ADC STUDENT LECTUREAndrew BrownJonathan WarnerLaura Strickland

Table of Contents• Signals• Applications of ADC’s• Types of ADC’s• Successive Approximation Example• The ADC on the MC9S12C32

Introduction• Analog to digital converters convert analog, or “real world”

signals to a series of 1’s and 0’s, able to be stored or transmitted through computers or digital systems.

Introduction cont.• Reasons why this would be needed:

• Digital storage of a non-digital signal• (ex: recording light intensity of a lightning strike using sensors, mapping

a flight path of an aircraft onto a computer for analysis)• Transmitting data over a digital system

• (ex: sending your voice through a telephone system, Skype chatting, etc…)

Analog Signals• Analog signals are the smooth, “real”, signals of the world.

• These signals can contain any and all values needed to represent the data in question.

Digital Signals• Digital signals, however, contain series of discrete values,

with interpolation occurring between data points to recreate the signal.

• Digital signals are meant to be used in digital systems, and therefore are composed simply of 0’s and 1’s.

Benefits of Digital Signals over Analog

• Can be stored in digital system. • Can be compressed.• Can filter out frequencies you don’t want, analog noise is

removed.

How does it work?• ADC’s work in two steps:

• Sampling• Quantization

Sampling• Let’s look again at our last graph:

• Our discrete values on the y axis are taken at spaced-out time steps on the x axis.

• These are the “sampling points”.

Sampling cont.• Larger number of sampling points during the same amount of time = smoother looking graph.

• “Sampling rate” is this frequency at which sampling will occur.

• Nyquist Theorem: Sampling rate should be 2*highest frequency you want to capture.

Sampling Question• If you use a sampling rate of 50,000 Hz for 2 seconds,

how many data points are you capturing?

• What is the distance between each point on the resulting graph of Voltage vs. time?

Quantization• “Sampling for y axis”

• Assigning a binary code value to discrete measurements, stored on a fixed-length variable.

Quantization Noise• Since values are rounded to the nearest possible digital

value, a certain level of “quantization noise” will occur.• Example: In an 8-bit resolution system, a value of 236.4

will be stored as the digital value 236.

• Signal to noise ratio measures the noise level by the equation:

• SNR = 6.02*n + 1.761 dB, for n-bit resolution

Disadvantages of Digital Signals

• Not a perfect representation of the analog signal

• Low memory systems give you bad quality output, as resolution or sampling may be low

Example: Phone systems use a sampling rate of 8kHz, so all frequencies above 4kHz are canceled. As a result, playing music through a phone sounds muffled and low quality.

Aliasing• Aliasing occurs when a signals frequency is above the

Nyquist Frequency.

• The data points captured suggest a lower frequency signal than the one that actually exists.

ADC APPLICATIONS

Sound recording• ADC’s are used to convert sound waves into digital

signals through the use of computer microphones or sensors.

• This allows digital storage and transmission of music, voice, and other sound data.

• Ex: Telephones convert your voice using 8kHz sampling.

Sensors and Data Acquisition• Digital sensors output an analog voltage when reading

data.• Examples:

• light sensors• pressure sensors• accelerometers

• Computers store this data by converting the signal to digital values, used later by computers.

Digital Cameras• Photo-sensors on cameras convert photon impacts into voltage outputs.

• These are then converted to digital values and stored on your camera’s memory card to be recreated later on a computer.

Circuit representation of ADC• The general representation of an ADC is shown below.

• But what is inside the ADC block? How is the data recorded and stored?

TYPES OF ANALOG TO DIGITAL CONVERTERS

Jonathan Warner

Overview

1. Parallel Design (Flash)2. Successive Approximation 3. Dual-Slope 4. Sigma-Delta

Parallel Design (Flash ADC)

• Vref set to Vmax

• Resistors used to divide reference voltage into intervals

• Comparators used to compare Vin to the reference voltages

• Encoder uses logic gates to convert control logic to binary digital output

2^n-1 comparators

Parallel Design (Flash ADC)

Advantages• Fastest ADC (gigahertz)

• Simple Design• Can achieve non-linear output

Disadvantages• 2^n-1 comparers• Low resolution• Large Die size• Prone to glitches

(out of sequence output)

Successive ApproximationDAC-Based Design

• Starts by setting MSB D(n-1) to 1

• Uses DAC and op amp to determine if bit should remain 1 or be set to zero (greater or less than Vres * 2^(n-1))

• Next, bit D(n-2) set to 1 and comparison is repeated

Output Buffer allows the circuit to read the digital data while the ADC is working on the next sample

Successive ApproximationDAC-Based Design

Advantages• Speed, worst case n clock cycles• Conversion time independent of amplitude of Vin

• Capable of outputting the binary number in serial (one bit at a time) format.

Disadvantages• Resolution tradeoff

with speed

Dual-SlopeIntegrator-Based Design• Switch connects Vin with

integrator• Switch held for fixed

number of clock cycles• Analog switched at set time

to –Vref

• T2 clock cycles proportional to Vin

• Vin = Vref x T2/T1

Dual-SlopeIntegrator-Based Design

Dual-SlopeIntegrator-Based Design

Advantages• Insensitive to components value errors

• Can achieve high resolution (but at the cost of speed)

• Useful for highly accurate measurements

Disadvantages• Speed, 2^n-1 clock

cycles• Limited applications

Sigma-Delta• Analog signal set to

integrator• Resulting “sawtooth”

waveform compared with zero volts

• Output either high or low• Output converted to positive or negative Vres and fed back to be added to next sample’s Vin

• Resulting stream of 0’s and 1’s represents the analog signal average voltage

Clock rate used is very high, results in “oversampling” of data

Sigma-Delta

Advantages• High Resolution• No need for precision components

Disadvantages• Speed,

Oversampling• Only applicable for

low bandwidth

ADC Comparison

Type Speed (relative)

Cost (relative)

Resolution

Dual Slope Slow Med 12-16Flash Very Fast High 4-12Successive Approx

Medium – Fast

Low 8-16

Sigma – Delta

Slow Low 12-24

Successive Approximation ExampleGiven:8 bit ADCVin = 0.2 VVref = 2 V

Bit Voltage

7 1

6 0.5

5 0.25

4 0.125

3 0.0625

2 0.03125

1 0.015625

0 0.0078125

2n = 28 = 256Vres = Vref / 256Vres = 0.0078125 V (Resolution)

Find:n bit digital output

Successive Approximation Example (cont.)

1 0 0 0 0 0 0 0

0 0 1 0 0 0 0 0

0 1 0 0 0 0 0 0

0 0 1 1 0 0 0 0

0 0 1 1 1 0 0 0

0.4 < 1

0 0 1 1 0 1 0 0

0 0 1 1 0 0 1 0

0 0 1 1 0 0 1 1

0 0 1 1 0 0 1 1

0.4 < 0.5

0.4 > 0.25

0.4 > 0.375

0.4 <0.4375

0.4 <0.4063

0.4 > 0.39

0.4 > 0.398

Digital Output

The ATD10B8C on the MC9S12C32

Input PinsATD10B8C

MC9S12C32 Block Diagram

The Basics of the ATD10B8C • Resolution: 8- or 10-bit (manually chosen)• 8-channel multiplexed inputs• Successive Approximation architecture• Can perform single or continuous sampling• Can sample single or multiple channels• Conversion time: 7 µs (in 10-bit mode)• Optional external trigger

ATD10B8C Block DiagramPin Purposes

AN7/ETRIG/PAD7

Analog input channel 7/External trigger for ADC/General purpose digital I/O

AN6/PAD6 – AN0/PAD0

Analog input/General purpose digital I/O

VRH, VRL High, low reference voltages

VDDA, VSSA Supply power for analog circuitry

Control Register 2

Pin Description

7 0 – Power down ATD; has recovery time period1 – Normal ATD functionality

6 0 – Normal clearing (read CCF before reading result register)1 – Fast Flag Clearing (auto-clear CCF after result register is accessed)

5 0 – Continue running in Wait Mode1 – Halt conversion and power ATD down while in Wait Mode

4 0 – External Trigger Edge1 – Trigger Level

3 0 – Low/falling trigger polarity1 – High/rising trigger polarity

2 0 – Disable external trigger mode1 – Enable external trigger mode

1 0 – ATD Sequence Complete Interrupt Request disabled1 – ATD Sequence Complete Interrupt Request enabled

0 0 – No ATD interrupt occurred1 – ATD sequence complete interrupt pending

Control Register 3

Pin Description

6 - 3 Controls the number of conversions per sequence

2 0 – ATD Conversion calculation goes to corresponding result register1 – Current ATD conversion put in consecutive result registers; wraps around sequentially at end

1-0 Determines how ATD responds to a breakpoint (see Table 8.5)

Control Register 4

Pin Description

7 0 – 10-bit resolution1 – 8-bit resolution

6-5 Selects the length of the second phase of the sample time in units of ATD conversion clock cycles. (See Table 8-7)

4-0 ATD Clock Prescaler (PRS) (5 bits long). ATD conversion clock frequency is calculated by:

Control Register 5

Pin Description

7 0 – Data in the result registers is left-justified1 – Data in the result registers is right-justified

6 0 – Result register data is unsigned1 – Result register data is signed

5 Continuous Conversion Sequence Mode0 – Single conversion sequence1 – Continuous conversion sequences (scan mode)

4 Multi-Channel Sample Mode0 – Sample only one channel1 – Sample across multiple channels

2-1 Selects the analog input channel(s) whose signals are sampled and converted to digital codes (See Table 8-12)

Single Channel (MULT = 0)Single Conversion (SCAN = 0)

7 6 5 4 3 2 1 0

Port AD

ATD Converter

ResultRegisterInterface

ATDDR0

ATDDR1

ATDDR2

ATDDR3

ATDDR4

ATDDR5

ATDDR6

ATDDR7

Single Channel (MULT = 0)Continuous Conversion (SCAN = 1)

7 6 5 4 3 2 1 0

Port AD

ATD Converter

ResultRegisterInterface

ATDDR0

ATDDR1

ATDDR2

ATDDR3

ATDDR4

ATDDR5

ATDDR6

ATDDR7

Multiple Channel (MULT = 1)Single Conversion (SCAN = 0)

7 6 5 4 3 2 1 0

Port AD

ATD Converter

ResultRegisterInterface

ATDDR0

ATDDR1

ATDDR2

ATDDR3

ATDDR4

ATDDR5

ATDDR6

ATDDR7

Single Channel (MULT = 1)Continuous Conversion (SCAN = 1)

7 6 5 4 3 2 1 0

Port AD

ATD Converter

ResultRegisterInterface

ATDDR0

ATDDR1

ATDDR2

ATDDR3

ATDDR4

ATDDR5

ATDDR6

ATDDR7

Status Register 0

Pin Description

7 0 – Conversion sequence not completed1 – Conversion sequence completed (set to 1 after each sequence complete when SCAN mode is on)

5 0 – No external trigger overrun error has occurred1 – External trigger overrun error has occurred

4 0 – No overrun in results1 – A overrun in results

3-0 Conversion Counter (read-only; points to result register that will receive the result of the current conversion)

Status Register 1

Pin Description

7-0 Conversion complete flag (one bit is set at the end of every conversion in a conversion sequence, going from CCF0 in order to CCF7)0 – Conversion # x is not completed1 – Conversion # x is completed and results are available

Left-Justified Result Register

• Right-Justified Result Register is similar. • Each register has a high and a low byte. • 8 Result Registers total ($0090 - $009F)

Setting Up the ATD• Step 1: Power-up the ATD and define settings in ATDCTL2

ADPU = 1 powers up the ATDASCIE = 1 enables interrupt

• Step 2: Wait for ATD recovery time (~ 20μs) before proceeding

• Step 3: Set the number of successive conversions in ATDCTL3

S1C, S2C, S4C, S8C determine the number of conversions (see Table 8-4)

Setting Up the ATD• Step 4: Configure the resolution, sampling time, and ATD

clock speed in ATDCTL4PRS0, PRS1, PRS2, PRS3, PRS4 set the sampling rate (see Table 8-6) SRES8 sets the resolution to 8-bit (= 1) or 10-bit (= 0)

• Step 5: Configure the starting channel, single/multiple channel, SCAN setting and whether result data should be signed or unsigned in ATDCTL5

CC, CB, CA determine input channel (see Table 8-12)MULT sets single (= 0) or multiple (= 1) inputsSCAN sets single (= 0) or continuous (= 1) samplingDJM sets output format as left-justified (=0) or right-justified (=1)DSGN sets output data as unsigned (=0) or signed (=1)