Yelo Laser Reliability Burn in and Lifetest for Active Photonic Device

Company History

1983 Yelo founded

2001 Acquired by Mindready Solutions

2008 Mindready acquired by Averna

2010 Management Buyout Out and rebrand Yelo

Clients

Yelo’s clients include Telecom Network Equipment Original Equipment Manufacturers, Photonic and opto-electronic device manufacturers, startups and contract manufacturers

Europe: UK, Germany, Sweden, Finland, France

North America: Canada, East and West coast USA

China: Shenzen

Over 110 systems installed with 34 clients globally

Laser Reliability,Burn-in and Lifetest Expertise

Over 100 man years of photonics experience

Ex Nortel / Bookham / Oclaro engineers

Photonic device manufacturing and QA expertise

Photonic device Qualification/Burn-in/Lifetest Equipment

Thermal Management

Device reliability-Telcordia standards

Device packaging (40Gb / 100 Gb)

Testing and fixturing (40Gb / 100 Gb)

Low Power Module Design

Low Power Module Designs

Probed Devices• VCSEL Array• Laser Array 10 channel• APD

Chip-on Carrier• Photonics Integrated Circuit (Lasers, Amplifiers, Modulator, Photodiode,

Thermistor)• SOA (Semi conductor Optical Amplifier)• Lasers• Laser Arrays• APD (150V)• PIN Photodiodes

Packaged• VCSEL

TO Headers• Mini DIL• Butterfly

Why Yelo?

Device fixturing research and development and expertise including

Tight temperature control of devicesSufficient downward pressure on devices to ensure good thermal contactAccurate electrical probing to drive and measure devicesOptical analysis

Photonics Domain expertiseWe have designed, manufactured and tested devices and understand the constraints

Time to marketModular approach using standard laser drive cards and standard flexible software enables new systems to be delivered faster than building your own

Laser Reliability, Burn-in, Lifetest & Qualification System

Lifetest and burn-in at different temperatures

Test different products and packages in different modules

Suitable for contract manufacturers, startups and mid volume

One control rack can test up to up to 2,048 devices per rack

Can be expanded by the addition of up to 2 slave racks as volume production increases

Independent Temperature Controlled Modules

A drawer can hold up to 8 modules

A module can hold up to 16 devices

This provides for up to 128 devices per drawer

Each module can operate at different temperature and testing cycle

Customised Module Design

Each module can hold up to 16 devices

The number of devices per module depends upon the complexity of the device

Devices held at temperature on hot plate

Light detectors can be added and cooled if required

High Power System

One control rack can test up to up to 480 devices per rack

Can be expanded by the addition of up to 2 slave racks as volume production increases

High Volume Drawer Based System

This system uses the same rack and laser drive cards.

Each rack contains 4 drawers with no modules.

Each drawer contains a customised heating plate allowing up to 256 devices to be loaded.

Suitable for packaged devices such as TO-CAN.

High Power Module

Uses a liquid-cooled baseplate with a peltier optionOff-the-shelf fixturing includes high accuracy pogo pins for chip-on-carrier devices, clamps for C-mount and W-mount devices, connectors for packaged devices and TO headersLiquid-cooled Integrating spheres dissipate high optical powers

Automation Software

Over 2 man years of software engineering developmentSophisticated temperature control algorithmsClear, flexible user interface displaying the status of units under test including module temperatureProgrammable alarm conditions and notification via emailData recording to any ODBC compliant databaseGraphical displays of device performance during testing including degradationLaser control constant current or constant power modesLIV sweep analysis & spot measurementsBurn-in at one temperature & characterize at another, with programmable cycle timesAll module parameters may be set independently (drive current, temperature, burn-in time etc.)

Main User Interface

Diagnostics & Configuration

Cost Effective Benchtop System

Suitable for laboratory or for low volume use

2 Modules – not expandable

Up to 32 devices

High Power Module Design

High Power Module Designs

Chip on Carrier• C Mount – 20 Amp • BA Mount – 40 Amp

Packaged• Butterfly – 20 Amp

Probed Photonic Integrated Circuit / Laser Bar Test & Qualification

Burn-in and lifetest of a 12 chip VCSEL array using a probe card.

Burn In and Life Test – Benefits

Easy reconfiguration for new products (wide range of modules)

Flexible use – Burn-in, Lifetest and Qualification at the same time

Automatic in-situ measurement (reduces handling time)

NIST standard measurement precision for every device

Ease of calibration / maintenance

Each drawer is independent of others (virtually no single point of failure)

Individual independent temperature zones in groups of 16

Price effective at low volume (suitable for R+D facilities)