The top documents tagged [detector thickness]

Image quality and spectroscopic characteristics of different silicon pixel imaging systems M. G. Bisogni, D.Bulajic, M. Boscardin, G. F. Dalla Betta, P
Documents Image quality and spectroscopic characteristics of different silicon pixel imaging systems M. G. Bisogni, D.Bulajic, M. Boscardin, G. F. Dalla Betta, P

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GaAs radiation imaging detectors with an active layer thickness up to 1 mm. D.L.Budnitsky, O.B.Koretskaya, V.A. Novikov, L.S.Okaevich A.I.Potapov, O.P.Tolbanov,
Documents GaAs radiation imaging detectors with an active layer thickness up to 1 mm. D.L.Budnitsky, O.B.Koretskaya, V.A. Novikov, L.S.Okaevich A.I.Potapov, O.P.Tolbanov,

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1 2003 ICFA School LABORATORY COURSE ON SILICON SENSORS Elisabetta Crescio – crescio@to.infn.it Marek Idzik – idzik@to.infn.it Tutors: This course consists
Documents 1 2003 ICFA School LABORATORY COURSE ON SILICON SENSORS Elisabetta Crescio – [email protected] Marek Idzik – [email protected] Tutors: This course consists

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Hartmut F.-W. Sadrozinski,Beam Test of LGADs, 10th Trento, Feb. 2015 Beam Test of LGADs Hartmut F.W. Sadrozinski with Astrid Aster, Vitaliy Fadeyev, Patrick
Documents Hartmut F.-W. Sadrozinski,Beam Test of LGADs, 10th Trento, Feb. 2015 Beam Test of LGADs Hartmut F.W. Sadrozinski with Astrid Aster, Vitaliy Fadeyev, Patrick

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GaAs radiation imaging detectors with an active layer thickness up to 1 mm
Documents GaAs radiation imaging detectors with an active layer thickness up to 1 mm

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Overview on the development of front-end building blocks
Documents Overview on the development of front-end building blocks

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Heavy flavor production at RHIC
Documents Heavy flavor production at RHIC

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Heavy flavor production at RHIC Yonsei Univ. Y. Kwon
Documents Heavy flavor production at RHIC Yonsei Univ. Y. Kwon

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MALKHAZ JABUA
Documents MALKHAZ JABUA

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CCE in irradiated silicon detectors considering the avalanche effect
Documents CCE in irradiated silicon detectors considering the avalanche effect

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Techniques for determination of deep level trap parameters in irradiated silicon detectors AUTHOR: Irena Dolenc ADVISOR: prof. dr. Vladimir Cindro
Documents Techniques for determination of deep level trap parameters in irradiated silicon detectors AUTHOR: Irena Dolenc ADVISOR: prof. dr. Vladimir Cindro

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Novel Stripixel Detectors on High Resistivity p-type Magnetic Czochralski Silicon for Experiments at Super LHC Zheng Li, D. Lissauer, D. Lynn, P. O’Connor,
Documents Novel Stripixel Detectors on High Resistivity p-type Magnetic Czochralski Silicon for Experiments at Super LHC Zheng Li, D. Lissauer, D. Lynn, P. O’Connor,

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