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Functional Test
for Automotive Electronics
Manufacturing Presented by:
Rodrigo Cantu
Agilent Technologies
Agenda
1. Automotive Market Overview
2. Automotive Electronics Functional Test
4. Agilent Functional Test Solutions
6. Question & Answer (Q&A) Session
3. Functional Test Challenges
5. HEV/EV – Functional test & Solutions
a
b
c
d
j
l k
e
f
g
h
i
Automotive Electronics in Cars Today
Body Electronics -
Comfort/Convenience
Powertrain & Hybrid
Safety and
Driver Assistance
Infotainment &
Communications
a. Adaptive Cruise Control
b. Collision Warning
c. Tire pressure monitoring
d. Audio Systems
e. Multimedia Systems
f. Rear Seat Entertainment
j. Instrument Cluster
k. Remote keyless entry
l. Climate Control
g. Engine management
h. Braking System
i. Power Steering
Air Conditioning
System
Automotive Market and Applications
Powertrain and Hybrid Systems Body Electronics
Safety and Chassis Infotainment and Telematics
Gasoline and Diesel Engine Management
Automatic Gearbox and Transmission
Hybrid Drive Train
Convenience and Comfort ECU – Lighting,
Climate Control, Memory Seats, etc.
Driver Assistance ECU – Night Vision, Cruise
Control, Park/Reverse Assist, etc.
Security ECU – Remote Keyless Entry (RKE)
Airbag ECU – Conventional and Adaptive)
Braking Systems – ABS and Traction Control
Tire Pressure Monitoring Systems (TPMS)
Collision Avoidance Electronics – DSRC
In-Car Entertainment – Radio, DAB/DVB, etc.
In-Car Networking – Bluetooth, WiMax, etc.
Telematics – GPS Navigation
Instrument Cluster – Dashboard
The Next Key Agenda for Automotive Hybrid and Electric Vehicles
Agenda
1. Automotive Market Overview
2. Automotive Electronics Functional Test
4. Agilent Functional Test Solutions
6. Question & Answer (Q&A) Session
3. Functional Test Challenges
5. HEV/EV – Functional test & Solutions
Remote Keyless Entry (RKE)
RF
Receiver
Remote Keyless Entry (RKE transmitter) – functional
test
Frequency Counter
Spectrum Analyzer
Voltage / Current
Source
Measurement
Instrument
Stimulate &
Measurement
Signal
Power Supplies
Power Management
Battery leakage
current
Power Analysis, e.g:
output amplitude,
center frequency
Response time
Remote Keyless Entry (RKE receiver) – functional test
Arbitrary Waveform Generator
CAN/LIN Transceiver
Communication
Power Supplies
Power Management
Stimulus Signal
Vector Signal Generator
Frequency Counter
Measurement
Instrument
As transmitter ( generate
FSK/ ASK modulate data)
Immobilizer testing, e.g:
RFID simulate charge cycle,
ignition
Time elapse
Infotainment System
Microcontroller
RF
Receiver
Power
Amplifier
Power
Supply
CAN
Transceiver
Power Management Communication
Input RF signals
CAN/LIN Transceiver Vehicle Battery
Radio station tower
Bluetooth devices
GPS Satellite
Multi Channel
Loudspeaker
Output Audio Signal
Infotainment System – functional test
Microcontroller
RF
Receiver
Power
Amplifier
Power
Supply
CAN
Transceiver
Power Management Communication
Input RF signals
CAN/LIN Transceiver Power Supply
Vector Signal
Generator
Wireless Connectivity
Test Set
Audio Generator +
Analyzer
Measurement
instrument
Generate modulated
signal, e.g: GPS,
FM/AM/RDS
Bluetooth test, e.g:
pairing, headset
Power level
Frequency response
THD+N
SINAD
IMD
Crosstalk
Anti-Lock Braking System
Microcontroller
High Side
Switch
Low Side
Switch
Sensor
Receiver
CAN
Transceiver
Voltage
Regulator
Power Management Communication
CAN/LIN Transceiver Vehicle Battery
Input Sensor
Wheel Speed Sensor
Pump Motor
Output Sensor
Valves
Simulate and
Measurement
Signal
Voltage / Current
Source
Anti-Lock Braking System – functional test
Microcontroller
High Side
Switch
Low Side
Switch
Sensor
Receiver
CAN
Transceiver
Voltage
Regulator
Power Management Communication
CAN/LIN Transceiver Power Supply
Sensor Input
Arbitrary Waveform
Generator
Measurement
Instrument
Digital
Multimeter
Digitizer
Wheel slippage
detection
Crosstalk
Flyback voltage
Leakage current
Saturation voltage
Saturation voltage
Flyback voltage
Body Control Modules (BCM)
Microcontroller
High Side
Switches
Low Side
Switches
H-Bridges
Sensor Inputs
Break Pedal Sensor
Wheel speed sensor
Throttle Plate Sensor
Radar Sensor
Actuators
Throttle Actuator
Switch
Monitoring
CAN/LIN
Transceiver
Power
Supply
Power Management
CAN/LIN Transceiver
Communication
Brake Actuators
Vehicle Battery
Body Control Modules (BCM) – Functional Test
Sensor Inputs
simulated by Stimulus
Instrumentation
Actuators simulated
by Loads and output
are measured
Power Management
CAN/LIN Transceiver
Communication
Power Supplies
Device Under Test
(ECU)
Arbitrary Waveform Generator
Digital Analog
Converter
Voltage/ Current
Source
Digital
Multimeter
Frequency Counter
Data Acquisition Unit
Leakage Current
High Side Driver
Low Side Driver
Connectivity
Power On
Analog Input
Digital Input
Engine Control Modules (ECM)
Microcontroller
CAN/LIN
Transceiver
Power
Supply
Input
Sensor Output
Actuators Crankshaft Position
Sensor
Oxygen Sensor
Mass Air Injection
Sensor
Radar Sensor
Throttle Air Bypass
Solenoid
Fuel Injector System
EGR Shutoff Solenoid
Sensor Inputs Actuators
Power Management
CAN/LIN Transceiver
Communication
Vehicle Battery
Engine Control Modules (ECM) – functional test
Microcontroller
CAN/LIN
Transceiver
Power
Supply
Input
Sensor Output
Actuators
Stimulus
Instrumentations
Actuators
simulated by
Loads and output
are measured
Power Management
CAN/LIN Transceiver
Communication
Arbitrary Waveform
Generator
Voltage/
Current
Source
Digital to Analog
Converter
Power Supplies
Digital
Multimeter
Frequency Counter
Data Acquisition Unit
Open/Short
Power On
Analog Input
Digital Input
Starter Key
Knock Sensor
High side driver
Low side driver
Leakage current
DUT-Assisted (Simulation) Testing Concept
Sensor Inputs
simulated by Stimulus
Instrumentation
Actuators simulated
by Loads and output
are measured
Power Management
CAN/LIN Transceiver
Communication
Power Supplies
Device Under Test
(ECU)
Arbitrary Waveform Generator
Digital Analog
Converter
Voltage/ Current
Source Digital
Multimeter
Frequency Counter
Data Acquisition Unit
High
Current
Relays
Relays for Input
Conditioning
Signal Routing and Load Simulation
Power Supply
Measurement
Instrumentations
DMM Frequency
Counter
Microcontroller
Communication Power
Management
Input
Conditioning Output
Drivers
ECU
Switching Unit Stimulus
Instrumentations
Arbitrary
Waveform
Generator DAC Signal
Routing
Load
Simulation
How We Test the ECU Inputs?
Input Conditioning: - Switch High (with or without loads)
- Switch Low (with or without loads)
- Bridge Load Connections
How We Test the ECU Outputs?
Output Load Simulation: - Pull-Up (with or without loads)
- Pull-Down (with or without loads)
- Bridge Load Connections
How is UUT flashing done at functional test?
UUT Power
Supplies
Controller
(IPC)
AUX Power
Supplies
Switching
Resources
Others (e.g. Functional Test)
Platform support (e.g. sensors,
pneumatic lock,
electricity safety)
System
Flash device(s)
Fixture (base)
Aux. Equipment
Sensors,
Grounding
UUT(s)
UUT adapter(s)
UUT(s) UUT(s)
Flashing Station Test System Architecture
Power
Supplies
Switching
Modules
UUT Power
Supplies
Controller
(IPC)
AUX Power
Supplies
Switching
Resources
Others (e.g. Functional Test)
System
Functional
Test
Main
Controller
Agenda
1. Automotive Market Overview
2. Automotive Electronics Functional Test
4. Agilent Functional Test Solutions
6. Question & Answer (Q&A) Session
3. Functional Test Challenges
5. HEV/EV – Functional test & Solutions
“Functional Testing is as per customer requirement”
• Customer gives free will to how functional testing is performed
• Understands Pass / Fail…
“Understands importance of Functional Test but need expertise”
• Realizes that good functional test is essential to better yield, quality, throughput…
• No expertise in production for functional testing / test development
“Team has no bandwidth to cover end of line testing”
• Interested to work with external parties for functional testing implementation
• Need expert advice and hardware to make functional test a success
Functional Test Challenge #1 – Functional Test, Need Help?
Functional Test Challenge #2 – Test Development Problems
Customized Cables
Self Designed
Connections/Circuits
Instruments
Cost $$$
We take these worries away from you!
Full range of Agilent
Instruments
Standard
Switch & Load Modules
Standard Design
Interconnect
Standard Cables
System built for
Automotive Tests
Software
Integration through
TestExec SL
Global
uncompromised
support
Agilent
Standardization
Toyota recalled 8 million cars in total from 2008 to 2009
• Unwanted acceleration problems ( at least 58 crashes reported in US tied to this)
• NASA and NHTSA investigated found problems within electronic throttle control
Ford recalled 2.1 million trucks in 2011
• Airbags go off without warning
• Root cause, wiring placement caused short circuit triggering air bag blow off
General Motors recalled 1.4 million vehicles in 2010
• Fire Hazard problem from the heated wind shield washer fluid system
• Short Circuit in board causes ground wire to overheat and lead to fire
Functional Test Challenge #3 – Are you struggling with them?
Most problems when drilled down, came to one common
answer: “Not tested / Test Not Covered / Not Enough
Coverage”
Or do you want to get to the next ADVANCE Level?
We can help you!
Areas: Test Methodologies, Quality & Test Coverage
Technical Know How
for Automotive Functional
Test
Want to improve
your test coverage
and confidence?
Want to make the
best out of your
functional test?
How we help you to be successful?
Maverick Test: Achieve wider test coverage, better test confidence
Scenario: Not all pins are covered during a test, how do you know if there are
unwanted/unknown “remnant signals” or cross talks happening?
3ms
3ms
3ms
3ms
3ms
3ms
3ms
3ms
Agilent
M9216A
Agilent
M9216A
P01
P02
P03
P04
P05
P06
P07
P08
P09
P10
P11
P12
P13
P14
P15
P16
3ms
3ms
3ms
3ms
3ms
3ms
3ms
3ms
T (ms)
Pin No.
Pin No.
T (ms) Pins under monitoring
Pins under test
DUT
14V
0V
14V
0V
P09
P10
P11
P12
P13
P14
P15
P16
Monitored Pins Expected State
0V
0V
0V
0V
0V
0V
14V
V
T (ms)
0V
3ms
Agenda
1. Automotive Market Overview
2. Automotive Electronics Functional Test
4. Agilent Functional Test Solutions
6. TS-8900 System Demonstration
7. Question & Answer (Q&A) Session
3. Functional Test Challenges
5. HEV/EV – Functional test & Solutions
Automotive FMT System Architecture
System Controller
(Software & IO)
Measuring/Stimulus
Instrumentation
Power Sources
Signal/Load
Switching
Mass Interconnect Device Under Test
(DUT)
DUT-Specific
Connections
Analog Digital Power In
terf
aces:
PX
I, L
XI,
GP
IB
Serial Communication
Agilent Functional Systems
High Coverage &
Performance System
• Body Electronics
• Engine Control
• PXI-Based
• Parallel Test Method
U8972A
Mid-Size Test System
• ABS Sensors,
• Climate Control
• Tire Pressure
Monitoring (TPMS),
• Instrument Clusters
Compact Test System
• RKE
• Flashing
• Instrument Clusters
TS-5040
High Performance
System
• Body Electronics
• Engine Control
• VXI-Based
Instruments
TS-5400
TS-5020
New
U8972A (Venturi S3) – System Architecture
Agilent PXI Instruments &
Chassis Switch Load Unit Modular Power Supplies Macpanel Blocks & Cabling
U8972A
CORE
N3300 E-Load
1. 2.0m rack with solid door and extractor fan
2. 3-Phase only PDU with EMO switch
3. Power Distribution Unit (PDM)
4. Thermistor
5. IPC backplane, CPU i5-2400, RAM 4GB, HDD 250GB
6. Windows 7, Agilent IO, TestExec SL 7.1, TS-5000 7.1
7. PXI-based instrumentation
8. 210 pin & 64 hi-power ICA blocks & cabling
9. N3300A eLoad mainframe & modules
10. 1kW and 400W Modular Power Supplies
U8972A – VALUE PROPOSITION
Value 1
Throughput
Improvement
Value 2
Floorspace
reduction
Value 3
New Applications
Ease of use
Lower maintenance cost
U8972A Value Proposition 1 –
Throughput Improvement via ≥ 2-DUT test operation (Speed is KING!)
Description E8786B (Venturi S2)
U8972A (Venturi S3)
%Savings
Test
Time/DUT
(s)
59s 39s
Est. Annual
output
per system
285K 431K
System
Price
$140K $179K
DUT
cost/system/
year
$0.49 $0.41 15.4%
DUT DUT
In-sequence test
TS-5400 (Venturi S2)
Note:
Assumption made for Annual output calculation:
1 system is running at 80% capacity for 12 months with 2 shifts (8hr/shift)
DUT
DUT
U8972A (Venturi S3)
DUT
DUT
Value Proposition 2 –
Floor space & Operator reduction of 50% vs. Venturi S2 via 2-DUT parallel
test support
Note:
Operator wages & floor space cost vary from location to location
Assumption made for Annual output calculation:
1 system is running at 80% capacity for 12 months with 2 shifts (8hr/shift)
2-DUT test
DUT
E8786B (Venturi 2)
DUT
DUT
U8972A
(Venturi
S3)
DUT
E8786B
(Venturi S2) DESCRIPTION 2x
E8786B
1x
U8972A
%
Savings
Test time/DUT (s) 29.5s 39s
DUT vol. output/year
(K units)
570K 431K
Total system price
(US$K)
$280K $179K
System cost/DUT/year
(US$)
$0.49 $0.41
Operator wages/DUT/year
(US$)
$0.04 $0.03
Total Cost/DUT/year (US$) $0.53 $0.44 17%
Conventional Method
DMM + Pin Matrix
Sequential measurement
Path needs to be
switched
New Method
M9216A HV-DAQ
Parallel measurement
Does NOT require an
external switch matrix
or multiplexer
DMM 3ms
P01
P02
P03
P04
P05
P06
P07
P08
P09
P10
P11
P12
P13
P14
P15
P16
DUT
Total Test time: 24ms*
Output Pins 6ms
9ms
12ms
15ms
18ms
21ms
24ms
M9216A
3ms P01
P02
P03
P04
P05
P06
P07
P08
P09
P10
P11
P12
P13
P14
P15
P16
DUT
Total Test time: 3ms*
Speed Improvement = 87.5%
Output Pins 3ms
3ms
3ms
3ms
3ms
3ms
3ms
Parallel Test Method Enabler for Automotive
• Used for stimulus and
measurement signal
routing.
• 32x4 and 64x4 pin matrix
for selection.
• Up to 24 instrument matrix.
• Up to 4 analog bus lines.
Agilent Switch Unit for Automotive
Pin Matrix Cards Load Cards
• User for DUT load simulation.
• 8 to 48 channels per card.
• Up to 30A current with fly-back
protection.
• Supports pull-up, pull-down, and
bridge load connection.
• Supports inductive/resistive
loads – single or multiple.
Stimulus and Measurement
Instrumentations
DUT
Load Simulations
E6198B Switch/Load Unit (SLU) Overview
Page 40
MSD-FMT / SLU SHP & PRC/PC checkpoint
Agilent Restricted
09 June 2010
Standalone System Integrated
New E6198B SLU
• Multi-channel support
• Improved reliability and safety
Lower risk of backplane failure
Utilization of fuses
• Introducing two versions, available for standalone orders
SLU Improvements
• Improvements to back plane for reliability and safety • Break out panel for easy access to SLU settings • Improved switching speed for better throughput
Introducing the NEW Standalone SLU
• Bench top usable SLU • External access for cables with protective cover • SLU setting selection at rear panel
E6198B Switch/Load Unit Summary
Page 45
MSD-FMT / SLU SHP & PRC/PC checkpoint
Agilent Restricted
09 June 2010
• 150W 5v, 150W 12v and 25W for -12v power supply. Support full switching capability
• Power bus current rating increased from 22A to 30A.
• SLU dimension maintained. Compatible with existing system layout
• Backward compatible with all cards supported by existing SLU
• Fuse protection prevent over current from power supply
• Easy communication connection access at front panel via USB
• Status Indicators
• Qualified as standalone product
E6198B Switch/Load Unit Summary
Page 46
MSD-FMT / SLU SHP & PRC/PC checkpoint
Agilent Restricted
09 June 2010
New Load and Switch Cards
New Switch Cards
E8782A 64-Channel Matrix with Instrumentation Matrix
E8783A 64-Channel Matrix without Instrumentation Matrix
New Load Cards
N9377A 16-Channel Dual Load Card (7.5A)
N9378A 24-Channel Quad Load Card (2.0A)
N9379A 48-Channel Dual Load Card (2.0A)
E6177B 24-Channel Load Card (2.0A) with current sense will replace the older E6177A model without the I-sense capability
Load Cards being Replaced
Matrix & Load Cards from Agilent
Pin matrix & load cards
E6198B
SLU
Pin Matrix Cards E8782A-FG (24-ch inst, 40-ch matrix)
E8783A-FG (64-ch matrix)
Load Cards E6175A-FG (8-ch, 7.5A, inductive load)
E6176A-FG (16-ch, 7.5A common load)
E6177A-FG (24-ch, 3A, low current load)
E6178B-FG (8-ch, 30A, hi-current load)
N9378A-FG (24-ch, 1A, lo-current, quad load)
N9379A-FG (48-ch, 1A, lo-current, quad load)
U7177A-FG (24-ch, 7.5A, common load, I-sense)
U7178A-FG (8-ch, 40A, hi-current load)
U7179A-FG (16-ch, 15A, hi-current load)
Agenda
1. Automotive Market Overview
2. Automotive Electronics Functional Test
4. Agilent Functional Test Solutions
6. Question & Answer (Q&A) Session
3. Functional Test Challenges
5. HEV/EV – Functional test & Solutions
Market Dynamics
Battery Management System
In vehicle – Drive system Outside vehicle - Infrastructure
0.0%
20.0%
40.0%
60.0%
80.0%
100.0%
2010 2011 2012 2013 2014 2015
Electric vs Internal Combustion Vehicle
Light Duty Vehicles
Electric Vehicles
Source – Pike Market Research
• Electric vehicle only constitute 2% of
overall market opportunity today
• Infrastructure will be needed in order to
make EV successful
• Huge potential growth opportunity for
companies develop batteries, motors, on
board chargers and EV components that
enhance performance and safety
Block / Module
EV /HEV modules
Cell Pack
Battery
Inverters
Inverter Converter Controller
Converters BMS
Acronym
BMS – Battery Management System
Agilent focus in HEV, EV & PHEV
Outside the car
• Home charging station
• Public charging station
Inside the car
• Battery Management System
• DC to DC converters
• DC to AC inverters
Agilent’s focus
EV & HEV customer’s challenges
High system
uptime -
Designed for
manufacturing
and easy to
troubleshoot
Acronym
ASP – Average Selling Price
Floor space
– Solution that
optimize floor
space usage
Test Speeds
– Long test
time 3 – 12
mins
depending on
the test
requirements
Product
certification
– CE and
safety
certified with
extraordinary
safety
features
System price
– Optimized
power matrix
and power
supply for
better cost
DUT
Fixture
DUT
Cooling
system
Customer’s
None
Standard
Functional
test system
650mm
Agilent EV, HEV and PHEV proposal
Power Supply and
Electronic Load
High power
Switch
3 Phase motor
and added
instruments
650mm 650mm 650mm
1950mm
High Powered
Power supply and Eload
Power
Matrix
650mm 650mm
Agilent
Standard Platform
Value propositions
1. Leverage Agilent Standard
platform
2. Compact power switching
• Less floor space required
• Easy maintenance
3. High safety features
Cell Balancing – Background information
• Balancing compensates for any underperforming cells in a
battery.
• During charge, a degraded cell with a diminished capacity will
become fully charged sooner so it will be subject to
overcharging until the rest of the cells reach their full charge.
• During discharging, the weakest cell will have the greatest
depth of discharge causing premature failure.
• Cell balancing extends the battery pack’s life by compensating
for weaker cells by equalizing the charge state on each cell.
Agilent application specific value proposition (example)
Cell Balancing Challenges
• Could be a long process. In some cases, takes nearly 1 hour.
• If individual cells are balanced by discharging through resistors --
• Discharging circuit cost and complexity is low, but …
• Time is long: All cells must be discharged to lowest cell voltage.
• Limited control: Fixed R means one discharge rate; Using multiple
Rs to select discharge rate raises cost and complexity.
• Active balancing can significantly speed up balancing process
from 2x to 10x by charging some cells and discharging
others to balance to the mid-voltage point.
Active balancing with Agilent N6783A-BAT
Overview of process
Process:
• Measure voltage of each cell
• Calculate mid point (Vmid)
• Program cells above Vmid to
discharge down to Vmid
• Program cells below Vmid to
charge up to Vmid
• Cuts balancing time in half,
at a minimum
Options:
• Further decrease balancing time
with higher charge/discharge rates
• Maintain cell safety with pulsed or
variable rates
• Since charge/discharge function is
PC controlled one can develop
more advanced algorithms to
optimize speed and complexity
…
Some cells charging, some discharging
Cell 1
Cell 2
Cell 3
Cell N
N6783A-BAT
Charger-Discharger
#1 = Charging
N6783A-BAT
Charger-Discharger
# N = Discharging
N6783A-BAT
Charger-Discharger
# 3 = Charging
N6783A-BAT
Charger-Discharger
# 2 = Discharging
…
Agenda
58
1. Automotive Market Overview
2. Automotive Electronics Functional Test
4. Agilent Functional Test Solutions
6. Question & Answer (Q&A) Session
3. Functional Test Challenges
5. HEV/EV – Functional test & Solutions