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The top documents tagged [defocus slide]
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Opt 307/407 Practical Scanning Electron Microscopy Considerations in any microscopy: Resolution Magnification Depth of field Secondary information
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Depth and Motion Discontinuities Stan Birchfield Ph.D. oral defense Stanford University January 1999
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Mayank A. Nanavaty, DO, MRCOphth, MRCS(Ed) David J. Spalton, FRCP, FRCS, FRCOphth James F. Boyce, PhD Thomas J. T. P. Van den berg, PhD St. Thomas’ Hospital,
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