IEE5008 –Autumn 2012 Memory Systems
3D Stacking SRAM
Anwar,Hossameldin Department of Electronics Engineering
National Chiao Tung University [email protected]
Anwar,Hossameldin 2012
Outline Introduction 3D Technology Process Physical Characteristics of d2d Vias Planar SRAM Components Planar SRAM design Techniques 3D implementations of Banked SRAM Arrays 3D implementations of Multiported SRAM arrays Bank and Array-Stacked 3D SRAM Benefits Multiported 3D SRAM Benefits Conclusion References
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Introduction The semiconductor industry faces number of challenges. 1.Poor Scaling of RC delays. 2.Power Consumption. 3.Manufacturing challenges. 3D integration has the potential to address these challenges. 3D integration can reap the advances in traditional planar processes such as double-gate transistors,Tri-gate transistors,finFETs,strained Silicon and metal gates.
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3D fabrication involves stacking two or more die connected with density and low latency.
The increased density and ability to place and route in 3D provide new opportunities for microarchitecture design.
In 3D fabrication, the dense die-to-die enable 3d SRAM components are partitioned at the levels of individual wordlines or bitlines.
So, the benefits are: 1.Reduction of wire length within SRAM arrays. Provides simultaneous latency. Provides energy reduction. 2.Reduction of area footprint. Provides reduction of required wires for global routing.
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3D Technology Process There are several proposed methods for 3D integration such as
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Multilayer buried structures(MLBS)
Die bonding
Multi layer buried structure (MLBS) Structure Multiple device layers are sequentially fabricated in stacked fashion. Layer-to-layer connections are made from interlayer vias or from direct source-
drain/drain-source contacts. It uses local polysilicon wires for connection. Advantage vertical 3D vias can potentially scale down with feature size.
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Die bonding Structure It uses conventional planar fabrication processes and metal vias to bond the planar
die vertically. Depositing vias on the top metal layers of each of the two die and/or etching vias
through the backside of the die, aligning the two die and bonding them together.
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There are many organizations for multiple die bonding: Face-to-Face (F2F) bonding. Face-to-Back (F2B) bonding. Back-to-Back (B2B) bonding.
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Physical Characteristics of d2d Vias
The thinning of the die, reduces the distance that d2d via must cross to connect the two die.
A d2d vias is much smaller than the planar interconnect. It reduces both resistance and capacitance. So, the signal propagation delay between the two die is reduced.
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Planar SRAM Components Caches
Basic design parameters Cache size. Block size. Associativity. Features Large capacity. 1.caches are organized as banks to increase bandwidth and decrease power consumption. 2.Caches are subbanked to save power by sharing sense amplifier circuitry among subbanks. Require both tag and data arrays.
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Register files
Features Lower capacity Do not have a tag array. Consist of regular array of 6T SRAM cells. Typically multiported with multiple read ports and multiple write ports to satisfy the required bandwidth for data processing.
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Planar SRAM array –based components features
Consists of regular array memory cells. Easy to partition across a multiple die. SRAM array are viewed as set of wordlines(horizontally) and set of bitlines(vertically). Row decoder drives the wordlines and control the access transistors of the data storage cells. The bitlines are read by sense amplifier at the bottom of the array.
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Planar SRAM design Techniques It used to increase the performance and reduce the power consumption in SRAM arrays.
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Memory Banking Technique
Memory Subbanking Technique
Hierarchical Wordline Technique
Memory Banking Technique Power Saving • Divides the memory array into multiple modules(banks). • Accessing only the bank that contains the required data.
Bandwidth Enhancement • If the requested data values located in different banks, • we can simultaneously obtain values out of multiple banks. • Thus, mimicking the effect of a multiported memory array.
But! • If multiple addresses target the same bank, we have a bank conflicts. • So, we need a buffer mechanism that stores and reissues the requests, • So that, the target bank provides the requested data values in later clock cycles.
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Example Higher order interleaving technique •Divides the memory array into banks based on the higher order address bits. •If the array contains 2^N locations, •One bank contains addresses from 0 to (2^(N-1))-1. •The other bank contains addresses from 2^(N-1) to (2^N)-1. Lower order interleaving technique •Uses the lower order address bits to identify the banks(odd and even addresses). •If the requested data is located into only one bank, no need to access other banks. •So, it does not consume dynamic power.
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Memory Subbanking Technique Features • A cache block is divided into a number of subbanks. • The required word is chosen using the offset bits in the address. • The subbank selector selects between the two subbanks and feeds the data from only
one subbank into the sense amplifier circuitry. • So, a common set of sense amplifiers can be shared across the subbanks. • Data are read out from only one subbank at a time. • Cutting down on the cache power. • Bitline precharge power saving because only the selected subbank needs to be
precharged.
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Hierarchical Wordline Technique(HWL) Problems • Wordlines are heavily loaded by the access transistors (two per SRAM cell) across the
whole row of SRAM cells. • Wordlines contribute the overall delay of SRAM access.
HWL structure (Solution) • Uses global wordlines(GWL) to drive multiple shorter subwordlines. • The decoder output is used as the global wordline. • So, the wordline loading and latency of driving wordlines are reduced.
Disadvantage • Worsen the wire complexity of the wordlines,the wiring requirement of wordlines is
doubled!!.
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3D Implementations of Banked SRAM Arrays One option for 3D-integrated SRAM array design is to stack banks on the top of each
others. Another option is to split the arrays in multiple layers. Long metal wires are used to route global signals in banked SRAM arrays.
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3D Bank Stacking
3D Array Splitting
3D Bank Stacking There are two possible orientations for bank stacking: • Left-to-Right Stacking • Top-to-Down Stacking Notes • X is the bank width, Y is the bank height. • Assuming that X=Y. • 67% reduction in horizontal component of wiring to and from the banks. • The vertical component of the bank wiring is unaffected. • So, the reduction in wire length translates into a reduction of power and delay.
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3D Array Splitting Features • Partitioning individual rows and columns of the SRAM arrays within a a bank and
stacking them upon themselves. • Can reduce the length of either wordlines or bitlines depending on the orientation of the
split.
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The First Array-split Configuration Stacks columns on columns Single long wordline has been replace by a pair of parallel wordlines. The decoder must drive the wordlines on both of the die. So, it requires one d2d via per wordline. At the bottom of the array, the column select multiplexors have been split across the two die. So, it requires additional d2d vias. There are reduction in latency and power due to wordlines length reduction.
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The Second Array-split Configuration Stacks rows on rows. The row decoder must be partitioned across the two die. Decompose the 1-to-n decoder into 1-to-2 decoder and two 1-to-n/2 decoders. The two 1-to-n/2 decoders are stacked on top of each other. The 1-to-2 decoder will only active to avoid the stacking of thermally active components. So, the length of the bitlines reduce to half. There are latency and power reduction due to wire reduction at both the array and bank levels.
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3D Implementation of Multiported SRAM Arrays There are many possible design for multiported SRAM array in 3D integration technology.
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Register Partitioning(RP)
Bit Partitioning(BP)
Port Splitting(PS)
Register Partitioning(RP) For 2-die 3D RP register file implementation(32-entry) • 3D RP SRAM array with a 2-die Splits half of the entries and places them on the vertically
stacked die. • As shown in the figure, the bottom die contains resisters R0-R15 and the top die contains
registers R16-R31. • The vertical distance (along the bitlines) has been halved.so, it can reduce latency and power
associated with toggling the bitlines. • The row decoder height has been halved.so, it can reduce the length of the critical path
associated with accessing the farthest entry in the register file. • Also, the overall footprint of the register file has been halved.
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For 4-die 3D RP register file implementation • The register entries are partitioned such that one quarter of the entries entries resides
on each die. • The Row decoder is similar to the 2-die stack.
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Bit Partitioning(BP) • Stacks higher order and lower order bits of the same register across different die. • Can be viewed as BP folds the register file(in horizontal direction) and BP fold the register
file(in vertical direction). • As shown in the figure, the bottom die store the LSBs and the top die stores the MSBs. • one could store the bits in odd positions on die, store the bits in even positions on other die. • The BP register file reduces the wire length and gate loading of the wordline. • So, it provides both latency and energy benefits. • The BP 3D register file requires the row decoder output to be fanned out to the different die.
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Example 3D integer arithmetic unit partitioned by significance •For one die : X[0:31]+Y[0:31]. •The other die : [32:63]+Y[32:63]. •So, the the register file BP should be arranged by significance to avoid unnecessary d2d routing between output of the register file and inputs of the arithmetic unit.
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Port Splitting(PS) • Individual SRAM cells(Caches) are designed to be very small to increase the capacity of the
cache. • The area per bit for a register file is dominated by the wordlines and bitlines for implementing
multiple read and write ports. • The register file SRAM cells have larger footprint (due to the high port count). • So, it provides opportunity to allocate one or two d2d vias per cell.
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Feature •Stacking the wordlines on the top of each other(halves the height) and stacking the bitlines (halves the width). •50% reduction in both dimensions leads to overall footprint ~75% reduction of SRAM arrays. •It translates into latency and energy savings.
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Single d2d via per cell configuration •Only single d2d via is used ti route the data bit b to the second die. •On the upper die, an extra inverter recomputes the complement bit b¯.
What is the limitation of the single via configuration?
•Ports on the top die may not be able to optimally support write operations because there is no path to access the true b¯ storage node.
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Two d2d via per cell configuration •Splits the back-to-back inverters across the two die. •Place all of b bitlines on the bottom die, •Place all of b¯ bitlines on the top die.
Disadvantages 1.Wordlines must be replicated across both die which eliminate the wire length reduction in one dimension. 2.Splitting the differential bitlines across more than die may require designing sense amplifiers that are themselves partitioned across more than one die.
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Bank and Array-Stacked 3D SRAM benefits In Table 1 reports • The size and latency of the baseline planar arrays. • The latency of the 3D array-split circuits. • The relative latency reduction. • The latency in terms of 3 GHz clock cycles.
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In Table 2 reports • The energy consumed per read access for both the planar and 3D configurations. • The overall savings range from 2-18%,varying due to the differences in the optimal banking configurations, transistor sizings, and the SRAM aspect ratios
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Multiported 3D SRAM Benefits
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Effect of Increasing the Number of Entries
Effect of Increasing the Data Widths
Effect of Increasing Port Requirements
Energy Benefits of Multiported 3D SRAMs
Effect of Increasing the Number of Entries
In Table 3 reports the planar latencies of each of the register files and percent latency reduction for each of the 3D configurations considered.
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Effect of Increasing the Data Widths
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Effect of Increasing Port requirements
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Energy Benefits of Multiported 3D SRAMs
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Conclusion 3D technology can provide significant benefits in terms of both performance and energy consumption. 3D technology can be applied to the design of SRAM components to reduce the lengths of critical wires. The reduction of the wire length leads to substantial improvement in both latency and energy characteristics of the 3D SRAM components.
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References
Puttaswamy, K. ,"3D-Integrated SRAM Components for High-Performance Microprocessors ",IEEE Transactions on Computers,Oct. 2009
Pfitzner, A. ; Kasprowicz, D. ; Emling, R. ; Fischer, T. ; Henzler, S. ; Maly, W. ;
Schmitt-Landsiedel, D.,"Stacked 3-dimensional 6T SRAM cell with independent double gate transistors ", IEEE International Conference on IC Design and Technology,May 2009
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