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The top documents tagged [vlsi test principles]
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Technical University Tallinn, ESTONIA DESIGN FOR TESTABILITY Raimund Ubar
[email protected]
220 views
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On Diagnosis of Multiple Faults Using Compacted Responses Jing Ye 1,2, Yu Hu 1, and Xiaowei Li 1 1 Key Laboratory of Computer System and Architecture Institute
214 views
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Spring 08, Mar 13 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 VLSI Test Principles Vishwani D. Agrawal James
221 views
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On Diagnosis of Multiple Faults Using Compacted Responses
29 views