Transcript
Page 1: CTL Standard for Memories Standardizing the Test View of Memories

CTL Standard for Memories

Standardizing the Test View of Memories

Page 2: CTL Standard for Memories Standardizing the Test View of Memories

Meeting Agenda• 9:30 Attendees Introduction All• 9:45 Standardization objectives Saman• 10:00 Discussion around the Objectives All• 11:00 Memory Specific Test requirements Saman To lead the discussion

• 12:00 Lunch time.....

• 1:00 CTL Role Saman/Rohit

• 2:00 Coffee Break (Sponsored by LogicVision)

• 2:30 Logistics discussion All– Working group composition– Meetings/conf calls frequency– Group members responsibilities

• 3:30 Standardization order All• 4:30 Adjourn

Page 3: CTL Standard for Memories Standardizing the Test View of Memories

Attendees Introduction

• Mix of EDA Memory Providers and Memory Users

• EDA– Cadence, Synopsys, Mentor Graphics,

Magma, LogicVision, Syntest

• Memory Providers– Arm, Virage Logic, Dolphin, EMT

• Memory Users– FreeScale, Others…?

Page 4: CTL Standard for Memories Standardizing the Test View of Memories

Standardization Objectives

• Test View of a Memory Needs to be More detailed than User View– Physical Information

• Number of Rows, Columns• Memory Cell Orientations and layout • Bit Grouping• Bit Line Twisting• ….

– Redundancy Information– Repair Information– Multi-port Use– Access Modes– Addressing Modes– Use of ECC– Scan Test Specific Logic

Page 5: CTL Standard for Memories Standardizing the Test View of Memories

Standardization Objectives

• EDA Industry Use Proprietary Modeling Schemes– Scan Test and BIST

• Memory User Need the Test/BIST Model• Same Memory is used by Multiple Users• Memory Providers Generate the Test Models based on

Customer Requirements– Multiple Models for the Same Memory

• Validating the Models – Responsibility?

• All Models Convey the Same Information– More or Less

Page 6: CTL Standard for Memories Standardizing the Test View of Memories

Standardization Objectives

• Unify All Models into one Common Model– Agreed on between all Parties

• EDA, Memory Providers and Users

• Use CTL as a Standardization Language– Some Constructs are Already There– Need to add More

• Independent of How to test the Memory– Memory Test Algorithm should not be the

Focus

Page 7: CTL Standard for Memories Standardizing the Test View of Memories

Objectives Discussion

• Any Other Objectives

Page 8: CTL Standard for Memories Standardizing the Test View of Memories

Memory Specific Test Requirements

• Several Aspects to be considered– Mostly Static Information

• Memory Level Information– Example: Address Segmentation

• Lower Level Information– Example: Ports and their Functions

Page 9: CTL Standard for Memories Standardizing the Test View of Memories

Memory Level Information• Memory Type

– SRAM, DRAM, ROM, FLASH, Single Program ROM– Synchronous, Asynchronous

• Memory template Name• Logical Ports

– (x)RW, (y)R, (z)W,• Retention Time• Bypass Mode• Minimum Hold Time• Write Mode Operation (Select During Write Through)• Data Out Stage

– Flop, Latch, None• Address Configuration

– Logical Physical Address Map– Count Ranges for Bank, Row, Column– Physical Address Map

• Address Transition Delay• Physical Data Map• Physical Data Bits Grouping• Write Enable Maping• Tri State condition

Page 10: CTL Standard for Memories Standardizing the Test View of Memories

Memory Level Information

• Redundancy Information– Redundant Rows, Columns, Row and

Columnls– Address Fuse and Fuse Map

• Repair Information– Soft/Hard

• ECC Information– #of ECC bits– Accessibility of ECC Bits

Page 11: CTL Standard for Memories Standardizing the Test View of Memories

Lower Level Information

• Ports Information– Port Name– Port Range [L:R]– Direction (Input, Output, InOut)– Logical Port relationship– Polarity (Active High/Low)– Port Function

• Data, Address, BistClock, ReadEnable, WriteEnable, Clock, GroupWriteEnable, Logic High, LogicLow, None, Open, OutputEnable, ScanTest, Select, | ShadowAddressEnable | ShiftEnable, Active, CAS, RAS, Refresh, ECCDisable, [User defined]

– Status During Scan (Enable, Disable, Observe)– Scan Test Functions (ScanIn, ScanOut, ScanEnable)

Page 12: CTL Standard for Memories Standardizing the Test View of Memories

Lower Level Information

• Memory Access Information– How to read, Write, and other Functions– Need specific waveforms – May have Multiple Access Modes

• Normal, Burst 2, Burst 4, …

• May be considered Application Specific– Do we need to standardize this?

Page 13: CTL Standard for Memories Standardizing the Test View of Memories

Lunch…….

• 1 Hour

• Will restart at 1 PM

Page 14: CTL Standard for Memories Standardizing the Test View of Memories

Role of CTL

• CTL Mode internal Block– Defines Attributes for Input and outputs– Starting Point

• Does not cover all port types and fuctions– data_type– testcontrol_subtype– testdata_subtype

– Need to go beyond the ports to cover Memory Level

Page 15: CTL Standard for Memories Standardizing the Test View of Memories

Logistics Discussion• Working group composition

– Are we missing a segment from the Industry?– Need to elect a Chair, Vice Chair

• Meetings/conf calls frequency– Two Face to Face Meetings per year

• @VTS and @ ITC• We will choose a scribe at the meeting• Hopefully one year is enough

– Conference calls once a month• Decide on Day/Time/Length• Minutes to be posted (Where/How?)• Actions collected and tacked by the Chair

– Use CTL Standard for Documentation• Group members responsibilities

– Share Your Knowledge– Get your Company Agreement – We need to know if your company holds patents on the Standard– Follow on with your commitment actions– Leave Politics out of it

• No need to know which tool is best• Keep the chair informed of conflicts

Page 16: CTL Standard for Memories Standardizing the Test View of Memories

Standardization Order

• Where do we start?– Ports and Their Functions

• Agree on them• Add them to the CTL data_type

– How do we do the handle the Memory Level Information?


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