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Title
S&T Campaign: Sciences for ManeuverLogistics & Sustainability
Michael Coatney, (410) 278-9834, [email protected]
Asha Hall, Ph.D., (410) 278-2384, [email protected]
SCM 027
Prognostics and Diagnostics Laboratory
• Acoustic Emission System ‒ 16-channel, low frequency, ultrasonic conditioning unit‒ Frequency Range: 1.6 kHz to 40 MHz ‒ Up to 10 MHz sampling rate‒ Detect cracks and crack locations in structural components;
detect fiber breaks and delaminations in composites
‒ Acellent’s ScanSentry and ScanGenie II diagnostic unit generates and captures signals from piezoelectric sensors and actuators using Lamb waves
‒ Able to actively interrogate metallic and composite structures in-plane and out-of-plane
• Lamb Wave Diagnostics
• Impact Modal Analysis‒ Adapts to FFT analyzers for structural behavior testing‒ 0–5,000 lb/ft impact loading‒ x1, x10, x100 gain signal conditioning
‒ High speed interrogator capable of monitoring and analyzing FBG sensors with up to 4 channels simultaneously
‒ Up to 500 kHz for a single channel of 100 kHz on four simultaneous channels
‒ Sensitivity of 0.02 µe for periodic vibrations
• High-Speed Optical Sensing
Lamb Wave Diagnostics
Research FacilitiesSupports prognostics health management research activities such as structural health monitoring and life prognosis; propulsion health monitoring; machinery and dynamic component diagnostics; physics, materials, electronics, advanced sensing, and data acquisition hardware
Equipment Available
Flaw Detection using Pulse Thermography
Sensor Path Configuration
Prestine Notched Specimen
Specimen Subjected under Fatigue Loading
Damage recognition using Acellent’sSMART patch technology
Acoustic Emission System
High-Speed Optical Sensing
Impact Modal Analysis
Pulse Thermography
• Pulse Thermography‒ Fast, non-contact, wide area, non-destructive inspection
of flat and curved structures‒ Can measure depth and area of subsurface defects
• Ultrasonics‒ Fast, non-contact, wide area, non-destructive
inspection of flat and curved structures‒ Can measure depth and area of subsurface defects
AE Sensors Damage Location Recognition
Vallen Systeme AMSY-6 AE System
Ultrasonics
RITEC RAM-5000 Controlled Ultrasonic System
Flash Source240v, 20A
Specimen
Hi-speed IR camera
Flash Source240v, 20A 1D Heat
conduction
IR radiation
Data acquisition
Strike Face Back Face
Strike face and back face scan of S-2 Glass composite panel with porosity and density
gradients
Slide Number 1