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The top documents tagged [noise hadamard matrix]
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Nov. 21, 2006ATS'06 1 Spectral RTL Test Generation for Gate-Level Stuck-at Faults Nitin Yogi and Vishwani D. Agrawal Auburn University, Department of ECE,
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Jan. 9, 2007 VLSI Design Conference 20071 Spectral RTL Test Generation for Microprocessors Nitin Yogi and Vishwani D. Agrawal Auburn University Department
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