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The top documents tagged [test time savings]
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A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for “Big-D/Small-A” Mixed-Signal SoCs Sudarshan Bahukudumbi Sule Ozev Krishnendu
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Sudarshan Bahukudumbi Sule Ozev Krishnendu Chakrabarty Vikram Iyengar
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