Transcript
Page 1: Ayasdi & Teradata : Applying Topological Data Analysis to Complex Data

Teradata Partners Conference ’14

Applying Topological Data Analysis to Complex Data

Abhishek Gupta, Senior Engineer

Page 2: Ayasdi & Teradata : Applying Topological Data Analysis to Complex Data

Company Confidential & Proprietary 2

Ayasdi named one of the Top 10 Most Innovative Companies in Big

Data for 2013

These big data companies are ones

to watch

The Structure Data Awards: Machine Learning / Artificial Intelligence

Top 100 Private Companies – Big Data/Analytics

Named by Mary Meeker as one of the most interesting

companies in the data/analytics space

Ayasdi makes the world’s complex data useful by extracting powerful insights automatically.

Page 3: Ayasdi & Teradata : Applying Topological Data Analysis to Complex Data

Company Confidential & Proprietary

The Promise of Big Data

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Information Understanding Business Impact

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Company Confidential & Proprietary

Why Do Current Approaches Fail?

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Hypothesis

Today’s Approach to Analytics

Challenges: •  Incomplete and missing insights • Depends on humans to scale • Slow responses due to iteration

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Company Confidential & Proprietary

A New Approach Is Required

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Algorithms & Compute

Benefits: • Automated understanding • Comprehensive • Fast

OR

Page 6: Ayasdi & Teradata : Applying Topological Data Analysis to Complex Data

Company Confidential & Proprietary

Hypothesis

Comparison

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Traditional Analytics Ayasdi Approach

Labor Intensive Automated

Analysts and Data Scientists Domain Experts Verifies Explains

Algorithms & Compute

or

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Company Confidential & Proprietary 7

Statistics

Machine Learning

Geometry

Ayasdi’s topological framework incorporates, unifies and enhances other disciplines. Because of these properties

it has extraordinary reach and effectiveness.

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Company Confidential & Proprietary

Ayasdi & Teradata Partnership

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SQL Code DDL

Data pushed through analysis

Key Benefit: Making your ETL process simpler.

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Company Confidential & Proprietary

Use Case: Anomaly Detection

ABOUT THE DATA

•  Data consists of die level test information for 1 wafer •  12,000+ dies with 100+ tests done for each of the die

•  Network was built using all the test columns

•  Test Result column with pass/fail flag used as metadata

GOAL OF THE ANALYSIS •  Identify different subgroups of dies based on similar test

information •  Find tests that uniquely identify failed die subgroups

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Fortune 500 and S&P 500 company

$5B+ in revenue

Leader in flash memory

storage and software

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Ayasdi CoreTM Demo

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Page 11: Ayasdi & Teradata : Applying Topological Data Analysis to Complex Data

Company Confidential & Proprietary

Use Case: Anomaly Detection

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High Low

Rows in Node

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Company Confidential & Proprietary

Use Case: Anomaly Detection

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High Low

Test Result=True

Key Takeaway: Tight concentration of wafers that pass their tests in the middle of the cluster

Page 13: Ayasdi & Teradata : Applying Topological Data Analysis to Complex Data

Company Confidential & Proprietary

Use Case: Anomaly Detection

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High Low

Test Result=False

Key Takeaway: Two distinct regions of wafers failing their tests à Next action: investigate the “why”

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Company Confidential & Proprietary

Use Case: Anomaly Detection

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High Low

Test Result=False

Select first failure group to view underlying wafer properties

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Company Confidential & Proprietary

Use Case: Anomaly Detection

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KS scores for test 13 show correlations for specific failures

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Company Confidential & Proprietary

Use Case: Anomaly Detection

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High Low

Select second failure group to view underlying wafer properties

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Company Confidential & Proprietary

Use Case: Anomaly Detection

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KS scores for tests 8, 11, and 3 show correlations for specific failures

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Company Confidential & Proprietary

Use Case: Anomaly Detection

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SOLUTION •  Accelerated the analysis of wafer data and yield rates to identify

and resolve issues •  Identified additional systemic anomalies previously dismissed as

“random” •  Estimated to save hundred million dollars in the first year from a

reduction in scrap by reducing yield loss by 10%

CHALLENGE

•  Pinpoint wafer anomalies that result in scrap and lost revenue •  Previously required at least two days of analysis to identify even the

most systemic anomalies

Fortune 500 and S&P 500 company

$5B+ in revenue

Leader in flash memory

storage and software

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Corporate Headquarters 4400 Bohannon Drive Suite #200 Menlo Park, CA 94025 ayasdi.com

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