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The top documents tagged [substrate current]
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umi-umd-1806
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Recent Challenges. 2 Soft Errors Scaling: SEU (Single-event upset): −Ionizing radiation corrupts data stored Cause: −Radioactive impurities in device
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Remote Plasma Sputtering: Recent Developments in Understanding the Process S. Thornley, P. Hockley, M. Thwaites, J. Dutson Dr James Dutson Senior Development
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