Puvaneswaran ChelvanathanP65212
Principal Supervisor: Professor Dr. Nowshad Amin
Transmission Electron Microscopy (TEM)
Basic Principles & Application in Thin Film
Photovoltaic Materials
Presentation Outline
Introduction : Limitation of Visible Light Microscopy (VLM) Electron Wave-Like Nature TEM Components & Working Principle TEM Image Generation Interpretation of TEM ImagesApplication in PV Research Field TEM Facility : Hi-Tech Ltd. Conclusion
Limitation of Light Microscopy
Resolution Illustration
Diffraction Barrier Phenomena
Visible Light & λ
“ It is a poor comfort to hope that human ingenuity will find ways and means of overcoming this limit”
Abbe’s Diffraction Limit :
20 years later…….
Particle-Wave DualityP.E K.E
Taking Relativistic Effect into account:
Accelerating Voltage Vs. λ
Light Vs. Electrons
Wave-Matter Interaction
Introduction to Electron Microcopy
Optical vs. TEM vs. SEM vs. CRT
TEM Working Principle
Electron Gun
Electron Gun Types
Electron Gun Types
Electron Lens
Electron Lens
Optical Lens vs. Electron Lens
Principle of Electron Lens
Electron Beam Alignment
Electron Beam Focusing
Imaging: “Seeing The Electrons”
Imaging vs. Diffraction Pattern (DP)
Imaging : Bright Field vs. Dark Field
Imaging : Bright Field vs. Dark Field
Imaging : Bright Field
Imaging : Bright Field
Diffraction Pattern
Diffraction Pattern
Diffraction Pattern
Diffraction Pattern
Diffraction Pattern
Diffraction Pattern
Application in PV Device/Materials
Application in PV Device/Materials
Application in PV Device/Materials
Application in PV Device/Materials
Application in PV Device/Materials
Application in PV Device/Materials
Application in PV Device/Materials
TEM Facility : Hitech, Puchong
Some Results…. MoS2
Some Results…. MoS2
XRD vs. SAED
XRD SAED
Conclusion
TEMFundamental Limitation of VLMTEM Main components & operating principlesImage generation: BF, DF and DP Interpretation of DP Application in PV research
Jeol Electron Microscopy 1.25 MeV HVEM
* RemarksTopics Not covered:
TEM Sample Preparation
Convergent Beam Electron Microscopy (CBED) Analytical Electron Microscopy (AEM) - Electron Energy Loss Spectroscopy (EELS) - Cathodoluminescence (CL)