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The top documents tagged [comparison of resistive]
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Touchscreen technology
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Results with Micromegas modules at LP-TPC
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Gain fluctuations and Neff Analysis of March 2010 data Neff measurement Gain fluctuation measurements with TimePix Beijing, 30/03/20101 P. Colas - FJPPL-FCPPL-LCTPC
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Micromegas TPC Results from beam tests 7-module design ILD TPC mechanics and integration D. Attié, M. Carty, P. Colas, G. De Lentdecker, M. Dixit, M. Riallot,
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