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The top documents tagged [surface analysis technique]
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XPS Slides
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PC4250 Secondary Ion Mass Spectrometry (SIMS). What is SIMS? SIMS is a surface analysis technique used to characterize the surface and sub-surface region
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Secondary Ion Mass Spectrometry (SIMS) Bombardment of a sample surface with a primary ion beam ( I p ) followed by mass spectrometry of the emitted secondary
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