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The top documents tagged [test generation n contest]
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Feb. 23, 2001VLSI Test: Bushnell-Agrawal/Lecture 141 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods n Use of fault simulation for test generation
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1 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods n Use of fault simulation for test generation n Contest n Directed search n Cost functions
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 14/13alt1 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods (Lecture 13alt in the Alternative
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