Compact Flash Memory Card Connector Product Specification
Specification No: PS98007 Rev. 3 Date: 11.10.99 Page 1 of 7
PRODUCT SPECIFICATION COMPACT FLASH MEMORY CARD CONNECTOR
1. SCOPE
This specification covers the performance, tests and quality of Compact Flash Memory Card connectors that conform to the CFA’s CompactFlash Specification.
2. PRODUCT PART NUMBER
Part No* Description
Solder Tail Style Side View Photo
952-
13-5
0GC
01-X
X
Memory Card
Receptacle
Straddle Mount
952-
13-5
0GC
19-X
X
Memory Card
Receptacle SMT
952-
02-5
0SM
01-X
X
Memory Card
Receptacle
Straddle Mount
952-
02-5
0SM
19-X
X
Memory Card
Receptacle SMT
*Note: XX refers to optional contact plating (Para 3.3)
Compact Flash Memory Card Connector Product Specification
Specification No: PS98007 Rev. 3 Date: 11.10.99 Page 2 of 7
3. MATERIAL AND PLATING
3.1 Insulator : Liquid Crystal Polymer, UL 94V-0, Black
3.2 Contact : Beryllium Copper
3.3 Contact Plating: -90 Underplate : 0.00127 - 0.00381mm Nickel underplate all over
Contact Area: 0.00008 - 0.00013 mm Gold flash over 0.00076 min. 80/20 Palladium Nickel Solder Tails : 0.00127 - 0.00381 mm 90/10 Tin/Lead
-20 Underplate : 0.00127 - 0.00254mm Nickel underplate all over
Contact Area: 0.000381mm Gold plate Solder Tails : 0.00127 - 0.00381 mm 90/10 Tin/Lead
4. PRODUCT SHAPE AND DIMENSIONS Refer to product drawing
5. RATING
5.1 Voltage Rating: 100 Vac
5.2 Current Rating (per position): 0.5 A max.
5.3 Contact Resistance (per position, max.): 40mΩ (initial), ∆R = 20 mΩ (final)
5.4 Dielectric Withstanding Voltage: 1000Vac min. (for 1 minute)
5.5 Insulation Resistance: 1000MΩ min. (initial), 100MΩ min. (final)
5.6 Durability: 10,000 cycles
5.7 Operation Temperature: -20°C to +60°C
6. PERFORMANCE
6.1 Electrical Performance No. Item Test Method Standard 6.1.1 Low Level
Contact
Resistance
Specification: MIL-STD-1344A Method
3002.1
Mated connectors subjected to test
current of 1mA with 20mV open circuit
Ri = 40mΩ
(Initial)
6.1.2 Low Level
Contact
Resistance
after
Environmental/
Mechanical
Test
Specification: MIL-STD-1344A Method
3002.1
Mated connectors subjected to test
current of 1mA with 20mV open circuit
Rf = Ri ±
20mΩ (Final)
Max. 20mΩ change allowed
after test
Compact Flash Memory Card Connector Product Specification
Specification No: PS98007 Rev. 3 Date: 11.10.99 Page 3 of 7
No. Item Test Method Standard 6.1.3 Dielectric
Withstanding
Voltage
Specification: MIL-STD-202F Method 301
Measured between adjacent contacts
while subjected to test potential of
500Vrms AC for one minute.
No breakdown
or flashover,
Current leakage
1 mA max
6.1.4 Dielectric
Withstanding
Voltage after
Environmental/
Mechanical
Test
Specification: MIL-STD-202F Method 301
Measured between adjacent contacts
while subjected to test potential of 750V
for one minute.
No breakdown
or flashover,
Current leakage
1 mA max
6.1.5 Insulation
Resistance
Specification: MIL-STD-202F Method 302
Measured between adjacent contacts at a
test potential of 500 Vdc for one minute
1000MΩ Min.
6.1.6 Insulation
Resistance
after
Environmental/
Mechanical
Test
Specification: MIL-STD-202F Method 302
Measured between adjacent contacts at a
test potential of 500 Vdc for one minute
100MΩ Min.
6.2 Mechanical Performance No. Item Test Method Standard 6.2.1 Contact
Insertion/
Withdrawal
Force
Specification: EIA-364-13
Insert and withdraw connectors at the
speed rate of 25mm per minute
Insertion force:
39.2N Max
Withdrawal force:
6.67N - 39.2N
6.2.2 Durability
(Office
Environment)
Specification: EIA-364-09
Connectors mate and unmate for
10,000 cycles at rate of 600 cycles per
hour at 15°C to 35°C with RH 25% to
85% and Air Pressure of 86 to 106kPa
Contact Resistance
Change (low level):
±20mΩ Max from
initial reading
Compact Flash Memory Card Connector Product Specification
Specification No: PS98007 Rev. 3 Date: 11.10.99 Page 4 of 7
No. Item Test Method Standard 6.2.3 Durability
(Harsh
Environment:
Humidity and
Hydrogen
Sulfide)
Specification: EIA-364-09
Connectors mate and unmate for 5000
cycles at rate of 600 cycles per hour at
15°C to 35°C with RH 25% to 85% and
Air Pressure of 86 to 106kPa
Contact Resistance
Change (low level):
±20mΩ Max from
initial reading
6.2.4 Vibration and
High
Frequency
Specification: MIL-STD-202F Method
204D Test Condition B
Mated connectors subjected to 147
m/s2 peak, 10Hz to 2000 Hz
No mechanical
damage.
Discontinuity:
100 nsec Max.
6.2.5 Mechanical
Shock
Specification: MIL-STD-202F Method
213B
Mated connectors are subjected to a
490m/s2, half sinewave, 11ms holding
time
No mechanical
damage.
Discontinuity:
100 nsec Max.
6.3 Environmental and Other Performance No. Item Test Method Standard 6.3.1 Moisture
Resistance
Specification: MIL-STD-202F Method
106E (Excluding Vibration)
Mated connectors exposed to 10
continuous temperature and humidity
cycles (1 cycle = 24 hours)
Contact Resistance
Change (low level):
20mΩ Max
Insulation Resistance:
100 MΩ Min
6.3.2 Thermal
Shock
Specification: MIL-STD-202F Method
107G Test Condition A
Mated connectors exposed to a
temperature extreme of -55°C to
+85°C for 5 cycles *1 cycle = 1 hour)
No physical
degradation Contact
Resistance Change
(low level): 20mΩ Max
Insulation Resistance:
100 MΩ Min
Compact Flash Memory Card Connector Product Specification
Specification No: PS98007 Rev. 3 Date: 11.10.99 Page 5 of 7
No. Item Test Method Standard 6.3.3 Humidity
(Normal
Condition)
Specification: MIL-STD-202F
Methode 103B, Test Condition B
Mated Connectors subjected to 90 to
95% relative humidity at 40°C for 96
hours.
Contact Resistance
Change (low level):
20mΩ Max
Insulation Resistance:
100 MΩ Min
6.3.4 Hydrogen
Sulfide
Specification: JEIDA 38
Mated connectors exposed to 3 PPM
hydrogen sulfide at 40°C with 80%
RH for 96 hours.
Contact Resistance
Change (low level):
20mΩ Max
6.3.5 Cold
Resistance
Specification: JIS C 0020
Mated exposed to -55°C for 96 hours.
Contact Resistance
Change (low level):
20mΩ Max
6.3.6 Durability
(High
Temperature)
Specification: MIL-STD-202F Method
108A
Mated Connectors subjected to 85°C
for 250 hours
Contact Resistance
Change (low level):
20mΩ Max
Technical Inquiry:
Contact Person: Mr. T. J. Tan Tel: (65) 869 0868 E-mail: [email protected]
Sales Inquiry:
Contact Person: Mr. C. K. Ng Tel: (65) 869 0898 E-mail: [email protected]
A subsidiary of Methode Electonics Inc., U.S.A.
1 Tuas Lane, Jurong Town Singapore 638610
Tel: (65) 861 5444 Fax: (65) 861 4777
Compact Flash Memory Card Connector Product Specification
Specification No: PS98007 Rev. 3 Date: 11.10.99 Page 6 of 7
Compact Flash Memory Card Connector Product Specification
Specification No: PS98007 Rev. 3 Date: 11.10.99 Page 7 of 7