STER
EOLITH
OGRAPH
Y Accura® ClearVue™ Material
Applications Benefits• Thehighestclarityandtransparency
• Durableandstrong
• Humidityandmoisturestable
• USPclassVIcapable
• Generalpurposeprototyping
• Modelsrequiringhighclarity
• Headlampsandlenses
• Fluidflowandvisualizationmodels
• Transparentassemblies
• Snapfitsandcomplexassemblies
• Medicalmodelsandmedicaldevices
Simulate the properties and appearance of Polycarbonate and ABS
with this durable clear plastic.
Liquid Material
Appearance Clear/Transparent
LiquidDensity @25°C(77°F) 1.1g/cm3at25°C
SolidDensity @25°C(77°F) 1.17g/cm3at25°C
Viscosity @30°C(86°F) 235-260cps
PenetrationDepth(Dp) 6.1mils
CriticalExposure(Ec) 9.5mJ/cm2
STER
EOLITH
OGRAPH
Y
Forusewithsolid-statestereolithography(SLA®)Systems
TechnicalData
Post-Cured Material
TensileStrength ASTMD638 46-53MPa 6,700-7,700PSI
TensileModulus ASTMD638 2,270-2,640MPa 329-383KSI
ElongationatBreak(%) ASTMD638 3-15% 3-15%
FlexuralStrength ASTMD790 72-84MPa 10,400-12,200PSI
FlexuralModulus ASTMD790 1,980-2,310MPa 287-335KSI
ImpactStrength(IzodNotched) ASTMD256 40-58J/m
0.70-1.1ft-lb/in
HeatDeflectionTemperature ASTMD648@66PSI@264PSI
51°C50°C
124°F122°F
Hardness,ShoreD 80 80
Co-efficientofThermalExpansion ASTME831-9325-50°C50-100°C
122μm/m-°C155μm/m-°C
68μin/in-°F86μin/in-°F
GlassTransition(Tg) DMA,E” 62°C 144°F
WaterAbsorption ASTMD570-98 0.3% 0.3%
3DSystemsCorporation Tel:+1803.326.4080
[email protected] Toll-free:800.889.2964
www.3dsystems.comRockHill,SC29730U.S.A. Fax:+1803.324.8810
NYSE:DDD
Warranty/Disclaimer:The performance characteristics of these
productsmay vary according to product application, operating
conditions, orwith end
use.3DSystemsmakesnowarrantiesofanytype,expressorimplied,including,butnotlimitedto,thewarrantiesofmerchantabilityorfitnessforaparticularuse.©2011by3DSystems,Inc.Allrightsreserved.Specificationssubjecttochangewithoutnotice.ClearVue,iProandthe3DlogoaretrademarksandAccura,ViperandSLAareregisteredtrademarksof3DSystems,Inc.
PN70740IssueDate-Nov2011
Accura® ClearVue™ Material
Measurement Condition Metric U.S.
Measurement Condition Value
TM
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