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The top documents tagged [bypass register]
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5-JTAG
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5 Jtag
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Alexander Gnusin Introduction to DFT. Internal Scan Concept Used to get access to all internal chip registers: Scan inputs Scan outputs Func inputs Func
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(Jtag) boundary scan test - a practical approach - harry bleeker - peter van den eijnden - frans de jong - kluwer academic
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Debugging-with-JTAG
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Debugging With JTAG Vision2008
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1 Energy-Efficient Register Access Jessica H. Tseng and Krste Asanović MIT Laboratory for Computer Science, Cambridge, MA 02139, USA SBCCI2000
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Energy-Efficient Register Access
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Alexander Gnusin
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