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The top documents tagged [optimal measurement]
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Multitype ICP Emission Spectrometer (ICPE-9000)
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© 2006 MVTec Software GmbH Press Colloquium Part II Building Technology for the Customer’s Advantage
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VEGA Pressure & Level Measurement – Building Materials, Stone, Aggregates Industry Applicationsindustry applications
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Meander-line structure for eddy-current sensing of magnetic nanoparticles
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Quantum enhanced metrology R. Demkowicz-Dobrzański 1, K. Banaszek 1, U. Dorner 2, I. A. Walmsley 2, W. Wasilewski 1, B. Smith 2, J. Lundeen 2, M. Kacprowicz
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APM Automation Solutions Ltd. Special Installation Solutions Adi Idel Director of Engineering
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Jesse Smith Industrial Engineering
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Getting a Handle on a Single Qubit Andrew Doherty work in collaboration with Agata Branczyk, Paulo Mendonca (poster), Steve Bartlett, and Alexei Gilchrist
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Engineering Measurement System (EMS) Project Charter Thursday, January 23, 2003 Kim Constantikes (
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Ramon Creager (
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)
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Leica-TS30
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Leica TS30
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