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The top documents tagged [field emission source]
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1 Microtexture: Electron Diffraction in the SEM (L16) Texture, Microstructure & Anisotropy, Fall 2009 A.D. Rollett, P. Kalu
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Silicon VLSI backplanes which shows cracking in the Al mirror Image provided by Dr Neil Collings
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Scanning electron microscopy Katedra experimentálnej fyziky FMFI UK B r a t i s l a v a
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Silicon VLSI backplanes which shows cracking in the Al mirror Image provided by Dr Neil Collings
20 views
Documents
Silicon VLSI backplanes which shows cracking in the Al mirror Image provided by Dr Neil Collings
19 views
Documents
Focused ion beam (FIB)
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