:

Indicates safety remarks and warnings of possible damage to the instrument or the accessories or danger to the operating personnel

Indicates particularly important information and notes

• Indicates listings

01

Indicates a measurement, which has to be performed as next action (perform the measurement with the probe connected! The axial single tip probe is used only as symbol for all probes, which can be connected!)

ENTER Refers to instrument keys

ON/OFF +ENTER Refers to instrument keys, which have to be pressed immediately one after the other (do not keep both keys pressed!)

Simplified representation of the display with all elements relevant for the current action

Style used for those prompt lines on the display, which are displayed alternately with the lines appearing above them

Styles used for operating notes appearing in the prompt lines on the display

Style used for error messages and warnings appearing in the display

Style used for text appearing on a printout.


”7 Measurement” Cross reference to a chapter of this operator manual

Seite 3 Cross reference to a page of this operator manual

Histogramm Cross reference to an additional term, that is also explained in chapter ”11 Glossary of Terms and Symbols”

/ 1 / Cross reference to additional literature, listed in chapter ”12 Additional Literature” (from page 87)

1.2 Abbreviations The following abbreviations are used in this operator manual: Abbreviation Explanation CR Carriage Return (ASCII character) CuBe Copper-Beryllium Fe ferromagnetic LF Line Feed (ASCII character) NC electrically nonconductive NF nonferromagnetic SM substrate material (= uncoated measuring object)

Table 1.1: Abbrevations used

1.3 General Note Illustrations of displays in this manual are examples only. Actual coating thickness measurement data, the prompt lines in the display (e. g. the number of the selected application, the number of measurements stored in a particular application) or the results of an evaluation depend on your individual application. It is possible that different numbers appear in the display. This is not an indication of any malfunction.

1.4 Trademarks DELTASCOPE®, ISOSCOPE® and DUALSCOPE® are registered trademarks of Helmut Fischer GmbH. All names of the products mentioned in this manual are marks of the respective companies. The fact that the trademark characters ® or ™ are missing does not indicate that the names are free trademarks.


2 Introduction to the instrument

2.1 Intended use The instruments DELTASCOPE® MP30E, ISOSCOPE® MP30E and DUALSCOPE® MP40E are used for coating thickness measurement only. Only accessories recommended or used by Fischer (e.g. AC power supply, probes, printer) may be connected to the instrument.

2.2 Requirements on the operating personnel The instruments should be operated by suitably qualified personnel only! Knowledge about configuration, operation and programming of the computer as well as of the software used, is necessary to connect the instrument to a computer. Refer to the corresponding operator manuals if necessary.

2.3 Power supply

To prevent damage to the instruments or wrong measurement results due to wrong A/C line voltage, connect the instruments to a power outlet only with the AC power supply supplied by Fischer. The A/C line voltage must agree with the A/C line voltage rating on the serial number plate of the AC power supply.

2.4 Environmental conditions for operation and storage of instrument and accessories

The instruments DELTASCOPE® MP30E, ISOSCOPE® MP30E and DUALSCOPE® MP4E0 are designed to meet and comply with all requirements as set forth in the ordinance about electromagnetic compatibility of instruments. The measured coating thicknesses are not influenced by the highest level of interference as stated in the guideline EN 50082-1 (which refers to EN 61000-4-2, ENi61000-4-3 and EN 61000-4-4.


In particular, the instrument is effectively shielded from electromagnetic fields (e.g. motors, power lines, etc.). Instrument and accessories are designed for use at temperatures between 5 and 45°C (41 ... 113°F). The equipment may be stored at temperatures between 5 and 60°C (41 ... 140°F).

Temperatures behind windows (e.g. in cars) in direct sunshine rise easily above 60 °C (140°F). To avoid damage to the instrument or the accessories by heat, do not keep or store the instrument or the accessories in such places.

Because of danger of short circuits instrument and accessories (in particular the AC power supply) must not come in direct contact with fluids! Instrument and accessories may be operated, kept and stored only in places where the environmental relative humidity is between 30 and 90 % (non-condensing).

Instrument and accessories are not acid resistant! Make sure to avoid direct contact of acid or acid solutions with the instrument or the accessories.

Instrument and accessories must not be operated in an explosive atmosphere!

Instrument and accessories are to be protected from static charge! Electric discharges may delete internally stored data or damage internal components.


3 Instrument and accessories description The functions and the operation of the instruments described in below table is identical. The instruments only differ in the test method used, therefore in the measurement application capability and the probes which can be used for measurement (see tables below).

3.1 Measurement application capabilities and test methods

Instrument model Thickness

measurement of Test method

DELTASCOPE® MP30E

Nonferromagnetic or nonconductive coatings on steel or iron

Magnetic induction test method according to DIN EN ISO 2178, ASTM B499 or BS 5411/11

ISOSCOPE® MP30E Nonconductive coatings on non-ferromagnetic substrates

Eddy current test method according to DIN EN ISO 2360, ASTM B244 or BS 5411/3

DUALSCOPE® MP40E

Nonferromagnetic or nonconductive coatings in steel or iron Nonconductive coatings on non-ferromagnetic substrates

Magnetic induction test method according to DIN EN ISO 2178, ASTM B499 or BS 5411/3 Eddy current test method according to DIN EN ISO 2360, ASTM B244 or BS 5411/3

Table 3.1 Measurement application capability and test method


3.2 Front and rear view The marked or displayed instrument model is the only difference between the front view of the instrument models DELTASCOPE® MP30E, ISOSCOPE® MP30E and DUALSCOPE® MP40E. The rear view of these instruments is identical.

Figure 3.1: Front view of the DUALSCOPE® MP40E

Figure 3.2: Rear view


3.2 Keypad functions The white and grey rectangles of the keypad are the actual membrane keys. Pressing and releasing a key produces a slight click. Pressing the text above the key instead of the key membrane will not actuate the key function. The overview on the following pages contains a brief description of the individual keypad functions: Key Function DEL Delete the last measurement;

pressing DEL repeatedly: delete the measurements of the current block one after the other; during normalization: 1x DEL -delete the last measurement, 2x DEL -delete the measurement series taken on substrate material; during calibration: 1x DEL -delete the last measurement, 2x DEL -delete the measurement series taken on the current calibration standard, pressing DEL repeatedly -delete the measurement series taken on the previous calibration standards

FINAL-RES Call-up final result; pressing FINAL-RES repeatedly: display in sequence the parameters of the final result (mean value, standard deviation, ...); followed by ENTER: end the display of the final result (return to measurement) without deleting the stored values (the current measurement block will be closed); followed by DEL: delete the stored values of the current application and end the display of the final result (return to measurement); during normalization and calibration: enabling and disabling the ”continuous” display mode (display the normalized probe output signal of the measurement, measurements will not be stored and not be used for calibration or normalization purposes), or with enabled external start: initiate a measurement

BLOCK-RES Call-up block result; pressing BLOCK-RES repeatedly: display in sequence the parameters of the block result (mean value, standard deviation, ...);


followed by : end the display of the block result (return to measurement) without closing the current measurement block (current measurement series can be continued); followed by : display the block result of the previous measurement block (pressing repeatedly will display all block results of the current application); followed by PRINT: print the displayed block result; followed by MENU: display the single readings of the evaluated measurement block (pressing s repeatedly will display all single readings), pressing MENU again will terminate displaying the single readings; followed by DEL: delete the measurements of the last open measurement block and end the display of the block result (return to measurement); followed by ENTER: end the display of the block result (return to measurement) and close the current measurement block

ON/OFF Switch the instrument on and off; ON/OFF + : switch the instrument on and enable the acoustic measurement accept signal (with the instrument switched off before); ON/OFF + switch the instrument on and disable the acoustic measurement accept signal (with the instrument swit-ched off before); ON/OFF + DEL: switch the instrument on and enable the restricted operating mode (with the instrument switched off before); ON/OFF + ENTER: switch the instrument on and disable the restricted operating mode (with the instrument switched off before); ON/OFF + PRINT: switch the instrument on and print the instrument status record (with the instrument switched off before); ON/OFF + ZERO: switch the instrument on and set time and date (with the instrument switched off before)

ZERO Call-up the normalization CAL Call-up the corrective calibration; followed by CAL:

cancel the corrective calibration; CAL + DEL: delete the corrective calibration of the current application;


CAL + ZERO: call-up the calibration on coating (only possible with magnetic induction probes or the magnetic induction channel of dual probes!); CAL + APPL No: call-up the master calibration

Change the displayed numerical values or parameters during application selection, calibration, or parameter entry (if is pressed for more than 3 seconds, the display will change faster); with enabled external start: initiate a measurement

Enabling and disabling the ”continuous” display mode; Change the displayed numerical values or parameters during application selection, calibration, or parameter entry (if is pressed for more than 3 seconds, the display will change faster)

APPL No Selecting the desired application; followed by DEL: delete the selected application; followed by PRINT: print the list of all previously created applications

MENU Display and change the application specific settings (by pressing ENTER repeatedly, specification limits, display resolution, block size and number of single readings (which have to be taken before the actual measurement is computed as mean value of these single readings), as well as outlier rejection can be displayed in sequence and changed by pressing or ); followed by MENU: stop the display of the application specific settings and return to measurement; MENU + DEL + MENU: disable specification limits monitoring and return to measurement; MENU + ( or ) + MENU: enable specification limits monitoring and return to measurement; MENU + PRINT: print or display the instrument status record

PRINT Print the values stored in the current application (with block results) or transfer them to the connected computer

ENTER Confirm the input; 10x ENTER: call-up the configuration programs


3.3 Display The display consists of multiple segments and symbols. At power-up with ON/OFF, briefly all segments and symbols will appear simultaneously. Additional explanations: chapter ”4.1 Switching the instrument ON” on page 5)

Figure 3.3: Display (Example) Display element Explanation

g Fischer trademark

z Indicates that a normalization is performed (on uncoated measuring object (= substrate material))

NF/Fe Indicates that measurements using the magnetic induction test method are performed

NC/NF Indicates that measurements using the Eddy current test method are performed

j Indicates that a calibration is performed

b Bell: indicates that specification limits monitoring is enabled

e Padlock: indicates that the restricted operating mode has been enabled, i.e. the keys ZERO, CAL and MENU are not active, it is not possible to call-up the configuration programs or to delete applications

p Arrow-circle: indicates that the ”continuous” display mode has been enabled resulting in continuous display of the measuring with placed probe

Arrow upwards: indicates that the upper specification limit has been violated

Arrow downwards: indicates that the lower specification limit has been violated


Both arrows together: indicates that the displayed measurement value has been recognized as outlier

-8.8.8.8 Number elements to display the measurement values, error messages and warnings

Unit of measurement of the display value

s Battery (flashing): indicates that the battery has to be changed or recharged, because of low battery voltage

c Hour glass: indicates that the instrument is busy

v Chain: indicates that all applications, created with the very same probe, are linked, i.e. the same normalization or corrective calibration is used for the measurements performed in those applications

t Wrench: indicates that the configuration programs have been called-up (the parameters of the individual configuration programs can be changed now)

m Sheets: indicates that the matrix measuring mode is enabled

k Key: indicates that the measurement block is closed

Prompt lines containing notes to guide the use []: instrument model []: instrument software version 20 40–––– : analog display with limits <= / = >: Lower / upper analog display limit has been violated

3.4 Probes All probes, which can be connected to the DELTASCOPE® MP30E, ISOSCOPE® MP30E or DUALSCOPE® MP40E, are equipped with a memory chip in the probe connector. The description E... (e.g.: for ED10) indicates the use of the memory chip (E stands EEPROM). The EEPROM stores all probe-specific information (e. g. probe type, manufacturing code, test method and the coefficients of the master calibration).


When switching the instrument ON, the instrument reads and processes the information of the connected probe automatically; the instrument ”recognizes” the probe.

Figure 3.4: Probe Connector of ED10 Probe Correct coating thickness measurements can be performed only if a suitable probe is used for the measurement application (see table 3.2). Explanantion Probe is suitable for measurement

Probe DELTASCOPE MP30E

ISOSCOPE MP30E

DUALSCOPE MP40E

Magnetic induction

-

Eddy current Probes

-

Dual probes - -

Table 3.2: Probes suited for measurement The magnetic induction and Eddy current test method are combined in dual probes. Nonferromagnetic or nonconductive coatings on iron or steel as well as nonconductive coatings on nonferromagnetic substrates can be measured with dual probes. The correct test method is selected automatically when placing the probe on the measuring object. Dual probes are suited only for coating thickness measurement with the DUALSCOPE® MP40. Several different probe types are available for measurements on objects having complex shapes and different surface structures. Special probe types with different measuring ranges are available for the following applications:


• extremely rough surfaces • extremely soft or hard surfaces • wet or acid-covered surfaces • extremely thick or thin coatings • hot surfaces • coatings inside of pipes

For information on the available probes, or advise regarding probes best suited to your applications, please refer to the brochure ”Probes and Measurement Fixtures - Application Specific Probes - The key to successful coating measurement”. This brochure is available from Fischer or your nearest Fischer sales representative.


3.5 Calibration standards For calibration purposes, the calibration standards (in form of foils or shims having various thicknesses) are placed on the uncoated measuring object to simulate the coating to be measured. Every probe type has a probe-specific set of calibration standards for the master calibration (master foils) and a set of probe-specific calibration standards for the corrective calibration (corrective foils), which have been prepared specifically for this probe type. The probe-specific calibration standards and additional calibration standards are available on request from your local supplier or Helmut Fischer GmbH The thickness of the calibration standards (calibration foils) is measured by Fischer with a mechanical indicator gauge. The mechanical indicator gauge was verified with gauge blocks, which were certified according to international standards. The indicated tolerance refers only to the area within the circle.

Figure 3.5: Calibration Foil (Example)

Figure 3.6: Master Foil (Example)

Only CuBe foils should be used at thicknesses below 30 µm (1.2 mils) for the calibration of magnetic induction probes or the magnetic induction channel of dual probes. CuBe foils are not subject to the fairly high indentation error of plastic foils. CuBe foils can be used only with the magnetic induction test method, because Copper Beryllium is a conductive material. For this reason, CuBe foils are to be used only to calibrate magnetic induction probes or the magnetic induction channel of dual probes.


When measuring the thickness of foils having the same thickness, but of different materials (e.g. a 12 µm CuBe foil and a 12 µm plastic foil), on a rough surface, the thicknesses measured on the two foils may differ greatly. This difference is caused by the greater hardness of the CuBe foil. (The hard CuBe foil lies on the peaks of the rough surface, whereas the smooth plastic foils are pressed into the rough surface by the pressure of the probe tip.) For this reason, the same foil material should be used for test measurements, which was used for calibration!


4 Switching the Instrument ON and OFF

4.1 Switching the instrument ON Keys Detail of Display Explanation ON/OFF

Press the ON / OFF key to switch the instrument on. An acoustic signal will sound. The instruments performs an automatic power-up self test. All display elements appear briefly (see ”3.3 Display” on page 14). Following that, the sand clock appears briefly. Following the power-up self test, the application used last with the connected probe will be called. The instrument is ready to measure. The last measurement of the last open block will be displayed. test method of the currently connected probe [ mm ] or [ mils ] or [ mm ]: unit of measurement of the displayed value [Appl:]: number of the current application [Thickn.]: coating thickness measurement (see “Display Modes”) [Blck:]: number of the current block [n=]: number of single readings stored in the current block


Switching the Instrument ON: To avoid erroneous measurements, keep the probe tip(s) at least 50 mm (2") away from any metal object when switching the instrument ON! The minimum distance is probe-specific. Guideline: Five times the upper limit of the measurement range; i.e. for a probe with a measurement range of 0 to 5 mm (0 to 200 mils) a minimum distance of 1" is necessary. After switching the instrument ON, the following displays can appear as an alternative to the display shown above: Detail of display Explanation (display after switching the

instrument ON)

After switching the instrument ON, no measurement will appear, since the last non-closed block contains no measurements. If [Storage mode do not store] or [Storage mode delete at off] was selected in the configuration program FINAL-RES, no measurement will be displayed after switching the instrument on (because the measurements have not been saved or have been deleted when the instrument was switched off). (Selecting the storage mode: see “12.6.1 Configuration Program FINAL-RES” on page 137)

A name (in this case: [Sheet 990721/22] ) has been assigned to the current application. (see ”5.8 Assigning Application Names” on page 35) The name appears in the prompt lines of the display, if an application name has been assigned. If necessary, the name appears alternating with the application number.

Specification limits monitoring has been enabled in the current application. (see ”5.9.1 Specification Limits Monitoring” on page 37; see ”7.7 Measurement with Specification Limits Monitoring Enabled” on page 66)

Automatic block formation has been enabled in the current application (see ”5.9.3 Automatic Block Formation and Block Size” on page 40;


see ”7.8 Measurement with Fixed Block Size” on page 68). [n=]: number of single readings stored in the current block; the fixed block size appears after the slash

”Mean reading” mode has been enabled in the current application (see ”5.7.4 ”Mean Reading" Mode"; see ”7.2.7 Measurement with ”Mean Reading" Mode Enabled"). [i=]: number of single readings taken with ”mean reading” Mode enabled; the number of single readings to be averaged appears after the slash

”Continuous” display mode has been enabled in the current application (see ”7.5 Measurement with ”Continuous" Display Mode Enabled").

”Continuous” display mode and analog display mode have been enabled in the current application (see ”7.5 Measurement with ”Continuous" Display Mode"; Enabling Analog Display Mode: see ”12.4.7 Configuration Program APPLNo”). [10 50]: Analog Display Limits

Matrix Measuring Mode is enabled (see”7.6.2 Measurement with Matrix Measuring Mode Enabled”; Enabling Matrix Measurement Mode: see ”12.4.7 Configuration Program APPL No”)

Matrix Measuring Mode is enabled (see ”7.6.2 Measurement with Matrix Measuring Mode Enabled”; Enabling Matrix Measurement Mode: see ”12.4.7 Configuration Program APPLiNo”). Additionally, a name (in this case: [Sheet 990721] and [Rear side]) has been assigned to the current application and the current block.(see ”5.6 Assigning Application Names”; see ”6.3.2 Assigning Block Names”) The name appears in the prompt lines of the display, if an application or block name has been assigned. If necessary, the name appears alternating with the application- or block number.

This errors message appears briefly when switching


the instrument on in the following cases: no probe is connected to the instrument; the probe is not connected correctly; the connected probe is defective. Measurements are not possible without a probe connected. (Connecting a probe: see ”11.3 Connecting or Replacing a Probe”)

The current application has not yet been created. An application has to be created with the connected probe to be able to perform coating thickness measurements (see ”5.2 Creating an Application”).

4.2 Test method of the connected probe After switching the instrument ON, the test method of the currently connected probe will be displayed. Additionally, the dual method set for the current application will be displayed for dual probes. Explanations regarding the dual method: see ”5.7.7 Dual Method”; selecting the dual method: see ”12.4.7 Configuration Program APPL No”. Display Explanation [■NF/Fe] Magnetic induction probe connected [□NC/NF] Eddy current probe connected [NF/Fe NC/NF] Dual probe connected and dual method [both]

selected (i. e. both test methods can be used to measure in the current application)

[■NF/Fe NC/NF] Dual probe connected and dual method [NF/Fe] selected (i.e. only the magnetic induction test method can be used to measure in the current application)

[NF/Fe □NC/NF] Dual probe connected and dual method [NC/NF] selected (i. e. only the Eddy current test method can be used to measure in the current application)

If [■NF/Fe], [□NC/NF] or [NF/Fe NC/NF] flashes, no application has been created with the connected probe. Measurements are not possible with


flashing display. An application has to be created with the connected probe so that coating thickness measurements can be performed.(Creating an application: see ”5.2 Creating an Application”).

4.3 Switching the instrument OFF The instrument will switch itself off automatically if no measurement is taken and no key is pressed for approximately three minutes. However, if the auto switch-off mode has been disabled in the configuration programs, the instrument will not switch itself off automatically. Disable the auto switch-off mode: see ”12.4.1 Configuration Program FINAL-RES” To switch the instrument off manually simply press the ON/OFF key. The display will go blank.


5 Applications You can create up to 100 different applications. Up to 10,000 measurements can be stored in these applications. The measurements can be combined into up to 1,000 blocks. An application contains: - single readings, - application specific settings and - coefficients determined during normalization and corrective calibration (used for fitting the master calibration curve stored in the memory chip of the probe connector to the current measurement application)

5.1 Selecting the desired application A probe has to be connected and an application has to be selected which was created with the connected probe so that measurements can be performed. If [■NF/Fe], [□NC/NF] or [NF/Fe NC/NF] flashes after switching the instrument on or after selecting an application, no application has been created with the connected probe. Measurements are not possible with flashing display. If no application has been created with the connected probe, these are the choices: • Create a new application with the connected probe (see ”5.2 Creating an

Application”)

• Overwrite an existing application with the connected probe (see ”5.3 Overwriting an Existing Application”)

• Connect a probe, an application has been created with already (see ”11.3 Connecting or Replacing a Probe”)


Selecting an Application (with the instrument switched on): Keys Detail of Display Explanation

APPL No

Press APPL No to start the application selection. [Appl:]: number of the current application [n=]: number of the measurements stored in the current application [Select: ENTER]: press ENTER to select the current application [EGAB1.3]: type of the probe, which was used to create the current application [missing]: current application was created with another probe type [wrong]: current application was created with a probe of the same type but with a different serial number

or:

Select the desired application using the arrow keys. [Select: ENTER]: press ENTER to select the current application [Not opened]: application has not yet been created (see ”5.2 Creating an Application”) [Open: ENTER]: press ENTER to create the application

ENTER

Confirm the selected application with ENTER. The selected application will be called. The last measurement of the last open block will be displayed. The instrument is ready to measure. (Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”)


If [missing] or [wrong] is displayed in the prompt lines during selection of an application, the selected application has not been created with the connected probe. These are the choices: • Select an application which has been created with the connected probe • Overwrite the selected application with the connected probe (see ”5.3

Overwriting an Existing Application”) • Create a new application with the connected probe (see ”5.2 Creating an

Application”)

5.2 Creating an application An application has to be created and a probe has to be connected so that measurements can be stored in this application. When creating an application with the linking mode enabled (indicated by v in the display), the instrument checks automatically, if one or more applications have been created with the connected probe.If at least one application has been created with the connected probe, no normalization is necessary when creating an application. The normalization and corrective calibration of the application(s) previously created with this probe is used in this case. With the restricted operating mode enabled (indicated by e in the display), only applications already created can be selected, i. e. new applications cannot be created (see ”12.3 Restricted Operating Mode”). Creating an application (with the instrument switched on): Keys / Actions

Detail of Display Explanation

APPL No

Press APPL No to start the application selection. [Appl:]: number of the current application [n=]: number of the measurements stored in the current application [Select: ENTER]: press ENTER to select the current application [EGAB1.3]: type of the probe, which was used to create the current application


[missing]: current application was created with another probe type [wrong]: current application was created with a probe of the same type but with a different serial number

Select an application, which has not been created yet (indicated by [Not opened]) using the arrow keys. [Not opened]: application has not been created yet [Open: ENTER]: press ENTER to create the application

ENTER

Start creating of an application by pressing ENTER. The sign appears and remains in the display as long as the normalization is performed. [Base]: measurements have to be performed on the uncoated measuring object (substrate material) [Cancel: ENTER]: press ENTER to cancel the normalization

Perform the normalization. (Explanations about normalization: see ”9 Normalization”).

ENTER Confirm and end the normalization with ENTER. The application will be created and called automatically. The instrument is ready to measure. (Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”)


5.3 Creating an application with a dual probe Creating an application with a dual probe will prepare the application only for one test method. To prepare the instrument for measurements with the other test method, the application has to be normalized for the other test method as well.

5.4 Overwriting an application An existing application can be overwritten by connecting a different probe and performing a normalization with this probe, if it is no longer needed. When overwriting an application with the linking mode enabled (indicated by special sign in the display), the normalizations of all applications linked to the current application will also be overwritten automatically. With the restricted operating mode enabled (indicated by e in the display), the key ZERO is not active, i. e. applications cannot be overwritten. (see ”12.3 Restricted Operating Mode”) Overwriting an application (with the instrument switched on): Keys / Actions


APPL No

Press APPL No to start the application selection. [Appl:]: number of the current application [n=]: number of the measurements stored in the current application [Select: ENTER]: press ENTER to select the current application [EGAB1.3]: type of the probe, which was used to create the current application [missing]: current application was created with another probe type [wrong]: current application was created with a probe of the same type but with a different serial number


Select the application to be overwritten using the arrow keys.

ENTER

Confirm the selection with ENTER.

ZERO

or:

(if the connected probe is not identical with the probe, the application was created with)

Start a normalization by pressing ZERO to overwrite the current application. The sp sign appears and remains in the display as long as the normalization is performed. [Base]: measurements have to be performed on the uncoated measuring object (substrate material) [Cancel: ENTER]: press ENTER to cancel the normalization [ New probe ?]: the connected probe is not identical with the probe, the application was created with (test method in the uppermost line in the display is flashing) [Yes: DEL No: ENTER]: press DEL to perform a normalization with the connected probe (stored normalization will be overwritten); press ENTER to cancel the normalization (stored normalization will remain unchanged) [EGAB1.3]: type of the connected probe

DEL

or:

Confirm overwriting of the existing application with DEL (necessary only if [New probe ? Yes: DEL No: ENTER] appeared in the display before). [Delete measure ? Yes: DEL No: ENTER]: press DEL to delete the measurements, press ENTER to keep


(if appeared in the display before and measurements are stored in the application to be overwritten)

the measurements (with the DUALSCOPE® MP40E keeping of the measurements is possible only if the test method of the connected probe is the same as the test method of the probe the application was created with)

DEL Confirm the deleting of the measurements with DEL (necessary only if [Delete measure? Yes: DEL No:ENTER] appeared in the display before). [Base]: measurements have to be performed on the uncoated measuring object (substrate material) [Cancel: ENTER]: press ENTER to cancel the normalization

Perform the normalization (see ”9 Normalization”).

ENTER Confirm and end the normalization with ENTER. The existing application will be overwritten. The instrument is ready to measure. Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”)


5.5 Overwriting an application with a dual probe

Overwriting an application with a dual probe will prepare the application only for one test method. To prepare the instrument for measurements with the other test method, the application has to be normalized for the other test method as well.

5.6 Deleting an application With the restricted operating mode enabled (indicated by special sign in the display), the key DEL is not active, i. e. applications cannot be deleted! (see ”12.3 Restricted Operating Mode”) How to delete an application (with the instrument switched on): Keys Detail of the

Display Explanation

APPL No

Press APPL No to start the application selection. [Appl:]: number of the current application [n=]: number of measurements stored in the current application [Select: ENTER]: press ENTER to select the current application [EGAB1.3]: type of the probe, which was used to create the current application [missing]: current application was created with another probe type [wrong]: current application was created with a probe of the same type but with a different serial number

Select the application to be deleted using the arrow keys.


DEL

Delete the selected application with DEL. [Delete appl. ? Yes: DEL No: ENTER]: press DEL to delete the application, keep the application with ENTER

DEL

Confirm the deletion with DEL. The selected application will be deleted. Another application can be selected now or a new application can created.

5.7 List of existing applications Keys Explanation

APPL No Press APPL No to start the application selection (with the instrument switched on and a probe connected).

PRINT Print the list of existing applications by pressing PRINT. With a printer connected and switched on, the list of existing applications will be printed (see figure 5.1). Another application can be selected now or a new application can created.

ENTER Confirm the selected application with ENTER. The selected application will be called. The last measurement of the last open block will be displayed. If no measurements are stored in this block, no measurement will be displayed.


Printing a list of existing applications:

Figure 5.1: List of Existing Applications (Example) Explanations for Figure 5.1: FISCHER DUALSCOPE®

MP40

Manufacturer and instrument model

28.08.99 Current date

1, 2, 3, 4 (1. column)

Application number

Sheet 990721... (2. column)

Application name (is displayed only if a name has been assigned (see ”5.6 Assigning Application Names”))

ETA3.3, ED10, ... (2. column)

short name of the probe this application was created with

NC/NF, Dual, ... (3. column)

test method of the probe this application was created with

23.08.99, ... (4. column)

creation date of the last closed block of this application (if no date appears the application contains no closed block!)

n= (5. column) number of measurements stored in this application


5.8 Assigning application names A customer-specific name can be assigned to each application. The name can consist of up to 16 ASCII characters. These are the choices for assigning application names: • Using the optional MPNAME software (the software is available from

Fischer or your nearest Fischer sales representative) • Sending the command ”SAN” via the RS232 interface (see ”11.3 RS232

Interface Commands”) Additionally, when measuring with matrix measuring mode enabled, a name can be assigned to each block (see ”6.3.2 Assigning Block Names”). The name appears in the prompt lines of the display, if an application name has been assigned. If necessary, the name appears alternating with the application number. On print-outs the application or block names are displayed instead of application or block number.


5.9 Application-specific settings The following settings are valid only for the current application, i. e. they are application-specific:

• settings made with the MENU key • display mode (see ”5.7.6 Display Modes”) • dual method (see ”5.7.7 Dual Method”, or ”12.4.7 Configuration Program

APPL No”) After pressing the key MENU the following application-specific settings can be changed:

• specification limits monitoring • display resolution • automatic block formation and block size • number of single readings, which have to be taken before the actual

measurement is computed as mean value of these single readings • outlier rejection

The procedure after pressing the key MENU may be terminated at any time by pressing MENU again. During the procedure after pressing the key MENU the record of the instrument status can be printed or displayed at any time by pressing the key PRINT (see ”12.5 Record of the Instrument Status”). With the restricted operating mode enabled (indicated by e in the display), the key MENU is not active, i. e. the application-specific settings cannot be changed! (see ”12.3 Restricted Operating Mode”)


5.9.1 Specification limits monitoring With specification limits monitoring enabled, it is possible to check quickly and easily whether the measurements are within a preset specification range. (see ”7.2.5 Measurement with Specification Limits Monitoring Enabled”)

Enabling or disabling specification limits monitoring:

Keys / Actions

Detail of the Display

Explanation

MENU

Press MENU to start the setting procedure. If specification limits monitoring is enabled, the lower specification limit set for this application appears as shown in the next step. [No spec. limits]: specification limits monitoring is disabled [Selection: {}]: press either arrow key to enable specification limits monitoring

Enable specification limits monitoring by pressing either arrow key (necessary only if specification limits monitoring has not been enabled yet). [Lower sp. limit]: lower specification limit is displayed [OK: ENTER]: press ENTER to confirm the setting of the lower specification limit [no limits: DEL]: press DEL to disable specification limits monitoring

Perform a measurement or

Perform a measurement on a coating having a thickness similar to the specification limit to be set. Use the arrow keys to set the measured thickness to the limit to be entered. Alternatively, the specification limit


can be set using only the arrow keys, i. e. without measurement.

ENTER

Confirm the setting of the lower specification limit with ENTER. Proceed for setting the upper specification limit in the same manner as for the lower specification limit.

MENU

Confirm the setting of the upper specification limit with MENU. Specification limits monitoring is enabled. The instrument is ready to measure. As long as specification limits monitoring is enabled, b appears in the display. Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”.

If the upper and the lower specification limit have been entered in reverse, the instrument will automatically use the smaller value as lower specification limit and the larger value as upper specification limit.


5.9.2 Display resolution The display resolution determines the resolution the measurements will be displayed with. The measurement value 73.29, for example, will be displayed as 73 if low resolution is selected, as 73.3 if medium resolution is selected and as 73.29 if high resolution is selected.

Table 5.1: Display of the measurements for the various display resolutions Selecting the display resolution: Keys Detail of Display Explanation

MENU Press MENU to start the setting procedure. If desired use the arrow keys to enable specification limits monitoring or set the limits (see ”5.7.1 Specification Limits Monitoring”).

ENTER

Press ENTER repeatedly until [Disp. resolution] appears in the display. [Disp. resolution]: use the arrow keys to select the display resolution [medium] / [low] / [high]: resolution: medium / low / high

Select the desired resolution using the arrow keys.


MENU

Confirm the selected display resolution with MENU. The last measurement will be dis-played in the selected resolution. The instrument is ready to measure. Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”.

5.9.3 Automatic block formation and block size Automatic block formation has to be enabled so that a fixed number of measurements is combined automatically into a block after measurement. The block size, i. e. the number of measurements to be combined into a block, has to be selected after enabling the automatic block formation. The block size must be between 2 and 99. (see ”7.2.6 Measurement with Fixed Block Size”) Automatic block formation cannot be enabled with matrix measuring mode enabled. Enabling automatic block formation and setting the block size: Keys Detail of Display Explanation

MENU Press MENU to start the setting procedure. If desired use the arrow keys to enable specification limits monitoring or set the specification limits (see ”5.7.1 Specification Limits Monitoring”).

ENTER, ...

Press ENTER repeatedly until [Block size] appears. If desired, the display resolution can also be changed during this procedure (as described above). [Block size free]: automatic block formation disabled [Selection: {}]: use the arrow keys to enable automatic block formation


Use an arrow key to enable automatic block formation. If no measurements are stored in the current application, the block size appears as shown in the next step. [Delete measure ? Yes: DEL No: ENTER]: the measurements stored in the current application have to be deleted with DEL so that the block size can be set

DEL

Press DEL to delete the measurements stored in the current application (necessary only if [Delete measure ? Yes: DEL No: ENTER] was displayed before). [Meas. per block]: block size is displayed [Delete: DEL]: press DEL to disable automatic block formation

Set the desired block size using the arrow keys.

MENU

Confirm the block size setting with MENU. [n= 0/]: number of measurements stored in the current block equals 0 (measurements were deleted!); the fixed block size appears after the slash Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”.


Changing the block size (with automatic block formation enabled):

Keys Detail of Display Explanation

MENU Press MENU to start the setting procedure. If desired, use the arrow keys to enable specification limits monitoring or set the specification limits (see ”5.7.1 Specification Limits Monitoring”).

ENTER, ...

Press ENTER repeatedly until [Meas. per block] appears. If desired, the display resolution can also be changed during this procedure (as described above). [Meas. per block]: block size is displayed [Delete: DEL]: press DEL to disable automatic block formation

Set the desired block size using the arrow keys.

MENU

Confirm the block size setting with MENU. If no measurements are stored in the current application, the block size is accepted and the instrument is ready to measure (see next step but one). [Delete measure ? Yes: DEL No: ENTER]: the measurements stored in the current application have to be deleted first with DEL so that the block size can be set; if ENTER is pressed to keep the measurements, the block size is reset to the previous value


DEL

Press DEL to delete the measurements stored in the current application (necessary only if [Delete measure ? Yes: DEL No: ENTER] was displayed before).

MENU

Confirm the block size with MENU. The instrument is ready to measure. [n= 0/]: number of measurements stored in the current block equals 0 (measurements were deleted!); the fixed block size appears after the slash Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”


Disabling automatic block formation: Keys Detail of Display Explanation


ENTER, ... Press ENTER repeatedly until [Meas. per block] appears. If desired, the display resolution can also be changed during this procedure (as described above). [Meas. per block]: block size is displayed [Delete: DEL]: press DEL to disable automatic block formation

DEL Disable automatic block formation by pressing DEL. [Block size free]: automatic block formation disabled [Selection: {}]: use the arrow keys to enable automatic block formation

MENU Confirm with MENU. The instrument is ready to measure. Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”.


5.9.4 “Mean reading” mode With ”mean reading” mode enabled, the mean value of multiple single measurements is stored instead of the single measurement. The number of single measurements, which have to be taken before the actual ”mean” measurement is computed, has to be between 2 and 20. (see ”7.2.7 Measurement with ”Mean Reading" Mode Enabled") Selecting the Number of Single Measurements to be averaged: Keys Detail of Display Explanation


ENTER, ...

Press ENTER repeatedly until [i single read.] appears. If desired, the display resolution or the block size can also be changed during this procedure. (see ”5.7.2 Display Resolution”; see ”5.7.3 Automatic Block Formation and Block Size”). [i single read.]: number of single measurements, which have to be taken before the actual measurement is computed as mean value of these single measurements [OK:ENTER i=1:DEL]: press ENTER to confirm the number; press DEL to reset the number to 1

Set the desired number using the arrow keys.

MENU

Confirm the number with MENU. The instrument is ready to measure. [i=]: number of single measurements taken with ”mean reading” mode enabled; the number of single


measurements to be averaged appears after the slash Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”.

5.9.5 Outlier rejection With outlier rejection enabled measurements recognized as outliers will be indicated in the display and an acoustic signal will sound. (see ”7.2.8 Measurement with Outlier Rejection Enabled”) There is a choice of the following criteria for outlier rejection:

• Grubbs test • entry of a known standard deviation (Sigma)

Enabling the outlier rejection and setting the criteria: Keys Detail of Display Explanation


ENTER, ...

or

Press ENTER repeatedly until [Outlier Reject.] appears. If desired, the display resolution or the block size or the number of measurements to be averaged for ”mean reading” mode can also be changed during this procedure. [Outlier Reject.]: use the arrow keys to enable or disable outlier rejection [Off]: outlier rejection disabled [On]: outlier rejection enabled


Enable outlier rejection by pressing an arrow key (if outlier rejection was disabled and is to be enabled) or disable it (if the outlier rejection was enabled and is to be disabled).

ENTER

or

Confirm the setting with ENTER. [Method: {}]: use the arrow keys to select the outlier rejection criteria (this option will be displayed only with outlier rejection enabled; with outlier rejection disabled, the procedure will be terminated automatically and the instrument is ready to measure again (see below)) [Automatic]: automatic outlier rejection using to the Grubbs test [Sigma]: Sigma outlier rejection

Select the desired criteria using the arrow keys.

ENTER

Confirm the selection with ENTER. [Sigma - Entry: {}]: Set the desired standard deviation (Sigma) using the arrow keys (appears only if the Sigma outlier rejection has been selected; if automatic outlier rejection has been selected, the procedure will be terminated automatically and the instrument is ready to measure again (see below))

Use the arrow keys to adjust the desired standard deviation (Sigma).


ENTER

Confirm the selected standard deviation with ENTER. The procedure will be terminated automatically and the instrument is ready to measure again. Further explanations concerning the display: see ”3.1.4 Display”; see ”4.1 Switching the Instrument ON”.

5.9.6 Display modes The following display modes can be selected according to table 5.2 (Following measurement programs can be selected in the configuration program ZERO):

• Display coating thickness • Display Xn and Xs • Display th and Xs • Display Count rate • Display normalized Count rate

The display mode can be set separately for each application. The setting of the display mode of the other applications remains unchanged. Display Mode Detail of Display Explanation

Coating thickn.

Display of the coating thickness measurement value th

Xn and Xs

Display of the measured normalized probe output signal Xn [Xs= ]: saturation count rate Xs

th and Xs

Display of the coating thickness measurement value th [Xs= ]: saturation count rate Xs


Count rate

Display of the first four figures of the measured probe output signal X [X= ]: count rate X (all figures)

norm. Count rate

Display of the measured normalized probe output signal Xn

Table 5.2: Display Modes (Overview) (with Exemplary Display)


5.9.7 Dual method The following dual methods can be selected when measuring with a dual probe (Selecting the dual method: see ”12.4.7 Configuration Program APPL No”): ► [both] ► [NC/NF] ► [NF/Fe] After switching ON the instrument with dual probes, the display shows the selected dual method. (see 4.1.1"Test Method of the Connected Probe") The dual method can be selected in each application separately. The setting of the dual method in other applications remains uninfluenced here of.

Test method

Dual Method Magnetic induction Eddy current

[both] ● ●

[NC/NF] ●

[NF/Fe] ●

Table 5.0: Test methods with the different dual methods When the dual method [both] has been selected, both measuring methods can be used for measuring. The suitable test method is selected automatically when placing the probe on the measuring object. When the dual method [NC/NF] or [NF/Fe] have been selected, you can only use one test method (see table ). Selecting the suitable dual method is, for instance, the way to ensure that only the thickness of the coating of interest is determined when measuring on a multi-coating system. For example, the thickness of the non-ferromagnetic (NF) coating has to exceed a minimum thickness (for zinc approx. 2.4 mils) and the dual method [NC/NF] has to be selected to determine only the thickness of the non-conductive (NC) coating of figure. If [Fe] is selected, the ferromagnetic substrate will be used to determine the thickness of the NC and the NF metal coating.


Non-conducting coating

_______________________________________ non-ferromagnetic (NF) coating

_______________________________________ ferromagnetic substrate

Table 5.0: Multi-coating system (example) If [dual] is selected, depending on the thickness and electrical conductivity of the NF coating either only the thickness of the NC coating (for relatively thick NF layers) or the thickness of the NC coating and the NF metal coating (for relatively thin NF layers) will be determined.

5.10 Linking the applications

With linking mode enabled all applications created with the very same probe (having the same serial number) are linked with respect to normalization and calibration. The same normalization and corrective calibration is used for the computation of the measurement values in linked applications. As an example, if separate applications were created to measure different batches of the same part, it would make sense to link these applications. By linking all applications share the same corrective calibration and normalization. A normalization or calibration performed in any of the linked applications will be effective for all of the linked applications. (The normalization or calibration stored in these applications will be overwritten.) To ensure that the linked applications use the same normalization and calibration, perform a normalization and calibration in any of these linked applications. Applications created with different probes of the same probe type (having the same probe type but different serial numbers) cannot be linked! Performing a normalization or calibration with a dual probe will normalize or calibrate only one channel of the application at first.The normalization or calibration of this channel will be effective for all applications linked to the current application and used for the computation of the measurement values in this channel.The normalization or calibration of the other channel of the linked applications remain unchanged. Only if the other channel is also


normalized or calibrated, all applications will share the same normalization and calibration in both channels.

Figure 5.2: Linking of applications (Example) Explanations for Figure 5.2:


Immediately after enabling the linking mode: The normalizations and calibrations of the linked applications are different from one another because no normalization or calibration was performed in any of the linked applications immediately after enabling the linking mode. Since the applications 1 and 3 were created with the same ETA3.3 probe (serial number 909), they are linked (v). Since the application 5 was created with the ETA3.3 probe having the serial number 707, it is not linked to these applications. Since the applications 4 and 6 were created with the same ED10 probe (serial number 505), they are also linked. Since no other application was created with the EGAB1.3 probe (serial number 101), application 2 is not linked to any other application. After the corrective calibration of the Magnetic Induction Channel of Application 6: Since the applications 4 and 6 are linked, the new corrective calibration (Norm M6n, Cal M6n, indicated by the grey box in figure 5.2) of the magnetic induction channel of application 6 will also be effective for the magnetic induction channel of application 4.The previous normalizations and calibrations (Norm M4/M6 and Cal M4/M6) are overwritten. Since no corrective calibration of the Eddy current channel of application 4 or 6 was performed, the normalizations and calibrations of the Eddy current channels of application 4 and 6 will still differ (Norm E4/E6 and Cal E4/E6).


Since no normalization or calibration was performed with the other probes, in spite of the enabled linking mode, the normalizations and calibrations of the other applications remain unchanged.

5.10.1 Enabling or disabling the linking mode Enabling or disabling the linking mode The linking mode can be enabled or disabled only in the configuration program APPL No (see ”12.4.7 Configuration Program APPL No”). As long as the linking mode is enabled, a special sign will be displayed. The linking mode can only be enabled for all application, if [Dualmethod both] has been selected in the configuration program APPL No for all applications created with a dual probe! After disabling the linking mode, the applications become independent again! Every application can be normalized or calibrated separately again.

5.10.2 Linking mode at dual probes Performing a normalization or calibration with a Dual Probe will normalize or calibrate only one channel of the application at first. The normalization and calibration of this channel will be effective for all applications linked to the current application and used for the computation of the measurement values in this channel.The normalization or calibration of the other channel of the linked applications remain unchanged. Only if the other channel is also normalized or calibrated, all applications will share the same normalization and calibration in both channels.


6 Standard and matrix measuring mode The following measuring modes are available: • Standard measuring mode (see 6.2"Standard Measuring Mode"). • Matrix measuring mode (indicated by m in the display (see 60"Matrix

Measuring Mode").

Explanations for measuring in the standard- and matrix measurement Mode can be looked up in chapter ”7.6 Measurement with Standard or Matrix Measuring Mode Enabled”.

6.1 Changing the measuring mode The measuring mode can be changed only in the configuration program APPLNo (see ”12.4.7 Configuration Program APPLNo”). The instrument will be re-initialized automatically when changing the measuring mode. When re-initializing the instrument, all applications as well as all measurements stored will be deleted; the parameters of the configurations programs will be reset to the default settings.After re-initialization, i.e. as well after changing the measuring mode, the required applications have to be created again and the parameters of the configuration programs have to be adjusted to the required settings again!

6.2 Standard measuring mode With the standard measuring mode enabled single measurements are taken consecutively on the same part, for example on a bolt, and are then combined by pressing BLOCK-RES into a block. The resulting block mean value then represents the local coating thickness of the reference area. This measuring mode is especially suitable for the coating thickness measurements of electroplated coatings. With the standard measuring mode enabled, measurements can only be stored in the last open block of an application. The applications can contain different numbers of blocks. Each block can store a different number of measurements. However, if automatic block formation has been enabled, only blocks with fixed block size can be formed. (Enable automatic block formation and selecting the block size: see ”5.7.3 Automatic Block Formation and Block


Size”, page 43 ff; measurement with fixed block size: see ”7.2.6 Measurement with Fixed Block Size”)

Figure 6.1: Applications with standard measuring mode enabled (example)

6.3 Matrix measuring mode The number of applications and the number of blocks has to be entered when changing the measuring mode to matrix measuring mode. The same number of blocks is created for every application. Every block can store the same maximum number of measurements. After entering the number of applications and blocks, the maximum number of measurements each application and block can hold is calculated and displayed automatically by the instrument. If, for example, [Matrix mode On (3/20/318)] appears during display of the instrument status, 3 applications with 20 blocks each can be created at most. Every block can store 318 measurements at most.


Each application contains 20 blocks. At most N=318 measurements can be stored per block in 3 applications with 20 blocks each! Figure 6.2: Applications with matrix measuring mode enabled (Example) This measuring mode is ideally suited for coating thickness measurement applications, where different measuring objects of the same type have to be measured sequentially always on the same specific reference areas, and where the measurement data from the corresponding areas are to be combined into blocks. This measuring mode for example is used in the automobile industry and steel construction.


When selecting the reference areas of the different objects to be measured, is has to be noted that the same normalization and calibration is used for computation of the coating thickness measurement values. Therefore reference areas have to be selected, which do not require different normalizations or calibrations. The number of applications or blocks cannot be changed again afterwards without re-initializating the instrument. The matrix measuring mode is indicated by m in the display. With matrix measuring mode enabled, automatic block formation cannot be enabled! Accordingly it is not possible to set a block size for the automatic block formation after pressing MENU to change the application-specific settings (see ”5.7 Application-Specific Settings”)

6.4 Changing blocks With measurements in the matrix measurement mode, changing blocks, that is selecting the block where the next measurement reading is to be stored, can be carried out manually or automatically. (To set the block change: (see 12.4.7 APPL No service function") Changing blocks must be carried out manually to freely select the block where the next reading is to be stored. The desired block must be selected prior to making a measurement. (see 7.6.2 Measurements in the matrix measurement mode") For example with manual block changing active, one measurement may be stored in block 7 and the next measurement in block 3. Changing blocks must be set to automatic for the next measurement to be stored automatically in the subsequent block. A free selection of blocks is not possible with automatic block changing!

6.5 Assigning block names With measurements in the matrix measurement mode, a customer-specific name that may consist of a maximum of 16 ASCII characters can be assigned to each application and to each block. (see 5.6 Assigning application names") Assigning block names can be carried out in the following ways: Use of the optional software MPNAME (this software is available from your authorized supplier or directly from Fischer) Sending the command ”SBN” via the RS232 interface (see 14.2 RS232 interface commands")


If names have been assigned to applications and blocks, these names will appear in the information line of the LCD display, alternating with the corresponding application number. On a printout, the application or block names will appear instead of the application or block number.


7 Measurement It is absolutely necessary to follow the instructions of the chapter ”2 Notes Concerning the Operation of the Instruments and Handling the Accessories”!

7.1 Preparations for measurement The instrument and the measuring area of the measuring object have to be prepared for measurement as follows:

1. Determination of the significant surface and the measurement area according to / 6/.

2. Making sure, that the measurement area is not damaged and clean (e.g. free of fluids, dirt or grease).

3. Perform the instrument start-up (see ”11.1 Instrument Start-Up”). 4. Connect the printer and switch the printer on if necessary (if printer

is available and printout of the measurements desired). 5. Switch the instrument on (see ”4.1 Switching the Instrument ON”) 6. Select an application that fits the current measuring object (see ”5

Applications”). 7. Definition of the instrument configuration (see ”12 Instrument

Configuration”) and of the application-specific settings (see ”5.7 Application-Specific Settings”).

8. Check the normalization and calibration by reference measurement on an object having known coating thickness. (see ”9.2 Reference Measurement”).

7.2 Making a measurement The probe has to be placed vertically on the surface of the measuring object to perform a measurement. Following the measurement accept, i. e. after the measurement appears in the display, the probe can be lifted again. The instrument is ready to measure again.


Placing the probe:

1. Place the probe 2. Lift the probe

Figure 7.1: Measurement with axial single tip probe

1. Placing the Probe: 2. Lifting the Probe:

Figure 7.1: Measurement with double tip probes

Figure 7.3: Display with Measurement (taken with the Eddy current channel of a dual probe) Measurements should only be done within the mesurement area. To avoid erroneous measurements, do not hover above the measuring object with the probe! Between two measurements there has to be a time difference of at least 2 seconds With automatic measurement accept enabled, the probe has to be lifted at least 50 mm (2 ”) from the measuring object between readings.The minimum lift height of the probe between two measurements depends on the type of probe. As a rough guideline we recommend the five-fold of the upper limit, e.g. a probe with a mesuring range 0...5 mm you must lift the probe at least 25 mm above the measuring object.


When measuring on cylindrical objects, the probe tips should be placed in line with the longitudinal axis of the cylindrical object! Both tips should be placed simultaneously and with equal pressure! We recommend to measure coatings of measuring objects with substrate materials having a magnetic preference direction by storing the mean value of two measurements instead of the single measurements. The probe has to be turned by 90° after the first measurement (see figure 7.4). Magnetic preference direction can result from mechanical pretreatment of the measuring object (for instance, rolling or drawing of sheet metal). (see ”7.2.7 Measurements with ”Mean Reading" Mode Enabled").


1. Placing the Probe: 4. Placing the Probe:

2. Lifting the Probe: 5.Lifting the Probe:

3. Turning the Probe: 6. Turning the Probe:

Figure 7.4: Measurement with double tip probes on measuring objects with magnetic preference direction


7.3 Measurement accept With automatic measurement accept enabled, the measurement will be accepted immediately after placing the probe on the measuring object. After measurement accept an acoustic signal will sound with every measurement taken (unless it is not disabled). Enabling and disabling the acoustic measurement signal: see 7.2.3"Acoustic Measurement Accept Signal") With ”continuous” display mode enabled (enabling the ”continuous” display mode: see ”7.5 Measurement with ”Continuous" Display Mode"), measurement accept can be initiated by:

• pressing the key ENTER • sending the command ”G0"; ”ES"; ”EN”; or ”ESC?” via the RS232

interface (see 14.2 "RS232 Interface ”),

7.4 Measurements with external start enabled If automatic measurement accept is not desired, e. g. for measurement inside pipes, bores or grooves, measurements should be performed with external start enabled and with automatic measurement accept disabled. The external start feature allows measurement accept by pressing the keys or by sending the command G0 (G Zero) via the RS232 interface. Enable external start and disable automatic measurement accept: see ”12.4.3 Configuration Program ZERO”) There are several ways to initiate measurement accept manually with external start enabled after placing the probe on the measuring area: • pressing the key

(do not use this method for normalization or calibration

• pressing the key FINAL-RES (use this method only for normalization or calibration)

• sending the command ”G0", ”ES", ”EN” or ”ESC” via the RS232 interface (see 14.2 "RS232 Interface”)


7.5 Acoustic signals after measurement accept An acoustic signal will sound with every measurement taken (unless it is not disabled) after measurement accept. The signal indicates that the measurement signal coming from the probe is captured and the probe may be lifted off from the measuring object again. In addition to the acoustic measurement accept signal, the acoustic signals listed in table 7.1 may sound. If applicable, the signals will sound in succession. If, for example, the last measurement of a block has violated the upper specification limit when measuring with fixed block size, the acoustic measurement accept signal will sound followed by two short signals to indicate the violation of the upper specification limit and at last one long signal to indicate the closing of the block. The Acoustic Measurement Accept Signal can be disabled: (see 7.2.3"Acoustic Measurement Accept Signal") The other acoustic signals can not be disabled! For further explanations concerning acoustic signals refer to chapter (see 7.5 Measurement with Continuous Display Mode")

Signal Meaning 1x short Measurement violated the lower specification limit

(see ”7.2.5 Measurement with Specification Limits Monitoring Enabled”)

2x short Measurement violated the upper specification limit(see ”7.2.5 Measurement with Specification Limits Monitoring Enabled”)

1x long The block was closed automatically and the block result is displayed (see ”7.2.6 Measurement with Fixed Block Size”) or block was changed, refer to ”Measuring in the matrix Mode”

2x long Measurement was recognized as outlier (see ”7.2.8 Measurement with Outlier Rejection Enabled”)

Table 7.1: Meaning of the acoustic signals


7.6 Display of the test method used when measuring with dual probes

The test method of the connected probe appears in the upper line in the display after switching the instrument on (see ”4.1.1 Test Method of the Connected Probe”). With dual probes, the test method used for the last measurement will be indicated after measurement accept. Display Explanation

[NF/Fe NC/NF]

Measurement using the magnetic induction test method was performed

[ NF/Fe NC/NF]

Measurement using the Eddy current test method was perfor-med

7.7 Measurement with specification limits monitoring enabled

With specification limits monitoring enabled, it is possible to check quickly and easily whether the measured coating thicknesses are within a preset specification range. (Enable specification limits monitoring and set the specification limits: see ”5.7.1 Specification Limits Monitoring”) As long as specification limits monitoring is enabled, the special sign appears in the display. After a measurement violating the lower specification limit, a special sign appears in front of the measurement in the display (see figure 7.5). Additionally, a short acoustic signal will sound following the acoustic measurement accept signal to indicate the specification limit violation. After a measurement violating the upper specification limit, u appears in front of the measurement in the display (see figure 7.6). Additionally, two short acoustic signals will sound following the acoustic measurement accept signal to indicate the specification limit violation. With disabled acoustic measurement accept signal, only the signal(s) to indicate the specification limit violation will sound.


With outlier rejection enabled, only the acoustic signals to indicate the recognition of an outlier measurement will sound at outlier recognition. The specification limit violation will not be indicated acoustically in this case.

Figure 7.5: Display with specification limits monitoring enabled showing a measurement violating the lower specification limit

Figure 7.6: Display with specification limits monitoring enabled showing a measurement violating the upper specification limit


7.8 Measurement with fixed block size When measuring with fixed block size block formation will be performed automatically by the instrument after an adjustable number of measurements (= block size). (Selecting the block size: see ”5.7.3 Automatic Block Formation and Block Size”) With a printer connected and switched on, the block result will be printed automatically following the block formation. k appears in the display after storing the last measurement in the block. to indicate the block formation, a long acoustic signal will sound With disabled acoustic measurement accept signal, only the signal to indicate the block formation will sound. Measurement with fixed block size:

Keys / Actions


Perform a measurement. The measurement value will be displayed. [Appl:]: number of the current application [Thickn.]: coating thickness measurement values are displayed (display mode of the current application) [Blck:]: number of the current block [n=]: number of single measurements stored in the current block; the fixed block size appear after the slash

Perform measurements repeatedly until the block is closed automatically. [Ap:]: number of the current application [d.=]: mean value of the current block [Bl:]: number of the current block [s=]: standard deviation of the current block [k]: block is closed; additional measurements cannot be stored in this block


Performing the next measurement opens automatically the next block.

7.9 Measurement with ”Mean Reading” mode enabled

When measuring with ”mean reading” mode enabled, the mean value of multiple single measurements (i single readings) is stored instead of the single measurement. This mode is especially well suited for rough surfaces.(Selecting the number of single measurements, which have to be taken before the actual measurement is computed as mean value of these single measurements: see ”5.7.4 ”Mean Reading" Mode"). With ”mean reading” mode and outlier rejection enabled, single measurements recognized as outliers are not included in the computation of the actual measurement! Measurements with ”Mean reading” mode enabled: Keys / actions

Detail of display Explanation

Perform a measurement. The measurement value will be displayed. [Appl:]: number of the current application [i=]: number of single measurements taken with ”mean reading” mode enabled; the number of single measurements to be averaged appears after the slash [Blck:]: number of the current block [n=]: number of measurements stored in the current application


Perform measurements repeatedly until the number of measurements stored is increased by one ([i= 0/] is displayed again). The mean value of the measurements performed will be displayed and stored .

7.10 Measurement with outlier rejection enabled

With outlier rejection enabled, the measurements recognized as outliers will be indicated in the display and acoustically. (Enabling the outlier rejection: see ”5.7.5 Outlier Rejection”) After a measurement recognized as outlier by the instrument, d and u appear in front of the measurement in the display (see figure 7.7). to indicate the recognition of the outlier measurement, two long acoustic signals will sound In addition to the acoustic signal to indicate the recognition of an outlier measurement, [Outlier !] appears briefly in the prompt lines in the display, if a previous measurement is recognized as outlier. The measurement is then displayed (see figure 7.8) With ”mean reading” mode and outlier rejection enabled, single measurements recognized as outliers are not included in the computation of the actual measurement! With acoustic measurement accept signal disabled, only the signals to indicate the outlier measurement will sound.The specification limits violation will not be indicated acoustically in this case. With outlier rejection enabled, measurements recognized as outliers will not be included in the evaluation of the current block or application.

Figure7.7: Display showing a measurement recognized as outlier

Figure7.8: After Recognition of a previous measurement as outlier


7.11 Recording the measurements with a printer

With a printer connected and switched on, the single measurements will be printed immediately after measurement accept (see figure 7.9). With specification limits monitoring enabled, the measurements will be printed between or beside the specification limits (see figure 7.10). However, if [Print sgl. meas. Off] has been selected in the configuration program PRINT, the measurements will not be printed until the block result is called-up! (see ”12.4.8 Configuration Program PRINT”) With ”mean reading” mode enabled, only the mean value of the single readings will be printed. The single readings will not be printed. When measuring with fixed block size, with a printer connected and switched on, the block result of the closed block will be printed automatically following the block formation (see ”8.1 Evaluation of the Current Block (Block Result)”). With outlier rejection enabled, the previous measurement recognized as outlier will be printed once again below the current measurement and indicated as outlier (see figures 7.9 and 7.10).

7.12 Printing measurements later With a printer connected and switched on, the measurements and the block results of all blocks of the current application can be printed by pressing PRINT. The measurements and the block result of an individual block can be printed during evaluation of this block by pressing PRINT. (see ”8.1.1 Recording the block result with a printer”)


Explanations for figures 7.9 and 7.10 Application No. number of the current application Sheet 990721... designation of the application (only displayed, when

an application name has been assigned (see ”5.6 Assigning Application Names”))

Block No. number of the current block VS 4711... block designation (only displayed, when a block

designation has been assigned (see ”6.3.2 Assigning Block Names”))

n sequential number of the measurement th measured coating thickness with unit of

measurement LSL / USL lower / upper specification limit * measurement is within specification limits << / >> measurement is not within specification limits ! / !! measurement was recognized as outlier


7.13 Erroneous measurements

7.13.1 Deleting single erroneous measurements If an erroneous measurement is recognized immediately after measurement accept, the measurement can be deleted from the application by pressing the DEL key once. The deleted measurement will not be included in the block or final result. If DEL is pressed after the fifth measurement for example, the following line appears on the printout (with a printer connected and switched on). All measurements of the current block can be deleted one after the other by pressing DEL repeatedly.

7.13.2 Deleting all measurements of an open block The measurements stored in the current, open block can be deleted all at once by pressing DEL during the evaluation of the current block (see ”8.1 Evaluation of the Current Block (Block Result)”).

7.13.3 Deleting all measurements of the current application The measurements stored in the current application can be deleted all at once during the evaluation of the current application. To do this, press the key DEL twice after pressing FINAL-RES (see ”8.2 Evaluation of the Current Application (Final Result)”).

7.13.4 Overwriting single erroneous measurements later Erroneous measurements of the current or previous blocks can be overwritten with new measurements during evaluation of the current block.


Overwriting of stored measurements: Keys / Actions


BLOCK-RES

Call-up the block result of the current block with BLOCK-RES (see ”8.1 Evaluation of the Current Block)”). [Mean value th.]: mean value of the current block is displayed [Block]: number of the current block [n=]: number of measurements stored in the current block.

Select the block containing the erroneous measurement to be overwritten using the arrow keys. k: indicates a closed block

MENU

Call-up display of the single readings with MENU. [Blck]: number of the selected block [n=]: sequential number of the displayed single reading [Back: MENU]: press MENU to end the display of the single readings [Single meas.: {}]: use the arrow keys to display the single readings one after the other [Remeas.: DEL]: press DEL to delete the displayed single reading

Select the erroneous measurement to be overwritten using the arrow keys. [Back: MENU]: press MENU to end the display of the single readings [Single meas.: {}]: press the arrow keys to display the single readings one after the other [Remeas.: DEL]: press DEL to delete the displayed single reading


DEL

Delete the measurement with DEL. [remeasure]: request to perform a measurement [Cancel: DEL]: press DEL to cancel the procedure (measurement stored will be kept)

Perform a measurement. The measured value will be displayed.

MENU

End the display of the single readings with MENU. The block result will be calculated again and the updated mean value will be displayed.

ENTER

End the display of the block result with ENTER. The evaluated block will be closed automatically and a new block will be opened. If further measurements are to be included in the last open block, press the key instead of ENTER. The instrument is ready to measure again.

No outlier rejection will be performed when overwriting stored measurements during block result (not even if outlier rejection is enabled).

7.13.5 Measurement with ”continuous” display mode With the ”continuous” display mode enabled, you can easily determine the coating thickness distribution over the surface of the measuring object by moving the placed probe over the surface. With ”continuous” display mode enabled, measurements will be displayed continuously, measurements will not be accepted or stored automatically, and


no data will be transferred via the RS232 interface unless [Send in free ? On] is selected in the configuration program (see ”12.4.6 Configuration Program”).

7.13.6 Turning the ”continuous” display on and off To turn the ”continuous” display on, the key must be pressed prior to making a measurement. The ”continuous” display remains on until it is turned off; this means, it will remain active when the instrument is restarted after being shut off. To turn the ”continuous” display off, press the key again. As long as the ”continuous” display is on: the special sign “arrow ring” will appear on the LCD display the acceptance of a measurement can be triggered with ENTER or by sending the command ”GO”, ”ES”, ”EN” or ”ESC?” via the RS232 interface ( see 14.2"RS232 Interface ”, page 190) the acceptance of a measurement can also be triggered with (when external start is enabled). it is not possible to call the service functions! All acoustical signals are disabled in the ”continuous” display mode. Tolerance limit violations will only be displayed with “arrow up” or “arrow down” in the LCD. The ”continuous” display mode will be disabled automatically when switching the instrument off!

7.13.7 Measurement with ”continuous” display mode enabled When moving the placed probe over a test surface, the probe tip is subject to oncreased wear and tear!


Measurement with ”continuous” display mode enabled: Keys / Actions


Press the key to enable the ”continuous” display mode.

Place the probe on the measuring object and move the probe over the surface of the object to determine the coating thickness distribution.

Lift off the probe from the measuring object.

Press the key again to disable the ”continuous” display mode.

With ”continuous” display mode enabled, acoustical signals for displaying the violation of tolerance limits are disabled.Violations of tolerance limits are then only displayed by [arrow down] and [arrow up] in the LCD

7.13.8 Analog display When making measurements with the ”continuous” display, the analog display makes it easier to recognize trends in changes of the coating thickness. When analog display is enabled, the analog display together with its set limits will appear instead of the information line. The measurement is presented as an analog bar between the limits. (To enable the analog display ( see ”12.4.7 APPL No service function”) As long as the specification limits are disabled, the measurement range limits of the connected probe are displayed as the limits for the analog display. When the specification limits are enabled, the set specification limits are displayed as the limits for the analog display ( see ”5.7.1 Specification limits”) When making measurements with the ”continuous” display, the signal indicating a specification limit violation will sound if the measurement goes


below or above the limits for the analog display and the measurement acceptance signal is enabled ( see ” 7.2.3 Acoustic signals after measurement acceptance”, and ”7.2.5 Measurements with specification limits enabled”) If the measurement acceptance signal is disabled, then the acoustic signal indicating specification limit violations is automatically disabled as well ( see 7.2.3 Measurement acceptance signal"). Measurements with the ”free-running” display (with analog display): Key sequence / activity

Section of the LCD display

Explanation

Use to turn the ”Continuous” display on. $. limits for the analog display

Place the probe on the specimen and scan the surface of the specimen to determine the coating thickness distribution. limits for the analog display [-----]: analog display [<=] and [=>]: measurement below lower or above upper analog display limit

Lift probe off the specimen.

”Use to turn the ”Continuous" display off.


7.13.9 Measurement with ”Continuous” display using dual probes The last measurement performed with a dual probe prior to turning on the ”Continuous” display determines the measurement method to be used for the measurement with the ”Continuous” display. The measurement method that was used for the last measurement is displayed on the LCD display ( see ”7.2.4 Displaying the applied measurement method for measurements with dual probes”)

Automatic recognition of the substrate material and selection of the correct measurement method is disabled when making measurements with the ”Continuous” display!

If the magnetic induction method was used to make measurements prior to turning on the ”Continuous” display, the measurements with the ”Continuous” display will be made according to the magnetic induction method as well. The dual probe will then make measurements only on ferromagnetic substrate materials. If measurements are attempted on other substrates the LCD display will remain at [- - - - -].

If the Eddy current method was used to make measurements prior to turning on the ”Continuous” display, the measurements with the ”Continuous” display will be made according to the Eddy current method. The dual probe will make correct measurements only on non-ferromagnetic substrate materials; measurements obtained on ferromagnetic substrate materials will be erroneous. If no measurement has been made prior to turning on the ”Continuous” display, the measurements with the ”Continuous” display will be made according to the magnetic induction method.

7.13.10 Measurement with standard or matrix measuring mode enabled The preparations necessary for measurement and the making of a measurement are independent of the measuring mode selected and can be taken from the chapters ”7.1 Preparations for Measurement” and ”7.2 Making a Measurement”. (Detailed information about the standard and matrix measuring mode: see ”6 Standard and Matrix Measuring Mode”). The measuring mode can be changed only in the configuration program APPL No (see ”12.4.7 Configuration Program APPL No”).


7.13.11 Measurement with standard measuring mode enabled When measuring with standard measuring mode enabled, the measurements can be stored only in the last open block. It is not possible, to select the block the next measurement is to be stored in freely.

7.13.12 Measurement with matrix measuring mode enabled The matrix measuring mode is indicated by m in the display. With measurements in the matrix measurement mode, changing blocks, that is, selecting the block where the next measurement reading is to be stored, can be carried out automatically or manually. (To set the block change: ( see ”12.4.7 APPL No service function”) When changing blocks is set to automatic, the next measurement is automatically stored in the next block. After the acoustic signal for the acceptance of the measurement, a long acoustic signal will sound to inform of the block change. (For details about the acoustic signals: ( see ” 7.2.3 Acoustic signals after measurement acceptance”) If changing blocks is set to manual, the block for storing the next measurement can be freely selected prior to the measurement. For example, one measurement may be stored in block 7 and the next measurement in block 3. Selecting the block, the next measurement is to be stored in: Keys / Actions Detail of display Explanation

BLOCK-RES Press BLOCK-RES to start the selection of the block. [Mean value th.]: mean value th. of the measurements stored in the evaluated block up to now [Block:]: number of the evaluated block [n=]: number of measurements stored in the evaluated block


() Select the desired block using the arrow keys. mean value th. of the measurements stored in the evaluated block up to now [Block:]: number of the evaluated block [n=]: number of measurements stored in the evaluated block

Perform the measurement on the next measuring object. [Appl:]: number of the current application [Blck:]: number of the current block

The block will be automatically closed if the maximum number of measurements, which can be stored in a block, is reached. k appears in the display to indicate that the block is closed. Additionally, a long acoustic signal will sound after the acoustic measurement accept signal to indicate the block formation.(More details about acoustic signals: ( see ” 7.2.3 Acoustic signals after measurement acceptance”) With disabled acoustic measurement accept signal, only the signal to indicate the block formation will sound. Measurements taken with matrix measuring mode enabled and k appearing in the display will not be stored, printed or included in the evaluation. [E024 - Result block full !] appears briefly in the display after the measurement.The block the next measurement is to be stored in, has to be selected as described above so that the next measurement can be stored.


7.14 Transferring measurements to a computer and remote control of the Instrument

With a computer connected to the RS232 interface of the instrument, the following functions are available: transferring of the measurements from the instrument to a computer remote control of the instrument by sending commands from an external computer to the instrument. To do this, instrument and computer have to be connected by an interface cable. The interface cable and the adapter for correct connection of instrument and computer (9-pin or 25-pin) are included in the RS232 interface cable MP, which is available from Fischer or your local supplier. (Connecting a computer: see ”11.5 Connecting an External Computer”; factory settings and connector pin-out of the RS232 interface: see ”14.2 RS232 Interface”) Suitable commercial or self-programmed data processing software can be used to acquire and process the measurements coming from the instrument. Refer to the corresponding software manuals for information about import and processing the measurements with this software.

7.15 Output format of the measurement data string

The measurements will be transferred via the RS232 interface as floating point string followed by CR + LF. The word length, i. e. the number of bits an ASCII character consists of, can be selected in the configuration program ([Word length 7 Bits] or [Word length 8 Bits]). (Selecting the word length: see ”12.4.6 Configuration Program ”)

7.16 Transferring the measurements to an external computer

There are two modes to transfer the measurements from the instrument to an external computer: • on-line mode and • off-line mode.


In the on-line mode the instrument is connected to the computer during measurement and the measurements are transferred to the computer immediately (on-line) after the measurement. Single measurements are transferred via the RS232 interface immediately after measurement accept, if [Output to port Single meas.] is selected in the configuration program . However, if [Output to port Block mean values] is selected, the block mean values will be transferred via the RS232 interface after pressing BLOCK-RES; the single measurements will be displayed but not transferred. (Selecting the type of data to be transferred via the RS232 interface: see ”12.4.6 Configuration Program ”) In the off-line mode the measurements already stored in the instrument can be transferred via the RS232 interface at any time (off-line). The data transfer can be initiated by pressing PRINT. The single measurements are transferred via the RS232 interface after pressing PRINT, if [Output to port Single meas.] is selected in the configuration program . However, if [Output to port Block mean values] is selected, only the block mean values will be transferred. (Selecting the type of data to be transferred via the RS232 interface: see ”12.4.6 Configuration Program ”) A series of single measurements can be combined into a block by pressing BLOCK-RES (see ”8.1 Evaluation of a Block (Block Result)”, page 94 ff). The end of each block formed by pressing BLOCK-RES can be marked with a group separator code (ASCII GS). The group separator will be written to the end of each block and transferred via the RS232 interface followed by CR + LF only if [Group separator On] has been selected in the configuration program . (Setting the group separator mode: see ”12.4.6 Configuration Program ”)


8 Evaluation Two options for evaluation of the measured coating thickness are available: • evaluation of the current block (block result) • evaluation of the current application (final result) When calling a block result or a final result, the following parameters are calculated from the measurements of the current block or the current application and can be displayed in succession: • mean value • number of the evaluated block or application • number of the measurements evaluated • standard deviation • date and time of the block formation of the evaluated block or current

date (if the evaluated block has not yet been closed) • lowest or highest measurement or block mean value (if automatic block

formation has been enabled) • number of measurements violating the lower or the upper specification

limit (only if specification limits monitoring is enabled) When printing the result, the following will be printed in addition: • current date • 95% confidence interval for the mean value • coefficient of variation C.O.V. • Standard deviation sa (only when displaying or printing the final result if

automatic block formation has been enabled) • lower and upper specification limit LSL and USL • process capability indices cp and cpk, estimated value s^ of the

standard deviation (only if specification limits monitoring and automatic block formation have been enabled)

• histogram with information if a normal distribution of the measurements was found, skewness, kurtosis and a normal probability chart (only when printing the final result, and if the histogram mode [Histogram On] is selected in the configuration programs)


The block or final result cannot be called if there are no measurements stored in the current application or if the measurements have been deleted! The display will not change after pressing BLOCK-RES or FINAL-RES.

With outlier rejection enabled, measurements recognized as outliers will not be included in the evaluation! Detailed explanations about the evaluation parameters : see "16 Glossary of Terms and Symbols", beginning on page 177"

8.1 Evaluation of the current block (block result)

Single measurements are combined automatically into a block at evaluation of the current block. However, the block will not be closed until the evaluation is terminated by performing a measurement or pressing ENTER. If no measurements are stored in the current block, the block result of the last closed block will be displayed after pressing BLOCK-RES.

If [Symbol ”k”] appears in the display, the evaluated block has been closed already.

If the last block has not been closed when measuring with fixed block size, the next measurement will be added to this block (even if the evaluation was terminated with ENTER). The block formation is not accomplished until the number of measurements stored in this block equals the fixed block.


Evaluation of the current block (display of the block result):


BLOCK-RES _________________

_________________

Call-up the block result of the current block with BLOCK-RES. [Mean value]: mean value is displayed [Block:]: number of the evaluated block [n=]: number of measurements evaluated

BLOCK-RES

_________________

_________________

Display the next calculated parameter with BLOCK-RES. [Std. dev. s]: standard deviation s is dis played [04.07.01 11:02]: current date and time (for open blocks) or date and time of block formation (for closed blocks)

BLOCK-RES

_________________

_________________

Display the next calculated parameter with BLOCK-RES. [lowest meas.]: the lowest measurement is displayed [n= 0<LSL: 0%]: number of measurements violating the lower specification limit (LSL)


(will be displayed only with specification limits monitoring enabled)

BLOCK-RES

_________________

_________________

Display the next calculated parameter with BLOCK-RES. [highest meas.]: the highest measurement is displayed [n= 2>USL: 22%]: number of measurements violating the upper specification limit (USL) (will be displayed only with specification limits monitoring enabled)

BLOCK-RES

_________________

{ _________________

Display the notes concerning block closure with BLOCK-RES. [Leave open: ]: end the display of the block result without closing the current block with , further single measurements can be added to the current block (displayed only when evaluating open blocks) [End: ENTER]: end the display of the block result and close the evaluated block with ENTER (displayed only when evaluating open blocks) [Change block:}] or [Select block:{}]: display the block result of the previous or next block


using the arrow keys [Single meas: MENU]: display the single measurements of the evaluated block with MENU (the single measurements can be displayed in succession with , return to the block result with MENU) [Delete block: DEL]: delete the measurements of the last open block with DEL (is displayed only when evaluating open blocks)

ENTER

End the display of the block result with ENTER. The instrument is ready to measure again.

8.2 Recording the block result with a printer With a printer connected and switched on, the block result of the current block with date and time will be printed after pressing BLOCK-RES. If no measurements are stored in the current block, no block result will be printed after pressing BLOCK-RES, but the block result of the last closed block will be displayed. When measuring with fixed block size and with a printer connected and swit-ched on, the block result of the closed block will be printed automatically af-ter the block formation.


Depending on the selected block result, the short or the long block result is printed (see figures 8.1 and 8.2).

Figure 8.1: Printout of a short block result (example)

Figure 8.2: Printout of a long block result (example)

Figure 8.3: Printout of a long block result with specification limits monitoring enabled (example) With specification limits monitoring enabled, the number of measurements violating the specification limits are printed in addition to the long block result (see figure 8.3). If the printer is switched on during display of the block result, the block result can be printed by pressing PRINT. A list of all measurements stored in the current block will be printed additionally (see figures 8.4 and 8.5).


Figure 8.4: Printout of a long block result with a list of the measurements stored in the evaluated block (example)

Figure 8.5: Printout of a long block result with a list of the measurements (with specification limits monitoring enabled) (example)

Explanations for Figures 8.1 to 8.5:

instrument model current date number of the current application type of result number of the current block date and time of the last measurement of the


last block or the last block formation mean value with 95 % confidence interval standard deviation in the list of measurements: sequential number of

the measurement in the block result: number of measurements evaluated

coefficient of variation lowest measurement highest measurement lower / upper specification limit measurement is within specification limits measurement is not within specification limits measurement was recognized as outlier If the block result of a previous block is displayed (by pressing t while dis-playing the block result of the current block), the block result of this previous block can be printed by pressing PRINT. A list of all measurements stored in this previous block will be printed additionally. With matrix measuring mode enabled (indicated by symbol matrix in

the display), the block result will not be printed after pressing BLOCK-RES. With matrix measuring mode enabled, the block result can be printed only by pressing PRINT during display of the block result.

8.3 Evaluation of the current application (final result)

The evaluation of all measurements stored in the current application is sum-marized in the final result. Performing a measurement or pressing the key ENTER during evaluation of the current application will end the display of the final result. The current block will be closed and a new block will be opened. If the last block has not been closed when measuring with fixed block size, the next measurement will be added to this block (even if the evaluation was terminated with ENTER). The block formation is not accomplished until the number of measurements stored in this block equals the fixed block size.


When measuring with fixed block size, only the measurements stored in closed blocks will be included in the evaluation of the current appli-cation.


Evaluation of the current application (display of the final result):

Keys Detail of the display Explanation

FINAL-RES

or (with fixed block size):

Call-up the final result of the current application with FINAL-RES. [Mean value]: mean value is displayed [Appl:]: number of the current application [n=]: number of measurements evaluated [Mean v. from 3 blocks]: mean value of three closed blocks is displayed

FINAL-RES

or (with fixed block size)

Display the next calculated parameter with FINAL-RES. [Std. dev. s] or [Std. dev. s.]: standard deviation s or s. is displayed [12.11.01 12:29]: current date and time (if the last block of the application has not yet been closed) or date and time of the block formation of the last closed block


FINAL-RES

(appears only with fixed block size)

Display the next calculated parameter with FINAL-RES. [Std. dev. sa]: standard deviation sa is displayed [nBl=]: number of blocks evaluated

FINAL-RES


Display the next calculated parameter with FINAL-RES. [lowest meas.]: the lowest measurement is displayed [n= 2<LSL: 12%]: number of measurements violating the lower specification limit (LSL) (will be displayed only with specifi cation limits monitoring en abled) [smallest block]: smallest block mean value of all blocks evaluated is displayed

FINAL-RES


Display the next calculated parameter with FINAL-RES. [highest meas.]: the highest measurement is displayed [n= 4>USL: 24 %]: number of measurements violating the upper specifi cation limit (USL) (will be displayed only with specifi cation limits monitoring en


abled) [largest block]: largest block mean value of all blocks evaluated is displayed

FINAL-RES

Display the notes concerning the ending of the final result with FINAL-RES. [Delete meas.: DEL]: delete all measurements stored in the current application with DEL [Continue: ENTER]: end the display of the final result with ENTER (measurements stored will not be deleted)

ENTER

End the display of the final result with ENTER. If DEL was pressed be fore, all measurements stored in the current application are deleted now. The instrument is ready to measure again. Further explanations concerning the display: see "4.1 `Switching the Instrument ON and OFF"


8.4 Recording the final result with a printer With a printer connected and switched on, the final result of the current application with date and time will be printed after pressing FINAL-RES. Only if specification limits monitoring is enabled, the number of measure-ments violating the specification limits will be printed (see figure 8.6).

Figure 8.6: Printout of a final result with specification limits monitoring enabled (example) When measuring with fixed block size and with specification limits monitoring enabled, the standard deviation sa, the process capability indices cp and cpk, the estimated standard deviation s^, the number nBl of blocks evaluated and the block size ni will be printed in addition (see figure 8.7).


Figure 8.7: Printout of a final result with fixed block size and with specification limits monitoring enabled (example)


Explanations for Figures 8.6 and 8.7

instrument model

current date

the exact description of the measuring object the measurements were performed on and the operator name can be entered here for example

number of the current application

type of result

date and time of the block formation of the first and the last block of this application or current date and time (if the last block has not been closed yet)

mean value / mean value of the block mean values with 95% confidence interval

std. deviation s (s. with fixed block size)

number of measurements evaluated

block size (number of measurements per block)

standard deviation sa (only if the deviations of the block mean values cannot be attributed to the deviations within the blocks, as determined by analysis of vari ance methods (A.O.V.))

number of blocks evaluated

coefficient of variation

lowest measurement / lowest block mean value

highest measurement / highest block mean value

lower / upper specification limits

process capability index cp / cpk

estimated value s^ of the std. deviation


A histogram will be printed only if the histogram has been enabled in the configuration programs and if more than 9 measurements are stored in the application. Selecting the histogram mode: see "11.4.2 Instrument Configuration" To determine whether the measurements evaluated can be classified as ha-ving normal distribution, the instrument automatically performs a Kolmogo-rov-Smirnov test (if up to 40 measurements are to be evaluated) or a χ2 test (if more than 40 measurements are to evaluated) when evaluating the current application. The test result will be printed below the histogram and indicates whether the measurements were classified as having normal distribution [Normal distribution] or not [Distribution not normal] (see figure 8.8).

Figure 8.8: Printout of a histogram


9 Normalization and corrective calibration The following factors affect the thickness measurement: • Geometry of the specimen (size of measurement area, curvature,

substrate thickness) • Magnetic permeability or electrical conductivity of the specimen The effects of these factors can be corrected for by normalization or calibration. A normalization (measurement on an uncoated measuring object) is sufficient whenever the a. m. properties of the measuring object change only slightly. If changes in geometry, magnetic permeability, or electrical conductivity are significant and cannot be compensated by a normalization, a corrective calibration becomes necessary. If the changes of the a.m. factors are very significant, a master calibration has to be performed.

9.1 Hints for normalization and corrective calibration

• For the normalization, corrective calibration and master calibration, an uncoated measuring object of the same material and geometry as the coated objects to be measured is absolutely essential!

• Do not use the supplied test piece (Fe- or Al-Base) for a normalization or

calibration, because its material characteristics may differ from those of the measuring object! (The test piece should be used for functional testing only.)

• To ensure the measurement accuracy specified for the probe connected,

it is absolutely necessary to perform each normalization and calibration very carefully.

• It is absolutely necessary to follow the instructions of chapter “2 Notes

Concerning the Operation of the Instruments and Handling the Accessories” (from page 3)!


• CuBe calibration standards are to be used only to calibrate magnetic induction probes or the magnetic induction channel of dual probes (Ù“3.3 Calibration Standards”, from page 15).

• Perform reference measurements after each normalization and

calibration to check the normalization or calibration! • Following a normalization or calibration with the DUALSCOPE® MP40 all

measurements will be deleted. • With the restricted operating mode enabled (indicated by e in the display)

it is not possible to start a normalization or calibration! • When normalizing or calibrating with a dual probe, the first measurement

performed for this normalization or calibration will determine the channel of the dual probe, which will be normalized or calibrated. If the first measurement for a normalization is performed on a ferromagnetic measuring object, for example, the magnetic induction channel of the dual probe will be normalized.

• Performing a normalization or calibration with a dual probe will normalize

or calibrate the application only for one test method at first. The normalization or calibration for the other test method also has to be performed, so that coating thicknesses can be measured correctly with both test methods.

9.1.1 Normalization and corrective calibration with dual probes The first measurement made with a dual probe for this normalization or calibration will determine the channel of the dual probe that will be normalized or calibrated. When performing this normalization or calibration with a dual probe, initially the application is normalized or calibrated only for one of the two measurement methods. The application must be normalized or calibrated for the other measurement method as well, before correct coating thickness measurement can be obtained with the other method.


9.2 Reference Measurement When performing a reference measurement, measurements are taken on a reference sample. If the deviations of these measurements from the coating thickness of the reference sample violate the specified tolerances, the normalization or calibration has to be performed again. A reference measurement requires: reference sample (coated measuring object with known coating thickness and of the same geometry and of the same substrate material as the coated objects to be measured) Note: Reference samples are subject to wear and tear caused by the tactile measurement. Reference samples have to be checked regularly and replaced by new reference samples if the wear and tear becomes significant.

9.3 Normalization During a normalization, a new zero point will be determined for the calibration curve and stored in the EEPROM memory chip of the probe connector. A normalization requires: uncoated specimen of the same geometry and of the same substrate material as the coated objects to be measured. Note: A normalization is only valid for the current application. The other applications remain unchanged. However, if the linking mode is enabled (symbol “chain” in the display), the normalization is valid for all applications linked to the current application.


9.3.1 Performing a normalization (with the instrument switched on):

Keys / action Detail of the display Explanation

ZERO z

Call-up the normalization of the current application with ZERO. z appears and remains in the display as long as the normalization is performed. [Base]: measurements have to be performed on the Base [Cancel: ENTER]: press ENTER to cancel the normalization

z

Perform a measurement on the base. Repeat the measurement at several points of the Base until the mean value is stable (or the change of the mean value after another measurement does not violate the admissible limit for this change). The mean value of all normalization measurements will be displayed. [s= 0.01 n= 5]: standard deviation s=0.01, number of measurements n=5


[OK: ENTER]: press ENTER to confirm and end the normalization [Delete: DEL]: 1x DEL deletes the last measurement, 2x DEL deletes all normalization measurements

ENTER

Confirm and end the normalization with ENTER. The new calibration parameters will be computed and stored automatically. The instrument is ready to use now. Further explanations concerning the display: see "4.1 `Switching the Instrument ON and OFF`" Perform reference measurements to check the normalization!

9.3.2 Recording a normalization with a printer With a printer assigned and switched on, a record of the normalization is printed while a normalization is performed.

Figure 9.1: Record of a normalization (example)


Explanations for Figure 9.1: instrument model current date record of a normalization will be printed date and time of the normalization number of the current application (i. e. of the

application, which is normalized now) probe, which is used to perform the

normalization sequential number of the normalization

measurements measured thickness mean value of the normalization measurements standard deviation of the normalization

measurements

9.4 Corrective calibration During a corrective calibration, a new zero point and one additional point (one-point calibration with one calibration standard) or two additional points (two-point calibration with two calibration standards) will be determined to adjust the calibration to the measuring object. The new calibration parameters will be determined and stored in the EEPROM memory chip of the probe connector. A corrective calibration requires: uncoated measuring object of the same geometry and of the same

substrate material as the coated objects to be measured calibration standard(s) for the corrective calibration

(probe-specific corrective foil(s)) The corrective calibration using the corrective foils supplied with the probe offers the best measurement accuracy for the entire measurement range of the probe. To increase the accuracy at a specific narrow thickness range, a foil with a thickness covered by this range can be used. However, this usually reduces the accuracy outside this range when compared to the

Operator’s manual Hand-held MP30/40

corrective calibration performed with the supplied probe-specific corrective foils.

9.4.1 Corrective calibration (with the instrument switched on)

Keys / Actions Detail of display Explanation

CAL

Call-up the corrective calibration with CAL. [CAL] appears and remains in the display as long as the corrective calibration is performed. measurements have to be performed on the uncoated specimen (normalization) press ENTER to skip the normalization (stored normalization will not be changed) press CAL to cancel the corrective calibration press DEL to delete the corrective calibration of the current application (page 36)

SM

Perform a measurement on the uncoated specimen (substrate mate-rial). Repeat the measurement at several points of the reference area until the mean value is stable (or the change of the mean value after another measurement does not violate the admissible limit for this change). The mean value of all normalization


measurements will be displayed. standard deviation s=0.01, number of measurements n=5 press ENTER to confirm the normalization press DEL to delete the last measurement, 2x DEL deletes all normalization measurements

ENTER

Confirm and store the normalization with ENTER. (Previous normalization will be overwritten.) press ENTER to confirm and end the corrective calibration at this point press DEL to go back to the normalization use the arrow keys to enter the thickness of the corrective foil

SM + Foil

Place the first calibration standard (corrective foil) on the uncoated specimen and perform a measurement. Repeat the measurement at several points of the reference area until the mean value is stable (or the change of the mean value after another measurement does not violate the admissible limit for this change). The mean value of all measurements performed for this calibration step will be displayed.


foil thickness stored for the first calibration standard press ENTER to confirm and end the current calibration step press DEL to delete the last measurement, 2x DEL deletes the whole measurement series (all measurements performed for this calibration step), press 3x DEL to go back to the previous calibration step use the arrow keys to enter the thickness of the corrective foil

Use the arrow keys to set the displayed value to the current foil thickness (this step is not required, if the displayed foil thickness corresponds to the current foil thick-ness of the corrective foil). press ENTER to confirm and end the current calibration step

ENTER

If a corrective calibration with two calibration standards is desired: proceed for the second calibration standard (corrective foil) in the same manner as described above for the first calibration standard. Otherwise: press ENTER to confirm and end the corrective calibration.

ENTER Press ENTER to confirm and end the last calibration step.


The new calibration parameters will be determined and stored auto-matically. The instrument is ready to use now. (Further explanations concerning the display: “4.1.1 Switching the Instrument ON”) Perform reference measurements to check the corrective calibration!

9.4.2 Deleting the corrective calibration When deleting the corrective calibration of a product, only the corrective calibration of this product will be deleted. Corrective calibrations of other products remain unchanged. However, when the linking mode is enabled, all corrective calibrations of the other products, linked with the current product, will be deleted. When deleting the corrective calibration of a dual probe, the corrective calibration of both channels (magnetic induction and Eddy current) will be deleted.


Deleting the corrective calibration: Keys Detail of Display Explanation

CAL

Call-up the corrective calibration with CAL. [Cancel: CAL]: press CAL to cancel the corrective calibration [Delete cal.: DEL]: press DEL to delete the corrective calibration

DEL

Delete the corrective calibration with DEL. [Yes:DEL No:ENTER]: press DEL to delete the corrective calibration; press ENTER to cancel the procedure and keep the corrective calibration stored

DEL

Confirm the deleting of the corrective calibration with DEL. The corrective calibration will be deleted. The instrument is ready to measure now.


9.4.3 Recording the corrective calibration with a printer With a printer connected and switched on, a record of the corrective calibration is printed while a corrective calibration is performed (see figure 9.2).

Figure 9.2: Record of a corrective calibration


9.5 Calibration on the coating When performing a corrective calibration on a coated specimen, a new zero point and one additional point will be determined to adjust the calibration to the specimen. The coefficients of the master calibration characteristic in the EEPROM of the probe plug remain unchanged. A calibration on a coating requires: coated specimen of the same geometry and of the same substrate material

as the coated specimen to be measured calibration standard(s) for the corrective calibration

(probe-specific corrective foil(s)) with a thickness of the coated specimen used for the calibration on the coating

9.5.1 How to calibrate on the coating (with the instrument switched on) Keys / Actions Detail of display Explanation

CAL+ZERO

Call-up the corrective calibration with CAL+ZERO. [ZERO] and [CAL] appear and remain in the display as long as the corrective calibration on the coating is performed. measurements have to be performed on the coated measuring object. press ENTER to cancel the calibration on the coating

coated specimen

Perform a measurement on the coated specimen. Repeat the measurement at several points of the reference area until the mean value is stable (or the change of the mean value after another


measurement does not violate the admissible limit for this change). The mean value of all measurements performed for the current step will be displayed. standard deviation s=0.08, number of measurements n=5 press ENTER to confirm and end the current step press DEL to delete the last measurement, 2x DEL deletes all measurements performed the current step.

ENTER

Confirm and store the normalization with ENTER. press ENTER to confirm and end the corrective calibration at this point press DEL to go back to the normalization use the arrow keys to enter the thickness of the corrective foil

coated specimen + foil

Place the first calibration standard (foil) on the coated specimen and perform a measurement. Repeat the measurement at several points of the reference area until the mean value is stable (or the change of the mean value after another measurement does not violate the admissible limit for this change).


The mean value of all measurements performed for this calibration step will be displayed. foil thickness stored for the first calibration standard press ENTER to confirm and end the current calibration step press DEL to delete the last measurement, 2x DEL deletes the whole measurement series (all measurements performed for this calibration step), press 3x DEL to go back to the previous calibration step use the arrow keys to enter the thickness of the corrective foil

Use the arrow keys to set the displayed value to the current foil thickness (this step is not required, if the displayed foil thickness corresponds to the current foil thick-ness of the corrective foil). press ENTER to confirm and end the current calibration step

ENTER

Press ENTER to confirm and end the last calibration step. The new calibration parameters will be determined and stored automatically. The instrument is ready to use now. (Further explanations concerning the display: “4.1 Switching the Instrument ON”)


9.5.2 Recording the calibration on the coating With a printer connected and switched on, a record of the calibration is printed while a calibration on the coating is performed.

Figure 9.3: Record of a calibration on the coating (example)


9.6 Master calibration During a master calibration the coefficients of the master calibration are de-termined and stored in the EEPROM memory chip of the probe connector. These coefficients define the relationship between probe signal and coating thickness. The probes delivered from Fischer are already master calibrated. The coeffi-cients of this master calibration (computed during the master calibration, which was performed at Fischer) are stored in the EEPROM memory chip of the probe connector. These coefficients will be overwritten when performing a new master calibration. A master calibration requires: • uncoated measuring object of the same geometry and of the same

substrate material as the coated objects to be measured • probe-specific set of calibration standards (master foils)

! Note: A master calibration should be performed only by an

experienced user of the instrument!

9.6.1 Determination of the calibration standards for master calibration The master characteristic can only be determined during a master calibration if suitable calibration standards are used. Calibration standards are suitable for the master calibration only if their normalized Count rate s Xn are within the specified, probe-characteristic Xn range. After a complete master calibration, the normalization and corrective calibra-tion, which have been stored in the assigned probe, will be deleted automati-cally. After performing a master calibration with dual probes, the normaliza-tion and corrective calibration of both channels (magnetic induction and Eddy current) will be deleted. A new normalization or corrective calibration has to be performed if required!


How to perform a master calibration (with the instrument switched on):

Keys / Action Detail of Display Explanation

10 x ENTER

Call-up the configuration programs by pressing ENTER 10 times.

Set the display to the code number of the configuration programs. [159]: Code number of the configuration programs

ENTER

Confirm with ENTER. [Opions: KEYS]: The desired configuration program can be selected by pressing the corresponding key [Exit: DEL]: Configuration programs can be exited by pressing DEL

CAL

z j

Call-up the master calib-ration by pressing CAL. z and j appear and remain in the display as long as the master calibration is performed. [Master Cal. Base]: master calibration has been called-up; measurements


have to be performed on the uncoated measuring object (substrate material) (nor-malization) [Skip: ENTER]: press ENTER to skip the normalization (stored nor-malization will not be changed) [Cancel: CAL]: press CAL to cancel the master calibration

SM

z j

Perform a measurement on the uncoated measuring object (substrate material). Repeat the measurement at several points of the re-ference area until the mean value is stable (or the change of the mean value after another measurement does not violate the admissible limit for this change). The mean value of all nor-malization measurements will be displayed. [s= 0.01 n= 5]: standard deviation s=0.01 number of measurements n=5 [OK: ENTER]: press ENTER to confirm and end the normalization [Delete: DEL]: 1x DEL deletes the last


measurement, 2x DEL deletes all nor-malization measurements

ENTER z j

Confirm and store the normalization with ENTER. The previous normalization will be overwritten. [Cal.Std.:]: foil thickness stored for the calibration standard [Cancel: ENTER]: press ENTER to cancel the master calibration [Back: DEL]: press DEL to go back to the normalization [Entry: {}]: use the arrow keys to enter the thickness of the master foil

SM + Foil

z j

Place the first calibration standard (master foil) on the uncoated measuring object and perform a measurement. Repeat the measurement at several points of the re-ference area until the mean value is stable (or the change of the mean value after another measurement does not violate the admissible limit for this change). The mean value of all measurements performed for this calibration step will be


displayed. [Cal.Std.1:]: foil thickness stored for the first calibration standard [OK: ENTER]: press ENTER to confirm and end the current calib-ration step [Delete: DEL]: 1x DEL deletes the last measurement, 2x DEL deletes the whole measurement series (all measurements performed for this calibration step), 3x DEL: go back to the previous calibration step [Entry: {}]: use the arrow keys to enter the thickness of the master foil

z j

Use the arrow keys to set the displayed value to the current foil thickness (this step is not required, if the displayed foil thickness corresponds to the current foil thickness of the master foil). [OK: ENTER]: press ENTER to confirm and end the current calib-ration step


ENTER

z j

Proceed for the second calibration standard in the same manner as described above for the first calibration standard. Proceed in the same manner for the third and fourth calibration standard.

ENTER

z j

c

Press ENTER to confirm and end the last calibration step. c appears briefly in the display. The new master calibration parameters will be de-termined and stored automatically. [FrEE] is displayed auto-matically. [Opions: KEYS]: The desired configuration program can be selected by pressing the corresponding key [Exit: DEL]: Configuration programs can be exited by pressing DEL

DEL

Exit the configuration programs by pressing DEL. The instrument is ready to use now. Further explanations concerning the display: see "4.1 Switching the Instrument ON and OFF" Perform reference measurements to check the master calibration!


10 Technical Data

10.1 Measurement application capabilities

Instrument model Thickness measurement of

Test method

DELTASCOPE® MP30E

Nonferromagnetic or nonconductive coatings on steel or iron


ISOSCOPE® MP30E Nonconductive coatings on nonferromagnetic substrates

Eddy current test method according to DIN EN ISO 2360, ASTM B244 or BS 5411/3

DUALSCOPE® MP40E

Nonferromagnetic or nonconductive coatings in steel or iron

Nonconductive coatings on non ferromagnetic substrates


Eddy current test method accor ding to DIN EN ISO 2360, ASTM B244 or BS 5411/3


10.2 Technical data Instrument type DELTASCOPE® MP30E, ISOSCOPE® MP30E

and DUALSCOPE® MP40E

Display LC display with symbols and prompts to guide the user

Dimensions Instrument: 160 mm x 80 mm x 30 mm (L x W x H) 6.3" x 3.1" x 1.2" (L x W x H) Display: 60 mm x 30 mm (L x W) 2.4" x 1.2" (L x W)

Mass 250 g (0.55 lbs)

Admissible ambient temperature range during operation

5 ... 45 °C (41 ... 113 °F)

Admissible storage temperature

5 ... 60 °C (41 ... 140 °F)

Admissible environ-mental relative humidity during opera tion

30 ... 90 % (non-condensing)

Applications 100 for up to 10,000 measurements, which may be combined into up to 1,000 blocks

Measuring modes Standard and matrix measuring mode

Measuring range Depending on the assigned probe

Trueness Depending on the assigned probe

Repeatability Depending on the assigned probe


Accuracy Depending on the assigned probe

Power supply 9 V battery (6LR61) for up to 25 hours of operation or 9 V rechargeable NiCd battery for up to 5 hours of ope ration (battery can be recharged with the plug-in type battery charger) orAC power supply (12V 30 mA) 220 V or 110 V

Power consumption 0.2 W

Receptacles Probe: 8-pin round plug AC power supply: 2-pin tubular plug RS232 interface: 9-pin micro-T-plug

RS232 interface Bidirectional (data transfer to an external computer and remote control of the instrument by sending com mands from an external computer)

10.3 RS232 interface By using the appropriate connection cable, the instrument recognizes auto-matically, if a printer or a computer is connected to the RS232 interface. Printers with suitable connection cables or an RS232 interface cable MP to connect the instrument and the external computer are available from your lo-cal supplier or from Fischer directly.

10.3.1 Factory settings Baud rate 9600

Word length 8 bit, 1 stop bit, no parity

Handshake: In off-line mode, the PC hardware handshake needs to be supported by the RTS and CTS lines

Measurement data format:

Floating point string consisting of ASCII characters followed by CR + LF

Voltage levels: 5 V TXD, RTS, DTR, to - 15 V inputs


11 Start-up, maintenance and cleaning Switch the instrument off before connecting or disconnecting any components! Switch the instrument off before connecting the AC power supply or changing the battery! Even small electrical discharges may delete internally stored data.

To prevent damage to the connector pins do not tilt the plug when inserting or disconnecting it.

It is absolutely necessary to follow this instructions see "2 Notes Concerning the Operation of the Instrument and Handling the Accessories”

11.1 Instrument start-up An instrument start-up includes the following steps: • providing a power supply for the instrument

see "10.2 Start-Up, Maintenance and Cleaning" • connecting a probe to the instrument see

"10.3 Start-Up, Maintenance and Cleaning" • connecting a printer (if available) to the instrument

see "10.4 Start-Up, Maintenance and Cleaning" • connecting an external computer (if desired) to the instrument

see "10.5 Start-Up, Maintenance and Cleaning"

11.2 Power supply There are three ways to provide power for the instrument:

• AC power supply

• 9 V battery

• rechargeable 9 V NiCd battery

To prevent damage to the instrument or wrong measurement results due to wrong A/C line voltage, connect the instrument to a power outlet only with the AC


power supply supplied by Fischer. The A/C line voltage must agree with the A/C line voltage rating on the serial number plate of the AC power supply.

To connect the instrument with the AC power supply to a power outlet, switch the instrument off and connect the AC power supply to the instrument and to power outlet. i If s appears in the display, the battery is discharged and needs to

be replaced or recharged!

Installing or replacing the battery:

1. Switch the instrument off using ON/OFF (if it isn’t off already).

2. Place the instrument with the back side facing up on a table. To open the battery compartment cover, insert the tip of a screwdriver into the slotted recess of the battery compartment cover and carefully push the screwdriver down (see figure 10.1). The cover will lift up on the side with the recess.

Figure 10.1: Open the battery compartment cover

! When handling the screwdriver take care not to injure yourself or other people with the screwdriver (e.g. because the screwdriver slipped at trying to open the battery compartment cover)!

3. Remove the battery compartment cover.

4. If an old battery has to be replaced, remove the old battery from the instrument and pull the battery connector clips from the contacts of the battery. Otherwise: Install the new battery as described in step 5.


i Exhausted or defective batteries are hazardous waste. Observe your local waste disposal ordinances!

5. Connect the new battery by snapping the battery connector clips onto the contacts of the new battery. The shape of the clips prevents connecting the battery in reverse polarity.

! Be careful not to touch the battery terminals to the battery connector clips with reverse polarity!

6. Put the battery back into its compartment.

7. Close the battery compartment cover. i Ensure that the battery clip wires are completely within the

compartment so that the compartment can be closed correctly.

11.3 Connecting or replacing a probe

To prevent damage to the connector pins of the probe receptacle do not rotate the probe connector in the probe receptacle.

To prevent electrical discharges, switch the instrument off before connecting or replacing a probe! Even small electrical discharges may delete internally stored data.

To prevent wrong connection of probe and instrument or damage to the pins of the probe connector, do not try to plug in the probe connector unless keyway and notch are properly aligned (see figure 10.2)!

Connecting or replacing a probe:

1. Switch the instrument off with ON/OFF (if it isn’t off already).

2. If the probe assigned to the instrument needs to be replaced, unscrew the knurled locking ring completely. Carefully pull the the probe connector from the probe receptacle of the instrument. If no probe is assigned to the instrument, continue with step 3.

3. Plug the probe connector of the new probe into the probe receptacle of the instrument (refer to figure 10.3).


To prevent wrong connection of probe and instrument or damage to the pins of the probe connector, do not try to plug in the probe connector unless keyway and notch are properly aligned (see figure 10.2)!

Figure 10.2: Probe connector and probe receptacle

4. To prevent unintentional turning of the probe connector, keep hold of the probe connector when tightening the knurled locking ring.

Figure 10.3: Orientation of the probe connector when plugging the probe connector into the probe receptacle Left: notch (connector) Right: keyway (receptacle)

To prevent damage to the connector pins of the probe receptacle turn only the knurled locking ring. Do not rotate the probe connector in the probe receptacle!

5. Switch the instrument on with ON/OFF.

The instrument recognizes automatically the type of probe assigned.


11.4 Opening the instrument or the accessories

The battery is the only user-serviceable part of the instruments DELTASCOPE® MP30E, ISOSCOPE® MP30E and DUALSCOPE® MP40E and the accessories. To prevent damages to the internal components, the instrument or the accessories should only be opened to replace the battery. Further servicing of the instrument or the accessories should only be performed by Fischer authorized service technicians.

11.5 Handling the probes In order to avoid breakage of the wiring, do not bend the connector cable! Radius of rolled cables should always be < 50 mm (2 ”).

Figure2.1: Minimum radius for probe connector cable When measuring, the probe tips are placed directly on the measuring object. To reduce probe tip wear, keep the following in mind: Place the probe rapidly, but gently on the surface of the measuring object! Avoid hard impacts! Do not drag the probe tip over the surface of the measuring object! Do not place standard probe on hot or acid-covered surfaces, do not immerse standard probes into liquids!Special probe types are available for these applications (see ”3.2 Probes”).


11.6 Handling, storing and transporting the calibration standards

Calibration standards in form of foils having various thicknesses are used to calibrate the measuring instruments DELTASCOPE® MP30E, ISOSCOPE® MP30E and DUALSCOPE® MP40E. The good condition of the calibration standards is an important requirement for an accurate calibration and therefore for correct measurements. To ensure the good condition of the calibration standards, keep the following in mind: To reduce the wear and tear of the calibration standards, the calibration standards should only be used for calibration purposes. Do not use them for test measurements! Do not soil, bend or scratch the calibration standards! Soiled, bent or scratched calibration standards or standards with deep gouges have to be replaced by new standards. Especially foils less than 50 µm (2 mils) thick are subject to rapid wear! We recommend no more than 100 or 200 measurements before replacing such foils. To protect the calibration standards from dirt or damage, keep, store and transport the standards in the supplied calibration standard case.

11.7 Warranty Fischer will not be responsible or honor any warranty claims for the following cases: • Disregard of this manual’s instructions • Instrument was not used for the intendend purpose • Non-recommended or unapproved accessories were connected • Repair or structural changes to the instrument or the accessories carried

out by unauthorized personnel • Improper handling of the instrument or accessories (such as operating in

explosion hazard zones, corrosive or excessively hot environments)


12 Instrument configuration Certain instrument settings, i.e. time and date, the unit of measurement or the control parameters of the RS232 interface, can be changed as required.

12.1 Acoustic measurement accept signal The acoustic measurement accept signal, i.e. the acoustic signal that sounds after each measurement, can be disabled. i The acoustic signals that sound after switching the instrument on,

after violation of the specification limits, after recognition of an outlier measurement or after automatic block formation (when measuring with fixed block size), cannot be disabled! Details about the acoustic signals: see "7.3.3 Measurement".

12.2 Enabling the measurement accept signal To enable the acoustic measurement accept signal after the instrument has been switched off, switch the instrument on using the key ON/OFF immediately followed by the key . The acoustic measurement accept signal remains enabled unless it will be disabled again. It is not necessary to enable the acoustic measurement accept signal each time, the instrument is switched on.

12.3 Disabling the measurement accept signal

Pressing the key immediately after switching the instrument on using ON/OFF will disable the acoustic measurement accept signal, i.e. the measurement accept signal will no longer sound from then on. The acoustic measurement accept signal remains disabled unless it will be enabled again. It is not necessary to disable the acoustic measurement accept signal each time, the instrument is switched on.


12.4 Setting the date and time Setting the date and time:


ON/OFF+ZERO With the instrument switched off, press ON/OFF + ZERO to start the setting procedure for date and time. Following the power-up selftest, the hour currently set appears automatically.

Use the arrow keys to set the hours.

ENTER Confirm the hour by pressing ENTER. The minutes currently set appear.

Use the arrow keys to set the minutes.

ENTER Confirm the minutes by pressing ENTER. The day currently set appears. The order, day, month and year appear


in, depends on the currently set date format. Setting the date format: see ""11.4.3 Instrument `Configuration`", beginning"

Use the arrow keys to set the day.

ENTER Confirm the day by pressing ENTER. The month currently set appears.

Use the arrow keys to set the month.

ENTER Confirm the month by pressing ENTER. The year currently set ap pears.

Use the arrow keys to set the year.

ENTER

Confirm the year by pressing ENTER. The instrument switches to measuring mode automati cally. The application used last for the assigned probe will be called.


Further explanations con cerning the display: see "`"4.1 Switching the Instru`ment ON and OFF"

i Another way to set the date and time is described in the

configuration programs see "11.4.3 Instrument Configuration"

12.5 Restricted operating mode With the restricted operating mode enabled, only those keys necessary for measurement and evaluation are active. This may prevent erroneous measurements due to unintentional changes to the instrument parameters. With the restricted operating mode enabled, the following keys are deactivated: • ZERO • CAL • MENU

Pressing these keys will not trigger any action, the display will not change. In addition, it is not possible to call-up the configuration programs, to create, overwrite or delete applications!


12.5.1 Enabling and disabling the restricted operating mode To enable the restricted operating mode with the instrument switched off, switch the instrument on using the key ON/OFF immediately followed by the key DEL. i As long as the restricted operating mode is enabled,

e appears in the display.

The restricted operating mode remains enabled unless it will be disabled. It is not necessary to enable the restricted operating mode each time, the instrument is switched on. Pressing the key ENTER immediately after switching the instrument on using the key ON/OFF will disable the restricted operating mode again.

12.6 Configuration programs To change the parameters defined in the configuration programs, you need to call-up the configuration programs, select the desired configuration program by pressing the corresponding key, step through the individual parameter positions by pressing ENTER, and make the changes where desired. Using the arrow keys, the parameters can be changed. i As long as the restricted operating mode is enabled (indicated

by e in the display), it is not possible to call-up the configuration programs!


Call-up the configuration programs:

Keys Explanation

10 x ENTER Call-up the configuration programs by pressing ENTER 10 times (with the instrument switched on). [157] appears in the display.

2 x Set the display by pressing to [159]

ENTER Confirm with ENTER. [FrEE] appears in the display. The desired configuration program can be selected by pressing the corresponding key.

i As long as the configuration programs are called-up, t appears in

the display.

i The following description of the configuration programs is based on the assumption that the configuration programs are called-up and have not yet been exited.

Exit the configuration programs:

Keys Explanation DEL If [FrEE] appears in the display, the

configuration programs can be exited by pressing DEL. The instrument is ready to measure again.

Figure 11.1: Configuration programs (overview)


12.6.1 Configuration program FINAL-RES (storage mode and auto switch-off mode)

Keys Explanation

FINAL-RES Select the configuration program FINAL-RES by pressing FINAL-RES. Select the desired storage mode by pressing or [Storage mode store]: measurements are stored (and remain stored when switching the instrument off) [Storage mode do not store]: measurements are displayed, but not stored [Storage mode delete at off]: all measurements are deleted when switching the instrument off

ENTER Confirm the selection with ENTER. Select the desired auto switch-off mode by pressing or : [Auto. switch off On]: the instrument switches itself off, if no measurement is taken and no key is pressed for approximately three minutes (auto switch-off mode enabled) [Auto. switch off Off]: the instrument does not switch itself off (auto switch-off mode disabled)


12.6.2 Configuration program BLOCK-RES (histogram mode and block result mode)

Keys Explanation

BLOCK-RES Select the configuration program BLOCK-RES by pressing BLOCK-RES. Select the desired histogram mode with or : [Histogram On]: when printing the final result the histogram will be printed as well [Histogram Off]: when printing the final result the histogram will not be printed

ENTER Confirm the selection with ENTER. Select the block result mode by pressing or : [Block result short]: when printing the block result the short block result will be printed [Block result long]: when printing the block result the long block result will be printed


12.6.3 Configuration program ZERO (unit of measurement, date format, time, date, language, display mode, measurement accept, external start mode and delay)

Keys Explanation

ZERO Select the configuration program ZERO by pressing ZERO. Select the desired unit of measurement for the current application (and for every application to be created in future) by pressing or : (the setting of the unit of measurement of already existing applications remains unchanged): When changing the unit of measurement the normalization and corrective calibration of the current application will be deleted. A new normalization or corrective calibration has to be performed if required after changing the unit of measurement.

i When creating new applications, the measurements of these newly created applications will be displayed in the unit of measurement which is selected in the configuration program ZERO

ENTER Confirm the selection with ENTER (and delete the measurements by pressing DEL if required to select another unit of measurement). Select the desired date format by pressing or : [Date format european]: dd.mm.yy date format

[Date format USA]: mm.dd.yy date format


ENTER Confirm the selection with ENTER. Set the hours by pressing or : [Time hours]: hours

ENTER Confirm the selection with ENTER. Set the minutes by pressing or : [Time minutes]: minutes

ENTER Confirm the selection with ENTER. The order, day, month and year appear in, depends on the previously set date format. Set the day by pressing or : [Date day]: day

ENTER Confirm the selection with ENTER. Set the month by pressing or : [Date month]: month

ENTER Confirm the selection with ENTER. Set the year by pressing or : [Date year]: year

ENTER Confirm the selection with ENTER. Select the language for prompt lines and printouts by pressing or : [Language deutsch]: German [Language english]: English [Language français]: French [Language italiano]: Italian [Language español]: Spanish

ENTER Confirm the selection with ENTER. Select the display mode of the current


application by pressing or : (the setting of the display mode of the other applications remains unchanged (display mo des (overview): see ""5.6.6 `Applications`" [Appl: 5 Display Count rate ]: in addition to the first four figures of the probe output signal all figures of the probe output signal will be displayed [Appl: 5 Display norm. Count rate ]: the normalized probe output signal of the measurement will be displayed

ENTER Confirm the selection with ENTER (and delete the measurements by pressing DEL if required to select another display mode). Select the desired measuring signal with or : [Meas. signal On]: measuring signal enabled, i. e. the measurement will be accepted automatically when the probe is placed on the measuring object (automatic measurement accept enabled) [Meas. signal Off]: measuring signal disabled, i. e. the measurement will not be accepted automatically when the probe is placed on the measuring object (automatic measurement accept disabled)

ENTER Confirm the selection with ENTER. Select the desired external start mode by pressing or : [External start Off]: external start disabled [External start On]: external start enabled, i. e. the measurement accept can be initiated by


pressing (or FINAL-RES during normalization or calibration) The combination [Meas. signal Off] and [External start Off] is not allowed, since measurement accept is not possible with this setting. The parameters are reset to [Meas. signal On] and [External start Off] if this combination is selected.

ENTER Confirm the selection with ENTER. Set the displayed measurement accept pause to the pause desired after initiation of the external start (= delay) by pressing or : [Delay 0 ms]: no pause after initiation of the external start [Delay 100 ms]: 100 ms pause ... [Delay 2500 ms]: 2500 ms pause


12.6.4 Configuration program CAL (master calibration) During a master calibration the coefficients of the master calibration are computed and stored in the EEPROM memory chip of the probe connector. These coefficients define the relationship between probe signal and ferrite content. A master calibration requires a specific set of calibration standards (master set). i A master calibration should only be performed by

Fischer authorized service technicians!

Keys Explanation CAL Select the configuration program CAL by

pressing CAL. Perform the master calibration with assigned probe.

12.6.5 Configuration program (re-initialization) Re-initialization: Restoring the default factory settings of the instrument. i When re-initializing the instrument, all applications will be

deleted, i. e. all measurements stored, all normalizations and corrective calibrations of all applications will be deleted! The applications have to be created again if required after re-initialization.

i In addition, all settings of the configuration programs are reset to the default factory settings as well. The parameters have to be changed again if required.


Keys Explanation Select the configuration program by pressing

[Initialize unit? Yes: DEL No: ENTER]: press DEL to re-initialize the instrument, or press ENTER to exit without re-initializing

DEL Press DEL only if the re-initialization is indeed desired. The re-initialization will be performed automatically.

12.6.6 Configuration Program (parameters of the RS232 interface)

Keys Explanation

Select the configuration program by pressing . Select the desired baud rate by pressing or : [Baud rate 9600] ... [Baud rate 300]: baud rate: 9600 ... 300

ENTER Confirm the selection with ENTER. Select the desired parity by pressing or [Parity none]: no parity [Parity even]: even parity [Parity odd]: odd parity

ENTER Confirm the selection with ENTER. Select the desired word length by pressing or : [Word length 8 Bits]: word length: 8 bit [Word length 7 Bits]: word length: 7 bit


ENTER Confirm the selection with ENTER. Select the desired number of stop bits by pressing or : [Stop bits 1 Bit]: number of stop bits: 1 [Stop bits 2 Bits]: number of stop bits: 2

ENTER Confirm the selection with ENTER. Select the desired handshake by pressing or : [Handshake Hardware RTS/CTS]: hardware handshake [Handshake none]: no handshake [Handshake Xon/Xoff]: Xon/Xoff handshake

ENTER Confirm the selection with ENTER. Select the desired transmit pause (= pause before sending the next measurement to the RS232 interface) by pressing or : [Transmit pause 0 ms]: measurements will be sent without pause ... [Transmit pause 8000 ms]: 8000 ms before sending the next measurement

ENTER Confirm the selection with ENTER. Select the type of data to be sent to the RS232 interface by pressing or : [Output to port Single meas.]: single readings [Output to port Block mean values]: block mean values

ENTER Confirm the selection with ENTER. Enable or disable the group separator with or : [Group separator On]: a group separator will be sent between the


single blocks when transferring the data via the RS232 inter face [Group separator Off]: no group separator will be sent between the single blocks when transferring the data via the RS232 inter face

ENTER Confirm the selection with ENTER. Select the desired “continuous” transfer mode by pressing or : [Send in free ? Off]: measurements taken with “continuous” display mode enabled will not be sent to the RS232 interface [Send in free ? On]: measurements taken with “continuous” display mode enabled will be sent to the RS232 interface

12.6.7 Configuration program APPL No (application linking mode and measuring mode)

Keys Explanation

APPL No Select the configuration program APPL No by pressing APPL No. Select the desired application linking mode by pressing or : [Link appl. ? Off]: applications are not linked (application linking mode disabled)


[Link appl. ? On]: all applications created with the same probe are linked (application linking mode enabled)) As long as the application linking mode is enabled, v will be displayed.

To ensure that the linked applications use the same normalization and corrective calibration, perform a normalization and corrective calibration in one of these linked applications after enabling the linking mode with every probe used to create more than one application!

ENTER Confirm the selection with ENTER. Select the desired measuring mode with or : [Matrix mode: {} Off]: standard measuring mode enabled [Matrix mode: {} On (20/40/17)]: matrix measuring mode enabled [(20/40/17)]: 20 applications with 40 blocks of 17 measurements each (the numbers are examples only!) The instrument will be re-initialized automatically when changing the measuring mode. [Initialize unit? Yes: DEL No: ENTER]: press DEL to re-initialize, or press ENTER to exit without re-initialization.


Following the re-initialization the number of applications and the number of block has to be entered when switching to the matrix measuring mode [number of fixed applications] [No. of blocks per application: {}]. With that the maximum number of measurements that can be stored in a block is fixed. As long as the matrix measuring mode is enabled, m will be displayed.

The number of applications and blocks cannot be changed again afterwards without re-initializating the instrument.

When re-initializing the instrument, all applications will be deleted, i.e. all measurements stored, all normalizations and corrective calibrations of all applications will be deleted!

The applications have to be created again if required after re-initialization!

12.6.8 Configuration program PRINT (Printer)

Keys Explanation

PRINT

Select the configuration program PRINT by pressing PRINT.


Select the desired printer with or : [Printer FMP3-EPSON P40S]: printer Epson P40S [Printer DPU 411]: printer Seiko DPU 411 [Printer Kyosha-Kyoline]: printer Kyosha Kyoline [Printer With HW hndshk]: Epson-compatible serial printer with hardware handshake [Printer no HW handshake]: Epson-compatible serial printer without hardware handshake

ENTER Confirm the selection with ENTER. Select the desired left margin for the printout by pressing or . This option is displayed only if [Printer With HW hndshk] or [Printer no HW handshake] has been selected before: [left margin]: width of the left margin

ENTER Confirm the selection with ENTER. Press or to select whether single readings are printed immediately after measurement accept or when printing the block result: [Print sgl. meas. On]: single readings will be printed immediately after measurement accept [Print sgl. meas Off]: single readings will not be printed until the block result is called-up


12.6.9 Record of the instrument status Printing the record of the instrument status:

Keys Explanation

ENTER With the configurations programs called-up and with [FrEE] being displayed, the record of the instrument status can be printed by pressing ENTER (see figure 11.2). The configuration programs will be exited automatically and the instrument is ready to measure again.

i A record of the instrument status without probe-specific data

can be printed by pressing PRINT immediately after switching the instrument on with ON/OFF. Another way to print the record of the instrument status is to press MENU+ PRINT with the instrument switched on.

Displaying the record of the instrument status:

Keys Explanation

MENU + PRINT With the instrument switched on call-up the display by pressing MENU + PRINT. If no printer is connected, [Software version] will be displayed in the prompt lines. With a printer connected and switched on, the record of the instrument status will be printed

,..., Display the next information by pressing . All parameters can be displayed by pressing repeatedly.


The instrument is ready to use again when all parameters have been printed or displayed.

i The procedure after pressing MENU may be terminated at any time by pressing MENU again or by performing a measurement.

Figure 11.2: Record of the instrument status with probe-specific data (example)


13 Errors

Error Possible cause Solution No display Instrument not switched on

or instrument switched itself off automatically (battery save feature for operation without AC power supply) Battery discharged (when operating without AC power supply)

Switch on the instrument with ON/OFF Replace the battery or connect the AC power supply

No results displayed after pressing FINAL-RES

No data stored in the application (e.g. because the data were deleted)

Perform measurements

No results displayed after pressing BLOCK-RES

No data stored in the application (e.g. because the data were deleted)

Perform measurements

No change of the display after pres sing ZERO, CAL or MENU

Restricted operating mode enabled

With the instrument switched off disable the restricted operating mode with ON/OFF + ENTER

Applications can not be created, overwritten or dele ted



Configuration programs cannot be called-up



Probe does not measure

Wrong probe assigned (application was created with another probe) or [%] flashes in the display) Automatic measurement accept disabled

Connect the proper probe Enable automatic measurement accept in the con figuration program


Probe defective

ZERO orinitiate measurement accept with external start by pressing the key (or FINAL-RES when normalizing or calibrating)

Replace probe

Erroneous measurements

Measurement is influenced by the curvature of the measuring object, distance of the measuring position to the edge, thickness of the measuring object or by the layer thickness Erroneous normalization or calibration

Multiply the measured ferrite content with the corresponding correction factor Perform the normalization or calibration correctly

Erroneous measurements

Probe not placed correctly on the measuring object (e.g probe hovers above the specimen) Selected application is unsuitable for this specimen Wrong input power voltage caused by connection of the wrong AC power supply (e. g. AC power supply with 220V instead of 110 V) Probe tip worn

Place probe correctly on the measuring object Select the proper application with APPL No Connect the proper AC power supply Have probe tips replaced by the Fischer service department

Printer prints hieroglyphics

Wrong printer selected (configuration programs)

Select the proper printer in the configuration program PRINT

No histogram has been printed

Not enough measurements stored in the evaluated application (at least 10 measurements are required to print the histogram) Histogram disabled in the

Perform more measurements Enable histogram in the


configuration program BLOCK-RES

configuration program BLOCK-RES

Block result is not printed after pressing BLOCK-RES

Matrix measuring mode enabled (block result will not be printed automatically with matrix measuring mode enabled)

Press PRINT to print the block result

Printer does not print

Printer not switched on or not assigned to the instrument Printer battery discharged and printer not connected to a power outlet Wrong printer selected (configuration programs) Configuration of the printer interface does not correspond to the control parameters of the RS232 interface of the instrument (wrong baud rate, parity, word length, ...) Wrong printer cable used Printer or printer cable defective

Switch on the printer or connect the printer to the instrument Charge the printer battery or connect the printer to a power outlet Select the proper printer in the configuration program PRINT Bring the interface configuration of printer and instrument into line Use the proper printer cable Replace printer or printer cable


14 Display Messages The display messages, error messages (E***) and warnings (U***), that may occur during operation of the instrument, are included in the overview on the following pages.

Display message

Explanation/ possible cause

Solution

Measurement cannot be displayed (since the value is larger than 9999 or smaller than -9999) Cause: measurement was not performed correctly

Perform the measurement correctly (e.g. do not hover with the probe over the measuring object before or after the measurement)

Histogram has not been printed since less than 10 measurements are stored in the evaluated application

Perform more measurements

Internal error Switch the instrument off and on again with ON/OFF If the error occurs repeatedly, call the Fischer ser vice department

Overflow of the internal application memory

Delete the measurements stored in the applications ordelete an entire application

Measurement cannot be displayed since it is out of the measuring range of the assigned probe Cause: measurement was not performed cor rectly

Perform the measurement correctly (e. g. do not ho ver with the probe over the measuring object before or after the measurement)

Outlier measurement was recognized during norma lization or calibration Cause: measurement on the calibration standard was not performed cor rectly

Repeat the calibration step and perform the measure ments correctly (e.g. do not hover with the probe over the measuring object before or after the measu rement).


Cause: measurements were performed on the wrong calibration stan dard (e.g. one measurement was performed on the Base instead of the calibration standard)

Repeat the calibration step and perform the measure ments on the proper calib ration standard

The assigned probe is not suitable (the test method of the assigned probe does not correspond to the instrument model, e. g. an Eddy current probe is assigned to an ISOSCOPE® MP30E). Probe defective

Connect a suitable probe. Replace probe.

Corrective calibration cannot be terminated. Cause: measurement was not performed cor rectly Cause: the thickness of the calibration standards used is not suitable or the calibration stan dards are defective Cause: normalization was performed on a calibration standard instead of the Base

Repeat the corrective cali bration and perform the measurements correctly (e.g. do not hover with the probe over the measuring object before or after the measurement) Repeat the corrective calibration with proper calibration standards Repeat the corrective calibration and perform the normalization on the Base

Calibration standards were measured in the wrong sequence during corrective calibration (standard 1 was interchanged with standard 2) and the thickness were not set cor respondingly

Repeat the corrective calibration and measure the calibration standards in the correct sequence

Master calibration cannot be terminated Cause: measurement was not performed correctly

Repeat the master calibra tion and perform the measurements correctly (e. g. do not hover with the


Cause: the thickness of the calibration stan dards used is not suitable or the calibration standards are defective Cause: normalization wasperformed on a calibration standard instead of the base

probe over the measuring object before or after the measurement) Repeat the master calibra -tion with proper calibration standards Repeat the master calibration and perform the normalization on the Base

Internal error: the coeffi cients of the master calib ration curve cannot be calculated (the previous master calibration curve will not be changed)

Repeat the master calibra tion If the error occurs repea tedly, call the Fischer service department

Master calibration para-meters cannot be stored Cause: the probe connec tor is not plugged correct ly into the receptacle or the locking ring was not tightened Cause: probe defective

Plug-in the probe correctly, tighten the lockingring and repeat the master calibration Replace the probe and re peat the master calibration if required

The ferrite contents stored and the Ferrite Contents measured do not match Cause: calibration stan dards were measured in thewrong sequence during master calibration (e.g. standard 1 was inter changed with standard 2) and the thickness were not set correspon dingly

Repeat the master calibration and measure the calibration standards in the correct sequence

When measuring with fixed block size, the block result

Perform measurements until the first block will be closed


cannot be called-up if the first block of the eva luated application has not yet been closed

and call-up the block result again

Corrective calibration is not possible with the ente red ferrite content (e.g.be cause [Cal.Std. 2: 0] has been entered)

Set the ferrite content of the calibration standard used and continue the cor rective calibration

No probe is assigned Probe was not assigned correctly Probe defective

Connect a probe Connect the probe correctly Replace probe

When overwriting an ap plication, the stored measurements can be kept only, if the test me thod of the assigned pro be is the same as the test method of the probe the application was created with

Delete the measurements when overwriting an appli cation or create a new ap plication with the assigned probe

The next measurement cannot be stored in this block since this block was closed (occurs only with matrix measuring mode enabled)

Select another block with BLOCK-RES and the ar row keys

Internal error Delete the application and transfer the measure mentsvia the RS232 interface [Delete Appl. ? Yes: DEL No: ENTER]: press DEL to delete the application [Meas. to port ? Yes: DEL No: ENTER]: press DEL to transfer the measurements via the


RS232 interface to the printer or external compu ter

Measurements cannot be computed since no nor malization has been per formed with the assigned probe after enabling the application linking mode

Perform a normalization with the assigned probe

Measurements cannot be computed since no cor rective calibration has be en performed with the assigned probe after en abling the application lin king mode

Perform a corrective calib ration with the assigned probe

Internal error Call the Fischer service department

An additional block can not be formed since the maximum number of 1,000 blocks has been formed

Delete the measurements stored in the applications ordelete an entire applicati on

Printer not switched on Printer off line Printer not connected to the instrument Wrong printer selected (configuration programs)

Switch the printer on and repeat the print command Switch the printer on line and repeat the print com mand. Connect the printer to the instrument and repeat the print command Select the proper printer in the configuration program PRINT and repeat the print command

Erroneous settings were corrected automatically by the instrument

An action was canceled (e. g. a corrective calibra tion was canceled with ENTER)

Repeat the action if required

The difference of the thickness of the two cali bration standards the

Perform the corrective cali bration with suitable stan dards (the difference


corrective calibration was performed with, is not large enough (will be treated as one-point calibration)

between the normalized probe output signals of the standards has to be larger than 0.1: Xn Cal. Std 2 - Xn Cal. Std 1 = DXn > 0.1

17 Glossary of terms and symbols

This chapter explains the most common terms and symbols in ferrite content measurement and related fields (e. g. quality assurance). In some cases, alter-nate terms or synonyms are mentioned in parentheses.

χ2 testsee term "Chi squared test (c2 test)" on page 195

AccuracyDifference between the average result of a measurement with a particular in-strument and the true value of the quantity being measured. Usually, accuracy is divided into -> Trueness and -> Precision.

Figure 16.1: Accuracy

AC power supplyThe ...SCOPE® MP*0E can be connected to a power outlet with the AC po-wer supply.

ApplicationMeasurement application of the user.

ApplicationIn the use of ferrite content measurement instruments, the application memo-ry is the memory that stores the instrument characteristic and the single measurements for a particular measurement application. In addition, the application-specific settings are stored in the applications. Up to 100 different applications can be created in the ...SCOPE® MP*0E.

Operator’s manual MP30E and MP40E (5.1 - 07/06) Page 191

It is recommended that the user create a list of application memories (e.g. in form of a table) and their uses and probes, which were used to create the ap-plication.

Attributive featuressee term "Features" on page 198

B (Bit)see term "Bit (Binary Digit)" on page 192

BaseComponent of the calibration standard set. The Base is used for normalization and corrective calibration of the ...SCOPE® MP*0E. See see term "Calibration standards" on page 18

BaudUnit of speed for transferring information via a serial port. 1 baud corresponds to a data transfer rate of 1 bit per second.

Baud rateData transfer rate. Used mainly in connection with terminal programs for se-rial data transfer. Since data are transferred via a serial port, the transfer rate is calculated in bits per second.

Bd (Baud)see term "Baud" on page 192

Bidirectional data exchangeData can be sent to and received from both participants (for example from in-strument to computer and from computer to instrument).

Bit (Binary Digit)Binary number. 1 bit is the smallest unit in the binary number system. The value of a bit is either 0 or 1. Being the smallest unit of information in a computer, a bit forms the basis of every computer system. 8 bits are combined to a byte, or several bytes to a word.

Page 192 Operator’s manual MP30E and MP40E (5.1 - 07/06)

BlockSeveral measurements can be combined into a block. A closed block is indi-cated by k in the display. A block can only be closed by pressing the key BLOCK-RES or FINAL-RES followed by ENTER (or a measurement).

Block mean valueMean value of the measurements combined into a block.see term "Fe.." on page 216.

Block resultAfter pressing BLOCK-RES the measurements will be combined into a block and the results of the evaluation of the current block (e. g. mean value and standard deviation of the measurements combined into this block) will be displayed or printed.

Block sizeNumber of measurements that are combined into a block.

Calibration curve (characteristic)Quantitative relationship between the probe signal and a function of the fer-rite content as defined by calibration standards.The mid portion of the calibration curve (see figures 16.2 and 16.3) approa-ches a straight line. This is the range with the smallest relative measurement error. As long as no normalization or corrective calibration has been perfor-med, the calibration curve is identical with the master calibration curve. During normalization or corrective calibration the calibration curve is adjus-ted to the individual measurement application and the coefficients of the nor-malization or corrective calibration are stored in the current application.


Figure 16.3: Calibration curve (coating thickness as a function of the countrate)

Figure 16.3: Calibration curve (coating thickness as a function of the normalized coun-trate)

Calibration standardsObjects with the same attributes (or as close as possible) as the measuring ob-ject with known coating thickness. The coating thickness of the calibration standards has been measured with an extremely accurate test method.

The coating thickness is displayed in dependence of the countrate X as calibration curve.

X = X0 -> Uncoated specimen

X = Xs -> Specimen with at least saturation thickness

The coating thickness is displayed in dependence of the normalized coun-trate Xn as calibration curve.

Xn = 0 -> Uncoated specimen

Xn = 1 -> Specimen with at least saturation thickness


Carriage return (CR)Character of the ASCII character set with the following function: when data or commands are entered, the line one is currently working on will be closed by pressing the CR key (Enter or Return key); the information entered will be processed accordingly. The cursor is again placed at the beginning of the line. It is usually used toge-ther with the LF (Line Feed) character to start the next line at the beginning.

Characteristicsee term "Calibration curve (characteristic)" on page 193.

Chi squared test (χ2 test)Test used to determine whether the evaluated measurements are normal dis-tributed (Normal distribution). This test is performed when calling-up the fi-nal result of more than 40 measurements with the ...SCOPE® MP*0E.

ClassRange between a lower and an upper class boundary (e. g. ferrite content li-mits). The single readings of a measurement series can be sorted according to classes of equal width which cover the entire range of the measurement series. The number of measurements per class plotted for each class is called a his-togram.

Coefficient of variationabreviated: C.O.V.

Comparative samplesee term "Reference sample" on page 210

Confidence levelsee term "u" on page 217

“Continuous” display modeWith the probe placed on the measuring object, measurements will be dis-played continuously. Will be indicated by p in the display of the measuring instrument.

Control chartsee term "Process control chart (SPC chart, quality control chart)" on page 209


Control limitsIf the measurements are entered in a process control chart, there is no need for process control measures, if the measured quantity lies within the range defi-ned by control limits.

Corrective calibrationAdjustment of the instrument using a Base and one or two calibration stan-dards. The corrective calibration includes calibration and adjustment.During corrective calibration the calibration curve is adjusted to the individu-al measurement application, the current application is calibrated for. The coefficients of the adjusted calibration curve are stored in the current ap-plication. The coefficients of the master calibration curve, which are stored in the EEPROM of the probe connector, remain unchanged.

CountrateDigitized form of the measurement signal, which is proportional to the coa-ting thickness. The measurement signal is produced in the probe by the coa-ting to be measured. The larger the coating thickness is, the larger is the coun-trate. see term "Calibration curve (characteristic)" on page 193The numeric values of the normalized countrate Xn range between 0 and 1, and are calculated according to the following equation:

with:

X count rate measured on the coated measuring object

XBase: countrate measured on the Base of the calibration standard set

Xs: countrate measured on a measuring object with coating thickness = 0

C.O.V. (Coefficient of Variation)Also known as relative standard deviation. It is a measure of variation of a measurement series expressed in percentage points. For many coating proces-ses, C.O.V. [%] is a characteristic process constant. A change in a parameter during the coating process can alter C.O.V. [%] significantly; thus, a sudden change of indicates a change in the process conditions.

Xn

X XBase–

Xs XBase–-------------------------=


Cpsee term "Process capability index" on page 208

CpkProcess capability index

CR (Carriage Return)see term "Carriage return (CR)" on page 195

Cumulative frequency distributionA form of display of the measurement data distribution, such that the number of measurements smaller or equal to a particular measurement is calculated and displayed in percent.

Cumulative frequency distribution chartsee term "Normal probability chart (Gaussian probability paper, cumulative frequency distribution chart, probability paper)" on page 206

CurvatureExcess and Kurtosis are measures for the curvature (e. g. how pointed or how wide) of a distribution compared to a normal distribution. A positive Kurtosis indicates a relatively narrow, pointed distribution; a negative Kurtosis indica-tes a relatively flat distribution. The Kurtosis of a normal distribution is Zero. When evaluating the current application with the measuring instrument, the excess will be calculated and printed after “Kurtosis”.

Data transfer ratesee term "Baud rate" on page 192

Dip switch (Dual inline package switch)Electronic component ready to be installed. In this case, a series of little swit-ches. They are often used in peripheral devices, i. e., in printers, to change the basic settings of the device.

DisplayThe display of the measuring instrument is large, neatly arranged and inclu-des a multitude of symbols to indicate the instrument status and prompts to guide the user.


Figure 16.5: Display of the measuring instrument

EEPROM (Electrically Erasable Programmable Read Only Memory)Advanced EPROM.

EvaluationCalculation of statistical parameters, e. g. mean value or standard deviation, with graphic output on the connected printer if required. The evaluation can be called-up with the keys BLOCK-RES and FINAL-RES. - BLOCK-RES will start the display of the block result, - FINAL-RES will start the display of the final result.

Excesssee term "Curvature" on page 197

External startWith external start enabled, measurement accept can be initiated by pressing the key � or by sending the command G0 (G Zero) from an external compu-ter.

FeaturesProperties of a product. Variable features are the measurable properties of a product subject to change or variability. Ferrite content is a variable feature. Attributive features are the properties of a product that usually cannot be cap-tured by taking measurements. Examples are, deviations in color, or whether the product is true to gauge size.

Ferrite standardssee term "Calibration standards" on page 194

Final result


Evaluation of all measurements stored in the current applications. The results of this evaluation (e.g. mean value and standard deviation) will be displayed or printed after pressing FINAL-RES.

Frequency distributionsee term "Histogram (frequency distribution)" on page 199

Gaussian distributionsee term "Normal distribution (Gaussian normal distribution, Gaussian distri-bution)" on page 204

Gaussian normal distributionsee term "Normal distribution (Gaussian normal distribution, Gaussian distri-bution)" on page 204

Gaussian probability papersee term "Normal probability chart (Gaussian probability paper, cumulative frequency distribution chart, probability paper)" on page 206

Group separatorThe end of a block can be marked with a group separator. The group separator can be transferred with the measurement data to the external computer.

Grubbs testMethod for outlier rejection. see term "Outlier rejection" on page 207.

Histogram (frequency distribution)Graphic representation of the single readings of a measurement series by clas-ses (coating thickness ranges) of equal width. The degree to which a statistical result is meaningful depends, among other things, on this distribution. When evaluating the current application, the histogram of the coating thickness measurement values will be printed as follows:


Figure 16.6: Printout of a histogram (example)

InterfaceTransfer and connecting point between components, circuits or programs. Interfaces are used for data transfer. Using a serial interface, the data are transferred bit by bit. Using a parallel interface, the data are transferred by sending several bits simultaneously.

Kolmogorov Smirnov testTest, which is performed when evaluating the current application with the measuring instrument, to determine whether the evaluated measurements can be classified as having normal distribution (if up to 40 measurements are to be evaluated).

Kurtosissee term "Curvature" on page 197

Largest measurementsee term "Maximum measurement" on page 202

LF (Line Feed)see term "Line Feed (LF)" on page 201

Limitssee term "Specification limits (LSL and USL)" on page 214


Line Feed (LF)Advances the printer paper by one line. It is usually used together with the CR (Carriage Return) character to start the next line at the beginning.

Local ferrite contentThe local ferrite content is the arithmetic mean value of the single measure-ments performed on the reference area.

LSL (Lower Specification Limit)see term "Specification limits (LSL and USL)" on page 214

Master calibrationAdjustment of the instrument using a Base and calibration standards. During a master calibration, the master calibration curve is determined. The master calibration includes calibration and adjustment.


Master calibration curve (probe characteristic)Characteristic of the measuring system (see -> Calibration curve)The master calibration curve is determined during master calibration on the Base and calibration standards. It is the basis for determination of the measu-rement values, since it represents the relationship between the coating thick-ness and the probe signal. The coefficients of the master calibration curve are stored in the EEPROM of the probe connector.

Maximum measurementLargest measurement of a measurement series.

Mean valuesee term "Fe." on page 185

MeasurementNumeric reading of an instrument, expressed in the unit of measurement.The measurement can be obtained as the result of a single measurement or as arithmetic mean of several single measurements (e. g. when measuring with “mean reading” mode enabled).

Measurement accuracysee term "Accuracy" on page 191

Measurement applicationStructure of the measuring object according to material, thickness and other properties (hard/soft, porous/dense, homogenous/inhomogenous, etc.) and any other conditions relevant to the measurement requirement. These factors determine the selection of a suitable test method and the instrument.

Measurement blocksee term "Block" on page 193

Measurement errorsThe difference between the actual and measured value of a measured quanti-ty. For measuring instruments there is a distinction between random (unpredictable) and systematic (correctable) errors. Random errors determine the repeatability precision. Systematic (bias) errors affect the trueness and the reproducibility. Systematic errors are far more prevalent in practical coating thickness measu-rement applications (see / 7 / for further details).


Systematic (bias) errors can be traced back to:

� faulty calibration,

� operator related errors, or

� changes in test conditions (inhomogeneities of the substrate, aging, etc.).

Systematic (bias) errors tend to lean in one direction. With appropriate care, causes 1 and 2 can usually be avoided or corrected. Causes of the third kind can sometimes be eliminated by using an appropriate correction technique.

Measurement rangesee term "Measuring range" on page 204

Measurement seriesA series of single measurements made between two block or final results.Measurement system check: A significant part of monitoring the test equip-ment. Calibration standards or, even better, reference samples, are used to check the calibration and to verify the stability of the instrument.

Measurement uncertaintysee term "u" on page 217

Measuring- Measuring is comparing - The probe signal generated at the measuring position is compared to the probe signal of the calibration standard. Using the calibration curve, the instrument converts the probe signal to the measurement result.

Measuring methodsee term "Test method" on page 216

Measuring object = specimenObject on which the measurements are to be performed to determine the coating thickness for example.

Measuring positionA limited and clearly defined point within the reference surface of the measu-ring object where the coating thickness is to be determined. Detailed information is included in / 8 /.


Measuring probesee term "Probe" on page 207

Measuring rangeThe range between the two limits within which a measurement is possible at a specified trueness and precision. In a narrower sense, it refers to the range of an analog instrument. The measuring range depends on the test method, the design of the probe, and the measurement application.

MemoryData storage element of a microprocessor-based measuring instrument. Information is saved in the memory. see term "Application" on page 191.

Methodsee term "Test method" on page 216

Minimum measurementSmallest measurement of a measurement series.

Monitoring of test equipmentA quality assurance task. It consists of ensuring that the measuring system (instrument) is operating properly and is still calibrated correctly, and to take corrective measures, if necessary (re-calibration of instrument or repair). See -> Measurement system check.

Normal distribution (Gaussian normal distribution, Gaussian distribution)Probability distribution, discovered by C. F. Gauß in 1794. If a quantity X can be classified as having normal distribution, 68.3 % of the observed values of X are within the σ-interval (σ - deviation) around the mean value µ of the quantity X, i. e. the following is valid for 68.3 % of the observed values: µ-σ ≤ X ≤ µ+σ. This interval is indicated in figure 16.7 by the grey area below the curve.


Figure 16.7: Probability distribution P(X) of a quantity X, which can be classified as ha-ving normal distribution

The probability distribution P(X) is symmetrical around the mean value µ of the quantity X, which can be classified as having normal distribution. Skewness and curvature are zero for the normal distribution. The populations, which are tested for technical purposes, often can be classi-fied as having approximately normal distribution.

However, the following fact is of great importance: if several random samples with equal size are drawn of a population, and the mean values of these ran-dom samples are determined, these mean values can be classified as having normal distribution (Central Limits Theorem).

The mean value of these sample mean values is an estimated value for the mean value µ of the population. The uncertainty of measurement u can be de-termined using the standard deviation of the sample mean values (since the sample mean values can be classified as having normal distribution) (see term "u" on page 217) Whether a quantity can be classified as having normal dis-tribution can be checked in the normal probability chart, since a straight line in the normal probability chart indicates normal distribution.

When evaluating the current application with the measuring instrument, a Kolmogorov-Smirnov test is performed for small random samples (up to 40 measurements) and a χ2 test is performed for large random samples (more than 40 measurements) to check whether the measurements can be classified as having normal distribution.


NormalizationAdjusting a measuring instrument to a new zero value. Important for some applications when the substrate changes, or when the test method is subject to instability (e. g. to drift) (e.g. for beta backscatter and X-ray fluorescence methods). During normalization the calibration curve is adjusted to the individual measurement application, the current application is calibrated for. The coefficients of the adjusted calibration curve are stored in the current application. The coefficients of the master calibration curve, which are stored in the EEPROM of the probe connector, remain unchanged.

Normalized countratesee term "Countrate" on page 196

Normalized probe output signalsee term "Countrate" on page 196

Normal probability chart (Gaussian probability paper, cumulative frequency distribution chart, probability paper)Can be used to check graphically for normal distribution of the measure-ments. A straight line in the normal probability chart indicates normal distribution.

Off lineStatus of a peripheral device, for instance a printer or a computer, that does not allow it to receive data.

One-point calibrationsee term "Corrective calibration" on page 196

On lineReady condition of a peripheral device, for instance a printer or a computer, that allows it to receive data. The connected instrument is ready for operation then.

Outlier measurementsMeasurements that are considerable larger or considerable smaller than the other measurements of the measurement series and therefore can be conside-red as unexpected or unacceptable.With outlier rejection enabled, recognized outlier measurements will be indicated by two short acoustic signals immedi-ately after measurement accept and the simultaneous appearing of d and u in


the display.

Outlier rejectionIs used to prevent the distortion of the measurement results by outlier measu-rements. With the measuring instrument, outlier rejection can be enabled or disabled. Measurements recognized as outliers will not be included in the evaluation. Two methods are available for outlier rejection:

� Grubbs test

� Sigma outlier rejection (entry of a known standard deviation)

ParityAn error checking method where the digits of a number must add up to an even or an odd number. During data transfer the parity bits are added to the data bits of each character to be transferred. In a word, this bit is set such that Ones of the byte always result in an even or an odd number (corresponding to an even or odd parity). The type of parity must be defined prior to the data transfer. By checking the parity, the receiver can determine if simple bit trans-fer errors occurred.

PinConnectors for integrated circuits or connecting plugs of computers and peri-pheral devices. Usually in the shape of a pin.

PrecisionAgreement between the single measurement results under precisely defined test conditions. The precision is composed of repeatability and reproducibili-ty (see -> Accuracy; see -> Repeatability; see -> Reproducibility).

Probability papersee term "Normal probability chart (Gaussian probability paper, cumulative frequency distribution chart, probability paper)" on page 206

ProbeThe instrument receives the electrical probe signal, which is proportional to the ferrite content measured, from the probe. The probe signal is then conver-ted by means of the calibration parameters into the ferrite content measure-ment value. The Fischer E... probes are equipped with a memory chip (EEPROM) in the probe connector. The EEPROM stores probe-specific in-formation (e. g. probe type, manufacturing code, test method and coefficients of the master calibration curve).


Probe characteristicsee term "Master calibration curve (probe characteristic)" on page 202

Probe output signalsee term "Countrate" on page 196

Probe signalsee term "Countrate" on page 196

Process capabilityThe process capability is assessed by the indices cp and cpk. (For further in-formation see / 4 /.) Process capability is met when the process capability ex-ceeds specified values. Commonly required is:

Process capability is a measure for long-term influences stemming from the so-called 6 Ms (mankind, machine, material, method, measuring instrument and milieu). To determine the process capability, a longer sequence of cycli-cal production steps needs to be employed (same product, same production line, same conditions, but different orders on different days).

Process capability indexThe process capability is assessed by the indices cp and cpk. (For further in-formation see / 4 /.)The process capability index cp takes the deviation of a process in relation to the width of the specification limit range (USL-LSL) into account.The process capability index cpk takes the position of the mean value in relation to the set specification limits into account.The measuring instrument calculates the process capability indices as fol-lows:

with:

th. mean value of all single measurements

cp process capability index

cpk critical process capability index

USL upper specification limit

LSL lower specification limit

s^ estimated value for the standard deviation -> s^

cpUSL LSL–

6 s⋅---------------------------and cpk Min

USL th.–3 s⋅

------------------------ ;

th. LSL–3 s⋅

----------------------- = =


Process controlsee term "Statistical process control (SPC)" on page 215

Process control chart (SPC chart, quality control chart)Statistical Process Control (SPC) often uses random samples to control a pro-duction such that the production process is under statistical control. To do this, the variable features of the product are entered in a process control chart. Process control charts plot process variation over time and help to iden-tify the causes of variations. A random sample is taken from the production process and measured. The result (e. g. mean value and standard deviation (x-s chart)) is graphically documented. The results of the control chart are used to determine when ac-tion should be taken in the process.

Quality assuranceAll measures taken by a producer to ensure a controlled production process within the established quality criteria. One aspect of it is quality control, spe-cifically, ferrite content measurements where coating thickness limit specifi-cations are involved.

Quality control chartsee term "Process control chart (SPC chart, quality control chart)" on page 209

RRange R of all measurements being displayed in the process control chart. The range is the difference between the maximum measurement Femax and the minimum measurement Femin in a measurement series.

Random measurement errorssee term "Measurement errors" on page 202

Random sampleA representative group selected from the production lot, using random sample principles. The sample is used to determine the properties of the entire lot (batch, unit of production).

R Femax Femin–=


Random sample sizeNumber of parts, combined into a random sample.

Rangesee term "R" on page 209

Reference areaA portion of the significant surface area of a product where one or more measurements are to be taken. It is recommended to include the reference area or significant surface area in the production specifications, in addition to the specifications limits for the coating thickness.

Reference measurementMeasurement on a reference sample to check the normalization or calibration which was performed before.

Reference sampleMeasuring object with a known ferrite content on a defined reference area that can be used to check the calibration. The coating thickness within the refe-rence area should be as regular as possible. The reference sample should have the same properties (geometry, etc.) as the measuring object, the calibration is performed for. The reference samples may be from in-house production or may be from external sources. The coating thickness of a reference sample should have been determined using a reliable and properly calibrated instru-ment. Reference samples are used for the monitoring of test equipment. Reference samples are subject to wear and tear caused by the tactile measu-rement. The wear and tear is dependent on the properties of the surface and on the probe which used for measurement. For this reason, reference samples have to be checked regularly and replaced by new reference samples if the wear and tear becomes significant.

Relative standard deviationsee term "Coefficient of variation" on page 195

RepeatabilityThe standard deviation of the measurements taken under repeatability condi-tions is a measure for the repeatability. The smaller the standard deviation of these measurements, the better is repeatability. The repeatability is dependent on the test method and the quality of the instrument, but often also on the pro-perties of the measuring object (for instance, surface roughness). The standard deviation of the measurements under repeatability conditions


can be reduced by generating the mean value of the measurements (for in-stance, when measuring with the “mean reading” mode enabled). see term "Accuracy" on page 191

ReproducibilityThe ability of different operators to achieve practically the same measure-ment result, when taking measurements with different instruments at the same measuring position of the same measuring object at different locations. see term "Accuracy" on page 191

Right valuesee term "Trueness" on page 217

RS232 InterfaceA serial interface protocol standardized originally in the United States. Employed, for instance, to connect a printer to a measuring instrument.

sThe standard deviation s is a measure of the deviations of single measure-ments of a measurement series from their common mean value.The mean square deviation of the single measurements from the mean value is calculated as follows:

with:

Fe. mean value of the single measurements

Fei single measurement

N number of measurements

Figure 16.8 demonstrates that two measurement series with different standard deviations can still have the mean value.

sFe . Fe1–( )2

Fe. Fe2–( )2 … Fe. FeN–( )2+ + +( )

N 1–( )---------------------------------------------------------------------------------------------------------------------------=

s1

N 1–( )----------------- Fe. Fei–( )2

i 1=

N

∑⋅=


Figure 16.8: Measurement series with the same mean value but different standard de-viation

s^Estimated value for the standard deviation.

with:

s. standard deviation -> see „s.´´

c4 the factor c4 depends on the number of measurements N and can be obtained from any popular publication of mathematical statistics table

s.Standard deviation of the measurements taken with fixed block size (will be displayed or printed only when evaluating the current application).

with:

NBl number of evaluated blocks

sj standard deviation of the measurements stored in the j-th block

saCalculated by the measuring instrument only when the measurements were performed with fixed block size and the deviations of the block mean values cannot be attributed to the deviations within the subgroups, as determined by

ss.c4

-----=

s.1

NBl

-------- sjj 1=

NBl

∑⋅=


analysis of variance methods (A.O.V.). It describes the deviations of the block mean values in relation to the deviations of the single measurements within the blocks. With a suitable measurement strategy, sa is a measure of the product deviation.

with

sII see -> sII

Ni block size (number of measurements per block)

Estimated value for the standard deviation -> s^

If, for instance, the same number of measurements is performed on several measuring objects and the measurements on each object are combined into a block (e. g. when measuring with fixed block size), s. is a measure for the in-strument deviation and sa is the product deviation with the instrument devia-tion eliminated.

sIIIs calculated like this:

with:

NBl number of evaluated blocks

Ni block size (number of measurements per block)

Fe.. mean value of all evaluated measurements

Fe.j mean value of the measurements stored in the j-th block

Sigma outlier rejectionMethod for outlier rejection. (see term "Outlier rejection" on page 207)

sa

sII2

s2

–

Ni

-------------------=

sII Ni1

NBl 1–----------------- Fe.. Fe.j–( )2

j 1=

NBl

∑⋅⋅=


Significant surfaceArea on the surface of a measuring object containing the the coating thickness to be measured. All properties necessary for the use and appearance of the product must occur at this significant area.

Single measurementsee term "Single reading" on page 214

Single readingMeasurement result as displayed by the instrument after a single measure-ment at the measuring position.

SkewnessMeasure for the asymmetry of a single-peak probability distribution around its mean value. A positive skewness indicates a distribution whose peak stret-ches more towards values that are greater than the mean value. A negative skewness indicates a distribution whose peak stretches more towards values that are smaller than the mean value. The skewness of symmetric distributi-ons is zero (e. g. for normal distributions). When evaluating the current appli-cation with the measuring instrument, the skewness is calculated.

Smallest measurementsee term "Minimum measurement" on page 204

SPC (Statistical Process Control)see term "Statistical process control (SPC)" on page 215

SPC chartsee term "Process control chart (SPC chart, quality control chart)" on page 209

Specification limits (LSL and USL)The lower specification limit LSL is the minimum coating thickness allowed for the measuring object. The upper specification limit USL is the maximum coating thickness allowed for the measuring object. Specification limits are usually set by engineering requirements to assure proper functioning or ser-viceability of the product. (see -> Specifications). With specification limits monitoring enabled, b appears in the display.


SpecificationsRequirements according to which production is defined within certain limits for variable and attributive properties, like for instance the lower and the up-per specification limit for the coating thickness. Quality control monitors ad-herence to these requirements. (-> Specification limits)

Specimensee term "Measuring object = specimen" on page 203

StabilityAs with every process, test methods are also subject to deviations. This may lead to systematic measurement errors (e. g. drift), independent of handling. By examining the stability and by regular checks, one can ensure stability.

Standardsee term "Calibration standards" on page 18

Standard deviationsee term "s" on page 211

Statistical process control (SPC)A statistical method to analyze and control the quality of a process. In high volume productions, only random samples are taken instead of 100 % inspec-tion which would be too costly. The measurement results of the random samples are extrapolated for the entire production lot with mathematical-sta-tistical methods, and then used to control the production process. This modern method of quality control ensures constant good quality, with a minimum le-vel of rejected parts. Normal distribution of the measurements is required so that statistical process control can be used for quality control purposes.

Stop bitWith serial asynchronous data transfer, the stop bit is added to the data word to be transferred. 1 to 2 bit logic Ones are used. After the stop bit, the sender remains at logic One until the start bit of the next character arrives.

Student distribution factorsee term "t" on page 216

Systematic measurement errorssee term "Measurement errors" on page 202


tThe student distribution factor t can be obtained from any popular publication of mathematical statistics tables and is given as follows:

Example: At a confidence level of 95 % and N>200 (resulting in a degree of freedom f=199 (because of f = N-1)) the student distribution factor ist 97.5;199 = 1.96.

Test methodProcedures and process to obtain information about the properties of a measu-ring object. The test method is based on scientific findings and depends on the application. (For further details, see / 12 /.)

th.Mean value. Arithmetic mean value Fe. of a measurement series consisting of N single readings Fei, according to the equation

with:

Fei single reading

N number of single readings evaluated

Fe..Mean value of the block mean values of the evaluated blocks (see -> Block).

with:

t1

α2---–

;f

Fe.Fe

1Fe2 … FeN+ + +

N-----------------------------------------------------

Feii 1=

N

∑

N-------------------------==

Fe.. 1

NBl

-------- Fe.ji 1=

N

∑⋅ =


NBl number of evaluated blocks Fe.j mean value of the j-th block

Tolerance limitssee term "Specification limits (LSL and USL)" on page 214

Transfer ratesee term "Baud rate" on page 192

TruenessAgreement between the true value and the mean value of the measurement re-sults, achieved constantly under practical measurement conditions. See -> Accuracy. The true value is a value known from mathematical theoretical for-mulations. Since such values are seldom encountered, a value deduced from national or international standards is taken as “right”. This right value is often indicated as true value.

True valuesee term "Trueness" on page 217

Two-point calibrationsee term "Corrective calibration" on page 196

uUncertainty of measurement. The mean value th. of a random sample is not equal to the mean value µ of the population. However it is possible to define an interval, in which the mean value µ of the population will be found with a certain probability (indicated as confidence level):

For a population having normal distribution, the uncertainty of measurement u is calculated as follows for a given confidence level (1-α):

with:

t student distribution factor

s standard deviation

Fe . u– µ Fe. u+≤ ≤

ut s⋅

N--------=


N number of measurements.

By entering the coefficient of variation C.O.V. in place of the standard devi-ation s one gets the relative measurement uncertainty urel in %. For further details see / 7 /.

Uncertainty of measurementsee term "u" on page 217

Unit of measurementUnit used for the measurement display. In coating thickness measurement, the common units of measurement are micrometer (µm) or mils.

ut C.O.V.⋅

N-----------------------=


USL (Upper Specification Limit)see term "Specification limits (LSL and USL)" on page 214

Variable featuressee term "Features" on page 198

VarianceMean squared deviation. The square root of the variance is called standard de-viation.

XCountrate. See

XBaseCountrate obtained when measurements are taken on the Base of the calibra-tion standard set.

XnNormalized countrate.

XsCountrate obtained when measuring on a measuring object with no coating thickness.


Supplemental Operator’s Manual for the

Coating Thickness Measuring Instrument DELTASCOPE MP30E-R

ISOSCOPE MP30E-R DUALSCOPE MP40E-R FERITSCOPE MP30E-R

Purpose of this supplemental operator’s manual: This manual includes supplemental instructions as an addendum to the standard operator’s manual “DELTASCOPE MP30; ISOSCOPE MP30; DUALSCOPE MP40; Part number 902-583” as well as standard operator’s manual “FERITSCOPE MP30; Part number 902-512”. Supplemented were the documentation of the radio interface and of the associated radio receiver.

Documentation order no.: 902-074

Version 1.0 Issue date 02/2005

Manufacturer: HELMUT FISCHER GMBH Institute for Electronics and Measurement Technology Industriestrasse 21 D-71069 Sindelfingen / Germany

Phone ++49 (0) 70 31 303-0 Fax ++49 (0) 70 31 303-710 Internet www.Helmut-Fischer.de eMail [email protected]

Contents

2

1 Transmitting measurement data from the instrument to the computer using the radio interface.........3

1.1 General prerequisites for the joint operation of the radio transmitter and the radio receiver........3 1.2 Transmit the current single reading only (Online operation) ........................................................3 1.3 Transmit the block mean value only (Online operation) ..............................................................3 1.4 Transmit all single readings of the current application (Offline operation) ...................................4 1.5 Transmit all block mean values of the current application (Offline operation)..............................4 1.6 Setting the radio interface parameters ........................................................................................4 1.7 Parameters of the radio interface sub-menu ...............................................................................4

2 Technical notes / hardware ................................................................................................................6 3 Intended use ......................................................................................................................................6 4 Options for processing the received data using software ...................................................................7 5 Start-up of the radio receiver together with PC-DATEX......................................................................8 6 Start-up of the radio receiver together with HyperTerminal ..............................................................10 7 Receiving data using PC-DATEX.....................................................................................................11 8 Menu “Options” ................................................................................................................................11 9 Transferring Data from the MP0R Instrument to the PC using the “HyperTerminal” Program ..........15

9.1 Installing "HyperTerminal" using the Windows installation CD-ROM .......................................15 9.2 Starting HyperTerminal for the first time and program configuration .........................................15

10 Transferring data from HyperTerminal to an EXCEL spreadsheet..................................................17 10.1 Setting the required number format in the Windows operating system....................................17 10.2 Transferring data from HyperTerminal to an EXCEL spreadsheet ..........................................17

11 Sources of errors and possible solutions........................................................................................18 12 Service and Sales Adresses ..........................................................................................................18

3

1 Transmitting measurement data from the instrument to the computer using the radio interface

This chapter applies only to instruments with an integrated radio interface; list of types:

ISOSCOPE MP30E-R DUALSCOPE MP40E-R DELTASCOPE MP30E-R FERITSCOPE MP30E-R

The radio interface integrated in the instrument allows for the transmission of the data from the measurement memory to an optional radio receiver. The radio frequency is 915 MHz (US-version models) and 868 MHz (EU-version; and many other countries). The optional radio receiver (order number 603-467) transmits the data to the evaluation computer via a cable (cf. Operator’s Manual of the radio receiver). The radio transmitter is always on standby as long as the instrument is switched on. No settings are provided for switching off the radio device. Data are transmitted only when measurement data are to be transferred. No radio waves are transmitted at other times.

1.1 General prerequisites for the joint operation of the radio transmitter and the radio receiver

The radio receiver and the associated software for data reception (PC-Datex or Hyperterminal) must be taken into operation correctly, the software interface settings must correspond to the interface settings of the radio transmitter in the instrument, and the reception software (PC-Datex or Hyperterminal) must be set to “Online” operation. The radio receiver must be within the range of the radio receiver. Detailed descriptions of these settings are found in this supplemental operator’s manual. Note: Please ensure that no undesirable data are received from other MP instruments by correctly setting the parameters “FM Subnet number” and “FM instrument number.”

1.2 Transmit the current single reading only (Online operation)

After each measurement, the current single reading is transmitted automatically to the radio receiver of the PC (always after the measurement is accepted from the probe). At the same time, the measurement is also accepted into the measurement data memory and integrated into the statistical evaluation. Prerequisite: Service menu setting “Output = Single readings.”

1.3 Transmit the block mean value only (Online operation)

The block mean value, which is generated based on the number of single readings, is transferred automatically to the radio receiver of the PC. Prerequisite: Service menu setting “Output = Block mean values.”

4

1.4 Transmit all single readings of the current application (Offline operation)

All single readings that are present in the data memory of the current application are transmitted together. Prerequisite: Service menu setting “Output = Single reading transmission.” Only the complete single readings are transmitted, not the block mean values. Transmitting data: Press the PRINT key 1x.

1.5 Transmit all block mean values of the current application (Offline operation)

All block mean values that are present in the data memory of the current application are transmitted together. Prerequisite: Service menu setting “Output = Block mean values.” Only the complete block mean values are transmitted, not the single readings. Transmitting data: Press the PRINT key 1x. 1.6 Setting the radio interface parameters

Calling the Service sub menu of the radio interface:

Prerequisite: Instrument is switched ON; Main menu of the MP instrument is active. 1) Press the ENTER key 10x.

Display 157 appears. 2) Press the key 2x.

Display 159 appears. 3) Press the ENTER key 1x.

Display FrEE appears; i.e., the Service menu is active. 4) Press the key 1x.

Display “FM instrument number 0” appears. The Service sub-menu of the radio interface is active. To advance to the additional parameters of this sub-menu, press the ENTER key 1x each time (cf. listing below).

1.7 Parameters of the radio interface sub-menu

Service menu “Radio” Menu option

Default setting

Additional settings

FM instrument number 0 Numbers between 0 and 15.

FM Subnet number 0 Numbers between 0 and 15.

FM Repeat 1 Numbers between 0 and 7.

Transmission pause 0 ms 80; 160; 400; 800; 1600; 4000; 8000 [ms]

Output Single readings I.e., each single reading is transmitted.

“Block mean values”: Only block mean values are transmitted.

Group separator off No group separator is transmitted.

on A group separator is transmitted.

Continuous transmission? off See glossary below.

on See glossary below.

5

Abbreviations: FM = Funkmodul [= radio module] Glossary: Explanation of the individual functions

FM SubNet number: Designates the number of the SubNet instrument group that is assigned to the respective instrument from which the current measurements are to be received. FM Instrument number: This number identifies the individual instrument within a SubNet group. FM Repeat: A signal can be transmitted repeatedly to enable verification of the data transmission. The set rate corresponds to the number of repeats. Transmission pause: The duration of the pause between the transmissions of individual data can be selected to prevent an overload for slower data receivers. With today’s generally powerful receivers, this function has lost much of its significance. Output: Designates the type of data output, such as the measurements or their statistical evaluations that are sent to the radio receiver. Group separator: A group separator separates the individual data blocks during the transmission via the radio interface. Continuous transmission?: Single readings that have been obtained in the continuous mode are transmitted continuously via the radio interface.

2 Radio receiver: Technical notes / hardware

The radio receiver requires no maintenance or care. The radio receiver has no regular or rechargeable batteries.

The power supply is provided via the cable connection to the computer. The radio receiver must be operated using only the connection cable (order

number 505-923) that is supplied with the shipment.

Only data that are transmitted by the MP0R instrument at a suitable radio frequency can be received. Country / Region

MP0R instrument type / Order no. Radio frequency

Radio receiver type / Order no.

DUALSCOPE MP0R 603-539 868 MHz Radio receiver 603-467 Most parts of Europe and other regions ISOSCOPE MP0R 603-538 868 MHz Radio receiver 603-467

DUALSCOPE MP0R 603-543 915 MHz Radio receiver 603-544 USA, Australia ISOSCOPE MP0R 603-560 915 MHz Radio receiver 603-544 Note: Other export versions of the MP0R instrument may operate at different radio frequencies.

Receiver with connected cable

A: Receiver B: USB connector C: SubMin D connector

3 Intended use The “Radio Receiver RS232” is used for receiving data that have been transmitted by one (or more) MP0R instrument(s) and for transmitting them to a RS232 port of a personal computer.

6

7

4 Options for processing the received data using software Two options are available for displaying the received data on the monitor: 1) Software HyperTerminal 2) Software PC-DATEX Option 1: The HyperTerminal program is supplied with MS Windows, i.e., it is already available on your personal computer. However, the program is often not installed during the standard installation. You can find a description on how to install the program on your computer and details about its use in chapter 9.1 , “Installing "HyperTerminal" using the Windows installation CD-ROM. Option 2: PC-DATEX is an optional supplementary software program that can be obtained from HELMUT FISCHER (order number 602-465). The PC-Datex installation CD ROM includes a description on how to install the program on your computer and details concerning its use.

5 Start-up of the radio receiver together with PC-DATEX Assumption: The required PC-DATEX software is already installed. 1. Connect the connection cable to the receiver. 2. Plug the SubMin D connector into a COM port (e.g., COM1 or COM2) of the

computer. 3. Plug the USB connector into the USB port of the computer.

Computer interfaces with the receiver’s connections

A: USB connector B: SubMin D connector C: Receiver

4. Position the receiver at a location that provides good radio reception. We recommend elevated locations that are not influenced by shielding components or by persons standing in front of the receiver. An extension cord for the connection cable (not part of the standard shipment) can be used to position the receiver at a suitable location.

5. Open MS Excel.

8

6. Use the menu command “PC-Datex > Parameter” to open the dialog window “Settings”. Select the following settings: Bits per second: 19200 Data bits: 8 Parity: none Stop bits: 1 Flow control: none Connection: Select the COM port, where the receiver is plugged into the PC (cf. step # 2 of these instructions). Note: The Options parameters must be set to ONLINE prior to use.

7. Click [OK] to close this dialog window. 8. Use the menu command “PC-Datex > Options” to open the “PC-Datex” dialog

window. 9. Select the required settings as described in Chapter 8 “Menu “Options beginning

on Page 11. 10. Click [OK] to close this dialog window. 11. In the Excel spreadsheet, place the cursor in the cell where you would like to

insert the received data. 12. Use the menu command “PC-Datex > Online” to place the instrument online, i.e.,

to enable data reception. The dialog window “PC-Datex – Receiving data !” opens.

Note: The dialog window “PC-Datex – Receiving data !” remains open during the entire transmission time. Please note: The connection between the radio receiver and the computer must not be interrupted during the online session. Connectors must not be unplugged!

13. When the measurement is finished, click the [Cancel] button to exit the online status. The dialog window closes.

14. Save the Excel spreadsheet and exit the file.

9

6 Start-up of the radio receiver together with HyperTerminal Assumption: The required HyperTerminal software is already installed. (cf. installation of software HyperTerminal as described in chapter 9.1 , “Installing "HyperTerminal" using the Windows installation CD-ROM”, page 15). 1. Connect the connection cable to the receiver. 2. Plug the SubMin D connector into a COM port (e.g., COM1 or COM2) of the

computer. 3. Plug the USB connector into the USB port of the computer.

Computer interfaces with the receiver’s connections

A: USB connector B: SubMin D connector C: Receiver

4. Position the receiver at a location that provides good radio reception. We recommend elevated locations that are not influenced by shielding components or by persons standing in front of the receiver. An extension cord for the connection cable (not part of the standard shipment) can be used to position the receiver at a suitable location.

5. Start the software “HyperTerminal” as described in chapter 9.2 , “Starting HyperTerminal for the first time and program configuration”, page 15. HyperTerminal is now active and ready to receive data.

6. Transfer the received readings from the HyperTerminal main window to the Excel spreadsheet as described in chapter 17, “Transferring data from HyperTerminal to an EXCEL spreadsheet”, page 17.

7. Save the Excel spreadsheet and exit the file.

10

7 Receiving data using PC-DATEX These instructions apply to PC-DATEX Version 1.6 and up.

8 Menu “Options” This menu is used to select the settings that are important for receiving and displaying the data in an Excel spreadsheet.

Image: Dialog window PC-Datex (opened using the menu command “Options”) Description of the individual menu options: 1) “Number of channels per measurement:” Specifies the number of single readings per measurement that are to be expected by PC-Datex. Default setting: “1”, max. 256

2) "Set cell format before enter value"

Specifies the cell format setting in the Excel spreadsheet. indicates: Cell format is adjusted corresponding to the required format type (numeric or text) of the received data. indicates: the cell format is not altered. Default setting: 3) “No special text output”

Specifies whether a specific text is transmitted to the Excel spreadsheet in addition to the measurement data. The additional text is permanently set in PC-Datex, e.g., “Block 1”.

4) “Beep while receiving measurement” Specifies whether an acoustic signal will sound while receiving measurements. Useful only if a sound board is enabled and loudspeakers are connected to the computer. 11

5) “Blocks in columns”

12

“Arrange blocks in columns” The measurements of a block are arranged in columns in the Excel spreadsheet.

6) “Blocks in rows”

The measurements of a block are arranged in rows in the Excel spreadsheet. Default setting: “in columns”.

Settings for MP0R only

7) “SubNet Number (0 - 15)” SubNet Number: Identifies the number of the SubNet instrument group that is assigned to the MP0R instrument from which the current measurement data are to be received. Integers from 0 to 15 are acceptable. *********************************************************************************************** Definition of “SubNet Number”: The SubNet Number identifies a group of MP0R instruments that are assigned to a certain radio receiver. Definition of Instrument number within the SubNet: This number identifies the individual instrument within a SubNet Group. *********************************************************************************************** This must be the same number that is defined for “SubNet Number” in the Service menu of the MP0R instrument. Cf. Operator’s Manual MP0R, Chapter 10 “Service Settings”; Menu 2, Menu Option “SubNet Number”, Display “nN”. Integers from 0 to 15 are acceptable.

Accordingly, a total of 256 MP0R instruments can be operated simultaneously at one radio receiver (16 SubNet groups with 16 MP0R instruments each).

Note: If several MP0R instruments are operated simultaneously at one radio receiver, the SubNet Number and instrument number must be displayed together with the measurement data (the menu options # 11 and 12 in this chapter must be set to ). If various MP0R instruments send data at precisely the same time, the radio receiver will not be able to positively assign the data and such data will be discarded. 8) “Device Number (0 - 15)”

Device Number: Specifies the number of the MP0R instrument from which measurement data are to be received. This number identifies the individual MP0R instrument within a SubNet group. *********************************************************************************************** 9) “Check Subnet Number”

YES ( ) means: Only those received data that exhibit the required “SubNet Number” (i.e., the number that is currently entered in the entry field “SubNet Number”) will be transferred to the Excel spreadsheet. NO ( ) means: All received data are transferred to the Excel spreadsheet. Default setting: NO ( )

10) “Check Device Number”

13

YES ( ) means: Only those received data that exhibit the required “Device Number” (i.e., the number that is currently entered in the entry field “Device Number”) will be transferred to the Excel spreadsheet. NO ( ) means: All received data are transferred to the Excel spreadsheet. Default setting: NO ( ) 11) “Display Device Number”

YES ( ) means: The device number of the MP0R is transferred to the Excel spreadsheet. NO ( ) means: The device number of the MP0R is NOT transferred to the Excel spreadsheet. Default setting: NO ( ) An example relating to this point can be found underneath point # 12 in this chapter. Note: If data with several single readings per block are to be displayed in one line (that is, setting ), it is recommended to arrange the blocks in rows cf. point # 6 in this chapter “Blocks in rows””. 12) “Display Subnet Number”

YES ( ) means: The SubNet Number of the MP0R is transferred to the Excel spreadsheet. NO ( ) means: The SubNet Number of the MP0R is NOT transferred to the Excel spreadsheet. Default setting: NO ( ) Note: If data with several single readings per block are to be displayed in one line (that is, setting ), it is recommended to arrange the blocks in rows cf. point # 6 in this chapter “Blocks in rows””. ***********************************************************************************************

Example for points # 11) and 12):

14

Measurement

11.000 12.000 11.000 13.000 12.000

Image 2: Received data in the Excel spreadsheet with the settings for “Transfer of the device number” for “Transfer of the SubNet Number”

************************************************************************************************* SubNet Number Device Number Measurement

2 0 11.000 2 0 12.000 2 0 11.000 2 0 13.000 2 0 12.000

Image 3: Received data in the Excel spreadsheet with the settings for “Transfer of the device number” for “Transfer of the SubNet Number” *************************************************************************************************

9 Transferring Data from the MP0R Instrument to the PC using the “HyperTerminal” Program The "HyperTerminal" program is part of the standard MS Windows software. However, it is typically not installed during the standard installation. Here is the description of how to install the program on your computer. Note: Depending on your Windows-operating system, a few steps in this manual may differ from the instructions below. Case 1: The "HyperTerminal" program is already included in the menu “Start > Programs > Accessories > Communication” and can be started from there. The procedure is explained in the following chapter "Starting and configuring HyperTerminal". Case 2: If it is not included in the menu selection "Programs > Accessories > Communication", you will need your Windows installation CD-ROM. You will find a detailed description for this case below. When you have finished that, follow the instructions of case 1.

9.1 Installing "HyperTerminal" using the Windows installation CD-ROM

Description for Case 2:

1. Double-click "My Computer > Control Panel > Add/Remove Programs"; then select the tab "Windows Setup".

2. Select the "Communications" component from the dialog window and click "Details". The "Communications" dialog window opens.

3. In the "Communications" dialog window click the control box "HyperTerminal". A check mark appears.

4. Click [OK]. The "Windows Setup" tab appears. 5. Click [OK]. The message "Insert CD or diskette" appears.

Insert the CD-ROM and click [OK]. "HyperTerminal" is now installed and ready to start.

9.2 Starting HyperTerminal for the first time and program configuration

Description for case 1: 1. Click the [Start] button.

[Start] is found at the bottom left corner of your Windows screen. 2. Use the menu command sequence "Programs > Accessories > Communication >

HyperTerminal" to open the "HyperTerminal" dialog window. 3. Double-click "HYPERTRM.EXE".

The "Connection Description" window opens. 4. Enter a name, e.g., "MP0R-Radio".

5. Click an icon to select it; e.g., the yellow and red telephone 6. Click [OK].

The "Connect to" dialog window opens. 7. Make the appropriate selection in the "Connect to" dialog window in the line "Connect

using": "Direct via COM1" or "Direct via COM2". The selection of COM1 or COM2 depends on the COM port on your computer that is

15

currently available and can be used for the radio receiver. You do not need to edit the remaining fields.

8. Click [OK]. The "COM1 Properties" or "COM2 Properties" dialog window opens.

9. Select the following settings: Bits per seconds: 19200 Data bits: 8 Parity: none Stop bits: 1 Flow control: none

10. Click [OK]. The main window of the "HyperTerminal" program opens.

11. The menu command "File > Properties" opens the "MP0R-Radio Properties" dialog window.

12. Click the "Settings" tab and select: Under the list field "Emulation": -> select "Auto detect". Do not change the other settings.

13. From the "Settings" tab, click "ASCII Setup". The "ASCII Setup" dialog window opens.

14. Click the control box (check mark appears) to the left of the line "Append line feeds to incoming line ends". Do not change the other settings.

15. Click [OK] in the "ASCII Setup" dialog window. The window closes and the settings are saved.

16. Click [OK] in the "MP0R-Radio Properties" dialog window. The window closes and the settings are saved. The main HyperTerminal window appears.

17. If the display in the bottom left corner of the main HyperTerminal window does not show "Connected":

Click the "Connect" button. Data transfer is now active.

HyperTerminal is now active and ready for use.

Closing HyperTerminal 1. Use the menu command "File > Exit" to end the session with the "HyperTerminal"

program. The "HyperTerminal" dialog window opens.

2. Respond to the prompt: "A connection is still established. Close existing connection?" by clicking the [Yes] button.

3. If the settings have not been saved in a file at the beginning of the "HyperTerminal" session, a dialog window appears with the prompt: "Save MP0R-Radio session?" Respond by clicking the [Yes] button and entering a file name. Finished. The selected symbol with the file name will appear in the "HyperTerminal" dialog window. The data are now saved and you can now close this dialog box. When doing further HyperTerminal sessions, you do not need to do the program settings again. You can begin with messuring at once after opening the program and “MP0R-Radio” file.

16

17

Putting a shortcut on the desktop (if desired)

1. Right-click the "MP0R-Radio" button. In the dialog field, click the command "Create shortcut". The button with the text "MP0R-FUNK" appears.

2. Use the mouse pointer to drag the "MP0R-Radio" button onto the desktop. Advantage: You can now start the "HyperTerminal" program for data transfer simply by double-clicking the "MP0R-Radio" button.

10 Transferring data from HyperTerminal to an EXCEL spreadsheet

Important: The number format settings in the control panel of the Windows operating system must be adjusted prior to the data transfer. Neglecting to do so may result in serious errors in the numeric display!

10.1 Setting the required number format in the Windows operating system

1. Click the [Start] button. [Start] is found at the bottom left corner of your Windows screen.

2. Use the menu command sequence "Settings > Control Panel" to open the "Control Panel" dialog window.

3. Double-click the "Regional Settings" button. The "Regional Settings Properties" dialog window opens.

4. Click the "Number" tab. 5. Set the parameters as follows:

- Decimal symbol: . (that is, a period) - Number of digits after decimal: 5 - Digit grouping symbol: , (that is, a comma) - Do not change the other settings.

6. Click [Apply]. 7. Click [OK]. The "Regional Settings Properties" dialog window closes. 8. Close the "Control Panel" dialog window. Ready.

10.2 Transferring data from HyperTerminal to an EXCEL spreadsheet

1. In the main HyperTerminal window select the data that you would like to transfer into Excel. Drag the mouse pointer across the data. The background of the selected data changes to blue.

2. Use the command "Edit > Copy" to copy the data to the clipboard (or use the key combination "Ctrl + C").

3. Start Excel. An empty spreadsheet opens. 4. Use the command "Edit > Paste" to paste the data into the spreadsheet.

Finished. You can now process and save the data as desired.

11 Sources of errors and possible solutions Error Possible cause and solution

PC-Datex is not online -> Give the command “Online”

Wrong COM port setting. -> Set the correct, corresponding COM port in the instrument and in the receiver

Received data are not shown in the Excel spreadsheet

Check “SubNet / Device Number” is set but the values of the instrument and receiver do not match. -> Set the corresponding values

PC-Datex no longer displays Subnet or Device numbers

Connection between the radio receiver and the computer has been interrupted during the online session -> Cancel the online status and re-start using the menu command “online”.

“Foreign” measurement data are shown in the Excel spreadsheet.

Data from a different instrument are received. -> Set Check “SubNet / Instrument Number”

18

Supplemental operator’s manual RS232-interface (1.0 - 04/05) Page 1

Supplemental Operator’s Manual for the Coating Thickness Measuring Instrument

DELTASCOPE® MP20E-SDELTASCOPE® MP30E-S

ISOSCOPE® MP30E-S DUALSCOPE® MP40E-SFERITSCOPE® MP30E-S

Purpose of this supplemental operator’s manual:This manual includes supplemental instructions as an addendum to the standard operator’s manual “DELTASCOPE MP30; ISOSCOPE MP30;

DUALSCOPE MP40; Part number 902-583” as well as standard operator’s manual “FERITSCOPE MP30; Part number 902-512”.

Supplemented were the documentation of the RS232-interface.

Documentation order no 902-078 Version 1.0

Issue date 04/2005 Subject to changes.

weidgen

Rechteck

Page 2 Supplemental operator’s manual RS232-interface (1.0 - 04/05)


1 Data export, data import and remote control of the instrument

The following functions are available if a computer is connected to the RS232 interface of the instrument:

� Transfer of measurement data from the instrument to the com-puter (Export)

� Remote control of the instrument by transmitting commands from the computer to the instrument

� Requesting measurement data and other data (e.g., number of the current application) by transmitting a com-mand from the computer to the instrument (Export)

� Transferring data (e.g., names of applications) from the computer to the instrument by transmitting commands from the computer to the instrument (Import)

For this purpose, the instrument must be connected to the computer using an interface cable. The interface connection set MP, which can be ordered from your authorized supplier or directly from Helmut Fischer GmbH+Co.KG, in-cludes the interface cable and an adapter unit for the correct connection of the RS232 interface of the instrument to the RS232 interface of the computers (9-pin or 25-pin).

Knowledge concerning configuration, operation and programming of the computer and of the software in use is required for the connection of the instrument to a computer. If necessary, this information can be obtained from the respective operator’s manuals!

Commercially available or individually created database programs can be used to process the data that have been exported by the instrument.Information concerning import and processing of the exported data using these programs may be obtained from the manuals of these programs if re-quired.


1.1 Export format of the measurement data

The measurement data are exported by the instrument via the RS232 interface as so-called floating point values followed by the control characters CR and LF (ASCII CR: Dec.13, Hex. 0D; ASCII LF: Dec.10, Hex.0A).The data bits, i.e., the number of bits used to describe an ASCII character is set under � Service function [Word length 7 bits] or [Word length 8 bits].

1.2 Transferring measurement data to the computer

Transfer of measurement data to the computer can be performed in two ways:

� Online operation, and

� Offline operation.

1.2.1 Online operation

When transferring measurement data in online operation, the instrument is connected to the computer during the measurement and the data are exported immediately (online) via the RS232 interface.

If [] is set in the � Service function, the single readings are exported via the RS232 interface immediate-ly following measurement accept. However, if the setting is [], the block mean values are exported via the RS232 interface after BLOCK-RES is pressed; in this case, the single readings will be displayed but not ex-ported.

1.2.2 Offline operation

In offline operation, measurement data previously stored in the instrument will be exported via the RS232 interface at a later time (offline). Data output is triggered by pressing PRINT.

If is set in the � Service func-tion, the single readings are exported via the RS232 interface after PRINT is pressed. However, if the setting is , only the block mean values are exported via the RS232 interface.


1.2.3 Transferring of measurement data with a group separator

A series of individual measurements can be combined to a block by pressing BLOCK-RES. The end of the individual blocks that have been generated by pressing BLOCK-RES can be identified for data transfer using a group separator (ASCII GS). However, the group separator is set at the end of each block and exported via the RS232 interface followed by CR+LF only if [Group separator on] is se-lected in the � Service function.

1.3 RS232 Interface commands

By transmitting the RS232 interface commands (cf. table list) from the com-puter to the instrument, the instrument can be remote-controlled, measure-ments and other data can be requested from the instrument and can be trans-ferred from the computer to the instrument. The requested measurements or data are then transmitted from the instrument via the RS232 interface and received by the computer.

Should an error result when transmitting the commands “DAM”, “DAT”, “GAN”, “GBN”, “SAN”, “SBN”, “SGS” or “SWA”, i.e., the respective function cannot be carried out, the instrument will transmit the ASCII char-acter “NAK” to the computer via the RS232 interface.

1.3.1 Format of the RS232 interface commands

A CR and an LF control character (ASCII CR: Dec. 13, Hex. 0D; ASCII LF: Dec.10, Hex. 0A) must follow each RS232 interface command that is sent by the computer to the instrument.

The data bits, i.e., the number of bits that describe an ASCII character can be set in the � Service function ([data bits 7] or [data bits 8]).

Command Function

STATE Requests the current state of the instrument. “1” is output when the instrument is ready to measure. “0” is output when the current application is not set up.“-1” is output for any other state (e.g., when the ser-vice functions are being called).


G0 or ES or EN orESC?

Triggers measurement accept. The measurement is exported from the instrument via the RS232 interface.

XX orz

Requests the current count rate The current count rate is exported but not stored in the instrument.

XN ory

Requests the current normalized count rate. The current normalized count rate is exported but not stored in the instrument.

SAM Requests all measurements that are stored in the cur-rent application.

DAM0...DAM99

Deletes all measurements that are stored in the appli-cation with the specified number. Example: The command “DAM2” deletes all mea-surements of the second application.

PT1 Sets the measurement data output mode “Single readings without group separator”, i.e., when mea-surements are exported they are transferred without a group separator.

PT2 Sets the measurement data output mode “Single readings with group separator”, i.e., when measure-ments are exported, single readings are transferred and a group separator (ASCII GS) is transmitted be-tween the individual blocks of measurements.

PT3 Sets the measurement data output mode “Block mean values only”, i.e., when measurements are exported, only the block mean values are trans-ferred.

ESC0 Actuates the DEL key.

ESC1 Actuates the FINAL-RES key.

ESC2 Actuates the BLOCK-RES key.

ESC3 Actuates the ON/OFF key.

ESC4 Actuates the ZERO key.

ESC5 Actuates the CAL key.

ESC6 Actuates the � key.

Command Function


ESC7 Actuates the � key.

ESC8 Actuates the APPL No key.

ESC9 Actuates the MENU key.

ESC: Actuates the PRINT key.

ESC; Actuates the ENTER key.

AN Requests the maximum possible number of applica-tions that can be set up in the instrument.

GAA Requests the number of the current application.

SWA0...SWA99

Selects the application with the number 0 (... 99) in the instrument. Example: The command “SWA2” has the effect of se-lecting the application with the number 2 in the instru-ment.

IEX0...IEX99

Checks, whether the application with the number 0 (... 99) is set up in the instrument. “1” is output by the instrument if the application is set up; “0” is output if it is not set up.

GAN0...GAN99

Requests the name of the application with the num-ber 0 (... 99). An empty string is output if no name is specified. Assign a name using the software MPNAME or the command “SAN”.Example: After the command “GAN2” is received, the instrument outputs the name of the second applica-tion.

SAN0...SAN99

Assigns a name for the application with the number 0 (... 99). After the command “SAN” is received, the instrument transmits the ASCII character “ACK”. This must be followed directly by the transfer of the name that the application is to receive. The name must also conclude with CR+LF and may contain a maximum of 16 ASCII characters. After the name is received, the instrument transmits again the ASCII character “ACK”. Example: The command “SAN2” followed by the de-sired name assigns a new name to the second appli-cation.

Command Function


GBN0...GBN999

Requests the name of the measurement block with the number 1 (... 1000). An empty string is output if no name is specified. Assign a name using the software MPNAME or the command “SBN”.Example: After the command “GBN2” is received, the instrument outputs the name of the third block of the current application.

SBN0...SBN999

Assigns a name for the measurement block with the number 1 (... 1000). After the command “SBN” is re-ceived the instrument transmits the ASCII character “ACK”. This must be followed directly by the transfer of the name that the block is to receive. The name must also conclude with CR+LF and may contain a maximum of 16 ASCII characters. After the name is received, the instrument transmits again the ASCII character “ACK”.Example: The command “SBN2” assigns a name to the third block of the current application.Blocks can be named only if the matrix measurement mode is enabled. The command “GMX” can be used to query, whether the matrix measurement mode is enabled.Enabling the matrix measurement mode: Cf. Chapter “Service functions“ in the separate operator’s manual.

DAT0...DAT999

Requests the date and time of the conclusion of the block with the number 1 (... 1000).Example: The command “DAT2” outputs date and time of the conclusion of the third block of the current application.

GNB Requests the number of measurement blocks that are stored in the current application.

GG Requests the block size of the current application, i.e., the number of the measurements that are to be combined during automatic block creation. “0” is output if automatic block creation is disabled. For enabling the automatic block creation function and setting of the block size of the current application: cf. Chapter “Automatic block creation and block size“.

Command Function


Table: RS232 interface commands (ASCII)

GMX Requests the measurement mode. The instrument outputs “1” if the matrix measurement mode is en-abled. “0” is output if the standard measurement mode is enabled. For enabling the matrix measurement mode: cf. Chapter “Service functions“ in the separate operators manual.

GGS Requests the group separator mode. The instrument outputs “1” if the group separator is enabled (i.e., during export via the RS232 interface, a group separator is transmitted between the individual measurement data blocks). “0” is output if the group separator is disabled. For setting the group separator mode: cf. Chapter “Service functions“ in the separate operators manual.

SGS0 Disables the group separator in the instrument. If the group separator is disabled, no group separator is transmitted between the individual measurement blocks during the output via the RS232 interface.

SGS1 Enables the group separator in the instrument. If the group separator is enabled a group separator is transmitted between the individual measurement blocks during the output via the RS232 interface.

PE Requests the ASCII character that is used by the in-strument as the group separator. The instrument outputs “GS” via the RS232 interface.

SER Requests the serial number of the instrument.

VV Requests the version name of the internal instrument software (e.g., RBA12)

Command Function


Devices & Hardware

Opm anotest ymp30-s_932-531_en