mj-sparnaay documents

Surface segregation in Au0.1Cu0.9 crystals
Documents Surface segregation in Au0.1Cu0.9 crystals
Thermodynamics (with an emphasis on surface problems)
Documents Thermodynamics (with an emphasis on surface problems)
16×23 1/2 cm 2, 310 pages. Price 84 s Daniel R. Frankl, ,Electrical Properties of Semiconductor Surfaces International Series of Monographs on Semiconductors Volume 7 (1967) Pergamon
Documents 16×23 1/2 cm 2, 310 pages. Price 84 s Daniel R. Frankl, ,Electrical Properties of Semiconductor Surfaces International Series of Monographs on Semiconductors Volume 7 (1967) Pergamon
Ion-size corrections of the Poisson-Boltzmann equation
Documents Ion-size corrections of the Poisson-Boltzmann equation
On the additivity of London-Van der Waals forces: An extension of London's oscillator model
Documents On the additivity of London-Van der Waals forces: An extension of London's oscillator model
Measurements of attractive forces between flat plates
Documents Measurements of attractive forces between flat plates
Van der waals forces and fluctuation phenomena
Documents Van der waals forces and fluctuation phenomena
The interaction between germanium and cupric ions in an aqueous solution
Documents The interaction between germanium and cupric ions in an aqueous solution
The donor and acceptor character of surface states on germanium as affected by the adsorption of carbon monoxide
Documents The donor and acceptor character of surface states on germanium as affected by the adsorption of carbon monoxide
Surface segregation in Au0.1Cu0.9 crystals
Documents Surface segregation in Au0.1Cu0.9 crystals
On the electrostatic contribution to the interfacial tension of semiconductor/gas and semiconductor/electrolyte interfaces
Documents On the electrostatic contribution to the interfacial tension of semiconductor/gas and semiconductor/electrolyte interfaces
Auger electron spectroscopy as a tool for measuring the diffusion of foreign atoms in solids near their surface
Documents Auger electron spectroscopy as a tool for measuring the diffusion of foreign atoms in solids near their surface