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The top documents tagged [increased leakage currents]
Engineering
Set and seu analysis of cntfet based designs in harsh environments
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12004 MAPLD: 141Buchner Single Event Effects Testing of the Atmel IEEE1355 Protocol Chip Stephen Buchner 1, Mark Walter 2, Moses McCall 3 and Christian
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Hassan Mostafa & M. Anis & M. Elmasry University of Waterloo, Ontario, Canada
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Space Radiation Effects in Electronic Components. Len Adams Professor Associate, Brunel Univ. Consultant to Spur Electron. For: PA and Safety Office. For:
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By: Jabulani Nyathi Washington State University School of EECS April 30, 2009 Circuits and Architectures to Deliver Low Power and High Speed Systems
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By: Jabulani Nyathi Washington State University School of EECS April 30, 2009
25 views