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April 29, 2001Essentials of Test: Agrawal & Bushnell1 Essentials of Testing Vishwani D. Agrawal Agere Systems, Murray Hill, NJ 47974
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Michael
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2003Agrawal: Digital Test and DFT1 Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey
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Spring 08, Mar 13 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 VLSI Test Principles Vishwani D. Agrawal James
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Testing 1. 2 Problems of Ideal Tests n Ideal tests detect all defects produced in the manufacturing process. n Ideal tests pass all functionally good
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