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The top documents tagged [tid effects]
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Electronic Systems Support LHC LVPS Procurement - Status Reported by: Chris Parkman, PH-ESS February 10, 2006 Tests by: Bruno Allongue, Philippe Fontaine,
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Design and Testing of a Radiation Hardened 13-bit 80 MS/s Pipeline ADC Implemented in a 90nm Standard CMOS Process B. Vaz, N. Paulino *, J. Goes *, M
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MURI Device-level Radiation Effects Modeling Hugh Barnaby, Jie Chen, Ivan Sanchez Department of Electrical Engineering Ira A. Fulton School of Engineering
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Ghosh_uta_2502D_10218.pdf
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