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The top documents tagged [chip circuits]
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Diseño ASIC BOUNDARY SCAN. Diseño ASIC BOUNDARY SCAN IEEE 1149.1 JTAG Boundary Scan Standard Motivation Bed-of-nails tester System view of boundary scan
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PhD Dissertation
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Education
"A designer's guide to asynchronous vlsi" by Peter a. beerel, recep o. ozdag, marcos ferretti
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Theory of Power Saving
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Mini-SRAM Test Structures: Distributed SRAM Yield Micro Probes for Monitoring 3D Integrated Chips JB Kuang and Keith Jenkins IBM Research June 2013
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Marvin Tom University of British Columbia Department of Electrical and Computer Engineering
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JB Kuang and Keith Jenkins IBM Research June 2013
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Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard
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