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The top documents tagged [increasing bias voltage]
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High resolution morphological and mechanical characterization of Niobium films obtained by MS and Biased MS PVD E. Bemporad, M. Sebastiani, F. Carassiti
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H. W. Choi 1, 2 , K. -R. Lee, R. Wang 3 , K. H. Oh 2
28 views
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1 FoCal Status of Silicon Pad detector Array: Design and Tests 1.Review of results from last test beam 2.Plan for the test beam for 2015 11 March 2015
218 views