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be-fischer documents
Documents
The scanning heavy ion microscope at GSI
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The heavy-ion microprobe at GSI — Used for single ion micromechanics
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Single-particle techniques
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Microtomography by heavy ions
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Aiming and hit verification in single ion techniques
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Simultaneous imaging of upset- and latchup-sensitive regions in a static RAM
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About the art to shoot with single ions
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An example of what you can miss in single-event-effect testing, when you do not have a microprobe