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The top documents tagged [results defects]
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Best Practices in Data Warehouse Testing GOOD
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® IBM Software Group © 2006 IBM Corporation Governing Test and Development with IBM Rational Test Management Solutions
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Defect Tolerance for Yield Enhancement of FPGA Interconnect Using Fine-grain and Coarse-grain Redundancy Anthony J. YuGuy G.F. Lemieux September 15, 2005
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FPGA Defect Tolerance: Impact of Granularity Anthony YuGuy Lemieux December 14, 2005
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