Cogent ATE A 100 ™

Analog and Mixed-Signal Test System Easy and Affordable Multi-Site Testing Cogent ATE’s Leopard A Series Analog and Mixed-Signal Test System represents a transformational change in the testing of analog and mixed-signal ICs, a high-volume and cost-sensitive segment of semiconductor market where the test cost has become agrowing percentage and sometimes the most significant part of the overall cost of manufacturing the device. Cogent ATE’s Leopard A Series Power Management Test System will give our customers, Integrated Device Manufacturers (IDM), fablessemiconductor companies and Outsourced Assembly and Test (OSAT) significant costadvantage over their competitions. Cogent ATE’s strategy to reduce the cost-of-test is simple; higher throughput at a lower price. We achieved higher throughputs with practical quad-site wafer and final testing using Cogent ATE’s Floating Test Sites™ System Architecture. We designed our test system for low cost by using the latest electronics and by incorporating our proprietaryembedded IP core technology, Tester-on-a-chip™, in our hardware. Floating Quad-Site Testing™ is Real and Guaranteed True parallel testing of up to 4 device-under-test (DUT) sites is not only real but also affordable with Cogent ATE’s Leopard Series Analog and Mixed-Signal Test System. For our targeted device markets, quad-sites parallel testing is most economical and practical solution for both wafer and final tests. Turret based handlers, a popular choice fordiscrete and power management devices are capable of quad-site testing. “Massive Parallelwafer testing is often unrealistic given the cost and technical issues in the interfacetechnology, i.e. probe card. We have achieved the lowest cost-of-test to date for the Discrete Power Semiconductor and Power Management IC markets by making Floating Quad-Site Testing™ a compelling alternative to the non-floating single or dual site testers from our competitions. We intendto maintain this leadership by continuously improving test performance and loweringhardware cost.

Target Devices

Power MOSFET Operational Amplifiers Linear Regulators LDO Regulators Voltage Reference Battery Charger PWM DC-DC Audio CODEC Audio DACs Audio ADCs Analog Switches

Low cost  New technology High performance

Features

True parallel multi-site testing with Floating Quad-Site Testing architecture

Scale from Single to Multi-Site Testing automatically with Auto Test Replication

48 Analog Channels and 32 Digital Channels in a single test head

Standard full feature manipulator for wafer level and final test

SBC Industrial PC, Telescope mounting for Monitor and Keyboard on the manipulator for a compact and ergonomic test cell

SummaryReliable and Repeatable Test Results by Design Reliable and repeatable multi-site testing requires floating resources with independent groundconnections to avoid interference commonly associated with a common ground pathway. Cogent ATE’s Floating Test Sites™ (FTS) System Architecture provides electrical separationbetween individual test sites in automatic test equipment (ATE) by providing floating resources withindependent ground connections for each individual device under test (DUT) sites. This feature allowseach device’s test results to remain isolated from the test results of other adjacent sites. This leads tobetter test accuracies and fewer false rejects due to device-to-device interference errors. In Automatic Test Equipment (ATE), the best path is the shortest path. All resources reside in thetest head. An included full-featured manipulator then that brings the test head as close to theDevice-Under-Test （DUT）as possible for both wafer level and final test configurations. Guaranteed Multi-Site Testing Cogent ATE’s Automatic Test Replication™ (ATR) Technology allows a test solution to be scaledfrom single to multi-site with ease, i.e. with a click of button and without any risk. This technologyeliminates the long and tedious routine of copying a single site test program, modifying it formulti-site testing and then debugging the new test program. Since all of our analog and digitalresource boards are Floating Quad-Site Testing™ ready, which means that the success ofconversion from single to multi-site testing will not be left to chance, i.e. the skills of the testengineer or the availability of floating resources. Our multi-site test solution are guaranteed to worksince each individual test sites are running on identical sets of hardware that are electrically isolatedfrom each other. Wide Range of Target Devices By choosing from a wide range of resources, the Leopard A Series can test devices from severalhigh-volume IC markets, such op-amps, MOSFETs, Power Management Devices, ADC, DAC andAudio CODEC.

page 2 Cogent ATE Systems Corporation | Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China | Tel: +86(10)59000102 | Fax:+86(10)58850677 | www.CogentATE.com

Cogent ATE Leopard Series

    

Cogent ATE Systems Corporation | Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China | Tel: +86(10)59000102 | Fax:+86(10)58850677 | www.CogentATE.compage 3

Cogent ATE Leopard Series

Higher Throughputs and Lower Capital CostWe have achieved significant cost advantages over the traditional ATE vendors by using the latest electronics and by incorporating our proprietary embedded IP core technology, Tester-on-a-chip™, in our hardware. Cogent ATE’s Tester-on-a-chip™ (ToC) is a collection of intellectual property (IP) cores that have been adapted by Cogent ATE to add Automatic Test Equipment (ATE) related functions such as timing accuracy, Arbitrary Waveform Generator (AWG), memory control, Digital Signal Processing (DSP) analysis, high-speed I/O capability, and jitter compliance. With the inclusion of a full-feature manipulator, Leopard A Series achieves close to zero footprint with most handlers and probers. Our choice of a Single Board Computer (SBC) based Industrial PC and the inclusion of Monitor and Keyboard mounts on the manipulator creates a compact and ergonomic test cell friendly to both engineers and operators.

Friendly Software for both IC design and Production environment Leopard A Series test system software Easy ATE™ has several industry-first features that are very useful for the debug and characterization of power ICs. In most ATEs a simple voltage force and current sense scenario may damage the ATE if the sensed current is large. Some ATEs try to dissipate the sense current with large heat sink. Cogent ATE’s patented technology allows the Power IC designer to observe a static sense a current as large as 2 Amp and 50 Volt.

Templates for individual devices test are created automatically, allowing the user to focus on high-level function calls to program devices and provide a means to build family generic templates without subsequent code changes .This environment provides the best features of template-driven programming and the fine control of procedural compiled commands.  

Easy ATE™ to provide a graphical representation of the hardware and give the user full control over device and instrument conditions.

Powerful program editor.  

Data analysis and map-making.

Specifications   

   

  Instruments DescriptionBase MUX Multiplexer Relay Control

Unit MUX to control 96 relays on DUT board, 100 mA

Base QVM* Quad Voltage Measurement Unit

4 channels, 16 bits ADC Converters

Base QTMU Quad Time Measurement Unit

Provides a wide range of interval and frequency measurement, 5ns~200ms / 20Hz~10MHz (125ps resolution)

Analog MVI* Medium Power V/I Source 4 channels, ± 20 V, ± 400 mA 2 channels, ± 20 V, ± 20 mA

Analog DPVI* Dual Power V/I Source 2 channels, ± 50 V, ± 10A pulsed Analog QVI Quad V/I Source 4 channels, ± 40 V, ± 400 mA Analog MVB Multi Voltage Bias 8 channels, ± 20 V, ± 20 mA Digital DSS Digital Subsystem 32 channels, 10 MHz data rate, 512K

Logic Vector Memory Mixed ACSM Alternating Current

Source/Measure Unit ACS, 4 channels, ± 10 V (p-p), 20 Hz – 2 MHz ACM, 4 channels, ± 100 V measure unit with 400Ksps or 10 Msps

Configuration Restrictions must contains one MUX Slot contains one QTMU Power Requirements AC single phase, 110 V, 20 A or 220 V, 10A

Cogent ATE Systems Corporation Room 705,SOHO Shangdu North Tower B No.8 Dongdaqiao Road,Chaoyang District Beijing 100020, P.R.China Tel: +86(10)59000102 | Fax: +86(10)58850677 World Wide Web | www.CogentATE.com Cogent ATE is a registered trademark; the Cogent ATE logo and Leopard Series are trademarks of Cogent ATE Systems Corporation. All other trademarks are the property of their respective owners. © 2008 Cogent ATE Systems Corporation. All rights reserved.

Width inches (cm) Depth inches (cm) Height inches (cm) 24.5(62) 20.5(50) 42(102)

.Operational Dimensions